Datasheet FDMB3900AN Datasheet (Fairchild)

Page 1
FDMB3900AN
MicroFET 3X1.9
Pin 1
G2
G1
S1
S2
8
1
7
2
3
4
6
5
Q2
Q1
D2 D2
D1
D1
Dual N-Channel Power Trench® MOSFET
25 V, 7.0 A, 23 mΩ
Features
Max rMax rFast switching speedLow gate chargeHigh performance trench technology for extremely low rHigh power and current handling capabilityRoHS Compliant
= 23 mΩ at VGS = 10 V, ID = 7.0 A
DS(on)
= 33 mΩ at VGS = 4.5 V, ID = 5.5 A
DS(on)
DS(on)
General Description
These N-Channel Logic Level MOSFETs are produced using Fairchild Semiconductor’s advanced PowerTrench that has been especially tailored to minimize the on-state resistance and yet maintain superior switching performance.
These devices are well suited for low voltage and battery powered applications where the low in-line power loss and fast switching are required.
TM
December 2011
®
process
FDMB3900AN Dual N-Channel Power Trench
®
MOSFET
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DS
V
GS
I
D
P
D
, T
T
J
STG
Drain to Source Voltage 25 V Gate to Source Voltage ±20 V Drain Current -Continuous TA = 25 °C (Note 1a) 7.0
-Pulsed 28 Power Dissipation TA = 25 °C (Note 1a) 1.6 Power Dissipation T Operating and Storage Junction Temperature Range -55 to +150 °C
= 25 °C unless otherwise noted
A
= 25 °C (Note 1b) 0.8
A
A
W
Thermal Characteristics
R
θJA
R
θJA
Thermal Resistance, Junction to Ambient (Note 1a) 80 Thermal Resistance, Junction to Ambient (Note 1b) 165
°C/W
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
3900 FDMB3900AN MicroFET 3X1.9 7 ’’ 8 mm 3000 units
©2011 Fairchild Semiconductor Corporation FDMB3900AN Rev.C1
1
www.fairchildsemi.com
Page 2
FDMB3900AN Dual N-Channel Power Trench
Electrical Characteristics T
= 25 °C unless otherwise noted
J
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
ΔBV ΔT
I
DSS
I
GSS
DSS
DSS J
Drain to Source Breakdown Voltage ID = 250 μA, VGS = 0 V 25 V Breakdown Voltage Temperature
Coefficient Zero Gate Voltage Drain Current VDS = 20 V, V Gate to Source Leakage Current VGS = ±20 V, V
I
= 250 μA, referenced to 25 °C 17 mV/°C
D
= 0 V 1 μA
GS
= 0 V ±100 nA
DS
On Characteristics
V
GS(th)
ΔV ΔT
r
DS(on)
g
FS
GS(th)
J
Gate to Source Threshold Voltage VGS = VDS, ID = 250 μA 1.0 2.0 3.0 V Gate to Source Threshold Voltage
Temperature Coefficient
Static Drain to Source On Resistance
I
= 250 μA, referenced to 25 °C -6 mV/°C
D
= 10 V, ID = 7.0 A 19 23
V
GS
V
= 4.5 V, ID = 5.5 A 26 33
GS
= 10 V, ID = 7.0 A
V
GS
T
= 125 °C
J
26 32
Forward Transconductance VDS = 5 V, ID = 7.0 A 27 S
Dynamic Characteristics
C
iss
C
oss
C
rss
R
g
Input Capacitance Output Capacitance 151 200 pF Reverse Transfer Capacitance 141 215 pF
= 13 V, VGS = 0 V
V
DS
f = 1MHz
Gate Resistance 0.8 Ω
650 890 pF
mΩ
®
MOSFET
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
g(TOT)
Q
gs
Q
gd
Turn-On Delay Time Rise Time 310ns Turn-Off Delay Time 15 26 ns Fall Time 310ns Total Gate Charge VGS = 0 V to 10 V Total Gate Charge V Gate to Source Charge 2.0 nC Gate to Drain “Miller” Charge 3.0 nC
= 13 V, ID = 7.0 A
V
DD
V
= 10 V, R
GS
= 0 V to 5 V 7 10 nC
GS
GEN
Drain-Source Diode Characteristics
V
= 0 V, IS = 1.25 A (Note 2) 0.8 1.2
V
SD
t
rr
Q
rr
NOTES:
1. R
is determined with the device mounted on a 1 in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R
θJA
the user's board design.
Source to Drain Diode Forward Voltage Reverse Recovery Time
Reverse Recovery Charge 3 10 nC
a. 80 °C/W when mounted on a 1 in2 pad o f 2 oz c o pper
GS
= 0 V, IS = 7.0 A (Note 2) 0.9 1.2
V
GS
= 7.0 A, di/dt = 100 A/μs
I
F
= 6 Ω
V
DD
I
= 7.0 A
D
= 13 V
612ns
11 17 nC
14 24 ns
is guaranteed by design wh ile R
θJC
b.165 °C/W when mounted on a minimum pad of 2 oz copper
is determined by
θCA
V
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0 %.
©2011 Fairchild Semiconductor Corporation FDMB3900AN Rev.C1
2
www.fairchildsemi.com
Page 3
FDMB3900AN Dual N-Channel Power Trench
01234
0
7
14
21
28
VGS = 6 V
VGS = 3.5 V
VGS = 10 V
VGS = 4 V
PULSE DURATION = 80μs DUTY CYCLE = 0.5%MAX
VGS = 4.5 V
I
D
, DRAIN CURRENT (A)
V
DS
, DRAIN TO SOURCE VOLTAGE (V)
0 7 14 21 28
0
1
2
3
4
V
GS
= 6 V
V
GS
= 10 V
PULSE DURATION = 80μs DUTY CYCLE = 0.5%MAX
NORMALIZED
DRAIN TO SOURCE ON-RESISTANCE
I
D
, DRAIN CURRENT(A)
V
GS
= 4 V
VGS = 4.5 V
VGS = 3.5 V
-75 -50 -25 0 25 50 75 100 125 150
0.6
0.8
1.0
1.2
1.4
1.6
ID = 7 A V
GS
= 10 V
NORMALIZED
DRAIN TO SOURCE ON-RESISTA NC E
T
J
, JUNCTION TEMPERATURE (
o
C)
246810
0
20
40
60
80
ID = 7 A
TJ = 25 oC
TJ = 125 oC
V
GS
, GATE TO SOURCE VO L TA G E (V)
r
DS(on)
,
DRAIN TO
SOURCE ON-RESISTANCE
(mΩ)
PULSE DURATION = 80μs DUTY CYCLE = 0.5%MAX
12345
0
7
14
21
28
TJ = 25 oC
TJ = -55 oC
V
DS
= 5 V
PULSE DURATION = 80μs DUTY CYCLE = 0.5%MAX
TJ = 150 oC
I
D
, DRAIN CURRENT (A)
VGS, GATE TO SOURC E V OLTAGE (V)
0.2 0.4 0.6 0.8 1.0 1.2 1.4
0.1
1
10
30
TJ = -55 oC
TJ = 25 oC
TJ = 150 oC
V
GS
= 0 V
I
S
, REVERSE DRAIN CURRENT (A)
VSD, BODY DIODE FORWARD VOLTAGE (V)
Typical Characteristics T
Figure 1.
On-Region Characteristics Figure 2.
= 25°C unless otherwise noted
J
Norma l i z e d O n -Resis t a n c e
vs Drain Current and Gate Voltage
®
MOSFET
Figure 3. Normalized On- Resistance
vs Junction Temperature
©2011 Fairchild Semiconductor Corporation FDMB3900AN Rev.C1
Figure 5. Transfer Characteristics
Figure 4.
On-Resist ance v s Gate to
Source Voltage
Figure 6.
Source to D rain D iode
Forward Voltage vs Source Current
3
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Page 4
FDMB3900AN Dual N-Channel Power Trench
036912
0
2
4
6
8
10
ID = 7 A
VDS = 10 V
V
DS
= 13 V
V
GS
, GATE TO SOURCE VOLTAGE(V)
Qg, GATE CHARGE(nC)
VDS = 15 V
0.1 1 10
100
200
300
400
500
600
700
800
900
25
f = 1 MHz V
GS
= 0 V
CAPACITANCE (pF)
VDS, DRAIN TO SOURCE VOLTAG E (V)
C
rss
C
oss
C
iss
25 50 7 5 100 125 150
0
2
4
6
8
V
GS
= 10 V
R
θJA
= 80 oC/W
V
GS
= 4.5 V
I
D
, DRAIN CURRENT (A)
T
A
, AMBIENT TEMPERATURE (
o
C)
0.01 0.1 1 10 100
0.01
0.1
1
10
40
100 μs
10 ms
10 s
100 ms
DC
1 s
1 ms
I
D
, DRAIN CURRENT (A)
VDS, DRAIN to SOURCE VOLTAGE (V)
THIS AREA IS LIMITED BY r
DS(on)
SINGLE PULSE T
J
= MAX RATED
R
θJA
= 165
o
C/W
T
A
= 25
o
C
10
-4
10
-3
10
-2
10
-1
110
100 1000
0.5
1
10
100
300
P
(PK)
, PEAK TRANSIENT POWER (W)
SINGLE PULSE R
θJA
= 165 oC/W
T
A
= 25 oC
t, PULSE WIDTH (sec)
Typical Characteristics T
Figure 7.
Gate Charge Characteristics Figure 8.
= 25°C unless otherwise noted
J
Cap a c i tan c e v s Dr a i n
to Source Voltage
®
MOSFET
Figure 9.
Maximum Continuous Drain
Current vs Ambient Temperature
©2011 Fairchild Semiconductor Corporation FDMB3900AN Rev.C1
Figure 11. Single Pulse Maximum Power Dissipation
Figure 10.
Forward Bias Safe
Operating Area
4
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Page 5
FDMB3900AN Dual N-Channel Power Trench
10
-4
10
-3
10
-2
10
-1
110
100 1000
0.001
0.01
0.1
1
SINGLE PULSE R
θJA
= 165 oC/W
DUTY CYCLE-DESCENDING O RD ER
NORMALIZED THERMAL
IMPEDANCE,
Z
θJA
t, RECTANGULAR PU L SE D U R ATION (sec)
D = 0.5
0.2
0.1
0.05
0.02
0.01
2
P
DM
t
1
t
2
NOTES: DUTY FACTOR: D = t
1/t2
PEAK TJ = PDM x Z
θJA
x R
θJA
+ T
A
Typical Characteristics T
Figure 12. Junction-to-Ambient Transient Thermal Response Curve
= 25°C unless otherwise noted
J
®
MOSFET
©2011 Fairchild Semiconductor Corporation FDMB3900AN Rev.C1
5
www.fairchildsemi.com
Page 6
Dimensional Outline and Pad Layout
FDMB3900AN Dual N-Channel Power Trench
®
MOSFET
©2011 Fairchild Semiconductor Corporation FDMB3900AN Rev.C1
6
www.fairchildsemi.com
Page 7
TRADEMARKS
®
™
tm
tm
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semi conductor and/or its glob al subsidiaries, and is not intended to be an exhaustive list of all such trademarks.
2Cool™ AccuPower™ AX-CAP™*
®
BitSiC Build it Now™ CorePLUS™ CorePOWER™ CROSSVOLT™ CTL™ Current Transfer Logic™ DEUXPEED Dual Cool™ EcoSPARK EfficentMax™ ESBC™
Fairchild Fairchild Semiconductor FACT Quiet Series™ FACT FAST FastvCore™ FETBench™ FlashWriter FPS™
®
®
®
® ®
®
*
®
F-PFS™
®
FRFET Global Power Resource Green Bridge™ Green FPS™ Green FPS™ e-Series™ Gmax™ GTO™ IntelliMAX™ ISOPLANAR™ Marking Small Speakers Sound Louder and Better™ MegaBuck™ MICROCOUPLER™ MicroFET™ MicroPak™ MicroPak2™ MillerDrive™ MotionMax™ Motion-SPM™ mWSaver™ OptoHiT™ OPTOLOGIC OPTOPLANAR
®
®
®
SM
PowerTrench PowerXS™ Programmable Active Droop™ QFET QS™ Quiet Series™ RapidConfigure™
Saving our world, 1mW/W/kW at a time™ SignalWise™ SmartMax™ SMART START™ Solutions for Your Success™ SPM STEALTH™ SuperFET SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SupreMOS SyncFET™ Sync-Lock™
®
®
®
®
®
®*
The Power Franchise
TinyBoost™ TinyBuck™ TinyCalc™
®
TinyLogic TINYOPTO™ TinyPower™ TinyPWM™ TinyWire™
®
TranSiC TriFault Detect™ TRUECURRENT μSerDes™
®
UHC Ultra FRFET™ UniFET™ VCX™ VisualMax™ VoltagePlus™ XS™
®
®
®
*
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
FDMB3900AN Dual N-Channel Power Trench
®
MOSFET
TM
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used here in:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably
2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
expected to result in a significant injury of the user.
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Fairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Fairchild’s Anti-Counterfeiting Policy is also stated on our external website, www.Fairchildsemi.com, under Sales Support Counterfeiting of semiconductor parts is a growing problem in the industry. All manu factures of semiconductor product s are experiencing counterfeiting of their parts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss o f bran d re putat ion, substand ard performa nce, failed application, and increased cost of production an d manufacturing delays. Fairchild is taking strong measur es to protect ourselves and our customers from the
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PRODUCT STATUS DEFINITIONS Definition of Terms
.
Datasheet Identification Product Status Definition
Advance Information Formative / In Design
Preliminary First Production
No Identification Needed Full Production
Obsolete Not In Production
Datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design.
Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only.
Rev. I61
©2011 Fairchild Semiconductor Corporation FDMB3900AN Rev.C1
7
www.fairchildsemi.com
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