Datasheet FDD306P Datasheet (Fairchild)

Page 1
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±
° C
θ
°
θ
°
θ
°
FDD306P P-Channel 1.8V Specified PowerTrench
January 2005
FDD306P P-Channel 1.8V Specified PowerTrench
®
MOSFET
Features
–6.7 A, –12 V. R R
Fast switching speed
High performance trench technology for extremely low R
DS(ON)
High power and current handling capability
G
Absolute Maximum Ratings
DS(ON)
DS(ON)
R
DS(ON)
S
= 28 m Ω @ V = 41 m Ω @ V = 90 m Ω @ V
D
TO-252
= –4.5 V
GS
= –2.5 V
GS
= –1.8 V
GS
T
=25°C unless otherwise noted
A
Applications
DC/DC converter
General Description
This P-Channel 1.8V Specified MOSFET uses Fairchild’s advanced low voltage PowerTrench process. It has been opti­mized for battery power management.
S
G
D
Symbol Parameter Ratings Units
V
DSS
V
GSS
I
D
P
D
T
, T
J
STG
Thermal Characteristics
R
JC
R
JA
R
JA
Drain-Source Voltage –12 V
Gate-Source Voltage
Drain Current – Continuous (Note 3) –6.7 A
– Pulsed (Note 1a) –54
Power Dissipation for Single Operation (Note 1) 52 W
(Note 1a) 3.8
(Note 1b) 1.6
Operating and Storage Junction Temperature Range –55 to +175
Thermal Resistance, Junction-to-Case (Note 1) 2.9
Thermal Resistance, Junction-to-Ambient (Note 1a) 40
Thermal Resistance, Junction-to-Ambient (Note 1b) 96
8V
C/W
C/W
C/W
®
MOSFET
Package Marking and Ordering Information
Device Marking Device Reel Size Tape width Quantity
FDD306P FDD306P 13’’ 12mm 2500 units
©2005 Fairchild Semiconductor Corporation
FDD306P Rev. C
1
www.fairchildsemi.com
Page 2
θ
θ
θ
∆
µ
±
∆
T
Electrical Characteristics
= 25°C unless otherwise noted
A
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
DSS
BV
∆ T
I
DSS
I
GSSF
On Characteristics (Note 2)
V
GS(th)
V
GS(th)
∆ T
R
DS(on)
I
D(on)
g
FS
Dynamic Characteristics
C
iss
C
oss
C
rss
R
G
Switching Characteristics (Note 2)
t
d(on)
t
r
t
d(off)
t
f
Q
g
Q
gs
Q
gd
Drain–Source Diode Characteristics and Maximum Ratings
I
S
V
SD
Tr r Diode Reverse Recovery Time IF = –6.7 A,
Irm Diode Reverse Recovery Current 0.9 A
Qrr Diode Reverse Recovery Charge 17 nC
Notes:
1. R R
Drain–Source Breakdown Voltage V
Breakdown Voltage Temperature Coefficient I
DSS
J
Zero Gate Voltage Drain Current V
Gate–Body Leakage V
Gate Threshold Voltage V
Gate Threshold Voltage Temperature Coefficient
J
Static Drain–Source On–Resistance
On–State Drain Current V
Forward Transconductance V
Input Capacitance V
Output Capacitance 590 pF
= 0 V, I
GS
= –250 µ A, Referenced to 25 ° C –0.6 mV/ ° C
D
= –10 V, V
DS
= ± 8V, V
GS
= V
DS
I
= –250 µ A, Referenced to 25 ° C 2.2 mV/ ° C
D
V
= –4.5 V, I
GS
V
= –2.5 V, I
GS
V
= –1.8 V, I
GS
V
= –4.5 V, I
GS
= –4.5 V, V
GS
= –5 V, I
DS
= –6 V, V
DS
f = 1.0 MHz
= –250 µ A –12 V
D
= 0 V –1
GS
= 0 V
DS
, I
= –250 µ A –0.4 –0.5 –1.5 V
GS
D
= –6.7 A
D
= –6.1 A
D
= –4.8 A
D
= –6.7A, T
D
= –5 V –45 A
DS
= –6.7 A 22 S
D
= 0 V,
GS
= 125 ° C
J
21 29 42 25
1290 pF
100 nA
28 41 90
m Ω
Reverse Transfer Capacitance 430 pF
Gate Resistance V
Tu r n–On Delay Time V
Tu r n–On Rise Time 816ns
= 15 mV, f = 1.0 MHz 4.2
GS
= –6 V, I
DD
V
= –4.5 V, R
GS
= –1 A,
D
GEN
= 6 Ω
16 29 ns
Tu r n–Off Delay Time 34 54 ns
Tu r n–Off Fall Time 41 65 ns
Total Gate Charge V
Gate–Source Charge 2.0 nC
DS
V
GS
= –6V, I = –4.5 V
= –6.7 A,
D
15 21 nC
Gate–Drain Charge 4.4 nC
Maximum Continuous Drain–Source Diode Forward Current –3.2 A
Drain–Source Diode Forward Voltage VGS = 0 V, IS = –3.2 A (Note 2) –0.8 –1.2 V
37 ns
diF/dt = 100 A/µs (Note 3)
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins.
JA
is guaranteed by design while R
JC
is determined by the user's board design.
CA
a) R
= 40°C/W when mounted
θJA
2
pad of 2 oz copper
on a 1in
b) R
= 96°C/W when mounted on a
θJA
minimum pad.
Ω
FDD306P P-Channel 1.8V Specified PowerTrench
A
®
MOSFET
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width < 300 µ s, Duty Cycle < 2.0%
3. Maximum current is calculated as: where P
4. Starting T
= 25°C, L = TBD, I
J
AS
= -6.7A
P
-----------------------­R
DS ON()
FDD306P Rev. C
is maximum power dissipation at T
D
D
2
= 25°C and R
C
DS(on)
is at T
J(max)
and V
GS
= 10V.
www.fairchildsemi.com
Page 3
Typical Characteristics
FDD306P P-Channel 1.8V Specified PowerTrench
54
VGS = -4.5V
-3.5V
-3.0V
45
-4.0V
36
-2.5V
27
18
, DRAIN CURRENT (A)
D
-I
9
-2.0V
-1.8V
0
01234
-VDS, DRAIN-SOURCE VOLTAGE (V)
Figure 1. On-Region Characteristics. Figure 2. On-Resistance Variation with
1.4
ID = -6.7A
= -4.5V
V
GS
1.3
1.2
1.1
, NORMALIZED
1
DS(ON)
R
0.9
DRAIN-SOURCE ON-RESISTANCE
0.8
-50 -25 0 25 50 75 100 125 150 175
TJ, JUNCTION TEMPERATURE (°C)
2.5
VGS = -1.8V
2
1.5
, NORMALIZED
DS(ON)
R
1
DRAIN-SOURCE ON-RESISTANCE
-2.0V
-2.5V
-3.0V
-3.5V
-4.5V
0.5 091827 36 45 54
-ID, DRAIN CURRENT (A)
Drain Current and Gate Voltage.
0.1
ID = -3.4A
0.08
0.06
0.04
, ON-RESISTANCE (OHM)
TA = 25°C
0.02
DS(ON)
R
0
0246810
TA = 125°C
-VGS, GATE TO SOURCE VOLTAGE (V)
®
MOSFET
Figure 3. On-Resistance Variation
withTemperature.
54
VDS = - 5V
45
36
27
18
, DRAIN CURRENT (A)
D
-I
9
0
01234
-VGS, GATE TO SOURCE VOLTAGE (V)
TA = -55°C
125°C
25°C
Figure 5. Transfer Characteristics. Figure 6. Body Diode Forward Voltage Variation
Figure 4. On-Resistance Variation with
Gate-to-Source Voltage.
100
VGS = 0V
10
1
0.1
0.01
0.001
, REVERSE DRAIN CURRENT (A)
S
-I
0.0001
TA = 125°C
25°C
-55°C
0 0.2 0.4 0.6 0.8 1 1.2
-VSD, BODY DIODE FORWARD VOLTAGE (V)
with Source Current and Temperature.
FDD306P Rev. C
3 www.fairchildsemi.com
Page 4
Typical Characteristics
FDD306P P-Channel 1.8V Specified PowerTrench
5
ID = -6.7A
4
V
= -4V
DS
-8V
3
-6V
2
, GATE-SOURCE VOLTAGE (V)
1
GS
-V
0
0481216 20
Qg, GATE CHARGE (nC)
Figure 7. Gate Charge Characteristics. Figure 8. Capacitance Characteristics.
1000
100
R
LIMIT
DS(ON)
DC
10s
100ms
1s
10
1
0.1
VGS =-4.5V
SINGLE PULSE
= 96oC/W
R
θ
JA
T
= 25oC
A
, DRAIN CURRENT (A)
D
-I
0.01
0.1 1 10 100
-VDS, DRAIN-SOURCE VOLTAGE (V)
10ms
1ms
2400
2000
f = 1MHz
= 0 V
V
GS
1600
C
iss
1200
C
800
CAPACITANCE (pF)
400
C
rss
oss
0
036912
-VDS, DRAIN TO SOURCE VOLTAGE (V)
20
15
SINGLE PULSE
= 96°C/W
R
θ
JA
= 25°C
T
A
10
5
P(pk), PEAK TRANSIENT POWER (W)
0
0.001 0.01 0.1 1 10 100 1000
t1, TIME (sec)
®
MOSFET
Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse Maximum
Power Dissipation.
1
D = 0.5
R
(t) = r(t) * R
θ
0.2
0.1
0.1
0.05
0.02
0.01
r(t), NORMALIZED EFFECTIVE
0.001
TRANSIENT THERMAL RESISTANCE
0.0001 0.001 0.01 0.1 1 10 100 1000
0.01
SINGLE PULSE
JA
R
θ
= 96 °C/W
JA
P(pk)
t
1
t
2
- TA = P * R
T
J
Duty Cycle, D = t
t1, TIME (sec)
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c. Transient thermal response will change depending on the circuit board design.
θ
JA
θ
(t)
JA
1 /t2
FDD306P Rev. C
4 www.fairchildsemi.com
Page 5
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks.
ACEx™ ActiveArray™ Bottomless™
FPS™
CoolFET™
CROSSVOLT
™ DOME™ EcoSPARK™
2
E
CMOS™ EnSigna™ FACT™ FACT Quiet Series™
Across the board. Around the world.™ The Power Franchise Programmable Active Droop™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT
CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAST FASTr™
LittleFET™ FRFET™ GlobalOptoisolator™ GTO™ HiSeC™
2
I
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i-Lo
™
ImpliedDisconnect™
IntelliMAX™ ISOPLANAR™
MICROCOUPLER™ MicroFET™ MicroPak™ MICROWIRE™ MSX™ MSXPro™ OCX™ OCXPro™ OPTOLOGIC
OPTOPLANAR™ PACMAN™
POP™ Power247™ PowerEdge™ PowerSaver™ PowerTrench
QFET
QS™ QT Optoelectronics™ Quiet Series™ RapidConfigure™ RapidConnect™ µSerDes™ SILENT SWITCHER SMART START™
SPM™ Stealth™ SuperFET™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SyncFET™ TinyLogic TINYOPTO™ TruTranslation™ UHC™ UltraFET
UniFET™ VCX™
FDD306P P-Channel 1.8V Specified PowerTrench
®
MOSFET
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification Product Status Definition
Advance Information
Preliminary
No Identification Needed
Formative or In Design
First Production
Full Production
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Obsolete
FDD306P Rev. C
Not In Production
This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
Rev. I15
5 www.fairchildsemi.com
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