Datasheet FDP3672 Datasheet (Fairchild)

Page 1
FDP3672
N-Channel PowerTrench® MOSFET 105V, 41A, 33mΩ
FDP3672
September 2003
Features
•r
•Q
• Low Miller Charge
•Low Q
• Optimized eff iciency at high frequ encies
• UIS Capability (Single Pulse and Repetitive Pulse)
• Qualified to AEC Q101
= 25mΩ (Typ.), V
DS(ON)
(tot) = 28nC (Typ.), V
g
Body Diode
RR
= 10V, ID = 41A
GS
= 10V
GS
Applications
• DC/DC converters and Off-Line UPS
• Distributed Pow er Architectures and VRMs
• Primary Switch for 24V and 48V Systems
• High Voltage Synchronous Re ctifier
• Direct Injection / Diesel Injection Systems
• 42V Automotive Lo ad Control
• Electronic Valve T rain System s
Formerly developmental type 82760
D
DRAIN
(FLANGE)
TO-220AB
FDP SERIES
MOSFET Maximum Ratings T
C
SOURCE
DRAIN
GATE
= 25°C unless otherwise noted
G
S
Symbol Parameter Ratings Units
V
DSS
V
GS
Drain to Source Voltage 105 V Gate to Source Voltage ±20 V Drain Curr e nt Continuous (T
I
D
Continuous (T Continuous (T
= 25oC, VGS = 10V)
C
= 100oC, VGS = 10V) 31 A
C
= 25oC, VGS = 10V, R
amb
= 62oC/W) 5.9 A
θJA
41 A
Pulsed Figure 4 A
E
AS
P
D
, T
T
J
STG
Single Pulse Avalanche Energy (Note 1) 48 mJ Power dissipation 135 W Derate above 25
o
C0.9W/
Operating and Storage Temperature -55 to 175
o
C
o
C
Thermal Characteristi cs
R
θJC
R
θJA
This product ha s been des igned to me et the e xtr eme test c ondit ions and envir onment deman ded by the automot ive indus t ry. For a
All Fairchild Semiconductor prod ucts are manufactured, assembled and tested under ISO9000 and QS9000 quality systems
©2003 Fairchild Semiconductor Corporation
Thermal Resistance Junction to Case TO-220 1.11 Thermal Resistance Junction t o Ambient TO-220 (No te 2) 62
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/
certification.
FDP3672 Rev. A3
o
C/W
o
C/W
Page 2
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDP3672 FDP3672 TO-220AB Tube N/A 50 units
FDP3672
Electrical Characteristics
TC = 25°C unless otherwise noted
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
B I
DSS
I
GSS
VDSS
Drain t o Source Breakdown Volta ge ID = 250µA, VGS = 0V 105 - - V
V
= 80V - - 1
Zero Gate Voltage Drain Current
DS
= 0V TC= 150oC- - 250
V
GS
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA2-4V
I
Drain to Source On Resistance
= 41A, V
D
I
= 21A, VGS = 6V, - 0.031 0.055
D
I
= 41A, V
D
T
= 175oC
C
= 10V - 0.025 0.033
GS
= 10V ,
GS
- 0.063 0.070
Dynamic Characteristics
C C C Q Q Q Q Q
ISS OSS RSS
g(TOT) g(TH) gs gs2 gd
Input Capacitance Output Capacitance - 240 - pF Reverse Transfer Capacitance - 55 - pF
= 25V, VGS = 0V,
V
DS
f = 1MHz
Total G ate Ch arg e at 10 V VGS = 0V to 10V Threshold Gate Charge VGS = 0V to 2V - 3.9 5 nC Gate to Source Gate Charge - 12 - nC Gate Charge Threshold to Plateau - 8.0 - nC
V
DD
I
= 41A
D
I
= 1.0m A
g
= 50V
Gate to Drain “Miller” Charge - 6.5 - nC
-1670- pF
-2837nC
µA
Ω
Resistive Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time Turn-On Delay Time - 12 - ns Rise Time - 48 - ns T u rn-Off Delay Time - 24 - ns Fall Time - 27 - ns Turn-Off Time - - 77 ns
(VGS = 10V)
V
DD
V
GS
--90ns
= 50V, ID = 41A = 10V, RGS = 11.0Ω
Drain-Source Diode Characteristics
I
= 41A - - 1 .25 V
V
SD
t
rr
Q
RR
Notes: 1: Starting T 2: Pulse Width = 100s
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
Source to Drain Di ode Voltage Reverse Recovery Time ISD = 41A, dISD/dt =100A/µs- - 39ns
Reverse Recovered Charge ISD = 41A, dISD/dt =100A/µs- - 42nC
= 25°C, L = 0.11mH, IAS = 30A.
J
SD
= 21A - - 1.0 V
I
SD
Page 3
FDP3672
Typical Characteristics T
= 25°C unless otherwise noted
C
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0255075100 175
125
TC, CASE TEMPERATURE (oC)
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2
DUTY CYCLE - DESCENDING ORDER
0.5
1
0.2
0.1
0.05
0.02
0.01
150
50
V
= 10V
GS
40
30
20
, DRAIN CURRENT (A)
D
I
10
0
25 50 75 100 125 150 175
TC, CASE TEMPERATURE (oC)
Figure 2. Maximum Continuous Drain Curr ent vs
Case Temperature
, NORMALIZED Z
, PEAK CURRENT (A) I
θJC
DM
THERMAL IMPEDANCE
500
100
30
0.1
0.01
10
-5
10
VGS = 10V
-5
SINGLE PULSE
-4
10
-3
10
-2
10
NOTES: DUTY FACTOR: D = t
PEAK TJ = PDM x Z
-1
10
t, RECTANGULAR PULSE DURATION (s)
Figure 3. Normalized Maximum Transient Thermal Impedance
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
-4
10
-3
10
t, PULSE WIDTH (s)
-2
10
-1
10
TC = 25oC
FOR TEMPERATURES ABOVE 25 CURRENT AS FOLLOWS:
I = I
P
DM
1/t2
x R
θJC
0
10
o
25
0
10
t
1
t
2
+ T
θJC
C
C DERATE PEAK
175 - T
C
150
1
10
1
10
Figure 4. Peak Current Capability
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
Page 4
Typical Characteristics T
= 25°C unless otherwise noted
C
FDP3672
200 100
10
OPERATION IN THIS
AREA MAY BE
LIMITED BY r
1
, DRAIN CURRENT (A)
D
I
SINGLE PULSE TJ = MAX RATED
= 25oC
T
C
0.1 1 10 100
DS(ON)
VDS, DRAIN TO SOURCE VOLTAGE (V)
10µs
100µs
1ms
10ms
DC
Figure 5. Forward Bias Safe Operating Area
80
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
V
= 15V
DD
60
40
TJ = 25oC
20
, DRAIN CURRENT (A)
D
I
0
3.5 4.0 4.5 5.0 5.5 6.0 6.5 VGS, GATE TO SOURCE VOLTAGE (V)
TJ = 175oC
TJ = -55oC
200
If R = 0
200
tAV = (L)(IAS)/(1.3*RATED BV
100
≠
0
If R
= (L/R)ln[(IAS*R)/(1.3*RATED BV
t
AV
10
, AVALANCHE CURRENT (A)
AS
I
STARTING TJ = 150oC
1
0.001
0.01 0.1 1 10 tAV, TIME IN AVALANCHE (ms)
- VDD)
DSS
- VDD) +1]
DSS
START ING TJ = 25oC
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
Figure 6. Unclamped Inductive Switching
Capability
80
TC = 25oC
60
40
, DRAIN CURRENT (A)
20
D
I
0
0 0.5 1.0 1.5 2.0 2.5 3.0
VGS = 10V
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
VGS = 5V
VDS, DRAIN TO SOURCE VOLTAGE (V)
VGS = 7V
VGS = 6V
Figure 7. Transfer Characteristics Figure 8. Saturation Characteristics
40
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
35
30
25
20
15
DRAIN TO SOURCE ON RESISTANCE (m Ω)
0 1020304050
VGS = 6V
VGS = 10V
I
, DRAIN CURRENT (A)
D
Figure 9. Drain to So urce On Resistanc e v s Drai n
Current
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
2.5
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
2.0
1.5
ON RESISTANCE
1.0
NORMALIZED DRAIN TO SOURCE
0.5
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
VGS = 10V, ID = 41A
Figure 10. Normalized Drain to Source On
Resistance vs Junction Temperature
Page 5
FDP3672
Typical Characteristics T
1.2
1.0
0.8
NORMALIZED GATE
0.6
THRESHOLD VOLTAGE
0.4
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
= 25°C unless otherwise noted
C
VGS = VDS, ID = 250µA
Figure 11. Normalized G ate Threshol d Voltage vs
Junction Temperatur e
3000
C
= CGS + C
1000
100
ISS
C
≅ C
+ C
OSS
DS
GD
C
= C
RSS
GD
GD
1.2 ID = 250µA
1.1
1.0
BREAKDOWN VOLTA GE
NORMALIZED DRAIN TO SOURCE
0.9
-80 -40 0 40 80 120 160 200 T
, JUNCTION TEMPERATURE (oC)
J
Figure 12. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
10
VDD = 50V
8
6
4
C, CAPACITANCE (pF)
V
= 0V, f = 1MHz
GS
10
0.1 1 10 100 VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 13. Capacitance vs Drain to Sour ce
Voltage
2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
0 5 10 15 20 25 30
Qg, GATE CHARGE (nC)
WAVEFORMS IN DESCENDING ORDER:
ID = 41A I
= 6A
D
Figure 14. Gat e Charge Waveforms for Constant
Gate Currents
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
Page 6
Test Circuits and Waveforms
FDP3672
BV
DSS
t
P
V
DS
TO OBTAIN
VARY t
P
REQUIRED PEAK I
V
GS
V
DS
L
I
AS
R
AS
G
+
V
DD
-
DUT
t
0V
P
I
AS
0.01Ω
0
t
AV
Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Wavef orm s
V
I
g(REF)
DS
L
V
GS
+
V
DD
-
DUT
Q
V
0
g(TH)
I
g(REF)
0
DD
V
GS
V
= 2V
GS
Q
gs2
Q
gs
Q
g(TOT)
V
DS
Q
gd
V
DD
V
= 10V
GS
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms
V
DS
R
L
V
GS
R
GS
V
GS
DUT
+
V
DD
-
V
DS
0
V
GS
10%
0
t
d(ON)
90%
t
ON
t
r
t
d(OFF)
t
OFF
t
f
90%
10%
10%
90%
PULSE WIDTH
50%50%
Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
Page 7
PSPICE Electrical Model
.SUBCKT FDP 3672 2 1 3 ; rev October 2002 Ca 12 8 5.8e-10 Cb 15 14 6.8e-10 Cin 6 8 1.6e-9
Dbod y 7 5 DbodyMOD Dbreak 5 11 Db reakMOD Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 105 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1
ESG
Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1
It 8 17 1 Lgat e 1 9 9.56e-9
GATE
1
LGATE
RLGATE
RGATE
9
EVTEMP +
20
18 22
Ldrain 2 5 1.0e -9 Lsource 3 7 4.45e-9
RLgate 1 9 95.6 RLdr ai n 2 5 10 RLsource 3 7 44.5
Mmed 16 6 8 8 M m edMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD
CA
S1A
12
S1B
Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 6.0e-3 Rgate 9 20 1.5 RSLC1 5 51 RSL CM OD 1.0e-6 RSLC2 5 50 1.0e 3 Rsource 8 7 RsourceMOD 9.5e-3 Rvthres 22 8 RvthresMO D 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BM OD S2a 6 15 14 13 S2AM OD S2b 13 15 14 13 S2BM OD
Vbat 22 19 DC 1 ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51))) *(PWR(V(5,51)/(1e-6 *98),3))}
.MODEL DbodyMOD D (IS=1.0E-11 N=1.05 RS=3.7e-3 TRS1=2.5e-3 TRS2=1.0e-6 + CJO=1.2e-9 M= 0.58 TT=3.75e -8 XTI=4.0) .MODEL Db reakMOD D (RS= 15 T RS 1=4.0e-3 TRS 2=-5.0e-6) .MODEL DplcapMOD D (CJO=3.8e-10 IS=1.0e-30 N=10 M=0.60)
.MODEL MmedMOD NMOS (VTO=3.6 KP=3 IS=1e-40 N=10 TOX=1 L=1u W=1u RG=1.5) .MODEL MstroMOD NMOS (VTO =4.3 KP=59 IS=1e-30 N=10 TOX=1 L=1u W=1u) .MODEL Mwe akMOD NMOS (VTO =3.09 KP=0. 05 IS=1e-30 N= 10 T OX=1 L=1u W=1u RG=15 RS=0.1)
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
+
19
6
-
S2A
13
14
8
13
S2B
13
+
+
6
EGS EDS
8
-
-
5
RSLC1
51
+
5
ESLC
51
­50
RDRAIN
16
21
-
8
MSTRO
CIN
15
CB
8
14
+
5 8
-
MMED
8
DBREAK
EBREAK
MWEAK
RSOURCE
RBREAK
17 18
IT
RVTHRES
FDP3672
LDRAIN
RLDRAIN
11
+
17
DBODY
18
-
LSOURCE
7
RLSOURCE
RVTEMP 19
­VBAT
+
22
DRAIN
2
SOURCE
3
.MODEL Rb reakMOD RES (T C1=9.0e-4 TC2=-1.0e-7) .MODEL Rd rai nMOD RES (TC1=11.0e-3 TC2= 6.1e-5) .MODEL RSLCMOD RES (TC1=3.0e-3 TC2=1.0e-6) .MODEL RsourceMOD RES (TC1=4.0e-3 TC 2=1.0e-6) .MODEL RvthresMOD RES (TC1=-3.5e -3 T C2=-1.5e-5 ) .MODEL RvtempMOD RES (T C1=-4.3e-3 TC2=1.5e-6)
.MODEL S1AMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 5. 0 VOFF =-3 .5 ) .MODEL S1BMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 3. 5 VOFF =-5 .0 ) .MODEL S2AMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= - 0.5 VO FF=0.3) .MODEL S2BMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= 0 .3 VOFF= -0.5)
.ENDS Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global
Temperature Options; IEEE Power Electroni cs Specialist Conference Records, 1991, written by Wil liam J. Hepp and C. F rank Wheatley.
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
Page 8
SABER Electrical Model
REV October 2002 template FDP3672 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=1.0e-11,nl=1.05,rs=3.7e-3,trs1=2.5e-3,trs2=1.0e-6,cjo=1.2e-9,m=0.58,tt=3.75e-8,xti=4.0) dp..model dbreakmod = (rs=15,trs1=4.0e-3,trs2=-5. 0e-6) dp..model dplcapmod = (cjo=3.8e-10,isl=10.0e-30,nl=10,m=0.60) m..model mmedmod = (type=_n,vto=3.6,kp=3,is=1e-40, tox=1) m..model mstrongmod = (type=_n,vto=4.3,kp=59,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=3.09,kp=0.05,is=1e-30, tox=1,rs=0.1) sw_vcsp.. mo del s1amod = (ron=1e-5,roff=0. 1, von=-5.0,voff=-3.5) sw_vcsp.. mo del s1bmod = (ron=1e-5,roff=0. 1, von=-3.5,voff=-5.0) sw_vcsp.. mo del s2amod = (ron=1e-5,roff=0.1,von=-0.5, vof f = 0. 3) sw_vcsp.. mo del s2bmod = (ron=1e-5,roff=0.1,von=0.3,voff=-0.5) c.ca n12 n8 = 5.8e -10 c.cb n15 n14 = 6.8e-10 c.cin n6 n8 = 1.6e -9
dp.dbody n7 n5 = model=dbodym od dp.dbreak n5 n11 = model=dbr eakmod dp.dplcap n10 n5 = model=dplcapmod
spe.ebreak n11 n7 n17 n18 = 105 spe.eds n14 n8 n5 n8 = 1 spe.egs n13 n8 n6 n8 = 1
GATE
spe.esg n6 n10 n6 n8 = 1 spe.evthres n6 n21 n19 n8 = 1
LGATE
1
9
RLGATE
RGATE
ESG
EVTEMP +
18 22
20
spe.evtemp n20 n6 n18 n22 = 1 i.it n8 n17 = 1 l.lgate n1 n9 = 95 .6 e-9
S1A
12
l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 4.45e-9
res.rlgate n1 n9 = 9.56 res.rldrai n n2 n5 = 10 res.rlsource n3 n7 = 44.5
S1B
CA
EGS EDS
m.mmed n16 n6 n8 n8 = m odel=mmedm od, l=1u, w=1u m.mstrong n16 n6 n8 n8 = model=mstrongmod, l= 1u, w=1u m.mweak n16 n21 n8 n8 = model=mwea kmod, l=1u, w=1u
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
+
6
-
S2A
13
14
8
13
S2B
13
+
+
6 8
-
-
5
RSLC1
51
ISCL
8
MMED
8
DBREAK
11
MWEAK
EBREAK
+
RSOURCE
RBREAK
17 18
IT
RVTHRES
50 RDRAIN
16
21
-
19
8
MSTRO
CIN
15
CB
14
+
5 8
-
17 18
­7
RVTEMP 19
-
+
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
FDP3672
res.rbreak n17 n18 = 1, tc1=9.0e- 4,tc2=-1.0e -7 res.rdrain n50 n16 = 6.0e-3, tc 1=11.0e-3,tc2=6.1e-5 res.rgate n9 n20 = 1.5 res.rslc1 n5 n51 = 1.0e-6, tc1=3.0e-3,tc2 =1.0e-6 res.rslc2 n5 n50 = 1.0e3 res.rsour ce n8 n7 = 9.5e-3, tc1 =4.0e-3,tc2=1 .0 e-6 res.rvthres n22 n8 = 1, tc1=-3.5e-3,tc2=-1. 5e-5 res.rvtemp n18 n19 = 1, tc1=-4.3e-3,tc2=1.5e-6 sw_vcsp.s1 a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1 b n13 n12 n13 n8 = mode l= s1bmod sw_vcsp.s2 a n6 n15 n14 n13 = mode l= s2amod sw_vcsp.s2 b n13 n15 n14 n13 = model = s2bmod
v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5 ,n51))))*(( abs(v(n5,n51)*1e6/98) )** 3)) }
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
Page 9
FDP3672
SPICE Thermal Model
REV October 2002 FDP3672 CTHERM1 TH 6 3.2e-3
CTHERM2 6 5 3. 3e-3 CTHERM3 5 4 3. 4e-3 CTHERM4 4 3 3. 5e-3 CTHERM5 3 2 6. 4e-3 CTHERM6 2 TL 1.9e-2
RTHERM1 TH 6 5.5e-4 RTHERM2 6 5 5. 0e-3 RTHERM3 5 4 4. 5e-2 RTHERM4 4 3 10.5e-2 RTHERM5 3 2 3. 4e-1 RTHERM6 2 TL 3.5e-1
SABER Thermal Model
SABER therm al m odel F DP3672 template thermal_model th tl thermal_ c th , tl { cctherm.ctherm1 th 6 =3.2e-3 ctherm.ctherm2 6 5 =3.3e-3 ctherm.ctherm3 5 4 =3.4e-3 ctherm.ctherm4 4 3 =3.5e-3 ctherm.ctherm5 3 2 =6.4e-3 ctherm.ctherm6 2 tl =1.9e-2
rtherm.rtherm1 th 6 =5.5e-4 rtherm.rt herm2 6 5 =5.0e-3 rtherm.rt herm3 5 4 =4.5e-2 rtherm.rt he rm4 4 3 =10. 5 e-2 rtherm.rt herm5 3 2 =3.4e-1 rthe r m.rtherm6 2 tl =3.5 e-1 }
RTHERM1
RTHERM2
RTHERM3
RTHERM4
RTHERM5
JUNCTION
th
CTHERM1
6
CTHERM2
5
CTHERM3
4
CTHERM4
3
CTHERM5
RTHERM6
2
CTHERM6
CASE
tl
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
Page 10
TRADEMARKS
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Power247™ PowerTrench
QFET
QS™ QT Optoelectronics™ Quiet Series™ RapidConfigure™ RapidConnect™ SILENT SWITCHER SMART ST ART™ SPM™ Stealth™ SuperSOT™-3
SuperSOT™-6 SuperSOT™-8 SyncFET™ TinyLogic TINYOPTO™ TruTranslation™ UHC™ UltraFET
VCX™
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORA TION. As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user.
PRODUCT STA TUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information
Preliminary
No Identification Needed
Formative or In Design
First Production
Full Production
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
Rev. I5
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