These N & P-Channel MOSFETs are produced using
Fairchild Semiconductor’s advanced PowerTrench
process that has been especially tailored to minimize
on-state resistance and yet maintain superior
switching performance.
These devices are well suited for low voltage and
battery powered applications where low in-line power
loss and fast switching are required.
Applications
• DC/DC converter
• Load switch
• Motor Driving
Absolute Maximum Ratings T
= 25°C unless otherwise noted
A
Features
•Q1 –4.2 A, –20V. R
R
•Q2 5.9 A, 20V. R
R
• Low gate charge
• High performance trench technology for extremely
DS(ON)
.
Bottom Drain Contact
Bottom Drain Contact
4
4
5
5
6
6
Bottom Drain Contact
Bottom Drain Contact
low R
• FLMP SSOT-6 package: Enhanced thermal
performance in industry-standard package size
= 55 mΩ @ VGS = – 4.5 V
DS(ON)
= 82 mΩ @ VGS = – 2.5 V
DS(ON)
= 27 mΩ @ VGS = 4.5 V
DS(ON)
= 39 mΩ @ VGS = 2.5 V
DS(ON)
Q2 (N)
Q2 (N)
3
3
2
2
1
Q1 (P)
Q1 (P)
1
Symbol Parameter Q1Q2 Units
V
Drain-Source Voltage –20 20 V
DSS
V
Gate-Source Voltage
GSS
ID Drain Current - Continuous (Note 1a) –4.2 5.9 A
- Pulsed –20 20
PD Power Dissipation for Dual Operation (Note 1a) 1.6 W
Power Dissipation for single Operation (Note 1a) 1.8
TJ, T
STG
Operating and Storage Junction Temperature Range –55 to +150
SymbolParameter Test Conditions TypeMinTyp Max Units
Off Characteristics
BV
Drain-Source Breakdown
DSS
Voltage
∆BVDSS
∆T
I
Zero Gate Voltage Drain
DSS
Breakdown Voltage
Temperature Coefficient
J
Current
I
Gate-Body Leakage VGS = +12 V, VDS = 0 V
GSS
VGS = 0 V, ID = –250 µA
= 0 V, ID = 250 µA
V
GS
= –250 µA, Referenced to 25°C
I
D
= 250 µA, Referenced to 25°C
I
D
VDS = –16 V, VGS = 0 V
= 16 V, VGS = 0 V
V
DS
= +12 V, VDS = 0 V
V
GS
Q2
Q1
Q2
Q1
Q2
Q1
Q2
–20
20
V
–14
12
–1
1
+
+
100
100
mV/°C
µA
nA
Q1
On Characteristics (Note 2)
Q1
–0.6
–1.0
V
Gate Threshold Voltage VDS = VGS, ID = –250 µA
GS(th)
∆VGS(th)
∆TJ
R
DS(on)
Gate Threshold Voltage
Temperature Coefficient
Static Drain-Source
On-Resistance
V
= VGS, ID = 250 µA
V
DS
I
= –250 µA, Referenced to 25°C
D
= 250 µA, Referenced to 25°C
I
D
VGS = –4.5 V, ID = –4.2 A
= –2.5 V, ID = –3.4 A
V
GS
= –4.5 V, ID = –4.2 A,TJ =125°C
V
GS
= 4.5 V, ID = 5.9 A
GS
= 2.5 V, ID = 4.9 A
V
GS
= 4.5 V, ID = 5.9 A, TJ = 125°C
V
GS
gFS Forward Transconductance VDS = –5 V, ID = – 4.2 A
= 5 V, ID = 5.9 A
V
DS
Q2
Q1
Q2
Q1
Q2
Q1
Q2
0.6
3
45
23
13
1.0
–3
65
58
33
31
23
–1.5
1.5
mV/°C
55
mΩ
82
73
27
39
39
S
Dynamic Characteristics
C
Input Capacitance Q1
iss
C
Output Capacitance Q1
oss
C
Reverse Transfer Capacitance
rss
RG Gate Resistance
Q1:
= –10 V, VGS = 0 V,
V
DS
f = 1.0 MHz
Q2:
= 10 V, VGS = 0 V,
V
DS
f = 1.0 MHz
15mV, f = 1.0 MHz
V
GS =
Q2
Q2
Q1
Q2
753
677
163
171
83
91
pF
pF
pF
Q1 8
Q2 2.2
V
Ω
Switching Characteristics
t
Turn-On Delay Time
d(on)
tr Turn-On Rise Time
t
Turn-Off Delay Time
d(off)
tf Turn-Off Fall Time
Qg Total Gate Charge
Qgs Gate-Source Charge
Qgd Gate-Drain Charge
Q1:
= –10 V, ID = –1 A,
V
DD
= –4.5 V, R
V
GS
GEN
= 6 Ω
Q2:
= 10 V, ID = 1 A,
V
DD
= 4.5V, R
V
GS
GEN
= 6 Ω
Q1:
= –10 V,ID = –4.2 A,VGS= –4.5V
V
DS
Q2:
= 10 V, ID = 5.9 A,VGS = 4.5 V
V
DS
Q1
Q2
Q1
Q2
Q1
Q2
Q1
Q2
Q1
Q2
Q1
Q2
Q1
Q2
13
8
26
14 7 52
11
16
18
23
20
16
29
42
32
ns
ns
ns
ns
14
7 6 10 8 nC
1.6
nC
1.5
1.9
nC
1.8
FDC6020C RevB (W)
Page 3
FDC6020C
Electrical Characteristics (continued)T
= 25°C unless otherwise noted
A
SymbolParameter Test Conditions TypeMinTyp Max Units
Drain-Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drain-Source Diode Forward Current Q1
VSD Drain-Source Diode Forward
Voltage
trr Diode Reverse Recovery
Time
Qrr Diode Reverse Recovery
Charge
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
θJA
the drain pins. R
is guaranteed by design while R
θJC
a) 68°C/W when
VGS = 0 V, IS = –1.3 A (Note 2)
VGS = 0 V, IS = 1.3 A (Note 2)
= – 4.2A,dIF/dt = 100 A/µs
I
F
IF = 5.9A, dIF/dt = 100 A/µs
= – 4.2A,dIF/dt = 100 A/µs
I
F
IF = 5.9A, dIF/dt = 100 A/µs
is determined by the user's board design.
θCA
mounted on a 1in2 pad
of 2 oz copper (Single
Operation).
Q2
Q1
Q2
Q1
Q2
Q1
–0.8
17
6 4
0.7
15
1.3
–1.2
1.2
Q2
–1.3
b) 102°C/W when mounted
on a minimum pad of 2 oz
copper (Single Operation).
Figure 19. Maximum Safe Operating Area. Figure 20. Single Pulse Maximum
Power Dissipation.
f = 1MHz
V
GS
= 102°C/W
JA
T
= 25°C
A
= 0 V
1
R
(t) = r(t) * R
JA
D = 0.5
0.2
0.1
THERMAL RESISTANCE
r(t), NORMALIZED EFFECTIVE TRANSI ENT
0.01
0.1
0.05
0.02
0.01
SINGLE PULSE
θ
R
JA
θ
P(pk)
T
- TA = P * R
J
Duty Cycle, D = t
= 102 °C/W
t
1
t
2
JA
θ
(t)
JA
θ
/ t
1
2
0.00010.0010.010.11101001000
t1, TIME (sec)
Figure 21. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1b.
Transient thermal response will change depending on the circuit board design.
FDC6020C RevB (W)
Page 8
Dimensional Outline and Pad Layout
FDC6020C
Bottom View
Top View
Recommended Landing Pattern
For Standard Dual Configuration
FDC6020C RevB (W)
Page 9
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
FAST
FASTr™
FRFET™
GlobalOptoisolator™
GTO™
HiSeC™
I2C™
ImpliedDisconnect™
ISOPLANAR™
Across the board. Around the world.™
The Power Franchise™
Programmable Active Droop™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE T O ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY , FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY
ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT
CONVEY ANY LICENSE UNDER ITS PA TENT RIGHTS, NOR THE RIGHTS OF OTHERS.
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORA TION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
PRODUCT STA TUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Formative or
In Design
First Production
Full Production
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I5
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