FDC653N
N-Channel Enhancement Mode Field Effect Transistor
General Description Features
This N-Channel enhancement mode power field effect
transistors is produced using Fairchild's proprietary, high cell
density, DMOS technology. This very high density process is
tailored to minimize on-state resistance. These devices are
particularly suited for low voltage applications in notebook
computers, portable phones, PCMICA cards, and other
battery powered circuits where fast switching, and low in-line
power loss are needed in a very small outline surface mount
package.
5 A, 30 V. R
R
Proprietary SuperSOTTM-6 package design using copper
lead frame for superior thermal and electrical capabilities.
High density cell design for extremely low R
Exceptional on-resistance and maximum DC current
capability.
November 1997
= 0.035 Ω @ VGS = 10 V
DS(ON)
= 0.055 Ω @ VGS = 4.5 V.
DS(ON)
DS(ON)
.
SOT-23
SuperSOTTM-6
D
SuperSOTTM-8
S
SO-8
1
SOT-223
SOIC-16
6
D
.653
2
5
G
pin
SuperSOT -6
TM
Absolute Maximum RatingsT
D
1
D
= 25°C unless otherwise note
A
Symbol ParameterFDC653NUnits
V
V
I
D
Drain-Source Voltage30V
DSS
Gate-Source Voltage - Continuous±20V
GSS
Drain Current - Continuous (Note 1a)5A
- Pulsed 15
P
TJ,T
Maximum Power Dissipation (Note 1a)1.6W
D
STG
(Note 1b)
Operating and Storage Temperature Range-55 to 150°C
Continuous Source Diode Current1.3A
Drain-Source Diode Forward Voltage
VGS = 0 V, IS = 1.3 A (Note 2)
0.751.2V
TJ = 125oC0.61
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. R
JA
θ
design while R
a. 78oC/W when mounted on a minimum on a 1 in
b. 156oC/W when mounted on a minimum pad of 2oz Cu in FR-4 board.
-50-250255075100125150
T , JUNCTION TEMPERATURE (°C)
J
3.5
V =3.5V
3
GS
2.5
2
DS(ON)
1.5
R , NORMALIZED
1
DRAIN-SOURCE ON-RESISTANCE
0.5
03691215
4.0
4.5
I , DRAIN CURRENT (A)
D
5.0
Figure 2. On-Resistance Variation with
Drain Current and Gate Voltage.
0.18
0.15
0.12
0.09
0.06
T = 25°C
A
0.03
DS(ON)
R , ON-RESISTANCE (OHM)
0
246810
T = 125°C
A
V , GATE TO SOURCE VOLTAGE (V)
GS
6.0
I =2A
D
10
Figure 3. On-Resistance Variation
with Temperature.
15
V = 5V
DS
12
9
6
D
I , DRAIN CURRENT (A)
3
0
1.522.533.544.5
V , GATE TO SOURCE VOLTAGE (V)
GS
Figure 5. Transfer Characteristics.
T = -55°C
A
125°C
25°C
Figure 4. On Resistance Variation with
Gate-To- Source Voltage.
15
V =0V
GS
1
0.1
0.01
0.001
S
I , REVERSE DRAIN CURRENT (A)
0.0001
00.20.40.60.811.2
V , BODY DIODE FORWARD VOLTAGE (V)
T= 125°C
A
25°C
-55°C
SD
Figure 6. Body Diode Forward Voltage
Variation with Source Current and
Temperature.
FDC653N Rev.B
Page 4
Typical Electrical And Thermal Characteristics
10
I = 5.0A
D
8
V = 5V
DS
10V
6
4
2
GS
V , GATE-SOURCE VOLTAGE (V)
0
02468101214
Q , GATE CHARGE (nC)
g
15V
Figure 7. Gate Charge Characteristics.
30
10
RDS(ON) LIMIT
3
1
0.3
V = 10V
0.1
D
I , DRAIN CURRENT (A)
0.03
0.01
GS
SINGLE PULSE
R = See Note 1b
JA
θ
T = 25°C
A
0.10.20.51251030 50
V , DRAIN-SOURCE VOLTAGE (V)
DS
1ms
10ms
100ms
1s
DC
100us
1000
500
200
CAPACITANCE (pF)
100
f = 1 MHz
V = 0V
GS
50
0.10.3131030
V , DRAIN TO SOURCE VOLTAGE (V)
DS
C
C
C
iss
oss
rss
Figure 8. Capacitance Characteristics.
5
4
3
2
POWER (W)
1
0
0.010.1110100 300
SINGLE PULSE TIME (SEC)
SINGLE PULSE
R =See note 1b
JA
θ
T= 25°C
A
Figure 9. Maximum Safe Operating Area.
1
D = 0.5
0.5
0.2
0.2
0.1
0.1
0.05
r(t), NORMALIZED EFFECTIVE
0.02
TRANSIENT THERMAL RESISTANCE
0.01
0.05
0.02
0.01
Single Pulse
0.00010.0010.010.1110100300
Figure 11. Transient Thermal Response Curve.
Note: Thermal characterization performed using the conditions described in note 1b.Transient thermal
response will change depending on the circuit board design.
t , TIME (sec)
1
Figure 10. Single Pulse Maximum Power
Dissipation.
R (t) = r(t) * R
JA
θ
R = See Note 1b
JA
θ
P(pk)
t
1
t
2
T - T = P * R (t)
J
A
Duty Cycle, D = t / t
JA
θ
JA
θ
2
1
FDC653N Rev.B
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