Datasheet FDMC8200S Datasheet (Fairchild)

Page 1
FDMC8200S
Bottom
Bottom
Power33
Pin 1
G1
D1
D1
D1
D1
D
2
/
S
1
G2
S2
S2
S2
V
IN
V
IN
V
IN
V
IN
S
W
I
T
C
H
N
O
D
E
G
LS
GND
GND
GND
G
HS
Dual N-Channel PowerTrench® MOSFET
30 V, 10 mΩ, 20 mΩ
FDMC8200S Dual N-Channel PowerTrench
March 2011
Features
Q1: N-Channel
Max rMax r
Q2: N-Channel
Max rMax rRoHS Compliant
= 20 mΩ at VGS = 10 V, ID = 6 A
DS(on)
= 32 mΩ at VGS = 4.5 V, ID = 5 A
DS(on)
= 10 mΩ at VGS = 10 V, ID = 8.5 A
DS(on)
= 13.5 mΩ at VGS = 4.5 V, ID = 7.2 A
DS(on)
General Description
This device includes two specialized N-Channel MOSFETs in a due power33(3mm X 3mm MLP) package. The switch node has been internally connected to enable easy placement and routing of synchronous buck converters. The control MOSFET (Q1) and synchronous MOSFET (Q2) have been designed to provide optimal power efficiency.
Applications
Mobile ComputingMobile Internet DevicesGeneral Purpose Point of Load
Q 2
5 6 7 8
Q 1
4 3 2 1
®
MOSFET
MOSFET Maximum Ratings T
Symbol Parameter Q1 Q2 Units
V
DS
V
GS
I
D
E
AS
P
D
TJ, T
STG
Drain to Source Voltage 30 30 V Gate to Source Voltage (Note 4) ±20 ±20 V Drain Current -Continuous (Package limited) TC = 25 °C 18 13
-Continuous (Silicon limited) T
-Continuous T
-Pulsed 40 27 Single Pulse Avalanche Energy (Note 3) 12 32 Power Dissipation for Single Operation TA = 25°C 1.9 Power Dissipation for Single Operation T Operating and Storage Junction Temperature Range -55 to +150 °C
= 25°C unless otherwise noted
C
= 25 °C 23 46
C
= 25 °C 6
A
= 25°C 0.7
A
1a
1a 1c
8.5
2.5
1.0
1b
1b 1d
A
W
Thermal Characteristics
R
θJA θJA
R
θJC
Package Marking and Ordering Information
©2011 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com FDMC8200S Rev.C4
Device Marking Device Package Reel Size Tape Width Quantity
FDMC8200S FDMC8200S Power 33 13” 12
Thermal Resistance, Junction to Ambient 65 Thermal Resistance, Junction to Ambient 180 Thermal Resistance, Junction to Case 7.5 4.2
1a
1c
mm 3000 units
50
125
1b
1d
°C/WR
Page 2
FDMC8200S Dual N-Channel PowerTrench
Electrical Characteristics T
= 25°C unless otherwise noted
J
Symbol Parameter Test Conditions Type Min Typ Max Units
Off Characteristics
BV
ΔBV ΔT
I
DSS
I
GSS
DSS
DSS J
Drain to Source Breakdown Voltage Breakdown Voltage Temperature
Coefficient Zero Gate Voltage Drain Current V
Gate to Source Leakage Current V
= 250 μA, VGS = 0 V
D
I
= 1mA, V
D
I
= 250 μA, referenced to 25°C
D
I
= 1mA, referenced to 25°C
D
= 24 V, V
DS
= ±20 V, V
GS
GS
= 0 V
= 0 V
GS
= 0 V
DS
Q1Q230
30
Q1 Q2
Q1 Q2
Q1 Q2
V
14 13
mV/°C
1
500 100
100nAnA
I
On Characteristics
V
V
GS(th)
ΔV ΔT
r
DS(on)
g
FS
GS(th)
J
Gate to Source Threshold Voltage Gate to Source Threshold Voltage
Temperature Coefficient
Static Drain to Source On Resistance
Forward Transconductance
= VDS, I
GS
V
= VDS, ID = 1mA
GS
I
= 250 μA, referenced to 25°C
D
I
= 1mA, referenced to 25°C
D
= 10 V, ID = 6 A
V
GS
V
= 4.5 V, ID = 5 A
GS
V
= 10 V, ID = 6 A, T
GS
V
= 10 V, ID = 8.5 A
GS
V
= 4.5 V, ID = 7.2 A
GS
V
= 10 V, ID = 8.5 A, T
GS
V
= 5 V, ID = 6 A
DD
V
= 5 V, ID = 8.5 A
DD
= 250 μA
D
= 125°C
J
= 125°C
J
Q1Q21.0
1.0
Q1 Q2
Q1
Q2
Q1 Q2
2.3
2.0
-5
-6
16 24 22
7.8
10.3
11.4 29
43
3.0
3.0 mV/°C
20 32 28
10.0
13.5
13.1
μA
V
mΩ
S
®
MOSFET
Dynamic Characteristics
C
iss
C
oss
C
rss
R
g
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
Q
Q
Q
g(TOT)
g(TOT)
gs
gd
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Gate Charge V
Total Gate Charge V
Gate to Source Charge
Gate to Drain “Miller” Charge
= 15 V, VGS = 0 V, f = 1 MHZ
V
DS
Q1 V
= 15 V, ID = 1 A,
DD
V
= 10 V, R
GS
GEN
= 6 Ω
Q2
= 15 V, ID = 1 A,
V
DD
V
= 10 V, R
GS
= 0 V to 10 V
GS
= 0 V to 4.5 V
GS
GEN
= 6 Ω
Q1 V
DD
I
= 6 A
D
Q2 V
DD
I
= 8.5 A
D
= 15 V,
= 15 V
Q1 Q2
Q1 Q2
Q1 Q2
Q1Q20.2
0.2
Q1 Q2
Q1 Q2
Q1 Q2
Q1 Q2
Q1 Q2
Q1 Q2
Q1 Q2
Q1 Q2
495
660
1080
1436
145
195
373
495
20 35
1.4
1.2
11
7.62015
3.1
1.81010 35
21
1.3
8.51017
7.3
15.71022
3.1
7.2
1.8
3 1
1.9
30 52
4.2
3.6
56 34
4.3 10
pF
pF
pF
Ω
ns
ns
ns
ns
nC
nC
nC
nC
©2011 Fairchild Semiconductor Corporation 2 www.fairchildsemi.com FDMC8200S Rev.C4
Page 3
Electrical Characteristics T
a.65 °C/W when mounted on a 1 in
2
pad of 2 oz copper
c. 180 °C/W when mounted on a minimum pad of 2 oz copper
b.50 °C/W when mounted on a 1 in
2
pad of 2 oz copper
d. 125 °C/W when mounted on a minimum pad of 2 oz copper
= 25°C unless otherwise noted
J
Symbol Parameter Test Conditions Type Min Typ Max Units
Drain-Source Diode Characteristics
= 0 V, IS = 6 A (Note 2)
V
GS
V
SD
t
rr
Q
rr
Notes:
1. R
is determined with the device mounted on a 1in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R
θJA
by the user's board design.
Source-Drain Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
V
= 0 V, IS = 8.5 A (Note 2)
GS
V
= 0 V, IS = 1.3 A (Note 2)
GS
Q1 I
= 6 A, di/dt = 100 A/s
F
Q2 I
= 8.5 A, di/dt = 300 A/s
F
Q1 Q2 Q2
Q1 Q2
Q1 Q2
is guaranteed by design while R
θJC
1.2
0.8
1.2
0.8
0.8
0.6 13
24
20
32
2.31510
24
θCA
is determined
ns
nC
FDMC8200S Dual N-Channel PowerTrench
V
®
MOSFET
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%.
3.Starting Q1: T = 25 °C, L = 1 mH, I = 5 A, Vgs = 10V, Vdd = 27V, 100% test at L = 3 mH, I = 4 A; Q2: T = 25°C, L = 1 mH, I = 8 A, Vgs = 10V, Vdd = 27V, 100% test at L = 3 mH, I = 3.2 A.
4. As an N-ch device, the negative Vgs rating is for low duty cycle pulse ocurrence only. No continuous rating is implied.
©2011 Fairchild Semiconductor Corporation 3 www.fairchildsemi.com FDMC8200S Rev.C4
Page 4
FDMC8200S Dual N-Channel PowerTrench
0.0 0.5 1.0 1.5 2.0 2.5 3.0
0
10
20
30
40
VGS = 10 V
VGS = 4 V
PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX
VGS = 3.5 V
VGS = 4.5 V
VGS = 6 V
I
D
, DRAIN CURRENT (A)
V
DS
, DRAIN TO SOURCE VOLTAGE (V)
0 10203040
0
1
2
3
4
VGS = 3.5 V
PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX
NORMALIZED
DRAIN TO SOURCE ON-RESISTANCE
I
D
, DRAIN CURRENT (A)
V
GS
= 4 V
VGS = 4.5 V
VGS = 6 V
V
GS
= 10 V
-75 -50 -25 0 25 50 75 100 125 150
0.8
1.0
1.2
1.4
1.6
ID = 6 A V
GS
= 10 V
NORMALIZED
DRAIN TO SOURCE ON-RESISTANC E
T
J
, JUNCTION TEMPERATURE (
o
C)
246810
0
20
40
60
80
100
TJ = 125 oC
ID = 6 A
TJ = 25 oC
V
GS
, GATE TO SOURCE VOLTA GE (V)
r
DS(on)
,
DRAIN TO
SOURCE ON-RESISTANCE
(mΩ)
PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX
2.0 2.5 3.0 3.5 4.0 4.5
0
10
20
30
40
TJ = 150 oC
V
DS
= 5 V
PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX
TJ = -55 oC
TJ = 25 oC
I
D
, DRAIN CURRENT (A)
VGS, GATE TO SOURCE VOLTAGE (V)
0.2 0.4 0.6 0.8 1.0 1.2
0.001
0.01
0.1
1
10
40
TJ = -55 oC
TJ = 25 oC
TJ = 150 oC
V
GS
= 0 V
I
S
, REVERSE DRAIN CURRENT (A)
VSD, BODY DIODE FORWARD VOLTAGE (V)
Typical Characteristics (Q1 N-Channel) T
Figure 1.
On Region Characteristics Figure 2.
= 25°C unless otherwise noted
J
Nor ma liz ed On- Res is tan ce
vs Drain Current and Gate Voltage
®
MOSFET
Fi gu re 3. No rmalized On Resistance
vs Junction Temperature
©2011 Fairchild Semiconductor Corporation 4 www.fairchildsemi.com FDMC8200S Rev.C4
Figure 5. Transfer Characteristics
Figure 4.
On-Resi stance vs Gate to
Source Voltage
Figure 6.
Source to Drain Diode
Forward Voltage vs Source Current
Page 5
FDMC8200S Dual N-Channel PowerTrench
02468
0
2
4
6
8
10
ID = 6 A
VDD = 10 V
V
DD
= 15 V
V
GS
, GATE TO SOURCE VOLTAGE (V)
Qg, GATE CHARGE (nC)
VDD = 20 V
0.1 1 10 30
10
100
1000
f = 1 MHz V
GS
= 0 V
CAPACITANCE (pF)
VDS, DRAIN TO SOURCE VOLTAGE (V)
C
rss
C
oss
C
iss
0.01 0.1 1 7
1
2
3
4
5
6
7
8
TJ = 100 oC
TJ = 25 oC
TJ = 125 oC
tAV, TIME IN AVALANCHE (ms)
I
AS
, AVALANCHE CURRENT (A)
25 50 75 100 125 150
0
5
10
15
20
25
Limited by Package
R
θJC
= 7.5 oC/W
V
GS
= 4.5 V
V
GS
= 10 V
I
D
, DRAIN CURRENT (A)
T
c
, CASE TEMPERATURE (
o
C)
0.01 0.1 1 10 100200
0.01
0.1
1
10
50
10 s
1 s
DC
100 ms
10 ms
1 ms
100 us
I
D
, DRAIN CURRENT (A)
VDS, DRAIN to SOURCE VOLTAGE (V)
THIS A REA IS LIMITED BY r
DS(on)
SINGLE PULSE T
J
= MAX RATED
R
θJA
= 125
o
C/W
T
A
= 25
o
C
0.01 0.1 1 10 100200
0.001
0.01
0.1
1
10
100
10 s
1 s
DC
100 ms
10 ms
1 ms
100 us
I
D
, DRAIN CURRENT (A)
VDS, DRAIN to SOURCE VOLTAGE (V)
THIS AREA IS LIMITED BY r
DS(on)
SINGLE PULSE T
J
= MAX RA TED
R
θJA
= 180
o
C/W
T
C
= 25
o
C
0.001 0.01 0.1 1 1 0 100 1000
0.1
1
10
100
SINGLE PULSE R
θJA
= 125
o
C/W
T
A
= 25
o
C
VGS = 10 V
P(
PK
), PEAK TRANSIENT POWER (W)
t, PULSE WIDTH (sec)
Typical Characteristics (Q1 N-Channel) T
Figure 7.
Gate Charge Characteristics Figure 8.
= 25°C unless otherwise noted
J
Cap aci tan ce v s Dr ain
to Source Voltage
®
MOSFET
Figure 9.
Unc l amp ed I n duc tiv e
Switching Capability
©2011 Fairchild Semiconductor Corporation 5 www.fairchildsemi.com FDMC8200S Rev.C4
Figure 11. Forward Bias Safe
Op
erating Area
Figure 10.
Ma ximum Conti nuous Drain
Current vs Case Temperature
Figure 12.
Single Pu lse Maxim um
Power Dissipation
Page 6
FDMC8200S Dual N-Channel PowerTrench
P
DM
t
1
t
2
NOTES: DUTY FACTOR: D = t1/t
2
PEAK TJ = PDM x Z
θJC
x R
θJc
+ T
C
10
-4
10
-3
10
-2
10
-1
110
100 1000
0.003
0.01
0.1
1
SINGLE PULSE R
θJA
= 180 oC/W
DUTY CYCLE-DESCENDING ORDER
NORMALIZED THERMAL
IMPEDANCE,
Z
θJA
t, RECTANGULAR PULSE DURATION (sec)
D = 0.5
0.2
0.1
0.05
0.02
0.01
2
Typical Characteristics (Q1 N-Channel) T
Figure 13. Junction-to-Ambient Transient Thermal Response Curve
= 25°C unless otherwise noted
J
®
MOSFET
©2011 Fairchild Semiconductor Corporation 6 www.fairchildsemi.com FDMC8200S Rev.C4
Page 7
FDMC8200S Dual N-Channel PowerTrench
0.00.51.01.5
0
9
18
27
VGS = 3.5 V
VGS = 3 V
PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX
VGS = 4.5 V VGS = 4 V
VGS = 10 V
I
D
, DRAIN CURRENT (A)
V
DS
, DRAIN TO SOURCE VOLTAGE (V)
091827
1
2
3
4
VGS = 3.5 V
PULSE DURATION = 80 μs DUTY CYCLE = 0.5% MAX
NORMALIZED
DRAIN TO SOURCE ON-RESISTANCE
I
D
, DRAIN CURRENT (A)
V
GS
= 4 V
VGS = 4.5 V
VGS = 3 V
V
GS
= 10 V
-75 -50 -25 0 25 50 75 100 125 150
0.8
1.0
1.2
1.4
1.6
ID = 8.5 A V
GS
= 10 V
NORMALIZED
DRAIN TO SOURCE ON-RESISTANCE
T
J
, JUNCTION TEMPERATURE (
o
C)
246810
0
20
40
60
80
100
TJ = 125 oC
ID = 8.5 A
TJ = 25 oC
V
GS
, GATE TO SOURCE VOLTA GE (V)
r
DS(on)
,
DRAIN TO
SOURCE ON-RESISTANCE
(mΩ)
PULSE DURA TION = 80 μs DUTY CYCLE = 0.5% MAX
1.0 1.5 2.0 2.5 3.0 3.5 4.0
0
9
18
27
TJ = 150 oC
V
DS
= 5 V
PULSE DURA TION = 80 μs DUTY CYCLE = 0.5% MAX
TJ = -55 oC
TJ = 25 oC
I
D
, DRAIN CURRENT (A)
VGS, GATE TO SOURCE VOLTAGE (V)
0.0 0.2 0.4 0.6 0.8 1.0 1.2
0.001
0.01
0.1
1
10
30
TJ = -55 oC
TJ = 25 oC
TJ = 150 oC
V
GS
= 0 V
I
S
, REVERSE DRAIN CURRENT (A)
VSD, BODY DIODE FORWARD VOLTAGE (V)
Typical Characteristics (Q2 N-Channel) T
Figure 14. On- Region Characteristics Figure 15. Normalized on-Resistance vs Drain
= 25 °C unless otherwise noted
J
Current and Gate Voltage
®
MOSFET
Figure 16. Normalized On-Resistance
vs Junction Temperature
©2011 Fairchild Semiconductor Corporation 7 www.fairchildsemi.com FDMC8200S Rev.C4
Figure 18. Transfer Characteristics Figure 19. Source to Drain Diode
Figure 17. On-Resistance vs Gate to
Source Voltage
Forward Voltag e vs Source Current
Page 8
FDMC8200S Dual N-Channel PowerTrench
0246810121416
0
2
4
6
8
10
ID = 8.5 A
VDD = 20 V
V
DD
= 10 V
V
GS
, GATE TO SOURCE VOLTAGE (V)
Qg, GATE CHARGE (nC)
VDD = 15 V
0.1 1 10 30
10
100
1000
3000
f = 1 MHz V
GS
= 0 V
CAPACITANCE (pF)
VDS, DRAIN TO SOURCE VOLTAGE (V)
C
rss
C
oss
C
iss
0.01 0.1 1 10 30
1
10
20
TJ = 100 oC
TJ = 25 oC
TJ = 125 oC
tAV, TIME IN AVALANCHE (ms)
I
AS
, AVALANCHE CURRENT (A)
25 50 75 100 125 150
0
3
6
9
12
15
Limited by package
V
GS
= 4.5 V
R
θJA
= 50 oC/W
V
GS
= 10 V
I
D
, DRAIN CURRENT (A)
T
A
, CASE TEMPERATURE (
o
C)
0.01 0.1 1 10 100200
0.01
0.1
1
10
50
10 s
1 s
DC
100 ms
10 ms
1 ms
100 us
I
D
, DRAIN CURRENT (A)
VDS, DRAIN to SOURCE VOLTAGE (V)
THIS A REA IS LIMITED BY r
DS(on)
SINGLE PULSE T
J
= MAX RATED
R
θJA
= 125
o
C/W
T
A
= 25
o
C
0.001 0.01 0.1 1 10 100 1000
0.1
1
10
100
SINGLE PULSE R
θJA
= 125
o
C/W
T
A
= 25
o
C
VGS = 10 V
P(
PK
), PEAK TRANSIENT POWER (W)
t, PULSE WIDTH (sec)
Typical Characteristics (Q2 N-Channel) T
Figure 20. Gate Charge Characteristics
= 25°C unless otherwise noted
J
Figure 21. Capacitance vs Drain
to Source Volt age
®
MOSFET
Figure 22. Unclamped Inductive
Switching Capability
©2011 Fairchild Semiconductor Corporation 8 www.fairchildsemi.com FDMC8200S Rev.C4
Figur e 24 . Forward Bias Sa fe
Operating Area
Figure 2 3. Maxim um Con ti nu ous Dr ai n
Current vs Case Temperature
Figure 25. Single Pulse Maximum Power
Dissipation
Page 9
10
-4
10
-3
10
-2
10
-1
110
100 1000
0.001
0.01
0.1
1
SINGLE PULSE R
θJA
= 125 oC/W
(Note 1b)
DUTY CYCLE-DESCENDING ORDER
NORMALIZED THERMAL
IMPEDANCE,
Z
θJA
t, RECTANGULAR PU L SE D U R ATION (sec)
D = 0.5
0.2
0.1
0.05
0.02
0.01
2
P
DM
t
1
t
2
NOTES: DUTY FACTOR: D = t1/t
2
PEAK TJ = PDM x Z
θJC
x R
θJC
+ T
C
FDMC8200S Dual N-Channel PowerTrench
Typical Characteristics (Q2 N-Channel) T
Figure 26. Junction-to-Ambient Transient Thermal Response Curve
= 25 °C unless otherwise noted
J
®
MOSFET
©2011 Fairchild Semiconductor Corporation 9 www.fairchildsemi.com FDMC8200S Rev.C4
Page 10
Figure 27. FDMC8200S SyncFET body diode reverse recovery characteristic
0 20406080100
-2
-1
0
1
2
3
4
5
6
7
di/dt = 300 A/μs
CURRENT (A)
TIME (ns)
Figure 28. SyncFET body diode reverses leakage versus drain-source voltage
0 5 10 15 20 25 30
0.000001
0.00001
0.0001
0.001
0.01
TJ = 125 oC
TJ = 100 oC
TJ = 25 oC
I
DSS
, REVERSE LEAKAGE CURRENT (A)
VDS, REVERSE VOLTAGE (V)
Typical Characteristics (continued)
SyncFET Schottky body diode Characteristics
FDMC8200S Dual N-Channel PowerTrench
Fairchild’s SyncFET process embeds a Schottky diode in parallel with PowerTrench MOSFET. This diode exhibits similar characteristics to a discrete external Schottky diode in parallel with a MOSFET. Figure 14 shows the reverses recovery characteristic of the FDMC8200S.
Schottky barrier diodes exhibit significant leakage at high tem­perature and high reverse voltage. This will increase the power in the device.
®
MOSFET
©2011 Fairchild Semiconductor Corporation 10 www.fairchildsemi.com FDMC8200S Rev.C4
Page 11
Dimensional Outline and Pad Layout
FDMC8200S Dual N-Channel PowerTrench
®
MOSFET
©2011 Fairchild Semiconductor Corporation 11 www.fairchildsemi.com FDMC8200S Rev.C4
Page 12
tm
®
tm
tm
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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
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FDMC8200S Dual N-Channel PowerTrench
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MOSFET
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used here in:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user.
ANTI-COUNTERFEITING POLICY
Fairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Fairchild’s Anti-Counterfeiting Policy is also stated on our external website, www.Fairchildsemi.com, under Sales Support Counterfeiting of semiconductor parts is a growing problem in the indust ry. All manufactures of semiconductor products are experiencin g counterfeiting of their parts. Customers who inadvertently purchase counte rfe it parts e xpe rien ce many probl ems such as loss of b rand reputa tio n, subst andard p erf orman ce, fai led
application, and increased cost of production and manufacturing del ays. Fairch ild is taking stro ng measure s to prot ect ourselves and our customers fro m the proliferation of counterfeit parts. Fairchild strongly encou rages customer s to purchase Fairchild parts either direct ly from Fairchild or from Authorized Fairchild Distributors who are listed by country on our web page cited above. Products customers buy either from Fairchild directly or from Authorized Fairchild Distributors are genuine parts, have full traceability, meet Fairchild’s qua lity standards for handing and storage and provide access to Fairchild’s full range of up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address and warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Fairchild is
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2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
committed to combat this global problem and encourage our customer s to do their part in stopping this practice by buying direct or from authorized distrib utors.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information Formative / In Design
Preliminary First Production
No Identification Needed Full Production
Obsolete Not In Production
©2011 Fairchild Semiconductor Corporation 12 www.fairchildsemi.com
Datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design.
Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The data sheet is for reference information only.
Rev. I53
FDMC8200S Rev.C4
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