*Drain current limited by maximum junction temperature
= 0.6Ω ( Typ. )@ VGS = 10V, ID = 2.3A
DS(on)
( Typ. 6.3pF )
rss
= 25oC unless otherwise noted*
C
SymbolParameterRatingsUnits
Drain to Source Voltage200V
Gate to Source Voltage±30V
-Continuous (T
-Continuous (T
(T
= 25oC)40W
C
- Derate above 25
STG
D r a i n C u r r e n t
D r a i n C u r r e n t - P u l s e d (Note 1)18A
Single Pulsed Avalanche Energy (Note 2)60mJ
Avalanche Current (Note 1)4.5A
Repetitive Avalanche Energy (Note 1)4.0mJ
Power Dissipation
Operating and Storage Temperature Range-55 to +150
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
Description
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary, planar
stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the avalanche
and commutation mode. These devices are well suited for high
efficient switched mode power supplies and active power factor
correction.
Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation
vs. Temperature vs. Temperature
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current
vs. Case Temperature
FDD6N20 / FDU6N20 N-Channel MOSFET
Figure 11. Transient Thermal Response Curve
FDD6N20 / FDU6N20 Rev. A
4
www.fairchildsemi.com
Page 5
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
FDD6N20 / FDU6N20 N-Channel MOSFET
FDD6N20 / FDU6N20 Rev. A
5
www.fairchildsemi.com
Page 6
DUT
V
DS
+
_
Driver
R
G
Sam e Type
as DU T
V
GS
• dv/dt controlled by R
G
•ISDcontrolled by pulse period
V
DD
L
I
SD
10V
V
GS
( D riv e r )
I
SD
( D U T )
V
DS
( DUT )
V
DD
Body D iode
Forw ard Voltage D rop
V
SD
IFM, B ody Diode Forw ard C urrent
Body D iode R everse Current
I
RM
Body D iode R ecovery dv/dt
di/dt
D =
G ate P ulse W idth
Gate Pulse Period
--------------------------
DUT
V
DS
+
_
Driver
R
G
Sam e Type
as DU T
V
GS
• dv/dt controlled by R
G
•ISDcontrolled by pulse period
V
DD
LL
I
SD
10V
V
GS
( D riv e r )
I
SD
( D U T )
V
DS
( DUT )
V
DD
Body D iode
Forw ard V oltage Drop
V
SD
IFM, B ody Diode Forw ard C urrent
Body D iode R everse Current
I
RM
Body D iode R ecovery dv/dt
di/dt
D =
G ate P ulse W idth
Gate Pulse Period
--------------------------
D =
G ate P ulse W idth
Gate Pulse Period
--------------------------
FDD6N20 / FDU6N20 N-Channel MOSFET
Peak Diode Recovery dv/dt Test Circuit & Waveforms
FDD6N20 / FDU6N20 Rev. A
6
www.fairchildsemi.com
Page 7
Mechanical Dimensions
D-PAK
FDD6N20 / FDU6N20 N-Channel MOSFET
FDD6N20 / FDU6N20 Rev. A
7
www.fairchildsemi.com
Page 8
Mechanical Dimensions
I-PAK
FDD6N20 / FDU6N20 N-Channel MOSFET
FDD6N20 / FDU6N20 Rev. A
www.fairchildsemi.com8
Page 9
TRADEMARKS
tm
tm
The following are registered and unregistered trademarks and service marks Fairchild Semiconductor owns or is authorized to use
and is not intended to be an exhaustive list of all such trademarks.
®
ACEx
Build it Now™
CorePLUS™
CROSSVOLT™
CTL™
Current Transfer Logic™
EcoSPARK
FACT Quiet Series™
FACT
FAST
SyncFET™
The Power Franchise
™
TinyBoost™
TinyBuck™
TinyLogic
®
TINYOPTO™
TinyPower™
TinyPWM™
TinyWire™
µSerDes™
®
UHC
UniFET™
VCX™
®
FDD6N20 / FDU6N20 N-Channel MOSFET
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO
IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE
OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE
RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS,
SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT
THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which,
(a) are intended for surgical implant into the body or (b) support
or sustain life, and (c) whose failure to perform when properly
used in accordance with instructions for use provided in the
labeling, can be reasonably expected to result in a significant
injury of the user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
2. A critical component in any component of a life support,
device, or system whose failure to perform can be reasonably
expected to cause the failure of the life support device or system,
or to affect its safety or effectiveness.
Datasheet IdentificationProduct StatusDefinition
Advance InformationFormative or In DesignThis datasheet contains the design specifications for product
development. Specifications may change in any manner without notice.
PreliminaryFirst ProductionThis datasheet contains preliminary data; supplementary data will be
published at a later date. Fairchild Semiconductor reserves the right to
make changes at any time without notice to improve design.
No Identification NeededFull ProductionThis datasheet contains final specifications. Fairchild Semiconductor
reserves the right to make changes at any time without notice to
improve design.
ObsoleteNot In ProductionThis datasheet contains specifications on a product that has been dis-
continued by Fairchild Semiconductor.The datasheet is printed for reference information only.
Rev. I28
FDD6N20 / FDU6N20 Rev. A
www.fairchildsemi.com9
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