These N-Channel power MOSFETs are manufactured using the
innovative UItraFET process. This advanced process technology
achieves the lowest possible on-resistance per silicon area,
resulting in outstanding performance.This device is capable of
withstanding high energy in the avalanche mode and the diode
exhibits very low reverse recovery time and stored charge. It was
designed for use in applications where power efficiency is
important, such as switching regulators, switching converters,
motor drivers, relay drivers, lowvoltage bus switches, and power
management in portable and battery-operated products.
5
D
D
6
D
D
D
D
D
7
8
D
4
3
2
1
MLP 3.3x3.3
MOSFET Maximum RatingsT
SymbolParameterRatingsUnits
V
V
I
I
E
I
E
P
T
T
DSS
GSS
D
DM
AS
AR
AR
D
J
L
, T
STG
Drain to Source Voltage55V
Gate to Source Voltage±20V
Drain Current
Drain Current- Pulsed (Note 2)60A
Single Pulsed Avalanche Energy (Note 3)36mJ
Avalanche Current 15A
Repetitive Avalanche Energy 3.5mJ
Power Dissipation
Operating and Storage Temperature Range-55 to +150
Maximum Lead Temperature for Soldering Purpose,
Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation
vs. Temperature vs. Temperature
1.2
2.5
FDMC15N06 N-Channel MOSFET
1.1
2.0
1.5
1.0
, [Normalized]
DSS
BV
0.9
Drain-Source Breakdown Voltage
0.8
-100-50050100150200
*Notes:
1. V
2. I
TJ, Junction Temperature [oC]
= 0V
GS
= 250µA
D
, [Normalized]
1.0
DS(on)
R
0.5
Drain-Source On-Resistance
0.0
-100-50050100150200
*Notes:
1. V
2. I
GS
= 15A
D
= 10V
TJ, Junction Temperature [oC]
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current
100
10
1
Operation in This Area
, Drain Current [A]
is Limited by R
D
I
0.1
0.01
0.1110100
DS(on)
*Notes:
1. T
= 25oC
C
2. T
= 150oC
J
3. Single Pulse
VDS, Drain-Source Voltage [V]
100ms
100s
1ms
10ms
1s
10s
DC
100µs
vs. Case Temperature
16
12
8
, Drain Current [A]
D
I
4
0
255075100125150
TC, Case Temperature [oC]
Figure 11. Transient Thermal Response Curve
θJA
Z
0.1
IMPEDANCE,
0.01
NORMALIZED THERMAL
0.001
FDMC15N06 Rev. A
2
DUTY CYCLE-DESCENDING ORDER
1
D = 0.5
0.2
0.1
0.05
0.02
0.01
SINGLE PULSE
R
= 125 oC/W
θJA
0.0010.010.11101001000
t, RECTANGULAR PULSE DURATION (sec )
4
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Page 5
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
FDMC15N06 N-Channel MOSFET
FDMC15N06 Rev. A
Unclamped Inductive Switching Test Circuit & Waveforms
5
www.fairchildsemi.com
Page 6
Peak Diode Recovery dv/dt Test Circuit & Waveforms
g
g
+
+
V
V
DS
DS
_
_
L
LL
Same Type
Same Type
as DU T
as DU T
• dv/dt controlled by R
• dv/dt controlled by R
•ISDcontrolled by pulse period
•ISDcontrolled by pulse period
G
G
V
V
GS
GS
R
R
Driver
Driver
G
G
DUT
DUT
I
I
SD
SD
V
V
DD
DD
FDMC15N06 N-Channel MOSFET
V
V
GS
GS
( D riv e r )
( D riv e r )
I
I
SD
SD
( DUT )
( DUT )
V
V
DS
DS
( DUT )
( DUT )
G ate P ulse W idth
G ate P ulse W idth
G ate P ulse W idth
--------------------------
--------------------------
--------------------------
D =
D =
D =
Gate Pulse Period
Gate Pulse Period
Gate Pulse Period
IFM, B ody Diode Forw ard Current
IFM, B ody Diode Forw ard Current
I
I
RM
RM
Body D iode Reverse Current
Body D iode Reverse Current
Body D iode R ecovery dv/dt
Body D iode R ecovery dv/dt
V
V
SD
SD
Body D iode
Body D iode
e D rop
Forward V olta
Forward V olta
e D rop
di/dt
di/dt
10V
10V
V
V
DD
DD
FDMC15N06 Rev. A
6
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Page 7
Dimensional Outline and Pad Layout
FDMC15N06 N-Channel MOSFET
FDMC15N06 Rev. A
7
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Page 8
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