Max r
Max r
Max r
Low profile - 0.8 mm maximum - in the new package
MicroFET 2x2 mm
RoHS Compliant
= 68 mΩ at VGS = 4.5 V, ID = 3.8 A
DS(on)
= 88 mΩ at VGS = 2.5 V, ID = 3.4 A
DS(on)
= 123 mΩ at VGS = 1.8 V, ID = 2.9 A
DS(on)
General Description
This device is designed specifically as a single package solution
for dual switching requirements in cellular handset and other
ultra-portable applications. It features two independent
N-Channel MOSFETs with low on-state resistance for minimum
conduction losses. The MicroFET 2x2 package offers
exceptional thermal performance for its physical size and is well
suited to linear mode applications.
Drain to Source Voltage30V
Gate to Source Voltage±12V
Drain Current -Continuous (Note 1a)3.8
-Pulsed16
Power Dissipation (Note 1a)1.5
Power Dissipation (Note 1b)0.7
Operating and Storage Junction Temperature Range-55 to +150°C
Thermal Resistance for Single Operation, Junction to Ambient (Note 1a)86
Thermal Resistance for Single Operation, Junction to Ambient (Note 1b)173
Thermal Resistance for Dual Operation, Junction to Ambient (Note 1c)69
Thermal Resistance for Dual Operation, Junction to Ambient (Note 1d)151
Thermal Resistance for Single Operation, Junction to Ambient (Note 1e)160
Thermal Resistance for Dual Operation, Junction to Ambient (Note 1f)133
328FDMA3028NMicroFET 2X27 ’’8 mm3000 units
= 25 °C unless otherwise noted
A
1
A
W
°C/W
www.fairchildsemi.com
Page 2
FDMA3028N Dual N-Channel PowerTrench
Electrical Characteristics T
= 25 °C unless otherwise noted
J
SymbolParameterTest ConditionsMinTypMaxUnits
Off Characteristics
BV
ΔBV
ΔT
I
DSS
I
GSS
DSS
DSS
J
Drain to Source Breakdown VoltageID = 250 μA, VGS = 0 V30V
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain CurrentVDS = 24 V, V
Gate to Source Leakage CurrentVGS = ±12 V, V
I
= 250 μA, referenced to 25 °C23mV/°C
D
= 0 V1μA
GS
= 0 V±100nA
DS
On Characteristics
V
GS(th)
ΔV
ΔT
r
DS(on)
g
FS
GS(th)
J
Gate to Source Threshold VoltageVGS = VDS, ID = 250 μA0.60.91.5V
Gate to Source Threshold Voltage
Temperature Coefficient
Static Drain to Source On Resistance
I
= 250 μA, referenced to 25 °C-3mV/°C
D
= 4.5 V, ID = 3.8 A4668
V
GS
V
= 2.5 V, ID = 3.4 A5688
GS
= 1.8 V, ID = 2.9 A80123
V
GS
= 4.5 V, ID = 3.8 A, TJ = 125 °C72108
V
GS
Forward TransconductanceVDS = 5 V, ID = 3.8 A15S
Dynamic Characteristics
C
iss
C
oss
C
rss
R
g
Input Capacitance
Output Capacitance4055pF
Reverse Transfer Capacitance2945pF
= 15 V, VGS = 0 V,
V
DS
f = 1 MHz
Gate Resistance2.4Ω
282375pF
mΩ
®
MOSFET
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
g(TOT)
Q
gs
Q
gd
Turn-On Delay Time
Rise Time 310ns
Turn-Off Delay Time1527ns
Fall Time 2.510 ns
Total Gate Charge
Gate to Source Charge0.4nC
Gate to Drain “Miller” Charge1nC
Drain-Source Diode Characteristics
V
SD
t
rr
Q
rr
Source to Drain Diode Forward VoltageV
Reverse Recovery Time
Reverse Recovery Charge3.310nC
The following includes registered and unregistered tradema rks and service marks, owned by Fair child Semiconductor and/ or its global subsidiaries, and is no t
intended to be an exhaustive list of all such trademarks.
AccuPower™
Auto-SPM™
AX-CAP™*
®
BitSiC
Build it Now™
CorePLUS™
CorePOWER™
CROSSVOLT™
CTL™
Current Transfer Logic™
DEUXPEED
Dual Cool™
EcoSPARK
EfficentMax™
ESBC™
The Power Franchise
The Right Technology for Your Success™
TinyBoost™
TinyBuck™
TinyCalc™
®
TinyLogic
TINYOPTO™
TinyPower™
TinyPWM™
TinyWire™
®
TranSiC
TriFault Detect™
TRUECURRENT
μSerDes™
®
UHC
Ultra FRFET™
UniFET™
VCX™
VisualMax™
XS™
®
®
®
*
FDMA3028N Dual N-Channel PowerTrench
®
MOSFET
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.
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PreliminaryFirst Production
No Identification NeededFull Production
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