Datasheet FDD8878, FDU8878 Datasheet (Fairchild)

Page 1
0
April 2008
FDD8878 / FDU8878 N-Channel PowerTrench
FDD8878 / FDU8878 N-Channel PowerTrench® MOSFET
30V, 40A, 15mΩ Features
r
= 15mΩ, V
DS(ON)
r
= 18.5mΩ, V
DS(ON)
High pe rformance trench tech nology for e xtremely low r
DS(ON)
Low gat e ch arge
High power and current handling capability
RoHS Compliant
= 10V, ID = 35A
GS
= 4.5V, ID = 35A
GS
General Description
This N- Channe l MOSF ET has been desig ned sp ecif icall y to improve the overall efficiency of DC/DC converters using either synchronous or conventional switching PWM contro llers. It ha s be en optimize d for low gate cha r ge , low r
and fast switching speed.
DS(ON)
Application
DC / DC Converters
tm
®
G
D
S
D-PAK
(TO-252)
©2008 Fairchild Semiconductor Corporation
DD8878 / FDU8878 Rev.
F
A4
G DS
1
I-PAK
(TO-251AA)
D
G
S
www.fairchildsemi.com
Page 2
FDD8878 / FDU8878 N-Channel PowerTrench
Absolute Maximum Rating s T
= 25°C unless otherwise noted
C
Symbol Parameter Ratings Units
V
DSS
V
GS
Drain to Sou r c e Voltage 30 V Gate to Source Voltage ±20 V Drain Cur re nt Continuous (T
I
D
Continuous (T Continuous (T
= 25oC, VGS = 10V) ( Note 1)
C
= 25oC, VGS = 4.5V) (Note 1) 36 A
C
= 25oC, VGS = 10V, with R
amb
= 52oC/W) 11 A
θJA
40 A
Pulsed Figure 4 A
E
AS
P
D
T
, T
J
STG
Single Pulse Avalanche Energy (Note 2) 25 mJ Power dissipation 40 W Derate above 25
o
C0.27W/
Operating and Storage Temperature -55 to 175
Thermal Characteristics
R
θJC
R
θJA
R
θJA
Thermal Resistance Junction to Case TO-252, TO-251 3.75 Thermal Resistance Junction to Ambient TO-252, TO-251 100 Thermal Resistance Junction to Am bient TO-252, 1in2 copper pad ar ea 52
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDD8878 FDD8878 TO-252AA 13” 12mm 2500 units FDU88 78 FDU8878 TO- 251AA Tube N/A 75 unit s F F
o
C/W
o
C/W
o
C/W
o
C
o
C
®
Electrical Characteristics
TC = 25°C unless otherwise noted
Symbol Parameter Test Condit ions Min Typ Max Units
Off Characteristics
B I
DSS
I
GSS
VDSS
Drain to Sou r c e Br ea k down Voltage ID = 250µA, VGS = 0V 30 - - V
V
= 24V - - 1
Zero Gate Voltage Drain Current
DS
= 0V TC = 150oC- -250
V
GS
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA 1.2 - 2.5 V
I
= 35A, VGS = 10V - 0.011 0.015
D
= 35A, VGS = 4.5V - 0.014 0.0185
I
Drain to S ou r c e On Re si st ance
D
I
= 35A, VGS = 10V,
D
T
= 175oC
J
- 0.018 0.024
µA
Ω
©2008 Fairchild Semiconductor Corporation
DD8878 / FDU8878 Rev. A
F
4
2
www.
fairchildsemi.com
Page 3
Dynamic Characteristics
C C C R Q Q Q Q Q Q
ISS OSS RSS G
g(TOT) g(5) g(TH) gs gs2 gd
Input Capacitance Output Capacit ance - 195 - pF Reverse Transfer Capacitance - 110 - pF Gate Resistance VGS = 0.5V, f = 1MHz - 3.1 - Ω Total Gate Charge at 10V VGS = 0V to 10V Total Gate Charge at 5V VGS = 0V to 5V - 10 14 nC Threshold Gate Charge VGS = 0V to 1V - 0.9 1.3 nC Gate to Source Gate Charg e - 2.6 - nC Gate Charge Threshold to Plateau - 1.7 - nC Gate to Drain “Miller” Charge - 4.5 - nC
= 15V, VGS = 0V,
V
DS
f = 1MHz
V
DD
I
= 35A
D
= 1.0m A
I
g
FDD8878 / FDU8878 N-Channel PowerTrench
-880- pF
-1926nC
= 15V
Switching Characteristi cs
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Ti me Turn-On Delay Time - 7 - ns Rise Time - 79 - ns Turn-Off Delay Time - 38 - ns Fall Time - 27 - ns Turn-Off Time - - 97 ns
(VGS = 10V)
Drain-Source Diode Character istics
V
SD
t
rr
Q
RR
Notes: 1: Package current limitation is 35A. 2: Starting TJ = 25°C, L = 65uH, IAS = 28A, VDD = 27V, VGS = 10V. 3
Source to Drain Diode Voltage Reverse Recovery Time ISD = 35A, dISD/dt = 100A/µs- -23ns
Reverse Recovered Charge ISD = 35A, dISD/dt = 100A/µs- - 9nC
--129ns
= 15V, ID = 35A
V
DD
= 4.5V, RGS = 16Ω
V
GS
I
= 35A - - 1.2 5 V
SD
I
= 3.2A - - 1.0 V
SD
®
©2008 Fairchild Semiconductor Corporation
DD8878 / FDU8878 Rev. A
F
4
3
www.
fairchildsemi.com
Page 4
FDD8878 / FDU8878 N-Channel PowerTrench
Typical Characteristics T
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0255075100 175
TC, CASE TEMPERATURE (oC)
= 25°C unless otherwise noted
C
150
125
Figure 1. Normalized Power Dissipation vs Case
Temperature
2
DUTY CYCLE - DESCENDING ORDER
0.5
1
0.2
0.1
0.05
0.02
0.01
0.1
, NORMALIZED
θJC
Z
THERMAL IMPEDANCE
0.01
-5
10
SINGLE PULSE
-4
10
-3
10
t, RECTANGULAR PULSE DURATION (s)
50
40
30
20
, DRAIN CURRENT (A)
D
I
10
0
25 50 75 100 125 150
TC, CASE TEMPERATURE (oC)
VGS = 4.5V
CURRENT LIMITED BY PACKAGE
VGS = 10V
175
Figure 2. Maximum Continuous Drain Curr ent vs
Case Temperature
P
DM
t
1
t
x R
2
2
+ T
θJC
C
1
10
NOTES: DUTY FACTOR: D = t1/t PEAK TJ = PDM x Z
-2
10
-1
10
θJC
10
0
®
Figure 3. Normalized Maximum Transient Thermal Impedance
500
100
, PEAK CURRENT (A)
DM
I
30
©2008 Fairchild Semiconductor Corporation F
DD8878 / FDU8878 Rev. A
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
VGS = 4.5V
-5
10
VGS = 10V
4
-4
10
-3
10
-2
10
t, PULSE WIDTH (s)
Figure 4. Peak Current Capability
4
TC = 25oC FOR TEMPERATURES ABOVE 25oC DERATE PEAK CURRENT AS FOLLOWS:
I = I
-1
10
175 - T
25
150
0
10
www.
C
1
10
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Page 5
FDD8878 / FDU8878 N-Channel PowerTrench
Typical Characteristics T
1000
100
10
, DRAIN CURRENT (A)
D
I
1
SINGLE PULSE TJ = MAX RATED TC = 25oC
0.1 110
OPERATION IN THIS
AREA MAY BE
LIMITED BY r
VDS, DRAIN TO SOURCE VOLTAGE (V)
DS(ON)
= 25°C unless otherwise noted
C
Figure 5. Forward Bias Safe Operating Area
80
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
V
= 15V
DD
60
TJ = 25oC
40
10µs
100µs
1ms 10ms
DC
500
If R = 0 tAV = (L)(IAS)/(1.3*RATED BV
If R ≠ 0 tAV = (L/R)ln [(IAS*R)/(1.3*RATED BV
100
10
, AVALANCHE CURRENT (A)
AS
I
60
STARTING TJ = 150oC
1
0.01 0.1 1 tAV, TIME IN AVALANCHE (ms)
- VDD)
DSS
- VDD) +1]
DSS
ST ARTING TJ = 25oC
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
Figure 6. Unclamped Inductive Switching
Capability
80
VGS = 5V
60
40
VGS = 10V
VGS = 4V
10
®
VGS = 3V
, DRAIN CURRENT (A)
D
I
20
TJ = 175oC
0
1.52.02.53.03.54.0 VGS, GATE TO SOURCE VOLTAGE (V)
TJ = -55oC
Figure 7. Transfer Charact eristics Figure 8. Saturation Characteristics
30
ID = 35A
25
20
, DRAIN TO SOURCE
ON RESISTANCE (mΩ)
15
ID = 1A
DS(ON)
r
10
246810
VGS, GATE TO SOURCE VOLTAGE (V)
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
Figure 9. Drain to So urce On Resistance vs Gate
Voltage and Drain Current
, DRAIN CURRENT (A)
D
I
20
PULSE DURATION = 80µs
0
0 0.25 0.5 0.75 1.0 1.25 1.5
VDS, DRAIN TO SOURCE VOLTAGE (V)
1.8
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
1.6
1.4
1.2
ON RESISTANCE
1.0
0.8
NORMALIZED DRAIN TO SOURCE
0.6
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
DUTY CYCLE = 0.5% MAX
TC = 25oC
VGS = 10V, ID = 35A
Figure 10. Normalized Drain to Source On
Resistance vs Junction Temperature
©2008 Fairchild Semiconductor Corporation F
DD8878 / FDU8878 Rev. A
4
5
fairchildsemi.com
www.
Page 6
FDD8878 / FDU8878 N-Channel PowerTrench
Typical Characteristics T
1.2
1.0
0.8
NORMALIZED GATE
THRESHOL D VO LTAGE
0.6
0.4
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
= 25°C unless otherwise noted
C
VGS = VDS, ID = 250µA
Figure 11. Normalized G ate Threshol d Voltage vs
Junction Temperature
2000
C
= CGS + C
1000
ISS
C
OSS
≅ C
DS
+ C
GD
GD
1.10 ID = 250µA
1.05
1.00
BREAKDOWN VOLTAGE
0.95
NORMALIZED DRAIN TO SOURCE
0.90
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
Figure 12. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
10
VDD = 15V
8
6
®
C
= C
RSS
GD
C, CAPACITANCE (pF)
100
V
= 0V, f = 1MHz
GS
50
0.1 1 10 VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 13. Capacitance vs Drain to Sour ce
Voltage
4
2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
30
0 5 10 15 20
Qg, GATE CHARGE (nC)
WAVEFORMS IN DESCENDING ORDER:
ID = 35A ID = 1A
Figure 14. Gat e Charge Waveforms for Constant
Gate Current
©2008 Fairchild Semiconductor Corporation F
DD8878 / FDU8878 Rev. A
4
6
fairchildsemi.com
www.
Page 7
Test Circuits and Waveforms
V
DS
L
VARY tP TO OBTAIN REQUIRED PEAK I
V
GS
R
AS
G
+
V
DD
-
I
AS
DUT
t
0V
P
I
AS
0.01Ω
0
Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms
V
DS
V
DD
V
Q
I
g(REF)
L
V
GS
DUT
+
V
DD
-
V
GS
0
I
g(REF)
= 1V
Q
gs2
Q
g(TH)
Q
gs
0
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms
BV
DSS
t
P
t
AV
Q
g(TOT)
DS
Q
g(5)
V
GS
VGS = 5V
gd
FDD8878 / FDU8878 N-Channel PowerTrench
V
DS
V
DD
V
= 10V
GS
®
V
GS
R
GS
V
GS
Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms
©2008 Fairchild Semiconductor Corporation F
DD8878 / FDU8878 Rev. A
4
V
DS
R
L
+
V
DD
-
V
DS
0
DUT
V
GS
10%
0
7
t
d(ON)
90%
t
ON
t
r
t
d(OFF)
t
OFF
t
f
90%
10%
10%
90%
PULSE WIDTH
50%50%
fairchildsemi.com
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Page 8
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, P application. Therefore the application’s ambient temperature, T must be reviewed to ensure that T Equation 1 mathematically represents the relationship and
(oC), and th ermal res istance R
A
is never exceeded.
JM
DM
θJA
, in an
(oC/W)
serve s as the basis for est ablis hing the rating of the part.
P
DM
TJMTA–()
----------------- ------------=
R
θJA
(EQ. 1)
125
100
C/W)
o
(
75
θJA
R
50
R
= 33.32+ 23.84/(0.268+Area) EQ.2
θJA
R
= 33.32+ 154/(1.73+Area) EQ.3
θJA
FDD8878 / FDU8878 N-Channel PowerTrench
In using surface mount devices such as the TO-252 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power d issipati on rating s. Precise d etermin ation of P comple x and influenced by many factors:
DM
is
1. Mounting pad area onto which the device is attach ed and whethe r the re is copp er on one s ide or both side s of the board.
2. The number of copper layers and the thickness of the board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air f low and board orientation.
6. For no n steady st ate applic ations, the pulse widt h, the duty cycle and the transient thermal response of the part, the boa rd and the environment they are in.
Fairchild provides thermal information to assist the designer’s preliminary application evaluation. Figure 21 defines the R copper (component side) area. This is for a horizontally
for the device as a function of the top
θJA
positi on ed FR-4 board with 1 oz c opper after 1 00 0 secon ds of stea dy st ate powe r w ith n o air flow . Th is gr aph prov ides the necessary inform ation for calc ulation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice t hermal model or manu ally utilizing the no rmalized maximum transient thermal impedance curve.
25
0.01 0.1 1 10 (0.645) (6.45) (64.5)(0.0645)
AREA, TOP COPPER AREA in2 (cm2)
Figure 21. Thermal Resistance vs Mounting
Pad Area
®
Therma l resist ances corresp onding to other co pper areas can be obtained from Figure 21 or by calculation using Equation 2 or 3. Equation 2 is used for copper area defined in inch es squ are and equ ation 3 is for area in centim eters square. The area, in square inches or square centimeters is the top copper area including the gate an d source pads.
23.84
R
R
©2008 Fairchild Semiconductor Corporation F
DD8878 / FDU8878 Rev. A
θJA
θJA
=
=
33.32
33.32
-------------------------------------+
0.268 Area+()
Area in Inches Squared
154
----------------------------------+
1.73 Area+()
Area in Centimeters Squared
4
(EQ. 2)
(EQ. 3)
8
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Page 9
PSPICE Electrical Model
.SUBCKT FDD8878 2 1 3 ; rev February 2004 Ca 12 8 8.6e-10 Cb 15 14 7.2e-10 Cin 6 8 8e-10
Dbod y 7 5 Dbody M OD Dbreak 5 11 D breakMOD Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 32.97 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1
It 8 17 1 Lgat e 1 9 5.4e- 9
Ldrain 2 5 1.0e -9 Lsou rce 3 7 2e- 9
RLgate 1 9 54 RLdr ai n 2 5 10 RLsource 3 7 20
Mmed 16 6 8 8 M m edMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD
Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 6.9e-3 Rgate 9 20 3.1 RSLC1 5 51 RSL CM OD 1e-6 RSLC2 5 50 1e3 Rsource 8 7 RsourceMOD 2.7e-3 Rvthres 22 8 RvthresMO D 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BM OD S2a 6 15 14 13 S2AM OD S2b 13 15 14 13 S2BM OD
Vbat 22 19 DC 1
GATE
1
LGATE
RLGATE
RGATE
9
CA
ESG
+
EVTEMP
+
-
18 22
20
S1A
12
13814
S1B
EGS EDS
-
13
10
6 8
+
+
RSLC2
6
S2A
13
S2B
6 8
-
-
DPLCAP
EVTHRES
+
19
8
CIN
15
CB
-
+
-
5
51
5
51
21
MSTRO
14
5 8
RSLC1
+
ESLC
­50
RDRAIN
16
8
MMED
8
DBREAK
11
+
17
EBREAK
18
-
MWEAK
RSOURCE
RBREAK
17 18
IT
RVTHRES
7
+
RVTEMP 19
-
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
FDD8878 / FDU8878 N-Channel PowerTrench
®
ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))* (P WR(V(5,51)/(1e-6*125),5))} .MODEL DbodyMOD D (IS=2.6E-12 IKF=8 N=1.01 RS=6.4e-3 TRS1=8e-4 TRS2=2e-7
+ CJO=3.4e-10 M=0.53 TT=1e -17 XTI=2) .MODEL DbreakMOD D (RS=1.4 TRS1=1e-3 TRS2=-5e-6) .MODEL DplcapMOD D (CJO=3.4e-10 IS=1e-30 N=10 M=0.39)
.MODEL Mmed MOD NM O S (VTO=1.75 KP=7 IS = 1 e-30 N=10 TO X=1 L=1u W=1u R G = 3.1 T_ABS=25) .MODEL MstroMOD NMOS (VTO=2.2 KP=100 IS=1e-30 N=10 TOX=1 L=1u W=1u T_ABS=25) .MODEL Mwe akMOD NMOS (VTO =1.45 KP=0. 03 IS=1e-30 N= 10 TO X = 1 L=1u W=1u RG=31 RS=0.1 T_ABS =25)
.MODEL RbreakMOD RES (TC1=8.3e-4 TC2=-8e-7) .MODEL Rd rai nMOD RES (TC1=1e-4 TC2=7. 5e-6) .MODEL RSLCMOD RES (TC1=9e-4 TC2=1e-6) .MODEL RsourceMOD RES (TC1=1.3e-2 TC 2=2e-6) .MODEL RvthresMOD RES (TC1=-1.7e -3 T C2=-8e-6) .MODEL RvtempMOD RES (T C1=-2.2e-3 TC2=2e-7)
.MODEL S1AMOD VSWITC H (RON =1e- 5 ROF F= 0. 1 VON=- 4. 5 VOFF =-3 .5 ) .MODEL S1BMOD VSWITC H (RON =1e- 5 ROF F= 0. 1 VON=- 3. 5 VOFF =-4 .5 ) .MODEL S2AMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= - 2 VOFF =-1 ) .MODEL S2BMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= - 1 VOFF =-2 ) .ENDS
Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Conference Rec o rds, 1991, writ ten by William J. Hepp and C. Frank Wheatley.
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©2008 Fairchild Semiconductor Corporation F
DD8878 / FDU8878 Rev. A
4
9
www.
Page 10
SABER Electrical Model
rev Februar y 2004 template FDD 8878 n2,n1,n3 =m_temp electrical n2,n1,n3 number m_temp=25 { var i iscl dp..model dbodymod = (isl=2.6e-12,ikf=8,nl=1.01,rs=6.4e-3,trs1=8e-4,trs2=2e-7,cjo=3.4e-10,m=0.53,tt=1e-17,xti=2) dp..model dbreakmod = (rs=1.4,trs1=1e-3 ,t rs 2=-5e-6) dp..model dplcapmod = (cjo=3.4e-10,isl=10e-30,nl=10,m=0.39) m..model mmedmod = (type=_n,vto=1.75,kp=7,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=2.2,kp=100,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=1.45,kp=0.03,is=1e-30, tox=1,rs=0.1) sw_vcsp.. mo del s1amod = (ron=1e-5,roff=0.1,von=-4.5, vof f =-3.5) sw_vcsp.. mo del s1bmod = (ron=1e-5,roff=0.1,von=-3.5, vof f =-4.5) sw_vcsp.. mo del s2amod = (ron=1e-5,roff=0.1,von=-2,voff=-1) sw_vcsp.. mo del s2bmod = (ron=1e-5,roff=0.1,von=-1,voff=-2) c.ca n12 n8 = 8. 6e-10 c.cb n15 n14 = 7.2e-10 c.cin n6 n8 = 8e-10
dp.dbody n7 n5 = model=dbodym od dp.dbreak n5 n11 = model=dbreakmod
ESG
dp.dplcap n10 n5 = model=dplcapmod spe.ebreak n11 n7 n17 n18 = 32.97
spe.eds n14 n8 n5 n8 = 1 spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1
GATE
1
LGATE
RLGATE
RGATE
9
EVTEMP +
18 22
20
spe.evthres n6 n21 n19 n8 = 1 spe.evtemp n20 n6 n18 n22 = 1
i.it n8 n17 = 1 l.lgate n1 n9 = 5.4e-9
l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 2e-9
CA
S1A
12
S1B
res.rlgate n1 n9 = 54 res.rldrai n n2 n5 = 10 res.rlsource n3 n7 = 20
m.mmed n16 n6 n8 n8 = m odel=mmedm od, l= 1u, w=1u, temp= m _t em p m.mstrong n16 n6 n8 n8 = model=mstrongmod, l= 1u, w=1u, temp=m _temp m.mweak n16 n21 n8 n8 = model=mwea kmod, l=1u, w=1u, te m p=m_temp
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
+
19
8
6
-
S2A
13814
13
S2B
13
+
+
6
EGS EDS
8
-
-
15
CIN
CB
-
+
-
5
MSTRO
14
5 8
RSLC1
51
ISCL
50 RDRAIN
16
21
8
MMED
8
DBREAK
11
MWEAK
EBREAK
+
RSOURCE
RBREAK
17 18
IT
RVTHRES
17 18
­7
RVTEMP 19
-
+
22
RLSOURCE
LDRAIN
RLDRAIN
DBODY
LSOURCE
VBAT
DRAIN
2
SOURCE
3
FDD8878 / FDU8878 N-Channel PowerTrench
®
res.rbreak n17 n18 = 1, tc1=8.3e- 4, tc 2=-8e-7 res.rdrain n50 n16 = 6.9e-3, tc1=1e-4,tc2=7. 5e-6 res.rgat e n9 n20 = 3. 1 res.rslc1 n5 n51 = 1e-6, tc1=9e -4, tc2=1e-6 res.rslc2 n5 n50 = 1e3 res.rsour ce n8 n7 = 2.7e-3, tc1= 1. 3e-2,tc2=2e- 6 res.rvthres n22 n8 = 1, tc1=-1.7e-3,tc2=-8e-6 res.rvtemp n18 n19 = 1, tc1=-2.2e-3,tc2=2e-7 sw_vcsp.s1 a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1 b n13 n12 n13 n8 = model = s1 bmod sw_vcsp.s2 a n6 n15 n14 n13 = model = s2 amod sw_vcsp.s2 b n13 n15 n14 n13 = model = s 2bmod
v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5 ,n 51))))*((abs (v(n5,n51)* 1e6/125))** 5)) } }
©2008 Fairchild Semiconductor Corporation F
DD8878 / FDU8878 Rev.
A4
10
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FDD8878 / FDU8878 N-Channel PowerTrench
PSPICE Thermal Model
REV 23 February 2004 FDD8878T CTHERM1 TH 6 3.5e-4
CTHERM2 6 5 5e-4 CTHERM3 5 4 2. 5e-3 CTHERM4 4 3 2. 7e-3 CTHERM5 3 2 5e-3 CTHERM6 2 TL 1e-2
RTHERM1 TH 6 2.9e-1 RTHERM2 6 5 3. 5e-1 RTHERM3 5 4 4. 5e-1 RTHERM4 4 3 5. 2e-1 RTHERM5 3 2 6. 9e-1 RTHERM6 2 TL 7e-1
SABER Thermal Model
SABER therm al m odel F DD8878T template thermal_model th tl thermal_ c th , tl { ctherm.c th erm 1 th 6 =3.5e -4 ctherm.ctherm2 6 5 =5e-4 ctherm.ctherm3 5 4 =2.5e-3 ctherm.ctherm4 4 3 =2.7e-3 ctherm.ctherm5 3 2 =5e-3 ctherm.ctherm6 2 tl =1e-2
rtherm.rtherm1 th 6 =2.9e-1 rtherm.rther m 2 6 5 =3.5e -1 rtherm.rther m 3 5 4 =4.5e -1 rtherm.rther m 4 4 3 =5.2e -1 rtherm.rther m 5 3 2 =6.9e -1 rtherm.rther m 6 2 tl =7e-1 }
RTHERM1
RTHERM2
RTHERM3
RTHERM4
RTHERM5
JUNCTION
th
CTHERM1
6
CTHERM2
5
CTHERM3
4
CTHERM4
3
CTHERM5
®
RTHERM6
2
CTHERM6
tl
CASE
©2008 Fairchild Semiconductor Corporation F
DD8878 / FDU8878 Rev. A
4
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Page 12
TRADEMARKS
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidianries, and is not intended to be an exhaustive list of all such trademarks.
®
ACEx Build it Now™ CorePLUS™ CorePOWER™ CROSSVOLT™ CTL™ Current Transfer Logic™ EcoSPARK
®
EfficentMax™ EZSWITCH™ *
™
®
®
Fairchild Fairchild Semiconductor FACT Quiet Series™
®
FACT
®
FAST FastvCore™ FlashWriter
®
*
®
* EZSWITCH™ and FlashWriter
FPS™ F-PFS™
®
FRFET Global Power Resource Green FPS™ Green FPS™ e-Series™ GTO™ IntelliMAX™ ISOPLANAR™ MegaBuck™ MICROCOUPLER™ MicroFET™ MicroPak™ MillerDrive™ MotionMax™ Motion-SPM™ OPTOLOGIC OPTOPLANAR
®
tm
®
are trademarks of System General Corporation, used under license by Fairchild Semiconductor.
®
®
PDP-SPM™ Power-SPM™ PowerTrench
SM
Programmable Active Droop™ QFET
®
®
QS™ Quiet Series™ RapidConfigure™ Saving our world 1mW at a time™ SmartMax™ SMART START™
®
SPM STEALTH™ SuperFET™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SuperMOS™
®
The Power Franchise
tm
TinyBoost™ TinyBuck™ TinyLogic
®
TINYOPTO™ TinyPower™ TinyPWM™ TinyWire™ µSerDes™
®
UHC Ultra FRFET™ UniFET™ VCX™ VisualMax™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
®
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user.
2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information Formative or In Design
This datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
This datasheet contains preliminary data; supplementary data will be pub-
Preliminary First Production
lished at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
No Identification Needed Full Production
Obsolete Not In Production
©2008 Fairchild Semiconductor Corporation F
DD8878 / FDU8878 Rev. A
4
This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design.
This datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only.
www.fairchildsemi.com
Rev. I34
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