Datasheet FDD2582 Datasheet (Fairchild)

Page 1
FDD2582
N-Channel PowerTrench® MOSFET 150V, 21A, 66mΩ
FDD2582
September 2002
Features
•r
•Q
• Low Miller Charge
•Low Q
• UIS Capability (Single Pulse and Repetitive Pulse)
• Qualified to AEC Q101
Formerly developmental type 82855
= 58mΩ (Typ.), V
DS(ON)
(tot) = 19nC (Typ.), V
g
Body Diode
RR
= 10V, ID = 7A
GS
= 10V
GS
Applications
• DC/DC converters and Off-Line UPS
• Distributed Pow er Architectures and VRMs
• Primary Switch for 24V and 48V Systems
• High Voltage Synchronous Re ctifier
• Direct Injection / Diesel Injection System
• 42V Automotive Lo ad Control
• Electronic Valve T rain System
DRAIN
(FLANGE)
GATE
SOURCE
TO-252AA
FDD SERIES
MOSFET Maximum Ratings T
= 25°C unless otherwise noted
C
D
G
S
Symbol Parameter Ratings Units
V
DSS
V
GS
Drain to Source Voltage 150 V Gate to Source Voltage ±20 V Drain Curr e nt
I
D
Continuous (T Continuous (T Continuous (T
= 25 oC, VGS = 10V)
C
= 100 oC, VGS = 10V) 15
C
= 25oC, VGS = 10V, R
amb
= 52oC/W) 3.7 A
θJA
21 A
Pulsed Figure 4 A
E
AS
P
D
, T
T
J
STG
Single Pulse Avalanche Energy (Note 1) 59 mJ Power dissipation 95 W
o
Derate above 25
C0.63W/
Operating and Storage Temperature -55 to 175
o
C
o
C
Thermal Characteristi cs
R
θJC
R
θJA
R
θJA
This product ha s been des igned to me et the e xtr eme test c ondit ions and envir onment deman ded by the automot ive indus t ry. For a
All Fairchild Semiconductor prod ucts are manufactured, assembled and tested under ISO9000 and QS9000 quality systems
©2002 Fairchild Semiconductor Corporation
Thermal Resistance Junction to Case TO-252 1.58 Thermal Resistance Junction to Ambient TO-252 100 Thermal Resistance Junction to Ambient TO-252, 1in2 copper pad ar ea 52
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.
certification.
FDD2582 Rev. B
o
C/W
o
C/W
o
C/W
Page 2
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDD2582 FDD2582 TO-252AA 330mm 16mm 2500 units
FDD2582
Electrical Characteristics
TC = 25°C unless otherwise noted
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
B I
DSS
I
GSS
VDSS
Drain t o Source Breakdown Volta ge ID = 250µA, VGS = 0V 150 - - V
V
= 120V - - 1
Zero Gate Voltage Drain Current
DS
= 0V TC = 150oC- - 250
V
GS
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA2-4V
I
Drain to Source On Resistance
= 7A, V
D
I
= 4A, VGS = 6V, - 0.066 0.099
D
I
= 7A, V
D
T
= 175oC
C
= 10V - 0.058 0.066
GS
= 10V,
GS
- 0.151 0.172
Dynamic Characteristics
C C C Q Q Q Q Q
ISS OSS RSS
g(TOT) g(TH) gs gs2 gd
Input Capacitance Output Capacitance - 145 - pF Reverse Transfer Capacitance - 30 - pF
= 25V, VGS = 0V,
V
DS
f = 1MHz
Total G ate Ch arg e at 10 V VGS = 0V to 10V Threshold Gate Charge VGS = 0V to 2V - 2.4 3.2 nC Gate to Source Gate Charge - 6.2 - nC Gate Charge Threshold to Plateau - 3.8 - nC
V
DD
I
= 7A
D
I
= 1.0m A
g
= 75V
Gate to Drain “Miller” Charge - 4.2 - nC
-1295- pF
-1925nC
µA
Ω
Resistive Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time Turn-On Delay Time - 8 - ns Rise Time - 19 - ns T u rn-Off Delay Time - 32 - ns Fall Time - 19 - ns Turn-Off Time - - 77 ns
(VGS = 10V)
V
DD
V
GS
--41ns
= 75V, ID = 7A = 10V, RGS = 16Ω
Drain-Source Diode Characteristics
I
= 7A - - 1 .25 V
V
SD
t
rr
Q
RR
Notes: 1: Starting T
©2002 Fairchild Semiconductor Corporation FDD2582 Rev. B
Source to Drain Di ode Voltage Reverse Recovery Time ISD = 7A, dISD/dt = 100A/µs- -67ns
Reverse Recovered Charge ISD = 7A, dISD/dt = 100A/µs - - 134 nC
= 25°C, L = 1.17 mH, IAS = 10A.
J
SD
= 4A - - 1.0 V
I
SD
Page 3
FDD2582
Typical Characteristics T
= 25°C unless otherwise noted
C
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0255075100 175
125
TC, CASE TEMPERATURE (oC)
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2
DUTY CYCLE - DESCENDING ORDER
0.5
1
0.2
0.1
0.05
0.02
0.01
150
25
V
= 10V
GS
20
15
10
, DRAIN CURRENT (A)
D
I
5
0
25 50 75 100 125 150 175
TC, CASE TEMPERATURE (oC)
Figure 2. Maximum Continuous Drain Curr ent vs
Case Temperature
P
θJC
DM
t
1
t
2
1/t2
x R
+ T
θJC
C
0
10
1
10
0.1
, NORMALIZED
θJC
Z
THERMAL IMPEDANCE
NOTES: DUTY FACTOR: D = t
PEAK TJ = PDM x Z
-1
10
0.01
SINGLE PULSE
-5
10
-4
10
-3
10
-2
10
t, RECTANGULAR PULSE DURATION (s)
Figure 3. Normalized Maximum Transient Thermal Impedance
300
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
100
VGS = 10V
, PEAK CURRENT (A)
DM
I
20
-5
10
-4
10
-3
10
-2
10
-1
10
t, PUL SE WIDTH (s)
TC = 25oC FOR TEMPERATURES
o
ABOVE 25
C DERATE PEAK
CURRENT AS FOLLOWS:
175 - T
I = I
25
10
C
150
0
1
10
Figure 4. Peak Current Capability
©2002 Fairchild Semiconductor Corporation FDD2582 Rev. B
Page 4
Typical Characteristics T
= 25°C unless otherwise noted
C
FDD2582
200 100
10
OPERATION IN THIS
AREA MAY BE
LIMITED BY r
1
, DRAIN CURRENT (A)
D
I
SINGLE PULSE TJ = MAX RATED
T
= 25oC
C
0.1 110
DS(ON)
VDS, DRAIN TO SOURCE VOLTAGE (V)
10µs
100µs
1ms
10ms
DC
100
Figure 5. Forward Bias Safe Operating Area
50
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
V
40
30
20
, DRAIN CURRENT (A)
D
I
10
= 15V
DD
TJ = 25oC
TJ = 175oC
TJ = -55oC
100
If R = 0
300
tAV = (L)(IAS)/(1.3*RATED BV If R ≠ 0
t
= (L/R)ln[(IAS*R)/(1.3*RATED BV
AV
10
, AVALANCHE CURRENT (A)
AS
I
1
0.001 0 .01 0.1 1
ST ARTING TJ = 150oC
tAV, TIME IN AVALANCHE (ms)
- VDD)
DSS
DSS
STARTING TJ = 25oC
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
Figure 6. Unclamped Inductive Switching
Capability
50
VGS = 10V
PULSE DURATION = 80µs
40
DUTY CYCLE = 0.5% MAX
TC = 25oC
30
20
, DRAIN CURRENT (A)
D
I
10
- VDD) +1]
10
VGS = 7V
VGS = 6V
VGS = 5V
0
3.5 4.0 4.5 5.0 5.5 6.0 6.5 7.0 VGS, GATE TO SOURCE VOLTAGE (V)
0
012345
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 7. Transfer Characteristics Figure 8. Saturation Characteristics
90
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
80
VGS = 6V
70
60
DRAIN TO SOURCE ON RESISTANCE (m Ω)
50
VGS = 10V
0 5 10 15 20 25
I
, DRAIN CURRENT (A)
D
Figure 9. Drain to So urce On Resistanc e v s Drai n
Current
©2002 Fairchild Semiconductor Corporation FDD2582 Rev. B
3.0
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
2.5
2.0
1.5
ON RESISTANCE
1.0
NORMALIZED DRAIN TO SOURCE
0.5
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
VGS = 10V, ID = 21A
Figure 10. Normalized Drain to Source On
Resistance vs Junction Temperature
Page 5
FDD2582
Typical Characteristics T
1.2
1.0
0.8
NORMALIZED GATE
THRESHOLD VOLTAGE
0.6
0.4
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
= 25°C unless otherwise noted
C
VGS = VDS, ID = 250µA
Figure 11. Normalized G ate Threshol d Voltage vs
Junction Temperatur e
2000
1000
C
≅ C
+ C
OSS
DS
GD
C
ISS
= CGS + C
GD
1.2
ID = 250µA
1.1
1.0
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.9
-80 -40 0 40 80 120 160 200 T
, JUNCTION TEMPERATURE (oC)
J
Figure 12. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
10
VDD = 75V
8
6
C
= C
RSS
100
C, CAPACITANCE (pF)
V
10
0.1 1 10 150
GD
= 0V, f = 1MHz
GS
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 13. Capacitance vs Drain to Sour ce
Voltage
4
, GATE TO SOURCE VOLTAGE (V)
2
GS
V
0
0 5 10 15 20
Qg, GATE CHARGE (nC)
WAVEFORMS IN DESCENDING ORDER:
ID = 21A I
= 7A
D
Figure 14. Gat e Charge Waveforms for Constant
Gate Currents
©2002 Fairchild Semiconductor Corporation FDD2582 Rev. B
Page 6
Test Circuits and Waveforms
FDD2582
BV
DSS
t
P
V
DS
TO OBTAIN
VARY t
P
REQUIRED PEAK I
V
GS
V
DS
L
I
AS
R
AS
G
+
V
DD
-
DUT
t
0V
P
I
AS
0.01Ω
0
t
AV
Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Wavef orm s
V
I
g(REF)
DS
L
V
GS
+
V
DD
-
DUT
V
DD
V
GS
V
= 2V
GS
Q
0
Q
g(TH)
I
g(REF)
gs2
Q
gs
Q
g(TOT)
V
DS
Q
gd
0
V
DD
V
= 10V
GS
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms
V
DS
R
L
V
GS
R
GS
V
GS
DUT
+
V
DD
-
V
DS
0
V
GS
10%
0
t
d(ON)
90%
t
ON
t
r
t
d(OFF)
t
OFF
t
f
90%
10%
10%
90%
PULSE WIDTH
50%50%
Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms
©2002 Fairchild Semiconductor Corporation FDD2582 Rev. B
Page 7
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maxi mum al lowab le de vice p ower di ssip ation, P application. Therefore the application’s ambient temperature, T must be reviewed to ensure that T Equation 1 mathematically represents the relationship and
(oC), and th ermal res istance R
A
is never exceeded.
JM
DM
θJA
, in an
(oC/W)
serve s as the basis for establ ishing the rating of the part.
P
DM
TJMTA–()
----------------- ------------=
R
θJA
(EQ. 1)
125
100
C/W)
o
(
75
θJA
R
50
R
= 33.32+ 23.84/(0.268+Area) EQ.2
θJA
R
= 33.32+ 154/(1.73+Area) EQ.3
θJA
FDD2582
In using surface mount devices such as the TO-252 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power d issipati on rating s. Precise d etermin ation of P comple x and influenced by many factors:
DM
is
1. Mou nting pad area ont o which the device is attached and whet her the re is copp er on one s ide or both side s of the board.
2. The number of copper layers and the thickness of the board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For no n steady state applic ations, th e pulse widt h, the duty cycle and the transient thermal response of the part, the boa rd and the environment they are in.
Fairchild provides thermal information to assist the designer’s preliminary application evaluation. Figure 21 defines the R copper (component side) area. This is for a horizontally
for the device as a function of the top
θJA
positi on ed FR-4 board w i th 1 oz c opper af ter 100 0 se c on ds of stea dy st ate pow er w ith n o air flow . Th is gr aph prov ides the necessary inf ormation for calculation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice t hermal model or manually u tilizing the normalized maximum transient thermal impedance curve.
25
0.01 0.1 1 10 (0.645) (6.45) (64.5)(0.0645)
AREA, TOP COPPER AREA in2 (cm2)
Figure 21. Thermal Resistance vs Mounting
Pad Area
Therma l resi stances correspondi ng to other copper areas can be obtained from Figure 21 or by calculation using Equation 2 or 3. Equation 2 is used for copper area defined in inch es squ are and equ ation 3 is for area in cent imeters square. The area, in square inches or square centimeters is the top copper area including the gate and source pads.
23.84
-------------------------------------+
33.32
=
R
θJA
33.32
=
R
θJA
©2002 Fairchild Semiconductor Corporation FDD2582 Rev. B
0.268 Area+()
Area in Inches Squared
154
----------------------------------+
1.73 Area+()
Area in Centimeters Squared
(EQ. 2)
(EQ. 3)
Page 8
PSPICE Electrical Model
.SUBCKT FDD2582 2 1 3 ; rev July 2002 Ca 12 8 4e-10 Cb 15 14 4.6e-10 Cin 6 8 1.24e-9
Dbod y 7 5 DbodyMOD Dbreak 5 11 Db reakMOD Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 160.4 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1
It 8 17 1 Lgat e 1 9 4.88e-9
Ldrain 2 5 1.0e -9 Lsource 3 7 2.24e-9
RLgate 1 9 48.8 RLdr ai n 2 5 10 RLsource 3 7 22.4
Mmed 16 6 8 8 M m edMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD
Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 37e-3 Rgate 9 20 1.8 RSLC1 5 51 RSL CM OD 1.0e-6 RSLC2 5 50 1.0e 3 Rsource 8 7 RsourceMOD 11.9e-3 Rvthres 22 8 RvthresMO D 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BM OD S2a 6 15 14 13 S2AM OD S2b 13 15 14 13 S2BM OD
Vbat 22 19 DC 1
GATE
1
LGATE
RLGATE
RGATE
9
CA
ESG
+
EVTEMP
+
18 22
20
S1A
12
13
8
S1B
EGS EDS
FDD2582
17 18
-
7
RVTEMP 19
-
+
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
6
-
S2A
14 13
S2B
13
+
+
6 8
-
-
5
RSLC1
51
+
5
ESLC
51
­50
RDRAIN
16
21
-
19
8
MSTRO
CIN
15
CB
8
14
+
5 8
-
MMED
8
DBREAK
11
+
EBREAK
MWEAK
RSOURCE
RBREAK
17 18
IT
RVTHRES
ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51))) *(PWR(V(5,51)/(1e-6 *42),2.5)) } .MODEL DbodyMOD D (IS=2.3E-12 RS=5.3e-3 TRS1=2.2e-3 TRS2=4.5e-7
+ CJO=8.8e-10 M=0.64 TT=3.8e-8 XTI=4.2) .MODEL DbreakMOD D (RS=0.4 TRS1=1.4 e-3 TRS2=-5e- 5) .MODEL Dpl capMOD D (CJO=2.75e-10 IS=1.0e-30 N=10 M=0.67)
.MODEL MmedMOD NMOS (VTO=3.76 KP=2.7 IS=1e-30 N=10 TOX = 1 L=1u W=1u RG=1.64) .MODEL Mstro M OD NMOS (VTO=4.25 K P=30 IS=1e-30 N =10 T OX=1 L=1u W=1u) .MODEL Mwe akMOD NMOS (VTO =3.2 KP=0.0 68 I S=1e-30 N=10 TOX=1 L=1u W=1u RG=16.4 RS=0.1)
.MODEL Rb reakMOD RES (T C1=1.1e-3 TC2=-1.1e-8) .MODEL Rd rai nMOD RES (TC1=1.0e-2 TC 2=2.6e-5) .MODEL RSLCMOD RES (TC1=2.7e-3 TC2=2.0e-6) .MODEL RsourceMOD RES (TC1=1.0e-3 TC 2=1.0e-6) .MODEL RvthresMOD RES (TC1=-3.9e -3 T C2=-1.7e-5 ) .MODEL RvtempMOD RES (T C1=-3.7e-3 TC2=1.9e-6)
.MODEL S1AMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 5. 0 VOFF =-2 .0 ) .MODEL S1BMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 2. 0 VOFF =-5 .0 ) .MODEL S2AMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= - 0.4 VO FF=0.3) .MODEL S2BMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= 0 .3 VOFF= -0.4)
.ENDS Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electroni cs Specialist Conference Records, 1991, written by Wil liam J. Hepp and C. F rank Wheatley.
©2002 Fairchild Semiconductor Corporation FDD2582 Rev. B
Page 9
SABER Electrical Model
REV July 2002 ttemplate F DD2582 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=2.3e-12,rs=5.3e-3,trs1=2.2e-3,trs2=4.5e-7,cjo=8.8e-10,m=0.64,tt=3.8e-8,xti=4.2) dp..model dbreakmod = (rs=0.4,trs1=1.4e-3,trs2=-5.0e-5) dp..model dplcapmod = (cjo=2.75e-10,isl=10.0e-30,nl=10,m=0.67) m..model mmedmod = (type=_n,vto=3.76,kp=2.7,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=4.25,kp=30,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=3.2,kp=0.068,is=1e-30, tox=1,rs=0.1) sw_vcsp.. mo del s1amod = (ron=1e-5,roff=0. 1, von=-5.0,voff=-2.0) sw_vcsp.. mo del s1bmod = (ron=1e-5,roff=0. 1, von=-2.0,voff=-5.0) sw_vcsp.. mo del s2amod = (ron=1e-5,roff=0.1,von=-0.4, vof f = 0. 3) sw_vcsp.. mo del s2bmod = (ron=1e-5,roff=0.1,von=0.3,voff=-0.4) c.ca n12 n8 = 4e- 10 c.cb n15 n14 = 4.6e-10 c.cin n6 n8 = 1.24 e-9
dp.dbody n7 n5 = model=dbodym od dp.dbreak n5 n11 = model=dbr eakmod dp.dplcap n10 n5 = model=dplcapmod
spe.ebreak n11 n7 n17 n18 = 160.4 spe.eds n14 n8 n5 n8 = 1 spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1
GATE
1
spe.evthres n6 n21 n19 n8 = 1
LGATE
9
RLGATE
RGATE
ESG
EVTEMP +
18 22
20
spe.evtemp n20 n6 n18 n22 = 1 i.it n8 n17 = 1
CA
S1A
12
S1B
l.lgate n1 n9 = 4.88e-9 l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 2.24e-9
res.rlgate n1 n9 = 48.8 res.rldrai n n2 n5 = 10 res.rlsource n3 n7 = 22.4
m.mmed n16 n6 n8 n8 = m odel=mmedm od, l=1u, w=1u m.mstrong n16 n6 n8 n8 = model=mstrongmod, l= 1u, w=1u m.mweak n16 n21 n8 n8 = model=mwea kmod, l=1u, w=1u
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
+
19
8
6
-
S2A
13
14
8
13
S2B
13
+
+
6
EGS EDS
8
-
-
15
CIN
CB
-
+
5 8
-
5
RSLC1
51
50 RDRAIN
21
MSTRO
14
ISCL
16
8
MMED
DBREAK
11
MWEAK
EBREAK
RSOURCE
RBREAK
17 18
IT
8
RVTHRES
+
17 18
­7
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
RVTEMP 19
­VBAT
+
22
DRAIN
2
SOURCE
3
FDD2582
res.rbreak n17 n18 = 1, tc1=1.1e- 3,tc2=-1.1e -8 res.rdrain n50 n16 = 37e-3, tc1=1.0e-2,tc2=2.6e-5 res.rgate n9 n20 = 1.8 res.rslc1 n5 n51 = 1.0e-6, tc1=2.7e-3,tc2 =2.0e-6 res.rslc2 n5 n50 = 1.0e3 res.rsour ce n8 n7 = 11.9e-3, tc1=1.0e-3,tc2 =1.0e-6 res.rvthres n22 n8 = 1, tc1=-3.9e-3,tc2=-1. 7e-5 res.rvtemp n18 n19 = 1, tc1=-3.7e-3,tc2=1.9e-6 sw_vcsp.s1 a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1 b n13 n12 n13 n8 = mode l= s1bmod sw_vcsp.s2 a n6 n15 n14 n13 = mode l= s2amod sw_vcsp.s2 b n13 n15 n14 n13 = model = s2bmod
v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5 ,n51))))*(( abs(v(n5,n51)*1e6/42) )** 2. 5)) } }
©2002 Fairchild Semiconductor Corporation FDD2582 Rev. B
Page 10
FDD2582
SPICE Thermal Model
REV 19 July 2002 FDD2582 CTHERM1 TH 6 1.6e-3
CTHERM2 6 5 4. 5e-3 CTHERM3 5 4 5. 0e-3 CTHERM4 4 3 8. 0e-3 CTHERM5 3 2 8. 2e-3 CTHERM6 2 TL 4.7e-2
RTHERM1 TH 6 3.3e-2 RTHERM2 6 5 7. 9e-2 RTHERM3 5 4 9. 5e-2 RTHERM4 4 3 1. 4e-1 RTHERM5 3 2 2. 9e-1 RTHERM6 2 TL 6.7e-1
SABER Thermal Model
SABER therm a l model FDD2582 template thermal_model th tl thermal_ c th , tl { ctherm.c th erm 1 th 6 =1.6e-3 ctherm.ctherm2 6 5 =4.5e-3 ctherm.ctherm3 5 4 =5.0e-3 ctherm.ctherm4 4 3 =8.0e-3 ctherm.ctherm5 3 2 =8.2e-3 ctherm.ctherm6 2 tl =4.7e-2
rrtherm.rtherm1 th 6 =3.3e-2 rtherm.rt herm2 6 5 =7.9e-2 rtherm.rt herm3 5 4 =9.5e-2 rtherm.rt herm4 4 3 =1.4e-1 rtherm.rt herm5 3 2 =2.9e-1 rthe r m.rtherm6 2 tl =6.7 e-1 }
RTHERM1
RTHERM2
RTHERM3
RTHERM4
RTHERM5
JUNCTION
th
CTHERM1
6
CTHERM2
5
CTHERM3
4
CTHERM4
3
CTHERM5
RTHERM6
2
CTHERM6
CASE
tl
©2002 Fairchild Semiconductor Corporation FDD2582 Rev. B
Page 11
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