Page 1
FDP3672
N-Channel PowerTrench® MOSFET
105V, 41A, 33mΩ
FDP3672
September 2003
Features
•r
•Q
• Low Miller Charge
•Low Q
• Optimized eff iciency at high frequ encies
• UIS Capability (Single Pulse and Repetitive Pulse)
• Qualified to AEC Q101
= 25mΩ (Typ.), V
DS(ON)
(tot) = 28nC (Typ.), V
g
Body Diode
RR
= 10V, ID = 41A
GS
= 10V
GS
Applications
• DC/DC converters and Off-Line UPS
• Distributed Pow er Architectures and VRMs
• Primary Switch for 24V and 48V Systems
• High Voltage Synchronous Re ctifier
• Direct Injection / Diesel Injection Systems
• 42V Automotive Lo ad Control
• Electronic Valve T rain System s
Formerly developmental type 82760
D
DRAIN
(FLANGE)
TO-220AB
FDP SERIES
MOSFET Maximum Ratings T
C
SOURCE
DRAIN
GATE
= 25°C unless otherwise noted
G
S
Symbol Parameter Ratings Units
V
DSS
V
GS
Drain to Source Voltage 105 V
Gate to Source Voltage ±20 V
Drain Curr e nt
Continuous (T
I
D
Continuous (T
Continuous (T
= 25oC, VGS = 10V)
C
= 100oC, VGS = 10V) 31 A
C
= 25oC, VGS = 10V, R
amb
= 62oC/W) 5.9 A
θ JA
41 A
Pulsed Figure 4 A
E
AS
P
D
, T
T
J
STG
Single Pulse Avalanche Energy (Note 1) 48 mJ
Power dissipation 135 W
Derate above 25
o
C0 . 9 W /
Operating and Storage Temperature -55 to 175
o
C
o
C
Thermal Characteristi cs
R
θ JC
R
θ JA
This product ha s been des igned to me et the e xtr eme test c ondit ions and envir onment deman ded by the automot ive indus t ry. For a
All Fairchild Semiconductor prod ucts are manufactured, assembled and tested under ISO9000 and QS9000 quality systems
©2003 Fairchild Semiconductor Corporation
Thermal Resistance Junction to Case TO-220 1.11
Thermal Resistance Junction t o Ambient TO-220 (No te 2) 62
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/
certification.
FDP3672 Rev. A3
o
C/W
o
C/W
Page 2
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDP3672 FDP3672 TO-220AB Tube N/A 50 units
FDP3672
Electrical Characteristics
TC = 25°C unless otherwise noted
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
B
I
DSS
I
GSS
VDSS
Drain t o Source Breakdown Volta ge ID = 250µ A, VGS = 0V 105 - - V
V
= 80V - - 1
Zero Gate Voltage Drain Current
DS
= 0V TC= 150oC- - 2 5 0
V
GS
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA2 - 4 V
I
Drain to Source On Resistance
= 41A, V
D
I
= 21A, VGS = 6V, - 0.031 0.055
D
I
= 41A, V
D
T
= 175oC
C
= 10V - 0.025 0.033
GS
= 10V ,
GS
- 0.063 0.070
Dynamic Characteristics
C
C
C
Q
Q
Q
Q
Q
ISS
OSS
RSS
g(TOT)
g(TH)
gs
gs2
gd
Input Capacitance
Output Capacitance - 240 - pF
Reverse Transfer Capacitance - 55 - pF
= 25V, VGS = 0V,
V
DS
f = 1MHz
Total G ate Ch arg e at 10 V VGS = 0V to 10V
Threshold Gate Charge VGS = 0V to 2V - 3.9 5 nC
Gate to Source Gate Charge - 12 - nC
Gate Charge Threshold to Plateau - 8.0 - nC
V
DD
I
= 41A
D
I
= 1.0m A
g
= 50V
Gate to Drain “Miller” Charge - 6.5 - nC
-1 6 7 0- p F
-2 83 7n C
µA
Ω
Resistive Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time
Turn-On Delay Time - 12 - ns
Rise Time - 48 - ns
T u rn-Off Delay Time - 24 - ns
Fall Time - 27 - ns
Turn-Off Time - - 77 ns
(VGS = 10V)
V
DD
V
GS
--9 0n s
= 50V, ID = 41A
= 10V, RGS = 11.0Ω
Drain-Source Diode Characteristics
I
= 41A - - 1 .25 V
V
SD
t
rr
Q
RR
Notes:
1: Starting T
2: Pulse Width = 100s
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
Source to Drain Di ode Voltage
Reverse Recovery Time ISD = 41A, dISD/dt =100A/µ s- - 3 9n s
Reverse Recovered Charge ISD = 41A, dISD/dt =100A/µ s- - 4 2n C
= 25°C, L = 0.11mH, IAS = 30A.
J
SD
= 21A - - 1.0 V
I
SD
Page 3
FDP3672
Typical Characteristics T
= 25°C unless otherwise noted
C
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
02 55 07 51 0 0 1 7 5
125
TC, CASE TEMPERATURE (oC)
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2
DUTY CYCLE - DESCENDING ORDER
0.5
1
0.2
0.1
0.05
0.02
0.01
150
50
V
= 10V
GS
40
30
20
, DRAIN CURRENT (A)
D
I
10
0
25 50 75 100 125 150 175
TC, CASE TEMPERATURE (oC)
Figure 2. Maximum Continuous Drain Curr ent vs
Case Temperature
, NORMALIZED
Z
, PEAK CURRENT (A)
I
θ JC
DM
THERMAL IMPEDANCE
500
100
30
0.1
0.01
10
-5
10
VGS = 10V
-5
SINGLE PULSE
-4
10
-3
10
-2
10
NOTES:
DUTY FACTOR: D = t
PEAK TJ = PDM x Z
-1
10
t, RECTANGULAR PULSE DURATION (s)
Figure 3. Normalized Maximum Transient Thermal Impedance
TRANSCONDUCTANCE
MAY LIMIT CURRENT
IN THIS REGION
-4
10
-3
10
t, PULSE WIDTH (s)
-2
10
-1
10
TC = 25oC
FOR TEMPERATURES
ABOVE 25
CURRENT AS FOLLOWS:
I = I
P
DM
1/t2
x R
θ JC
0
10
o
25
0
10
t
1
t
2
+ T
θ JC
C
C DERATE PEAK
175 - T
C
150
1
10
1
10
Figure 4. Peak Current Capability
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
Page 4
Typical Characteristics T
= 25°C unless otherwise noted
C
FDP3672
200
100
10
OPERATION IN THIS
AREA MAY BE
LIMITED BY r
1
, DRAIN CURRENT (A)
D
I
SINGLE PULSE
TJ = MAX RATED
= 25oC
T
C
0.1
1 10 100
DS(ON)
VDS, DRAIN TO SOURCE VOLTAGE (V)
10µs
100µs
1ms
10ms
DC
Figure 5. Forward Bias Safe Operating Area
80
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
V
= 15V
DD
60
40
TJ = 25oC
20
, DRAIN CURRENT (A)
D
I
0
3.5 4.0 4.5 5.0 5.5 6.0 6.5
VGS, GATE TO SOURCE VOLTAGE (V)
TJ = 175oC
TJ = -55oC
200
If R = 0
200
tAV = (L)(IAS)/(1.3*RATED BV
100
≠
0
If R
= (L/R)ln[(IAS*R)/(1.3*RATED BV
t
AV
10
, AVALANCHE CURRENT (A)
AS
I
STARTING TJ = 150oC
1
0.001
0.01 0.1 1 10
tAV, TIME IN AVALANCHE (ms)
- VDD)
DSS
- VDD) +1]
DSS
START ING TJ = 25oC
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
Figure 6. Unclamped Inductive Switching
Capability
80
TC = 25oC
60
40
, DRAIN CURRENT (A)
20
D
I
0
0 0.5 1.0 1.5 2.0 2.5 3.0
VGS = 10V
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VGS = 5V
VDS, DRAIN TO SOURCE VOLTAGE (V)
VGS = 7V
VGS = 6V
Figure 7. Transfer Characteristics Figure 8. Saturation Characteristics
40
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
35
30
25
20
15
DRAIN TO SOURCE ON RESISTANCE (m Ω)
0 1 02 03 04 05 0
VGS = 6V
VGS = 10V
I
, DRAIN CURRENT (A)
D
Figure 9. Drain to So urce On Resistanc e v s Drai n
Current
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
2.5
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
2.0
1.5
ON RESISTANCE
1.0
NORMALIZED DRAIN TO SOURCE
0.5
-80 -40 0 40 80 120 160 200
TJ, JUNCTION TEMPERATURE (oC)
VGS = 10V, ID = 41A
Figure 10. Normalized Drain to Source On
Resistance vs Junction Temperature
Page 5
FDP3672
Typical Characteristics T
1.2
1.0
0.8
NORMALIZED GATE
0.6
THRESHOLD VOLTAGE
0.4
-80 -40 0 40 80 120 160 200
TJ, JUNCTION TEMPERATURE (oC)
= 25°C unless otherwise noted
C
VGS = VDS, ID = 250µA
Figure 11. Normalized G ate Threshol d Voltage vs
Junction Temperatur e
3000
C
= CGS + C
1000
100
ISS
C
≅ C
+ C
OSS
DS
GD
C
= C
RSS
GD
GD
1.2
ID = 250µA
1.1
1.0
BREAKDOWN VOLTA GE
NORMALIZED DRAIN TO SOURCE
0.9
-80 -40 0 40 80 120 160 200
T
, JUNCTION TEMPERATURE (oC)
J
Figure 12. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
10
VDD = 50V
8
6
4
C, CAPACITANCE (pF)
V
= 0V, f = 1MHz
GS
10
0.1 1 10 100
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 13. Capacitance vs Drain to Sour ce
Voltage
2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
0 5 10 15 20 25 30
Qg, GATE CHARGE (nC)
WAVEFORMS IN
DESCENDING ORDER:
ID = 41A
I
= 6A
D
Figure 14. Gat e Charge Waveforms for Constant
Gate Currents
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
Page 6
Test Circuits and Waveforms
FDP3672
BV
DSS
t
P
V
DS
TO OBTAIN
VARY t
P
REQUIRED PEAK I
V
GS
V
DS
L
I
AS
R
AS
G
+
V
DD
-
DUT
t
0V
P
I
AS
0.01Ω
0
t
AV
Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Wavef orm s
V
I
g(REF)
DS
L
V
GS
+
V
DD
-
DUT
Q
V
0
g(TH)
I
g(REF)
0
DD
V
GS
V
= 2V
GS
Q
gs2
Q
gs
Q
g(TOT)
V
DS
Q
gd
V
DD
V
= 10V
GS
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms
V
DS
R
L
V
GS
R
GS
V
GS
DUT
+
V
DD
-
V
DS
0
V
GS
10%
0
t
d(ON)
90%
t
ON
t
r
t
d(OFF)
t
OFF
t
f
90%
10%
10%
90%
PULSE WIDTH
50% 50%
Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
Page 7
PSPICE Electrical Model
.SUBCKT FDP 3672 2 1 3 ; rev October 2002
Ca 12 8 5.8e-10
Cb 15 14 6.8e-10
Cin 6 8 1.6e-9
Dbod y 7 5 DbodyMOD
Dbreak 5 11 Db reakMOD
Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 105
Eds 14 8 5 8 1
Egs 13 8 6 8 1
Esg 6 10 6 8 1
ESG
Evthres 6 21 19 8 1
Evtemp 20 6 18 22 1
It 8 17 1
Lgat e 1 9 9.56e-9
GATE
1
LGATE
RLGATE
RGATE
9
EVTEMP
+
20
18
22
Ldrain 2 5 1.0e -9
Lsource 3 7 4.45e-9
RLgate 1 9 95.6
RLdr ai n 2 5 10
RLsource 3 7 44.5
Mmed 16 6 8 8 M m edMOD
Mstro 16 6 8 8 MstroMOD
Mweak 16 21 8 8 MweakMOD
CA
S1A
12
S1B
Rbreak 17 18 RbreakMOD 1
Rdrain 50 16 RdrainMOD 6.0e-3
Rgate 9 20 1.5
RSLC1 5 51 RSL CM OD 1.0e-6
RSLC2 5 50 1.0e 3
Rsource 8 7 RsourceMOD 9.5e-3
Rvthres 22 8 RvthresMO D 1
Rvtemp 18 19 RvtempMOD 1
S1a 6 12 13 8 S1AMOD
S1b 13 12 13 8 S1BM OD
S2a 6 15 14 13 S2AM OD
S2b 13 15 14 13 S2BM OD
Vbat 22 19 DC 1
ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51))) *(PWR(V(5,51)/(1e-6 *98),3))}
.MODEL DbodyMOD D (IS=1.0E-11 N=1.05 RS=3.7e-3 TRS1=2.5e-3 TRS2=1.0e-6
+ CJO=1.2e-9 M= 0.58 TT=3.75e -8 XTI=4.0)
.MODEL Db reakMOD D (RS= 15 T RS 1=4.0e-3 TRS 2=-5.0e-6)
.MODEL DplcapMOD D (CJO=3.8e-10 IS=1.0e-30 N=10 M=0.60)
.MODEL MmedMOD NMOS (VTO=3.6 KP=3 IS=1e-40 N=10 TOX=1 L=1u W=1u RG=1.5)
.MODEL MstroMOD NMOS (VTO =4.3 KP=59 IS=1e-30 N=10 TOX=1 L=1u W=1u)
.MODEL Mwe akMOD NMOS (VTO =3.09 KP=0. 05 IS=1e-30 N= 10 T OX=1 L=1u W=1u RG=15 RS=0.1)
DPLCAP
10
RSLC2
6
8
EVTHRES
+
+
19
6
-
S2A
13
14
8
13
S2B
13
+
+
6
EGS EDS
8
-
-
5
RSLC1
51
+
5
ESLC
51
50
RDRAIN
16
21
-
8
MSTRO
CIN
15
CB
8
14
+
5
8
-
MMED
8
DBREAK
EBREAK
MWEAK
RSOURCE
RBREAK
17 18
IT
RVTHRES
FDP3672
LDRAIN
RLDRAIN
11
+
17
DBODY
18
-
LSOURCE
7
RLSOURCE
RVTEMP
19
VBAT
+
22
DRAIN
2
SOURCE
3
.MODEL Rb reakMOD RES (T C1=9.0e-4 TC2=-1.0e-7)
.MODEL Rd rai nMOD RES (TC1=11.0e-3 TC2= 6.1e-5)
.MODEL RSLCMOD RES (TC1=3.0e-3 TC2=1.0e-6)
.MODEL RsourceMOD RES (TC1=4.0e-3 TC 2=1.0e-6)
.MODEL RvthresMOD RES (TC1=-3.5e -3 T C2=-1.5e-5 )
.MODEL RvtempMOD RES (T C1=-4.3e-3 TC2=1.5e-6)
.MODEL S1AMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 5. 0 VOFF =-3 .5 )
.MODEL S1BMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 3. 5 VOFF =-5 .0 )
.MODEL S2AMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= - 0.5 VO FF=0.3)
.MODEL S2BMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= 0 .3 VOFF= -0.5)
.ENDS
Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global
Temperature Options ; IEEE Power Electroni cs Specialist Conference Records, 1991, written by Wil liam J. Hepp and C. F rank
Wheatley.
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
Page 8
SABER Electrical Model
REV October 2002
template FDP3672 n2,n1,n3
electrical n2,n1,n3
{
var i iscl
dp..model dbodymod = (isl=1.0e-11,nl=1.05,rs=3.7e-3,trs1=2.5e-3,trs2=1.0e-6,cjo=1.2e-9,m=0.58,tt=3.75e-8,xti=4.0)
dp..model dbreakmod = (rs=15,trs1=4.0e-3,trs2=-5. 0e-6)
dp..model dplcapmod = (cjo=3.8e-10,isl=10.0e-30,nl=10,m=0.60)
m..model mmedmod = (type=_n,vto=3.6,kp=3,is=1e-40, tox=1)
m..model mstrongmod = (type=_n,vto=4.3,kp=59,is=1e-30, tox=1)
m..model mweakmod = (type=_n,vto=3.09,kp=0.05,is=1e-30, tox=1,rs=0.1)
sw_vcsp.. mo del s1amod = (ron=1e-5,roff=0. 1, von=-5.0,voff=-3.5)
sw_vcsp.. mo del s1bmod = (ron=1e-5,roff=0. 1, von=-3.5,voff=-5.0)
sw_vcsp.. mo del s2amod = (ron=1e-5,roff=0.1,von=-0.5, vof f = 0. 3)
sw_vcsp.. mo del s2bmod = (ron=1e-5,roff=0.1,von=0.3,voff=-0.5)
c.ca n12 n8 = 5.8e -10
c.cb n15 n14 = 6.8e-10
c.cin n6 n8 = 1.6e -9
dp.dbody n7 n5 = model=dbodym od
dp.dbreak n5 n11 = model=dbr eakmod
dp.dplcap n10 n5 = model=dplcapmod
spe.ebreak n11 n7 n17 n18 = 105
spe.eds n14 n8 n5 n8 = 1
spe.egs n13 n8 n6 n8 = 1
GATE
spe.esg n6 n10 n6 n8 = 1
spe.evthres n6 n21 n19 n8 = 1
LGATE
1
9
RLGATE
RGATE
ESG
EVTEMP
+
18
22
20
spe.evtemp n20 n6 n18 n22 = 1
i.it n8 n17 = 1
l.lgate n1 n9 = 95 .6 e-9
S1A
12
l.ldrain n2 n5 = 1.0e-9
l.lsource n3 n7 = 4.45e-9
res.rlgate n1 n9 = 9.56
res.rldrai n n2 n5 = 10
res.rlsource n3 n7 = 44.5
S1B
CA
EGS EDS
m.mmed n16 n6 n8 n8 = m odel=mmedm od, l=1u, w=1u
m.mstrong n16 n6 n8 n8 = model=mstrongmod, l= 1u, w=1u
m.mweak n16 n21 n8 n8 = model=mwea kmod, l=1u, w=1u
DPLCAP
10
RSLC2
6
8
EVTHRES
+
+
6
-
S2A
13
14
8
13
S2B
13
+
+
6
8
-
-
5
RSLC1
51
ISCL
8
MMED
8
DBREAK
11
MWEAK
EBREAK
+
RSOURCE
RBREAK
17 18
IT
RVTHRES
50
RDRAIN
16
21
-
19
8
MSTRO
CIN
15
CB
14
+
5
8
-
17
18
7
RVTEMP
19
-
+
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
FDP3672
res.rbreak n17 n18 = 1, tc1=9.0e- 4,tc2=-1.0e -7
res.rdrain n50 n16 = 6.0e-3, tc 1=11.0e-3,tc2=6.1e-5
res.rgate n9 n20 = 1.5
res.rslc1 n5 n51 = 1.0e-6, tc1=3.0e-3,tc2 =1.0e-6
res.rslc2 n5 n50 = 1.0e3
res.rsour ce n8 n7 = 9.5e-3, tc1 =4.0e-3,tc2=1 .0 e-6
res.rvthres n22 n8 = 1, tc1=-3.5e-3,tc2=-1. 5e-5
res.rvtemp n18 n19 = 1, tc1=-4.3e-3,tc2=1.5e-6
sw_vcsp.s1 a n6 n12 n13 n8 = model=s1amod
sw_vcsp.s1 b n13 n12 n13 n8 = mode l= s1bmod
sw_vcsp.s2 a n6 n15 n14 n13 = mode l= s2amod
sw_vcsp.s2 b n13 n15 n14 n13 = model = s2bmod
v.vbat n22 n19 = dc=1
equations {
i (n51->n50) +=iscl
iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5 ,n51))))*(( abs(v(n5,n51)*1e6/98) )** 3))
}
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
Page 9
FDP3672
SPICE Thermal Model
REV October 2002
FDP3672
CTHERM1 TH 6 3.2e-3
CTHERM2 6 5 3. 3e-3
CTHERM3 5 4 3. 4e-3
CTHERM4 4 3 3. 5e-3
CTHERM5 3 2 6. 4e-3
CTHERM6 2 TL 1.9e-2
RTHERM1 TH 6 5.5e-4
RTHERM2 6 5 5. 0e-3
RTHERM3 5 4 4. 5e-2
RTHERM4 4 3 10.5e-2
RTHERM5 3 2 3. 4e-1
RTHERM6 2 TL 3.5e-1
SABER Thermal Model
SABER therm al m odel F DP3672
template thermal_model th tl
thermal_ c th , tl
{
cctherm.ctherm1 th 6 =3.2e-3
ctherm.ctherm2 6 5 =3.3e-3
ctherm.ctherm3 5 4 =3.4e-3
ctherm.ctherm4 4 3 =3.5e-3
ctherm.ctherm5 3 2 =6.4e-3
ctherm.ctherm6 2 tl =1.9e-2
rtherm.rtherm1 th 6 =5.5e-4
rtherm.rt herm2 6 5 =5.0e-3
rtherm.rt herm3 5 4 =4.5e-2
rtherm.rt he rm4 4 3 =10. 5 e-2
rtherm.rt herm5 3 2 =3.4e-1
rthe r m.rtherm6 2 tl =3.5 e-1
}
RTHERM1
RTHERM2
RTHERM3
RTHERM4
RTHERM5
JUNCTION
th
CTHERM1
6
CTHERM2
5
CTHERM3
4
CTHERM4
3
CTHERM5
RTHERM6
2
CTHERM6
CASE
tl
©2003 Fairchild Semiconductor Corporation FDP3672 Rev. A3
Page 10
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
ACEx™
ActiveArray™
Bottomless™
CoolFET™
CROSSVOL T ™
DOME™
EcoSPARK™
E2CMOS
EnSigna
TM
TM
FACT™
FACT Quiet Series™
FAST
FASTr™
FRFET™
GlobalOptoisolator™
GTO™
HiSeC™
I2C™
ImpliedDisconnect™
ISOPLANAR™
Across the board. Around the world.™
The Power Franchise™
Programmable Active Droop™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE T O ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY , FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY
ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT
CONVEY ANY LICENSE UNDER ITS PA TENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
LittleFET™
MICROCOUPLER™
MicroFET™
MicroPak™
MICROWIRE™
MSX™
MSXPro™
OCX™
OCXPro™
OPTOLOGIC
OPTOPLANAR™
P ACMAN™
POP™
Power247™
PowerTrench
QFET
QS™
QT Optoelectronics™
Quiet Series™
RapidConfigure™
RapidConnect™
SILENT SWITCHER
SMART ST ART™
SPM™
Stealth™
SuperSOT™-3
SuperSOT™-6
SuperSOT™-8
SyncFET™
TinyLogic
TINYOPTO™
TruTranslation™
UHC™
UltraFET
VCX™
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORA TION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
PRODUCT STA TUS DEFINITIONS
Definition of Terms
Datasheet Identification Product Status Definition
Advance Information
Preliminary
No Identification Needed
Formative or
In Design
First Production
Full Production
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I5