Datasheet FDP047N08 Datasheet (Fairchild)

Page 1
tm
FDP047N08
N-Channel PowerTrench® MOSFET
75V, 164A, 4.7mΩ
FDP047N08 N-Channel PowerTrench
March 2008
Features
•R
• Fast switching speed
• Low gate charge
• High performance trench technology for extremely low R
• High power and current handling capability
• RoHS compliant
= 3.8mΩ ( Typ.)@ VGS = 10V, ID = 80A
DS(on)
G
D
S
TO-220 FDP Series
Description
This N-Channel MOSFET is produced using Fairchild Semicon­ductor’s advanced PowerTrench process that has been espe­cially tailored to minimize the on-state resistance and yet maintain superior switching performance.
DS(on)
Application
• DC to DC convertors / Synchronous Rectification
®
MOSFET
D
G
S
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DSS
V
GSS
I
D
I
DM
E
AS
dv/dt Peak Diode Recovery dv/dt (Note 3) 3.0 V/ns P
D
, T
T
J
STG
T
L
*Calculated continuous current based on maximum allowable junction temperature. Package limitation current is 80A.
Drain to Source Voltage 75 V Gate to Source Voltage ±20 V
D r a i n C urrent Drain Current - Pulsed (Note 1) 656 A
Single Pulsed Avalanche Energy (Note 2) 670 mJ
Power Dissipation Operating and Storage Temperature Range -55 to +175
Maximum Lead Temperature for Soldering Purpose, 1/8” from Case for 5 Seconds
= 25oC unless otherwise noted*
C
-Continuous (T
-Continuous (T
(T
= 25oC) 268 W
C
- Derate above 25
= 25oC) 164* A
C
= 100oC) 116* A
C
o
C1.79W/
300
Thermal Characteristics
Symbol Parameter Ratings Units
R
θJC θCS
R
θJA
©2008 Fairchild Semiconductor Corporation FDP047N08 Rev. A
Thermal Resistance, Junction to Case 0.56 Thermal Resistance, Case to Sink Typ. 0.5 Thermal Resistance, Junction to Ambient 62.5
o
C
o
C
o
C
o
C/WR
Page 2
FDP047N08 N-Channel PowerTrench
Package Marking and Ordering Information T
= 25oC unless otherwise noted
C
Device Marking Device Package Reel Size Tape Width Quantity
FDP047N08
FDP047N08 TO-220 - - 50
Electrical Characteristics
Symbol Parameter Test Conditions Min. Typ. Max. Units
Off Characteristics
BV
DSS
∆BV
DSS
/ ∆T
J
I
DSS
I
GSS
On Characteristics
V
GS(th)
R
DS(on)
g
FS
Dynamic Characteristics
C
iss
C
oss
C
rss
Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V, TC = 25oC75 - - V Breakdown Voltage Temperature
Coefficient Zero Gate Voltage Drain Current Gate to Body Leakage Current VGS = ±20V, V
I
= 250µA, Referenced to 25oC - 0.02 - V/oC
D
V
= 75V, V
DS
= 75V, TC = 150oC - - 500
V
DS
= 0V - - 1
GS
= 0V - - ±100 nA
DS
Gate Threshold Voltage VGS = VDS, ID = 250µA2.53.54.5V Static Drain to Source On Resistance VGS = 10V, ID = 80A - 3.7 4.7 mΩ Forward Transconductance VDS = 10V , ID = 80A (Note 4) - 150 - S
Input Capacitance Output Capacitance - 870 1155 pF Reverse Transfer Capacitance - 410 615 pF
= 25V, VGS = 0V
V
DS
f = 1MHz
- 7080 9415 pF
µA
®
MOSFET
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q Q
Q
g(tot) gs
gd
Turn-On Delay Time Turn-On Rise Time - 147 304 ns Turn-Off Delay Time - 220 450 ns Turn-Off Fall Time - 114 238 ns Total Gate Charge at 10V Gate to Source Gate Charge - 37 - nC
Gate to Drain “Miller” Charge - 32 - nC
Drain-Source Diode Characteristics
I
S
I
SM
V
SD
t
rr
Q
rr
Notes:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 0.21mH, IAS = 80A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C
3. ISD ≤ 75A, di/dt ≤ 200A/µs, VDD ≤ BV
4. Pulse Test: Pulse width ≤ 300µs, Duty Cycle ≤ 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
Maximum Continuous Drain to Source Diode Forward Current - - 164 A Maximum Pulsed Drain to Source Diode Forward Current - - 656 A Drain to Source Diode Forward Voltage V Reverse Recovery Time Reverse Recovery Charge - 66 - nC
, Starting TJ = 25°C
DSS
= 37.5V, ID = 80A
V
DD
R
= 25Ω, VGS = 10V
GEN
(Note 4, 5)
V
= 60V, ID = 80A
DS
V
= 10V
GS
(Note 4, 5)
= 0V, I
GS
V
= 0V, I
GS
dI
/dt = 100A/µs (Note 4)
F
= 80A - - 1.25 V
SD
= 80A
SD
- 100 210 ns
- 117 152 nC
-45-ns
FDP047N08 Rev. A
2
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Page 3
Typical Performance Characteristics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
500
V
= 15.0V
GS
10.0V
8.0 V
7.0 V
100
6.5 V
6.0 V
5.5 V
10
,Drain Current[A]
D
I
*Notes:
µs Pulse Test
1. 250 = 25oC
2. T
1
0.002 0.01 0.1 1
C
VDS,Drain-Source Voltage[V]
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperature
0.006
500
*Notes:
1. V
= 20V
DS
µs Pulse Test
2. 250
100
175oC
10
,Drain Current[A]
D
I
1
34567
25oC
-55oC
VGS,Gate-Source Voltage[V]
500
FDP047N08 N-Channel PowerTrench
®
MOSFET
0.005
VGS = 10V
[Ω],
0.004
DS(ON)
R
VGS = 20V
100
175oC
25oC
10
0.003
, Reverse Drain Current [A]
Drain-Source On-Resistance
S
I
*Note: TC = 25oC
0.002 0 100 200 300 400
ID, Drain Current [A]
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
12000
C
iss
C
= Cgs + Cgd (Cds = shorted)
iss
C
= Cds + C
oss
C
rss
= C
gd
gd
1
0.2 0.4 0.6 0.8 1.0 1.2 1.4
VSD, Body Diode Forward Voltage [V]
10
VDS = 15V
= 37.5V
V
8
V
DS DS
= 60V
*Notes:
1. VGS = 0V
2. 250µs Pulse Test
8000
6
C
oss
4000
Capacitances [pF]
C
rss
*Note:
= 0V
1. V
GS
2. f = 1MHz
4
, Gate-Source Voltage [V]
GS
V
2
0
FDP047N08 Rev. A
0.1 1 10 30 VDS, Drain-Source Voltage [V]
0
0 20406080100120
*Note: ID = 80A
Qg, Total G a te C harge [n C]
3
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Page 4
Typical Performance Characteristics (Continued)
Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation vs. vs. Temperature
1.15
Temperature
2.5
FDP047N08 N-Channel PowerTrench
1.10
2.0
1.05
, [Normalized]
1.00
DSS
BV
0.95
Drain-Source Breakdown Voltage
0.90
-100 -50 0 50 100 150 200 TJ, Junction Temperature [oC]
*Notes:
1. V
2. I
= 0V
GS
= 10mA
D
1.5
, [Normalized]
DS(on)
R
1.0
Drain-Source On-Resistance
0.5
-100 -50 0 50 100 150 200
*Notes:
1. V
2. I
TJ, Junction Temperature [oC]
GS
= 80A
D
= 10V
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs. Case Temperature
1000
30µs
10ms
DC
= 25oC
C
= 175oC
J
100µs
1ms
100
Operation in This Area
10
is Limited by R
, Drain Current [A]
D
I
1
0.1 110100
DS(on)
*Notes:
1. T
2. T
3. Single Pulse
VDS, Drain-Source Voltage [V]
180
150
120
90
60
, Drain Current [A]
D
Limited by package
I
30
0
25 50 75 100 125 150 175
TC, Case Tempera ture [oC]
Figure 11. Transient Thermal Response Curve
®
MOSFET
FDP047N08 Rev. A
]
θJC
Thermal Response [Z
0.1
0.01
1E-3
2 1
0.5
0.2
0.1
0.05
0.02
0.01
-5
10
Single pulse
P
DM
t
1
t
*Notes:
1. Z
2. Duty F act o r, D = t
3. TJM - TC = PDM * Z
-4
10
-3
10
-2
10
-1
10
2
(t) = 0.56oC/W Max.
θJC
1/t2
θJC
110
Rectangular Pulse Duration [sec]
4
(t)
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Page 5
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
FDP047N08 N-Channel PowerTrench
®
MOSFET
FDP047N08 Rev. A
Unclamped Inductive Switching Test Circuit & Waveforms
5
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Page 6
Peak Diode Recovery dv/dt Test Circuit & Waveforms
+
DUT
DUT
I
I
SD
SD
Driver
Driver
R
R
G
G
V
V
GS
GS
+
V
V
DS
DS
_
_
L
LL
Same Type
Same Type
as DUT
as DUT
• dv/dt controlled by R
• dv/dt controlled by R
•ISDcontrolled by pulse period
•ISDcontrolled by pulse period
G
G
FDP047N08 N-Channel PowerTrench
®
V
V
DD
DD
MOSFET
V
V
GS
GS
( Driver )
( Driver )
I
I
SD
SD
( DUT )
( DUT )
V
V
DS
DS
( DUT )
( DUT )
Gate Pulse Width
Gate Pulse Width
Gate Pulse Width
--------------------------
--------------------------
--------------------------
D =
D =
D =
Gate Pulse Period
Gate Pulse Period
Gate Pulse Period
IFM, Body Diode Forward Current
IFM, Body Diode Forward Current
I
I
RM
RM
Body Diode Reverse Current
Body Diode Reverse Current
Body Diode Recoverydv/dt
Body Diode Recoverydv/dt
V
V
SD
SD
Body Diode
Body Diode
Forward Voltage Drop
Forward Voltage Drop
di/dt
di/dt
10V
10V
V
V
DD
DD
FDP047N08 Rev. A
6
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Page 7
Mechanical Dimensions
FDP047N08 N-Channel PowerTrench
TO-220
®
MOSFET
FDP047N08 Rev. A
7
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Page 8
TRADEMARKS
tm
®
tm
tm
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidianries, and is not intended to be an exhaustive list of all such trademarks.
®
ACEx Build it Now™ CorePLUS™
CROSSVOLT™
CTL™ Current Transfer Logic™ EcoSPARK EZSWITCH™ *
™
Fairchild
®
®
Fairchild Semiconductor FACT Quiet Series™
®
FACT
®
FAST FastvCore™ FlashWriter
®
*
FPS™
®
FRFET Global Power Resource Green FPS™ Green FPS™ e-Series™ GTO™
i-Lo™
IntelliMAX™ ISOPLANAR™ MegaBuck™ MICROCOUPLER™
®
MicroFET™ MicroPak™ MillerDrive™ Motion-SPM™ OPTOLOGIC OPTOPLANAR
®
®
®
PDP-SPM™ Power220
SM
POWEREDGE Power-SPM™ PowerTrench Programmable Active Droop™ QFET
®
®
®
®
QS™ QT Optoelectronics™ Quiet Series™ RapidConfigure™ SMART START™
®
SPM STEALTH™ SuperFET™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8
SupreMOS™ SyncFET™
®
The Power Franchise
TinyBoost™ TinyBuck™ TinyLogic
®
TINYOPTO™ TinyPower™ TinyPWM™ TinyWire™ µSerDes™
®
UHC Ultra FRFET™ UniFET™ VCX™
®
FDP047N08 N-Channel PowerTrench
®
MOSFET
* EZSWITCH™ and FlashWriter
®
are trademarks of System General Corporation, used under license by Fairchild Semiconductor.
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LI CENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided
2. A critical component in any component of a life support, device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
in the labeling, can be reasonably expected to result in a significant injury to the user.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information Formative or In Design
This datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
This datasheet contains preliminary data; supplementary data will be pub-
Preliminary First Production
lished at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
No Identification Needed Full Production
This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
This datasheet contains specifications on a product that has been discontin-
Obsolete Not In Production
ued by Fairchild Semiconductor. The datasheet is printed for reference infor­mation only.
Rev. I33
FDP047N08 Rev. A
8
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