Under-Voltage Lockout (UVLO)
Optimized for Switching Frequencies up to 1MHz
Low-Profile SMD Package
Fairchild Green Packaging and RoHS Compliance
Based on the Intel
®
4.0 DrMOS Standard
Description
The XS™ DrMOS family is Fairchild’s next-generation,
fully optimized, ultra-compact, integrated MOSFET plus
driver power stage solution for high-current, highfrequency, synchronous buck DC-DC applications. The
FDMF6705B integrates a driver IC, two power MOSFETs,
and a bootstrap Schottky diode into a thermally
enhanced, ultra-compact 6x6mm PQFN package.
With an integrated approach, the complete switching
power stage is optimized with regards to driver and
MOSFET dynamic performance, system inductance,
and power MOSFET R
Fairchild's high-performance PowerTrench
technology, which dramatically reduces switch ringing,
eliminating the need for a snubber circuit in most buck
converter applications.
A new driver IC with reduced dead times and
propagation delays further enhances the performance of
this part. A thermal warning function warns of a potential
over-temperature situation. The FDMF6705B also
incorporates features, such as Skip Mode (SMOD), for
improved light-load efficiency, along with a three-state
3.3V PWM input for compatibility with a wide range of
PWM controllers.
XS™ DrMOS uses
DS(ON).
®
MOSFET
Applications
High-Performance Gaming Motherboards
Notebook Computers, V-Core and Non-V-Core
Compact Blade Servers, V-Core and Non-V-Core
16 – 28 PGND Power ground. Output stage ground. Source pin of low-side MOSFET.
36 GL For manufacturing test only. This pin must float; must not be connected to any pin.
38 THWN#
39 DISB#
40 PWM PWM signal input. This pin accepts a three-state logic-level PWM signal from the controller.
VSWH
the low-side driver is disabled. This pin has a 10µA internal pull-up current source. Do not add a
noise filter capacitor.
Power for gate driver. Minimum 1µF ceramic capacitor is recommended, connected as close as
possible from this pin to CGND.
Bootstrap supply input. Provides voltage supply to high-side MOSFET driver. Connect a
bootstrap capacitor from this pin to PHASE.
No connect. The pin is not electrically connected internally, but can be connected to VIN for
convenience.
Switch node input. Provides return for high-side bootstrapped driver and acts as a sense point
for the adaptive shoot-through protection.
Thermal warning flag, open collector output. When temperature exceeds the trip limit, the
output is pulled LOW. THWN# does not disable the module.
Output disable. When LOW, this pin disables power MOSFET switching (GH and GL are held
LOW). This pin has a 10µA internal pull-down current source. Do not add a noise filter
capacitor.
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol Parameter Min. Max. Unit
V
Supply Voltage Referenced to CGND -0.3 6.0 V
CIN
V
Drive Voltage Referenced to CGND -0.3 6.0 V
DRV
V
Output Disable Referenced to CGND -0.3 6.0 V
DISB#
V
PWM Signal Input Referenced to CGND -0.3 6.0 V
PWM
V
Skip Mode Input Referenced to CGND -0.3 6.0 V
SMOD#
VGL Low Gate Manufacturing Test Pin Referenced to CGND -0.3 6.0 V
V
Thermal Warning Flag Referenced to CGND -0.3 6.0 V
THWN#
VIN Power Input Referenced to PGND, CGND -0.3 30.0 V
V
Bootstrap Supply
BOOT
VGH High Gate Manufacturing Test Pin
V
PHASE Referenced to CGND -0.3 30.0 V
PHS
V
Switch Node Input
SWH
V
Bootstrap Supply
BOOT
I
THWN# Sink Current -0.1 7.0 mA
THWN#
I
O(AV)
θ
JPCB
Output Current
Junction-to-PCB Thermal Resistance 3.5 °C/W
(1)
TA Ambient Temperature Range -40 +125 °C
TJ Maximum Junction Temperature +150 °C
T
Storage Temperature Range -55 +150 °C
STG
ESD Electrostatic Discharge Protection
Note:
1. I
is rated using Fairchild’s DrMOS evaluation board, TA = 25°C, natural convection cooling. This rating is limited
O(AV)
by the peak DrMOS temperature, T
= 150°C, and varies depending on operating conditions and PCB layout. This
J
rating can be changed with different application settings.
Referenced to VSWH, PHASE -0.3 6.0 V
Referenced to CGND -0.3 30.0 V
Referenced to VSWH, PHASE -0.3 6.0 V
Referenced to CGND -0.3 30.0 V
Referenced to PGND, CGND (DC Only)-0.3 30.0 V
Referenced to PGND, <20ns -8.0 33.0 V
Referenced to VDRV 22.0 V
Referenced to VDRV, <20ns 25.0 V
fSW=300kHz, VIN=19V, VO=1.0V 38
fSW=1MHz, VIN=19V, VO=1.0V 35
Human Body Model, JESD22-A114 2000
Charged Device Model, JESD22-C101 1000
A
V
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Symbol Parameter Min. Typ. Max. Unit
V
Control Circuit Supply Voltage 4.5 5.0 5.5 V
CIN
V
Gate Drive Circuit Supply Voltage 4.5 5.0 5.5 V
DRV
VIN Output Stage Supply Voltage 3.0 12.0 24.0
Note:
2. Operating at high V
can create excessive AC overshoots on the VSWH-to-GND and BOOT-to-GND nodes
IN
during MOSFET switching transients. For reliable DrMOS operation, VSWH-to-GND and BOOT-to-GND must
remain at or below the Absolute Maximum Ratings shown in the table above. Refer to the “Application Information” and “PCB Layout Guidelines” sections of this datasheet for additional information.
The FDMF6705B is a driver-plus-FET module optimized
for the synchronous buck converter topology. A single
PWM input signal is all that is required to properly drive
the high-side and the low-side MOSFETs. Each part is
capable of driving speeds up to 1MHz.
VCIN and Disable
The VCIN pin is monitored by an Under-Voltage Lockout
(UVLO) circuit. When V
is enabled. When V
disabled (GH, GL=0). The driver can also be disabled by
pulling the DISB# pin LOW (DISB# < V
holds both GL and GH LOW regardless of the PWM
input state. The driver can be enabled by raising the
DISB# pin voltage HIGH (DISB# > V
Table 1. UVLO and Disable Logic
UVLO DISB# Driver State
0 X Disabled (GH, GL=0)
1 0 Disabled (GH, GL=0)
1 1 Enabled (See Table 2)
1 Open Disabled (GH, GL=0)
Note:
3. DISB# internal pull-down current source is 10µA.
Thermal Warning Flag
The FDMF6705B provides a thermal warning flag
(THWN) to warn of over-temperature conditions. The
thermal warning flag uses an open-drain output that
pulls to CGND when the activation temperature (150°C)
is reached. The THWN output returns to a highimpedance state once the temperature falls to the reset
temperature (135°C). The THWN output requires a pullup resistor, which can be connected to VCIN. THWN
does NOT disable the DrMOS module.
HIGH
THWN
Logic
State
Normal
Operation
LOW
Figure 25. THWN Operation
rises above ~3.1V, the driver
CIN
falls below ~2.7V, the driver is
CIN
), which
IL_DISB
).
IH_DISB
135°C
Reset
150°C
ctivation
Tem
erature
Thermal
Warning
T
J_driverIC
3-State PWM Input
The FDMF6705B incorporates a three-state PWM input
gate drive design. The three-state gate drive has both
logic HIGH level and LOW level, along with a three-state
shutdown window. When the PWM input signal enters
and remains within the three-state window for a defined
hold-off time (t
D_HOLD-OFF
), both GL and GH are pulled
LOW. This feature enables the gate drive to shut down
both high-and low-side MOSFETs to support features
such as phase shedding, which is a common feature on
multiphase voltage regulators.
Operation when Exiting Three-State
Condition
When exiting a valid three-state condition, the
FDMF6705B design follows the PWM input command. If
the PWM input goes from three-state to LOW, the lowside MOSFET is turned on. If the PWM input goes from
three-state to HIGH, the high-side MOSFET is turned
on. This is illustrated in Figure 26. The FDMF6705B
design allows for short propagation delays when exiting
the three-state window (see Electrical Characteristics).
Low-Side Driver
The low-side driver (GL) is designed to drive a groundreferenced low R
N-channel MOSFET. The bias
DS(ON)
for GL is internally connected between VDRV and
CGND. When the driver is enabled, the driver's output is
180° out of phase with the PWM input. When the driver
is disabled (DISB#=0V), GL is held LOW.
High-Side Driver
The high-side driver is designed to drive a floating Nchannel MOSFET. The bias voltage for the high-side
driver is developed by a bootstrap supply circuit,
consisting of the internal Schottky diode and external
bootstrap capacitor (C
held at PGND, allowing C
through the internal diode. When the PWM input goes
HIGH, GH begins to charge the gate of the high-side
MOSFET (Q1). During this transition, the charge is
removed from C
Q1 turns on, V
+ V
V
IN
BOOT
BOOT
rises to VIN, forcing the BOOT pin to
SWH
, which provides sufficient VGS enhancement
for Q1. To complete the switching cycle, Q1 is turned off
by pulling GH to VSWH. C
VDRV when VSWH falls to PGND. GH output is inphase with the PWM input. The high-side gate is held
LOW when the driver is disabled or the PWM signal is
held within the three-state window for longer than the
three-state hold-off time, t
The driver IC advanced design ensures minimum
MOSFET dead time, while eliminating potential shootthrough (cross-conduction) currents. It senses the state
of the MOSFETs and adjusts the gate drive adaptively
to ensure they do not conduct simultaneously. Figure 26
provides the relevant timing waveforms. To prevent
overlap during the LOW-to-HIGH switching transition
(Q2 off to Q1 on), the adaptive circuitry monitors the
voltage at the GL pin. When the PWM signal goes
V
IH_PWM
t
).
R_GH
HIGH, Q2 turns off after a propagation delay (t
PD_PHGLL
Once the GL pin is discharged below ~1V, Q1 turns on
after adaptive delay, t
D_DEADON
.
V
IH_PWM
V
IL_PWM
PWM
To preclude overlap during the HIGH-to-LOW transition
(Q1 off to Q2 on), the adaptive circuitry monitors the
voltage at the VSWH pin. When the PWM signal goes
LOW, Q1 turns off after a propagation delay (t
PD_PLGHL
Once the VSWH pin falls below ~2.2V, Q2 turns on after
adaptive delay, t
monitored. When V
D_DEADOFF
GS(Q1)
. Additionally, V
GS(Q1)
is discharged below ~1.2V, a
secondary adaptive delay is initiated, which results in
Q2 being driven on after t
D_TIMEOUT
state. This function is implemented to ensure C
, regardless of SW
BOOT
recharged each switching cycle in the event that the SW
voltage does not fall below the 2.2V adaptive threshold.
Secondary delay t
The SMOD function allows higher converter efficiency
under light-load conditions. During SMOD, the low-side
FET gate signal is disabled (held LOW), preventing
discharging of the output capacitors as the filter inductor
current attempts reverse current flow – also known as
Diode Emulation Mode. When the SMOD# pin is pulled
HIGH, the synchronous buck converter works in
Synchronous Mode, gating on the low-side FET. When
the SMOD# pin is pulled LOW, the low-side FET is
gated off. The SMOD# pin is connected to the PWM
controller, which enables or disables SMOD
automatically when the controller detects light-load
condition from output current sensing. Normally this pin
is active LOW. See Figure 27 for timing delays.
SMOD
Table 2. SMOD Logic
DISB# PWM SMOD# GH GL
0 X X 0 0
1 3-State X 0 0
1 0 0 0 0
1 1 0 1 0
1 0 1 0 1
1 1 1 1 0
Note:
4. The SMOD feature is intended to have low
propagation delay between the SMOD signal and
the low-side FET VGS response time to control
diode emulation on a cycle-by-cycle basis.
For the supply inputs (VDRV and VCIN), a local ceramic
bypass capacitor is required to reduce noise and to
supply peak transient currents during gate drive
switching action. It is recommended to use a minimum
capacitor value of 1µF X7R or X5R. Keep this capacitor
close to the VCIN and VDRV pins and connect it to the
GND plane with vias.
Bootstrap Circuit
The bootstrap circuit uses a charge storage capacitor
(C
), as shown in Figure 28. A bootstrap capacitance
BOOT
of 100nF X7R or X5R capacitor is typically adequate. A
series bootstrap resistor may be needed for specific
applications to improve switching noise immunity. The
boot resistor (R
near the maximum rated V
controlling the high-side MOSFET turn-on slew rate and
VSHW overshoot. Typical R
are effective in reducing VSWH overshoot.
) may be required when operating
BOOT
5V
I
5V
and is effective at
IN
values from 0.5 to 3.0Ω
BOOT
CVDRV
CIN
C
CIN
VCIN Filter
The VDRV pin provides power to the gate drive of the
high-side and low-side power MOSFETs. In most cases,
VDRV can be connected directly to VCIN, which
supplies power to the logic circuitry of the gate driver.
For additional noise immunity, an RC filter can be
inserted between VDRV and VCIN. Recommended
values of 10Ω (R
and 1µF (C
VCIN
) placed between VDRV and VCIN
VCIN
) from VCIN to CGND, Figure 28.
Power Loss and Efficiency
Measurement and Calculation
Refer to Figure 29 for power-loss testing method. Power
loss calculations are:
Figure 30 provides an example of a proper layout for
critical components. All of the high-current paths, such
as V
, V
, V
IN
SWH
, and GND copper, should be short
OUT
and wide for low inductance and resistance. This
technique achieves a more stable and evenly distributed
current flow, along with enhanced heat radiation and
system performance.
The following guidelines are recommendations for the
PCB designer:
1. Input ceramic bypass capacitors must be placed
close to the VIN and PGND pins. This helps reduce
the high-current power loop inductance and the input
current ripple induced by the power MOSFET
switching operation.
2. The V
copper trace serves two purposes. In
SWH
addition to being the high-frequency current path
from the DrMOS package to the output inductor, it
also serves as a heat sink for the low-side MOSFET
in the DrMOS package. The trace should be short
and wide enough to present a low-impedance path
for the high-frequency, high-current flow between the
DrMOS and inductor to minimize losses and
temperature rise. Note that the VSWH node is a
high-voltage and high-frequency switching node with
high noise potential. Care should be taken to
minimize coupling to adjacent traces. Since this
copper trace also acts as a heat sink for the lower
FET, balance using the largest area possible to
improve DrMOS cooling while maintaining
acceptable noise emission.
3. An output inductor should be located close to the
FDMF6705B to minimize the power loss due to the
VSWH copper trace. Care should also be taken so
the inductor dissipation does not heat the DrMOS.
®
4. PowerTrench
MOSFETs are used in the output
stage. The power MOSFETs are effective at
minimizing ringing due to fast switching. In most
cases, no VSWH snubber is required. If a snubber is
used, it should be placed close to the VSWH and
PGND pins. The resistor and capacitor need to be of
proper size for the power dissipation.
5. VCIN, VDRV, and BOOT capacitors should be
placed as close as possible to the VCIN to CGND,
VDRV to CGND, and BOOT to PHASE pins to
ensure clean and stable power. Routing width and
length should be considered.
6. Include a trace from PHASE to VSWH to improve
noise margin. Keep the trace as short as possible.
7. The layout should include a place holder to insert a
small-value series boot resistor (R
boot capacitor (C
) and DrMOS BOOT pin. The
BOOT
) between the
BOOT
BOOT-to-VSWH loop size, including R
C
, should be as small as possible. The boot
BOOT
resistor may be required when operating near the
maximum rated VIN. The boot resistor is effective at
controlling the high-side MOSFET turn-on slew rate
and VSHW overshoot. R
can improve noise
BOOT
operating margin in synchronous buck designs that
have noise issues due to ground bounce or high
positive and negative VSWH ringing. However,
inserting a boot resistance lowers the DrMOS
efficiency. Efficiency versus noise trade-offs must be
considered. R
values from 0.5 to 3.0Ω are
BOOT
typically effective in reducing VSWH overshoot.
The VIN and PGND pins handle large current
transients with frequency components greater than
100MHz. If possible, these pins should be connected
directly to the VIN and board GND planes. The use
of thermal relief traces in series with these pins is
discouraged
since this adds inductance to the
power path. This added inductance in series with
either the VIN or PGND pin degrades system noise
immunity by increasing positive and negative VSWH
ringing.
8. CGND pad and PGND pins should be connected to
the GND plane copper with multiple vias for stable
grounding. Poor grounding can create a noise
transient offset voltage level between CGND and
PGND. This could lead to faulty operation of the
gate driver and MOSFETs.
9. Ringing at the BOOT pin is most effectively
controlled by close placement of the boot capacitor.
Do not add an additional BOOT to the PGND
capacitor. This may lead to excess current flow
through the BOOT diode.
10. The SMOD# and DISB# pins have weak internal
pull-up and pull-down current sources, respectively.
These pins should not have any noise filter
capacitors. Do not to float these pins unless
absolutely necessary.
11. Use multiple vias on each copper area to
interconnect top, inner, and bottom layers to help
distribute current flow and heat conduction. Vias
should be relatively large and of reasonably low
inductance. Critical high-frequency components,
, C
such as R
BOOT
, the RC snubber, and bypass
BOOT
capacitors should be located as close to the
respective DrMOS module pins as possible on the
top layer of the PCB. If this is not feasible, they
should be connected from the backside through a
network of low-inductance vias.
B) ALL DIMENSIONS ARE IN MILLIMETERS.
C) DIMENSIONS DO NOT INCLUDE BURRS
OR MOLD FLASH. MOLD FLASH OR
BURRS DOES NOT EXCEED 0.10MM.
D) DIMENSIONING AND TOLERANCING PER
ASME Y14.5M-1994.
E) DRAWING FILE NAME: PQFN40AREV2
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Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings: