Drain–Source Diode Characteristics and Maximum Ratings
I
S
V
SD
Tr rDiode Reverse Recovery TimeIF = –6.7 A,
IrmDiode Reverse Recovery Current0.9A
QrrDiode Reverse Recovery Charge17nC
Notes:
1. R
R
Drain–Source Breakdown Voltage V
Breakdown Voltage Temperature Coefficient I
DSS
J
Zero Gate Voltage Drain CurrentV
Gate–Body LeakageV
Gate Threshold Voltage V
Gate Threshold Voltage
Temperature Coefficient
J
Static Drain–Source
On–Resistance
On–State Drain CurrentV
Forward TransconductanceV
Input CapacitanceV
Output Capacitance590pF
= 0 V, I
GS
= –250 µ A, Referenced to 25 ° C–0.6mV/ ° C
D
= –10 V, V
DS
= ± 8V, V
GS
= V
DS
I
= –250 µ A, Referenced to 25 ° C2.2mV/ ° C
D
V
= –4.5 V, I
GS
V
= –2.5 V, I
GS
V
= –1.8 V, I
GS
V
= –4.5 V, I
GS
= –4.5 V, V
GS
= –5 V, I
DS
= –6 V, V
DS
f = 1.0 MHz
= –250 µ A–12V
D
= 0 V–1
GS
= 0 V
DS
, I
= –250 µ A–0.4–0.5–1.5V
GS
D
= –6.7 A
D
= –6.1 A
D
= –4.8 A
D
= –6.7A, T
D
= –5 V–45A
DS
= –6.7 A22S
D
= 0 V,
GS
= 125 ° C
J
21
29
42
25
1290pF
100nA
28
41
90
m Ω
Reverse Transfer Capacitance430pF
Gate ResistanceV
Tu r n–On Delay TimeV
Tu r n–On Rise Time816ns
= 15 mV, f = 1.0 MHz4.2
GS
= –6 V, I
DD
V
= –4.5 V, R
GS
= –1 A,
D
GEN
= 6 Ω
1629ns
Tu r n–Off Delay Time3454ns
Tu r n–Off Fall Time4165ns
Total Gate ChargeV
Gate–Source Charge2.0nC
DS
V
GS
= –6V, I
= –4.5 V
= –6.7 A,
D
1521nC
Gate–Drain Charge4.4nC
Maximum Continuous Drain–Source Diode Forward Current–3.2A
Drain–Source Diode Forward VoltageVGS = 0 V, IS = –3.2 A (Note 2)–0.8–1.2V
37ns
diF/dt = 100 A/µs (Note 3)
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins.
Figure 9. Maximum Safe Operating Area.Figure 10. Single Pulse Maximum
Power Dissipation.
1
D = 0.5
R
(t) = r(t) * R
θ
0.2
0.1
0.1
0.05
0.02
0.01
r(t), NORMALIZED EFFECTIVE
0.001
TRANSIENT THERMAL RESISTANCE
0.00010.0010.010.11101001000
0.01
SINGLE PULSE
JA
R
θ
= 96 °C/W
JA
P(pk)
t
1
t
2
- TA = P * R
T
J
Duty Cycle, D = t
t1, TIME (sec)
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c.
Transient thermal response will change depending on the circuit board design.
θ
JA
θ
(t)
JA
1 /t2
FDD306P Rev. C
4www.fairchildsemi.com
Page 5
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systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Formative or
In Design
First Production
Full Production
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
FDD306P Rev. C
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I15
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