Datasheet FDB14AN06LA0, FDP14AN06LA0 Datasheet (Fairchild)

Page 1
查询FDB14AN06LA0供应商查询FDB14AN06LA0供应商
FDB14AN06LA0 / FDP14AN06LA0
N-Channel PowerTrench® MOSFET 60V, 60A, 14.6mΩ
FDB14AN06LA0 / FDP14AN06LA0
January 2004
Features
•r
•Q
• Low Miller Charge
•Low Q
• UIS Capability (Single Pulse and Repetitive Pulse)
• Qualified to AEC Q101
Formerly developmental type 83557
MOSFET Maximum Ratings T
= 12.8mΩ (Typ.), V
DS(ON)
(tot) = 24nC (Typ.), V
g
Body Diode
RR
DRAIN
(FLANGE)
= 5V, ID = 60A
GS
= 5V
GS
TO-220AB
FDP SERIES
SOURCE
DRAIN
GATE
= 25°C unless otherwise not ed
C
Applications
• Motor / Body Load Control
• ABS Systems
• Powertrain Management
• Injection Systems
• DC-DC converter s and Off-line UPS
• Distributed P ower Arc hitectures and VRMs
• Primary Switch for 12V and 24V systems
GATE
SOURCE
TO-263AB
FDB SERIES
DRAIN
(FLANGE)
D
G
S
Symbol Parameter Ratings Units
V
DSS
V
GS
Drain to Sou r c e Voltage 60 V Gate to Source Voltage ±20 V Drain Curr e nt Continuous (T
I
D
Continuous (T Continuous (T
= 25oC, VGS = 10V)
C
= 25oC, VGS = 5V) 60 A
C
= 25oC, VGS = 5V, R
A
= 43oC/W) 10 A
θJA
67 A
Pulsed Figure 4 A
E
AS
P
D
, T
T
J
STG
Single Pulse Avalanche Energy (Note 1) 46 mJ Power dissipation 125 W
o
Derate above 25
C0.83W/
Operating and Storage T emperature -55 to 175
o
C
o
C
Thermal Characteristics
R
θJC
R
θJA
R
θJA
This product has been designed to meet the extreme test conditions an d environment dem anded by the au tomotive industry. For a
All Fairchild Semiconductor products are manufactu red, assembled and tested under ISO9000 and QS9000 quality systems
©2004 Fairchild Semiconductor Corporation
Thermal Resistance Junction to Case TO-220,TO-263 1.2 Thermal Resistance Junction to Ambient TO-220, TO-263 ( Note 2) 62 Thermal Resistance Junction to Ambient TO-263, 1in2 copper pad ar ea 43
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/
Reliability data can be fou nd a t: http://ww w.f airc hilds e m i.co m /pr oduc ts/dis c rete/reliab ility/ind ex.html.
certification.
FDB14AN06LA0 / FDP14AN06LA0 Rev. B
o
C/W
o
C/W
o
C/W
Page 2
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDB14AN06LA0 FDB14AN06LA0 TO-263AB 330mm 24mm 800 uni ts FDP14AN06LA0 FDP14A N06LA0 TO- 220AB Tube N/A 50 unit s
FDB14AN06LA0 / FDP14AN06LA0
Electrical Characteristics
TC = 25°C unless otherwise noted
Symbol Parameter Test Con ditions Min Typ Max Units
Off Characteristics
B I
DSS
I
GSS
VDSS
Drain to Sou r c e Br ea k down Volt ag e ID = 250µA, VGS = 0V 60 - - V
V
= 50V - - 1
Zero Gate Voltage Drain Current
DS
= 0V TC = 150oC- -250
V
GS
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA1-3V
= 67A, VGS = 10V - 0.0102 0.0116
I
D
I
= 60A, VGS = 5V - 0.0128 0.0146
Drain to S ou r c e On Re si st ance
D
= 60A, VGS = 5V,
I
D
T
= 175oC
J
- 0.028 0.033
Dynamic Characteristics
C C C Q Q Q Q Q
ISS OSS RSS
g(TOT) g(TH) gs gs2 gd
Input Capacitance Output Capacitanc e - 270 - pF Reverse Transfer Capacitance - 115 - pF
= 25V, VGS = 0V,
V
DS
f = 1MHz
Total Gate Charge at 5V VGS = 0V to 5V Threshold Gate Charge VGS = 0V to 1V - 3.0 3.9 nC Gate to Source Gate Charg e - 1 2 - nC Gate Charge Threshold to Plateau - 9.1 - nC
V
DD
I
= 60A
D
I
= 1.0m A
g
= 30V
Gate to Drain “Miller” Charge - 7.9 - nC
- 2900 - pF
24 31 nC
µA
Ω
Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time Turn-On Delay Time - 15 - ns Rise Time - 169 - ns Turn-Off D elay Time - 24 - ns Fall Time - 50 - ns Turn-Off Time - - 109 ns
(VGS = 5V)
V
= 30V, ID = 60A
DD
V
= 5V, RGS = 5.1Ω
GS
--276ns
Drain-Source Diode Characteristics
I
= 60A - - 1.25 V
V
SD
t
rr
Q
RR
Notes: 1: Starting TJ = 25°C, L = 40µH, IAS = 48A. 2: Pulse width = 100s.
©2004 Fairchild Semiconductor Corporation FDB14AN06L A0 / FDP14AN0 6LA0 Re v . B
Source to Drain Diode Voltage Reverse Recovery Time ISD = 60A, dISD/dt = 100A/µs- -33ns
Reverse Recovered Charge ISD = 60A, dISD/dt = 100A/µs- -29nC
SD
= 30A - - 1.0 V
I
SD
Page 3
FDB14AN06LA0 / FDP14AN06LA0
Typical Characteristics T
= 25°C unless otherwise noted
C
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0255075100 175
125
TC, CASE TEMPERATURE (oC)
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2
DUTY CYCLE - DESCENDING ORDER
0.5
1
0.2
0.1
0.05
0.02
0.01
0.1
, NORMALIZED
θJC
Z
THERMAL IMPEDANCE
0.01
-5
10
SINGLE PULSE
-4
10
10
80
60
VGS = 5V
40
, DRAIN CURRENT (A)
D
20
I
150
0
25 50 75 100 125 150 175
Figure 2. Maximum Continuous Drain Curr ent vs
-3
t, RECTANGULAR PULSE DURATION (s)
-2
10
VGS = 10V
TC, CASE TEMPERATURE (oC)
Case Temperature
P
DM
NOTES: DUTY FACTOR: D = t1/t PEAK TJ = PDM x Z
-1
10
θJC
10
x R
0
t
1
t
2
2
+ T
θJC
C
1
10
Figure 3. Normalized Maximum Transient Thermal Impedance
1000
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
VGS = 10V
100
VGS = 5V
50
-5
10
-4
10
-3
10
-2
10
-1
10
, PEAK CURRENT (A)
DM
I
t, PUL SE WIDTH (s)
TC = 25oC FOR TEMPERATURES ABOVE 25oC DERATE PEAK CURRENT AS FOLLOWS:
175 - T
I = I
25
10
C
150
0
1
10
Figure 4. Peak Current Capability
©2004 Fairchild Semiconductor Corporation FDB14AN06L A0 / FDP14AN0 6LA0 Re v . B
Page 4
Typical Characteristics T
= 25°C unless otherwise noted
C
FDB14AN06LA0 / FDP14AN06LA0
1000
10µs
100
10
OPERATION IN THIS
AREA MAY BE
, DRAIN CURRENT (A)
D
I
LIMITED BY r
1
SINGLE PULSE TJ = MAX R ATED
TC = 25oC
0.1 110100
DS(ON)
VDS, DRAIN TO SOURCE VOLTAGE (V)
100µs
1ms
10ms
DC
Figure 5. Forward Bias Safe Operating Area
500
100
10
, AVALANCHE CURRENT (A)
AS
I
1
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
Figure 6. Unclamped Inductive Switching
150
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
125
V
= 15V
DD
100
75
50
, DRAIN CURRENT (A)
D
I
25
0
2.0 2.5 3.0 3.5 4.0 4.5 5.0
TJ = 25oC
TJ = 175oC
TJ = -55oC
VGS, GATE TO SOURCE VOLTAGE (V)
150
125
100
, DRAIN CURRENT (A)
D
I
If R = 0 tAV = (L)(IAS)/(1.3*RATED BV
If R ≠ 0 tAV = (L/R)ln[(IAS*R)/(1.3*RATED BV
STARTING TJ = 150oC
0.001 0.01 0.1 1 10 100 tAV, TIME IN AVALANCHE (ms)
- VDD)
DSS
- VDD) +1]
DSS
ST ARTING TJ = 25oC
Capability
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
TC = 25oC
VGS = 10V
75
50
25
0
0 0.5 1.0 1.5 2.0 2.5
VDS, DRAIN TO SOURCE VOLTAGE (V)
VGS = 5V
VGS = 4V
VGS = 3V
Figure 7. Transfer Characteristics Figure 8. Saturation Characteristics
13
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
12
VGS = 5V
11
10
DRAIN TO SOURCE ON RESISTANCE(mΩ)
9
0 20406080
VGS = 10V
ID, DRAIN CURRENT (A)
Figure 9. Drain to So urce On Resistanc e v s Drai n
Current
©2004 Fairchild Semiconductor Corporation FDB14AN06L A0 / FDP14AN0 6LA0 Re v . B
2.5
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
2.0
1.5
ON RESISTANCE
1.0
NORMALIZED DRAIN TO SOURCE
0.5
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
VGS = 5V, ID = 60A
Figure 10. Normalized Drain to Source On
Resistance vs Junction Temperature
Page 5
FDB14AN06LA0 / FDP14AN06LA0
Typical Characteristics T
1.4
1.2
1.0
0.8
0.6
NORMALIZED GATE
THRESHOLD VOLTAGE
0.4
0.2
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
= 25°C unless otherwise noted
C
VGS = VDS, ID = 250µA
Figure 11. Normalized G ate Threshol d Voltage vs
Junction Temperatur e
5000
C
= CGS + C
1000
C
= C
RSS
GD
C, CAPACITANCE (pF)
100
V
= 0V, f = 1MHz
GS
50
0.1 1 10
VDS, DRAIN TO SOURCE VOLTAGE (V)
ISS
C
OSS
≅ C
DS
+ C
GD
GD
60
1.2 ID = 250µA
1.1
1.0
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.9
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
Figure 12. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
10
VDD = 30V
8
6
4
2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
0 1020304050
Qg, GATE CHARGE (nC)
WAVEFORMS IN DESCENDING ORDER:
ID = 60A ID = 10A
Figure 13. Capacitance vs Drain to Sour ce
Voltage
©2004 Fairchild Semiconductor Corporation FDB14AN06L A0 / FDP14AN0 6LA0 Re v . B
Figure 14. Gat e Charge Waveforms for Constant
Gate Currents
Page 6
Test Circuits and Waveforms
V
DS
L
VARY tP TO OBTAIN REQUIRED PEAK I
V
GS
R
AS
G
+
V
DD
-
I
AS
DUT
t
0V
P
I
AS
0.01Ω
0
Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Wavef orm s
V
DS
V
DD
V
Q
I
g(REF)
L
V
GS
DUT
+
V
DD
-
V
GS
0
I
g(REF)
= 1V
Q
gs2
Q
g(TH)
Q
gs
0
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms
BV
DSS
t
P
t
AV
Q
g(TOT)
DS
gd
V
GS
FDB14AN06LA0 / FDP14AN06LA0
V
DS
V
DD
V
= 5V
GS
V
DS
R
L
V
GS
R
GS
V
GS
DUT
+
V
DD
-
V
DS
0
V
GS
10%
0
t
d(ON)
90%
t
ON
t
r
t
d(OFF)
t
OFF
t
f
90%
10%
10%
90%
PULSE WIDTH
50%50%
Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms
©2004 Fairchild Semiconductor Corporation FDB14AN06L A0 / FDP14AN0 6LA0 Re v . B
Page 7
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, P application. Therefore the application’s ambient temperature, T must be reviewed to ensure that T Equation 1 mathematically represents the relationship and
(oC), and th ermal res istance R
A
is never exceeded.
JM
DM
θJA
, in an
(oC/W)
serve s as the basis for establ ishing the rating of the part.
P
DM
TJMTA–()
----------------- ------------=
R
θJA
(EQ. 1)
In using surface mount devices such as the TO-263 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power d issipati on rating s. Precise d etermin ation of P comple x and influenced by many factors:
DM
is
1. Mou nting pad area ont o which the device is attached and whet her the re is copp er on one s ide or both side s of the board.
2. The number of copper layers and the thickness of the board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For no n steady state applic ations, th e pulse widt h, the duty cycle and the transient thermal response of the part, the boa rd and the environment they are in.
Fairchild provides thermal information to assist the designer’s preliminary application evaluation. Figure 21 defines the R copper (component side) area. This is for a horizontally
for the device as a function of the top
θJA
positi on ed FR- 4 bo ar d with 1 oz c o pp er after 1 00 0 secon ds of stea dy st ate pow er w ith n o air flow . Th is gr aph prov ides the necessary information for calculation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice t hermal model or ma nually utiliz ing the normalized maximum transient thermal impedance curve.
80
60
C/W)
o
(
θJA
R
40
20
Figure 21. Thermal Resistance vs Mounting
R
= 26.51+ 19.84/(0.262+Area) EQ.2
θJA
R
= 26.51+ 128/(1.69+Area) EQ.3
θJA
(0.645) (6.45) (64.5)
AREA, TOP COPPER AREA in2 (cm2)
1100.1
Pad Area
FDB14AN06LA0 / FDP14AN06LA0
Therma l resi stances correspondi ng to other copper ar eas can be obtained from Figure 21 or by calculation using Equation 2 or 3. Equation 2 is used for copper area defined in inch es squ are and equ ation 3 is for area in cent imeters square. The area, in square inches or square centimeters is the top copper area including the gate and source pads.
19.84
-------------------------------------+
26.51
=
R
θJA
26.51
=
R
θJA
©2004 Fairchild Semiconductor Corporation FDB14AN06L A0 / FDP14AN0 6LA0 Re v . B
0.262 Area+()
Area in Inches Squared
128
----------------------------------+
1.69 Area+()
Area in Centimeters Squared
(EQ. 2)
(EQ. 3)
Page 8
PSPICE Electrical Model
.SUBCKT FDP14AN06LA0 2 1 3 ; rev January 2004 Ca 12 8 1.8e-9 Cb 15 14 1.8e-9 Cin 6 8 3e-9
Dbod y 7 5 DbodyMOD Dbreak 5 11 Db reakMOD Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 64.8 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1
ESG
Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1
It 8 17 1 Lgat e 1 9 7.4e-9
GATE
1
LGATE
RLGATE
RGATE
9
EVTEMP
+
18 22
20
Ldrain 2 5 1.00 e-9 Lsou rce 3 7 3e-9
RLgate 1 9 74 RLdr ai n 2 5 10
S1A
12
RLsource 3 7 30 Mmed 16 6 8 8 M m edMOD
Mstro 16 6 8 8 MstroMOD
S1B
CA
Mweak 16 21 8 8 MweakMOD Rbreak 17 18 RbreakMOD 1
Rdrain 50 16 RdrainMOD 4.1e-3 Rgate 9 20 2.7 RSLC1 5 51 RSL CM OD 1e-6 RSLC2 5 50 1e3 Rsource 8 7 RsourceMOD 4e-3 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BM OD S2a 6 15 14 13 S2AM OD S2b 13 15 14 13 S2BM OD
Vbat 22 19 DC 1 ESLC 51 50 VALUE = {(V(5,5 1)/ ABS(V(5,5 1)))*(PWR (V(5,51)/(1e-6*200 ),3))}
.MODEL DbodyMOD D (IS=1 .7 e-11 RS=2.8e -3 N=1.05 TRS1=1.5e-3 TRS2 =1e-6 + CJO=1e-9 TT=1.9e-8 M=0.58 IKF=15.00 X T I = 3) .mod e l dbreakmod d (RS=1e -1 TRS1=1.12e- 3 T RS 2=1.25 e -6) .MODEL DplcapMOD D (CJO=8e-10 IS=1e-30 N=10 M=0.57)
.MODEL MmedMOD NMOS (VTO=1.96 KP=8 IS=1e-30 N=10 TOX =1 L=1u W=1u RG=2.7 ) .MODEL Mstro M OD NMOS (VTO=2.42 KP=105 IS=1e -30 N=10 TOX=1 L=1 u W=1u) .MODEL MweakMOD NMOS (VTO=1.6 KP=0.04 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=27 RS=0.1)
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
+
19
6
-
S2A
13814
13
S2B
13
+
+
6
EGS EDS
8
-
-
5
RSLC1
51
+
5
ESLC
51
­50
RDRAIN
16
21
-
8
MSTRO
CIN
15
CB
8
14
+
5 8
-
MMED
8
DBREAK
EBREAK
MWEAK
RSOURCE
RBREAK
17 18
IT
RVTHRES
FDB14AN06LA0 / FDP14AN06LA0
LDRAIN
RLDRAIN
11
+
17
DBODY
18
-
LSOURCE
7
RLSOURCE
RVTEMP 19
­VBAT
+
22
DRAIN
2
SOURCE
3
.MODEL RbreakMOD RES (TC1=9.2e-4 TC2=-3.55e-7) .MODEL Rd rai nMOD RES (TC1=1e-2 TC2=3e-5) .MODEL RSLCMOD RES (TC1=2.8e-3 TC2=1e-7) .MODEL RsourceMOD RES (TC1=4.0e-3 TC 2=1e-6) .MODEL RvthresMOD RE S (T C1=-2.7e-3 TC2=-9.5e-6) .MODEL RvtempMOD RES (TC1=-2.3e-3 TC2=1.5e -6)
.MODEL S1AMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= - 4 VOFF =-3 ) .MODEL S1BMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= - 3 VOFF =-4 ) .MODEL S2AMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 2. 5 VOFF =-0 .5 ) .MODEL S2BMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 0. 5 VOFF =-2 .5 ) .ENDS
Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electroni cs Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley.
©2004 Fairchild Semiconductor Corporation FDB14AN06L A0 / FDP14AN0 6LA0 Re v . B
Page 9
SABER Electrical Model
REV January 2004 template FDP14AN06LA0 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=1.7e-11,rs=2.8e-3,nl=1.05,trs1=1.5e-3,trs2=1e-6,cjo=1e-9,tt=1.9e-8,m=0.58,ikf=15.00,xti=3) dp..model dbreakmod = (rs=1e-1,trs1=1 .12e-3,trs2= 1.25e-6) dp..m odel dpl capmod = (cjo=8e-10,isl=10e-30,nl=10,m=0. 5 7) m..model mmedmod = (type=_n,vto=1.96,kp=8,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=2.42,kp=105,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=1.6,kp=0.04,is=1e-30, tox=1,rs=0.1) sw_vcsp.. mo del s1amod = (ron=1e-5,roff=0.1,von=-4, vof f=-3) sw_vcsp.. mo del s1bmod = (ron=1e-5,roff=0.1,von=-3, vof f=-4) sw_vcsp.. mo del s2amod = (ron=1e-5,roff=0.1,von=-2. 5,voff=-0.5 )
10
sw_vcsp.. mo del s2bmod = (ron=1e-5,roff=0.1,von=-0. 5,voff=-2.5 ) c.ca n12 n8 = 1.8e -9 c.cb n15 n14 = 1.8e-9
RSLC2
c.cin n6 n8 = 3e-9 dp.dbody n7 n5 = model=dbodym od
dp.dbreak n5 n11 = model=dbr eakmod dp.dplcap n10 n5 = model=dplcapmod
spe.ebreak n11 n7 n17 n18 = 64.8 spe.eds n14 n8 n5 n8 = 1
GATE
spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1
LGATE
1
RLGATE
RGATE
9
ESG
EVTEMP +
20
­6
8
+
6
-
18 22
spe.evthres n6 n21 n19 n8 = 1 spe.evtemp n20 n6 n18 n22 = 1
i.it n8 n17 = 1 l.lgate n1 n9 = 7.4e-9
l.ldrain n2 n5 = 1.00e-9 l.lsource n3 n7 = 3e-9
res.rlgate n1 n9 = 74 res.rldrai n n2 n5 = 10 res.rlsource n3 n7 = 30
CA
S1A
12
13
8
S1B
EGS EDS
S2A
14 13
S2B
13
+
+
6 8
-
-
m.mmed n16 n6 n8 n8 = m odel=mmed m od, l=1u, w=1u m.mstrong n16 n6 n8 n8 = model=m s trongmod, l=1u, w=1u m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u
DPLCAP
EVTHRES
+
19
8
15
CB
CIN
-
+
-
5
MSTRO
14
5 8
RSLC1
51
ISCL
50 RDRAIN
16
21
8
MMED
DBREAK
MWEAK
EBREAK
RSOURCE
RBREAK
17 18
IT
8
RVTHRES
11
+
17 18
­7
RVTEMP 19
-
+
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
FDB14AN06LA0 / FDP14AN06LA0
res.rbreak n17 n18 = 1, tc1=9.2e-4,tc2=-3. 5e-7 res.rdrain n50 n16 = 4.1e-3, tc 1=1e-2,tc2=3e-5 res.rgate n9 n20 = 2.7 res.rslc1 n5 n51 = 1e-6, tc1=2.8e-3,tc2= 1e-7 res.rslc2 n5 n50 = 1e3 res.rsour ce n8 n7 = 4e-3, tc1=4. 0e-3,tc2=1e-6 res.rvthres n22 n8 = 1, tc1=-2. 7e-3,tc2=-9. 5e-6 res.rvtemp n18 n19 = 1, tc1=-2.3e-3,tc2=1.5e-6 sw_vcsp.s1 a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1 b n13 n12 n13 n8 = mode l =s1bmod sw_vcsp.s2 a n6 n15 n14 n13 = mode l =s2amod sw_vcsp.s2 b n13 n15 n14 n13 = mod el =s2bmod
v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n 5,n51)/(1e-9+abs(v(n5,n51))))* ((abs(v(n5,n51)*1e6/200))** 3)) }
©2004 Fairchild Semiconductor Corporation FDB14AN06L A0 / FDP14AN0 6LA0 Re v . B
Page 10
FDB14AN06LA0 / FDP14AN06LA0
SPICE Thermal Model
REV January 2004 FDP14AN06LA0T
CTHERM1 TH 6 2.5e-3 CTHERM2 6 5 3e-3 CTHERM3 5 4 4e-3 CTHERM4 4 3 7e-3 CTHERM5 3 2 8. 2e-3 CTHERM6 2 TL 5e-2
RTHERM1 TH 6 4.2e-2 RTHERM2 6 5 8. 4e-2 RTHERM3 5 4 1. 04e-1 RTHERM4 4 3 1. 14e-1 RTHERM5 3 2 2. 74e-1 RTHERM6 2 TL 3.44e-1
SABER Thermal Model
SABER thermal model FDP1 4AN06LA0T template thermal_model th tl thermal_ c th , tl { ctherm.c th erm 1 th 6 =2.5e-3 ctherm.ctherm2 6 5 =3e-3 ctherm.ctherm3 5 4 =4e-3 ctherm.ctherm4 4 3 =7e-3 ctherm.ctherm5 3 2 =8.2e-3 ctherm.ctherm6 2 tl =5e-2
rtherm.rtherm1 th 6 =4.2 e-2 rtherm.rt herm2 6 5 =8.4e-2 rtherm.rt herm3 5 4 =1.04e-1 rtherm.rt herm4 4 3 =1.14e-1 rtherm.rt herm5 3 2 =2.74e-1 rthe r m.rtherm6 2 tl =3.4 4e-1 }
RTHERM1
RTHERM2
RTHERM3
RTHERM4
RTHERM5
JUNCTION
th
CTHERM1
6
CTHERM2
5
CTHERM3
4
CTHERM4
3
CTHERM5
2
RTHERM6
tl
©2004 Fairchild Semiconductor Corporation FDB14AN06L A0 / FDP14AN0 6LA0 Re v . B
CTHERM6
CASE
Page 11
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Rev. I7
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