! r
! r
! High performance trench technology for extremely low
! Low gate charge
! High power and current handling capability
RoHS Complicant
Application
! DC/DC converters
DS(ON)
DS(ON)
r
DS(ON)
= 11.5mΩ, V
= 15mΩ, V
= 10V, ID = 35A
GS
= 4.5V, ID = 35A
GS
MOSFET
General Description
This N-Channel MOSFET has been designed specifically to
improve the overall efficiency of DC/DC converters using
either synchronous or conventional switching PWM
controllers. It has been optimized for low gate charge, low
r
Drain to Source Voltage30V
Gate to Source Voltage±20V
Drain Current
Continuous (T
I
D
Continuous (T
Continuous (T
= 25oC, VGS = 10V) (Note 1)
C
= 25oC, VGS = 4.5V) (Note 1)50A
C
= 25oC, VGS = 10V, with R
amb
= 52oC/W)12.6A
θJA
55A
PulsedFigure 4A
E
AS
P
D
T
, T
J
STG
Single Pulse Avalanche Energy (Note 2)41mJ
Power dissipation55W
Derate above 25
o
C0.37W/
Operating and Storage Te mperature-55 to 175
Thermal Characteristics
R
θJC
R
θJA
R
θJA
Thermal Resistance Junction to Case TO-252, TO-2512.73
Thermal Resistance Junction to Ambient TO-252, TO-251100
Thermal Resistance Junction to Ambient TO-252, 1in2 copper pad area52
FDD8882FDD8882TO-252AA13”12mm2500 units
FDU8882FDU8882TO-251AAN/A (Tube)N/A75 units
FF
o
C/W
o
C/W
o
C/W
o
C
o
C
Electrical Characteristics T
= 25°C unless otherwise noted
C
SymbolParameterTes t Cond itionsMinTypMaxUnits
Off Characteristics
B
I
DSS
I
GSS
VDSS
Drain to Source Breakdown VoltageID = 250µA, VGS = 0V30--V
V
= 24V--1
Zero Gate Voltage Drain Current
DS
= 0VTC = 150oC--250
V
GS
Gate to Source Leakage CurrentVGS = ±20V--±100nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold VoltageVGS = VDS, ID = 250µA1.2-2.5V
I
= 35A, VGS = 10V -0.0094 0.0115
D
= 35A, VGS = 4.5V -0.0130 0.0150
I
Drain to Source On Resistance
D
I
= 35A, VGS = 10V,
D
= 175oC
T
J
-0.0150 0.0190
µA
Ω
FDD8882/FDU8882 Rev. C
2
www.fairchildsemi.com
Page 3
Dynamic Characteristics
C
C
C
R
Q
Q
Q
Q
Q
Q
ISS
OSS
RSS
G
g(TOT)
g(5)
g(TH)
gs
gs2
gd
Input Capacitance
Output Capacitance-240-pF
Reverse Transfer Capacitance-140-pF
Gate ResistanceVGS = 0.5V, f = 1MHz -2.4-Ω
Total Gate Charge at 10VVGS = 0V to 10V
Total Gate Charge at 5VVGS = 0V to 5V-11.717.6nC
Threshold Gate ChargeVGS = 0V to 1V-1.21.8nC
Gate to Source Gate Charge-3.7-nC
Gate Charge Threshold to Plateau-2.5-nC
Gate to Drain “Miller” Charge-4.6-nC
= 15V, VGS = 0V,
V
DS
f = 1MHz
V
DD
= 35A
I
D
= 1.0mA
I
g
FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET
-1260-pF
-2233nC
= 15V
Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time
Turn-On Delay Time-8-ns
Rise Time-82-ns
Turn-Off Delay Time-40-ns
Fall Time-25-n s
Turn-Off Time--98ns
(VGS = 10V)
Drain-Source Diode Characteristics
V
SD
t
rr
Q
RR
Notes:
1: Package current limitation is 35A.
2: Starting T3
Source to Drain Diode Voltage
Reverse Recovery Ti meISD = 35A, dISD/dt = 100A/µs- -32ns
Figure 1. Normali ze d Po we r Dis sip ation vs Case
Temperature
2
DUTY CYCLE - DESCENDING ORDER
0.5
1
0.2
0.1
0.05
0.02
0.01
0.1
, NORMALIZED
θJC
Z
THERMAL IMPEDANCE
0.01
-5
10
SINGLE PULSE
-4
10
-3
10
t, RECTANGULAR PULSE DURATION (s)
60
CURRENT LIMITED
BY PACKAGE
40
20
, DRAIN CURRENT (A)
D
I
VGS = 10V
0
255075100125150175
TC, CASE TEMPERATURE (oC)
Figure 2. Maximum Contin uous Drain Current vs
Case Temperature
P
DM
t
1
t
x R
2
+ T
θJC
C
0
1
10
NOTES:
DUTY FACTOR: D = t
PEAK TJ = PDM x Z
-2
10
-1
10
θJC
1/t2
10
600
100
, PEAK CURRENT (A)
DM
I
30
VGS = 4.5V
-5
10
FDD8882/FDU8882 Rev. C
Figure 3. Normalized Maximum Transient Thermal Impedance
TRANSCONDUCTANCE
MAY LIMIT CURRENT
IN THIS REGION
-4
10
-3
10
t, PULSE WIDTH (s)
-2
10
-1
10
TC = 25oC
FOR TEMPERATURES
ABOVE 25
CURRENT AS FOLLOWS:
I = I
Figure 4. Peak Current Capability
4
o
C DERATE PEAK
175 - T
25
150
0
10
www.fairchildsemi.com
C
1
10
Page 5
FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET
Typical Characteristics T
1000
100
10
OPERATION IN THIS
AREA MAY BE
LIMITED BY r
, DRAIN CURRENT (A)
D
I
1
SINGLE PULSE
TJ = MAX RATED
T
= 25oC
C
0.1
110
DS(ON)
V
, DRAIN TO SOURCE VOLTAGE (V)
DS
= 25°C unless otherwise noted
C
Figure 5. Forward Bias Safe Operating Area
80
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
= 15V
V
DD
60
10µs
100µs
1ms
10ms
DC
500
If R = 0
tAV = (L)(IAS)/(1.3*RATED BV
If R ≠ 0
t
= (L/R)ln[(IAS*R)/(1.3*RATED BV
AV
100
10
, AVALANCHE CURRENT (A)
AS
I
1
60
STARTING TJ = 150oC
0.0010.010.1110100
tAV, TIME IN AVALANCHE (ms)
- VDD)
DSS
- VDD) +1]
DSS
STARTING TJ = 25oC
NOTE: Refer to Fairchild Applica ti on Note s AN75 14 and AN75 15
Figure 6. Unclamped Inductive Switching
Capability
80
VGS = 10V
60
VGS = 4.5V
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VGS = 3.5V
40
, DRAIN CURRENT (A)
D
I
20
0
1.52.02.53.03.54.04.5
TJ = 25oC
TJ = 175oC
VGS, GATE TO SOURCE VOLTAGE (V)
TJ = -55oC
40
, DRAIN CURRENT (A)
D
I
20
0
00.51.01.52.02.5
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 7. Transfer CharacteristicsFigure 8. Saturation Characteristics
20
ID = 35A
16
, DRAIN TO SOURCE
12
ON RESISTANCE (mΩ)
DS(ON)
r
ID = 1A
8
246810
, GATE TO SOURCE VOLTAGE (V)
V
GS
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
1.8
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
1.6
1.4
1.2
ON RESISTANCE
1.0
0.8
NORMALIZED DRAIN TO SOURCE
0.6
-80-4004080120160200
TJ, JUNCTION TEMPERATURE (oC)
VGS = 3V
TC = 25oC
VGS = 10V, ID = 35A
Figure 9. Drain to Source On Resis tanc e vs Ga te
Voltage and Drain Current
FDD8882/FDU8882 Rev. C
Figure 10. Normalized Drain to Source On
Resistance vs Junction Temperature
5
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Page 6
FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET
Typical Characteristics T
1.2
1.0
0.8
NORMALIZED GATE
THRESHOLD VOLTAGE
0.6
0.4
-80-4004080120160200
TJ, JUNCTION TEMPERATURE (oC)
= 25°C unless otherwise noted
C
VGS = VDS, ID = 250µA
Figure 11. Normalized Gate Thresho ld Voltage vs
Junction Temperature
3000
C
= CGS + C
1000
C
= C
RSS
C, CAPACITANCE (pF)
100
0.1110
GD
V
= 0V, f = 1MHz
GS
VDS, DRAIN TO SOURCE VOLTAGE (V)
ISS
C
≅ C
OSS
GD
+ C
DS
GD
30
1.10
ID = 250µA
1.05
1.00
BREAKDOWN VOLTAGE
0.95
NORMALIZED DRAIN TO SOURCE
0.90
-80-4004080120160200
T
, JUNCTION TEMPERATURE (oC)
J
Figure 12. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
10
VDD = 15V
8
6
4
2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
0510152025
Qg, GATE CHARGE (nC)
WAVEFORMS IN
DESCENDING ORDER:
ID = 35A
= 5A
I
D
Figure 13. Capacitance vs Drain to Source
Voltage
FDD8882/FDU8882 Rev. C
Figure 14. Gate Charge Waveforms for Constant
Gate Current
6
www.fairchildsemi.com
Page 7
Test Circuits and Waveforms
V
DS
L
TO OBTAIN
VARY t
P
REQUIRED PEAK I
V
GS
R
AS
G
+
V
DD
-
I
AS
DUT
t
0V
P
I
AS
0.01Ω
0
Figure 15. Unclamped Energy Test CircuitFigure 16. Unclamped Energy Waveforms
V
DS
V
DD
L
V
I
g(REF)
GS
DUT
+
V
DD
-
V
GS
0
I
g(REF)
= 1V
Q
gs2
Q
g(TH)
Q
gs
Q
0
Figure 17. Gate Charge Test CircuitFigure 18. Gate Charge Waveforms
BV
DSS
t
P
t
AV
Q
g(TOT)
V
DS
Q
g(5)
V
GS
VGS = 5V
gd
FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET
V
DS
V
DD
V
= 10V
GS
V
GS
Figure 19. Switching Time Test CircuitFigure 20. Switching Time Waveforms
FDD8882/FDU8882 Rev. C
V
DS
R
L
V
GS
R
GS
DUT
+
V
DD
-
V
DS
0
V
GS
10%
0
7
t
d(ON)
90%
t
ON
50%
10%
t
r
PULSE WIDTH
t
OFF
t
d(OFF)
t
f
90%
10%
90%
50%
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Page 8
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the
thermal resistance of the heat dissipating path determines
the maximum allowable device power dissipation, P
application. Therefore the application’s ambient
temperature, T
must be reviewed to ensure that T
Equation 1 mathematically represents the relationship and
(oC), and thermal resistance R
A
is never exceeded.
JM
DM
θJA
, in an
(oC/W)
serves as the basis for establishing the rating of the part.
P
DM
TJMTA–()
------------------- ----------=
R
θJA
(EQ. 1)
125
100
C/W)
o
(
75
θJA
R
50
R
= 33.32+ 23.84/(0.268+Area) EQ.2
θJA
R
= 33.32+ 154/(1.73+Area) EQ.3
θJA
FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET
In using surface mount devices such as the TO-252
package, the environment in which it is applied will have a
significant influence on the part’s current and maximum
power dissipation ratings. Precise determination of P
complex and influenced by many factors:
DM
is
1. Mounting pad area onto which the device is attached and
whether there is copper on one side or both sides of t he
board.
2. The number of copper layers and the thickness of the
board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For non steady state applications, the pulse width, the
duty cycle and the transient thermal response of the part,
the board and the environment they are in.
Fairchild provides thermal information to assist the
designer’s preliminary application evaluation. Figure 21
defines the R
copper (component side) area. This is for a horizontally
for the device as a function of the top
θJA
positioned FR-4 board with 1oz copper after 1000 seconds
of steady state power with no air flow. This graph provides
the necessary information for calculation of the steady state
junction temperature or power dissipation. Pulse
applications can be evaluated using the Fairchild device
Spice thermal model or manually utilizing the normalized
maximum transient thermal impedance curve.
25
0.010.1110
(0.645)(6.45)(64.5)(0.0645)
AREA, TOP COPPER AREA in2 (cm2)
Figure 21. Thermal Resistance vs Mounting
Pad Area
Thermal resistances corresponding to other copper area s
can be obtained from Figure 21 or by calculation using
Equation 2 or 3. Equation 2 is used for copper area defined
in inches square and equation 3 is for area in centimeters
square. The area, in square inches or square centimeters is
the top copper area including the gate and source pads.
Note: For further discussio n of the PSP ICE mode l, consul t A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Confere nce Records, 1991, written by William J. Hepp and C. Frank
Wheatley.
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subsidianries, and is not intended to be an exhaustive list of all such trademarks.
®
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Global Power Resource
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®
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are trademarks of System General Corporation, used under license by Fairchild Semiconductor.
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SM
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Quiet Series™
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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS
HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE
APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER
ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S
WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
®
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR
SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which,
(a) are intended for surgical implant into the body or (b)
support or sustain life, and (c) whose failure to perform when
properly used in accordance with instructions for use provided
2. A critical component in any component of a life support,
device, or system whose failure to perform can be reasonably
expected to cause the failure of the life support device or
system, or to affect its safety or effectiveness.
in the labeling, can be reasonably expected to result in a
significant injury of the user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance InformationFormative or In Design
This datasheet contains the design specifications for product development.
Specifications may change in any manner without notice.
This datasheet contains preliminary data; supplementary data will be pub-
PreliminaryFirst Production
lished at a later date. Fairchild Semiconductor reserves the right to make
changes at any time without notice to improve design.
No Identification NeededFull Production
ObsoleteNot In Production
FDD8882/FDU8882 Rev. C
This datasheet contains final specifications. Fairchild Semiconductor reserves
the right to make changes at any time without notice to improve the design.
This datasheet contains specifications on a product that is discontinued by
Fairchild Semiconductor. The datasheet is for reference information only.
Rev. I34
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