High pe rformance trench tech nology for e xtremely low
r
DS(ON)
Low gat e ch arge
High power and current handling capability
RoHS Compliant
= 10V, ID = 35A
GS
= 4.5V, ID = 35A
GS
General Description
This N- Channe l MOSF ET has been desig ned sp ecif icall y to
improve the overall efficiency of DC/DC converters using
either synchronous or conventional switching PWM
contro llers. It ha s be en optimize d for low gate cha r ge , low
r
Drain to Sou r c e Voltage30V
Gate to Source Voltage±20V
Drain Cur re nt
Continuous (T
I
D
Continuous (T
Continuous (T
= 25oC, VGS = 10V) ( Note 1)
C
= 25oC, VGS = 4.5V) (Note 1)36A
C
= 25oC, VGS = 10V, with R
amb
= 52oC/W)11A
θJA
40A
PulsedFigure 4A
E
AS
P
D
T
, T
J
STG
Single Pulse Avalanche Energy (Note 2)25mJ
Power dissipation40W
Derate above 25
o
C0.27W/
Operating and Storage Temperature-55 to 175
Thermal Characteristics
R
θJC
R
θJA
R
θJA
Thermal Resistance Junction to Case TO-252, TO-2513.75
Thermal Resistance Junction to Ambient TO-252, TO-251100
Thermal Resistance Junction to Am bient TO-252, 1in2 copper pad ar ea52
Input Capacitance
Output Capacit ance-195-pF
Reverse Transfer Capacitance-110-pF
Gate ResistanceVGS = 0.5V, f = 1MHz -3.1-Ω
Total Gate Charge at 10VVGS = 0V to 10V
Total Gate Charge at 5VVGS = 0V to 5V-1014nC
Threshold Gate ChargeVGS = 0V to 1V-0.91.3nC
Gate to Source Gate Charg e-2.6-nC
Gate Charge Threshold to Plateau-1.7-nC
Gate to Drain “Miller” Charge-4.5-nC
= 15V, VGS = 0V,
V
DS
f = 1MHz
V
DD
I
= 35A
D
= 1.0m A
I
g
FDD8878 / FDU8878 N-Channel PowerTrench
-880- pF
-1926nC
= 15V
Switching Characteristi cs
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Ti me
Turn-On Delay Time-7-ns
Rise Time-79-ns
Turn-Off Delay Time-38-ns
Fall Time-27-ns
Turn-Off Time--97ns
(VGS = 10V)
Drain-Source Diode Character istics
V
SD
t
rr
Q
RR
Notes:
1: Package current limitation is 35A.
2: Starting TJ = 25°C, L = 65uH, IAS = 28A, VDD = 27V, VGS = 10V.
3
Source to Drain Diode Voltage
Reverse Recovery TimeISD = 35A, dISD/dt = 100A/µs- -23ns
The maximum rated junction temperature, TJM, and the
thermal resistance of the heat dissipating path determines
the maximum allowable device power dissipation, P
application. Therefore the application’s ambient
temperature, T
must be reviewed to ensure that T
Equation 1 mathematically represents the relationship and
(oC), and th ermal res istance R
A
is never exceeded.
JM
DM
θJA
, in an
(oC/W)
serve s as the basis for est ablis hing the rating of the part.
P
DM
TJMTA–()
----------------- ------------=
R
θJA
(EQ. 1)
125
100
C/W)
o
(
75
θJA
R
50
R
= 33.32+ 23.84/(0.268+Area) EQ.2
θJA
R
= 33.32+ 154/(1.73+Area) EQ.3
θJA
FDD8878 / FDU8878 N-Channel PowerTrench
In using surface mount devices such as the TO-252
package, the environment in which it is applied will have a
significant influence on the part’s current and maximum
power d issipati on rating s. Precise d etermin ation of P
comple x and influenced by many factors:
DM
is
1. Mounting pad area onto which the device is attach ed and
whethe r the re is copp er on one s ide or both side s of the
board.
2. The number of copper layers and the thickness of the
board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air f low and board orientation.
6. For no n steady st ate applic ations, the pulse widt h, the
duty cycle and the transient thermal response of the part,
the boa rd and the environment they are in.
Fairchild provides thermal information to assist the
designer’s preliminary application evaluation. Figure 21
defines the R
copper (component side) area. This is for a horizontally
for the device as a function of the top
θJA
positi on ed FR-4 board with 1 oz c opper after 1 00 0 secon ds
of stea dy st ate powe r w ith n o air flow . Th is gr aph prov ides
the necessary inform ation for calc ulation of the steady state
junction temperature or power dissipation. Pulse
applications can be evaluated using the Fairchild device
Spice t hermal model or manu ally utilizing the no rmalized
maximum transient thermal impedance curve.
25
0.010.1110
(0.645)(6.45)(64.5)(0.0645)
AREA, TOP COPPER AREA in2 (cm2)
Figure 21. Thermal Resistance vs Mounting
Pad Area
®
MOSFET
Therma l resist ances corresp onding to other co pper areas
can be obtained from Figure 21 or by calculation using
Equation 2 or 3. Equation 2 is used for copper area defined
in inch es squ are and equ ation 3 is for area in centim eters
square. The area, in square inches or square centimeters is
the top copper area including the gate an d source pads.
+ CJO=3.4e-10 M=0.53 TT=1e -17 XTI=2)
.MODEL DbreakMOD D (RS=1.4 TRS1=1e-3 TRS2=-5e-6)
.MODEL DplcapMOD D (CJO=3.4e-10 IS=1e-30 N=10 M=0.39)
.MODEL Mmed MOD NM O S (VTO=1.75 KP=7 IS = 1 e-30 N=10 TO X=1 L=1u W=1u R G = 3.1 T_ABS=25)
.MODEL MstroMOD NMOS (VTO=2.2 KP=100 IS=1e-30 N=10 TOX=1 L=1u W=1u T_ABS=25)
.MODEL Mwe akMOD NMOS (VTO =1.45 KP=0. 03 IS=1e-30 N= 10 TO X = 1 L=1u W=1u RG=31 RS=0.1 T_ABS =25)
.MODEL RbreakMOD RES (TC1=8.3e-4 TC2=-8e-7)
.MODEL Rd rai nMOD RES (TC1=1e-4 TC2=7. 5e-6)
.MODEL RSLCMOD RES (TC1=9e-4 TC2=1e-6)
.MODEL RsourceMOD RES (TC1=1.3e-2 TC 2=2e-6)
.MODEL RvthresMOD RES (TC1=-1.7e -3 T C2=-8e-6)
.MODEL RvtempMOD RES (T C1=-2.2e-3 TC2=2e-7)
Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Conference Rec o rds, 1991, writ ten by William J. Hepp and C. Frank
Wheatley.
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global
subsidianries, and is not intended to be an exhaustive list of all such trademarks.
®
ACEx
Build it Now™
CorePLUS™
CorePOWER™
CROSSVOLT™
CTL™
Current Transfer Logic™
EcoSPARK
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS
HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE
APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER
ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S
WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
®
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR
SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which,
(a) are intended for surgical implant into the body or (b)
support or sustain life, and (c) whose failure to perform when
properly used in accordance with instructions for use provided
in the labeling, can be reasonably expected to result in a
significant injury of the user.
2. A critical component in any component of a life support,
device, or system whose failure to perform can be reasonably
expected to cause the failure of the life support device or
system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance InformationFormative or In Design
This datasheet contains the design specifications for product development.
Specifications may change in any manner without notice.
This datasheet contains preliminary data; supplementary data will be pub-
PreliminaryFirst Production
lished at a later date. Fairchild Semiconductor reserves the right to make
changes at any time without notice to improve design.
This datasheet contains final specifications. Fairchild Semiconductor reserves
the right to make changes at any time without notice to improve the design.
This datasheet contains specifications on a product that is discontinued by
Fairchild Semiconductor. The datasheet is for reference information only.
www.fairchildsemi.com
Rev. I34
Page 13
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