Datasheet fdb8870 Datasheet

Page 1
May 2008
FDB8870
FDB8870
N-Channel PowerTrench® MOSFET 30V, 160A, 3.9mΩ
General Description
This N-Channel MOSFET has been designed specifically to improve the overall efficiency of DC/DC converters using either synchronous or conventional switching PWM controllers. It has been optimized for low gate charge, low r
and fast switching speed.
DS(ON)
Applications
• DC/DC converters
GATE
SOURCE
TO-263AB
FDB SERIES
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V V
I
E P T
D
DSS GS
AS
D
, T
J
STG
Drain to Source Voltage 30 V Gate to Source Voltage ±20 V Drain Current Continuous (T Continuous (T Continuous (T
C C
amb
Pulsed Figure 4 A Single Pulse Avalanche Energy (Note 2) 300 mJ Power dissipation 160 W Derate above 25 Operating and Storage Te mperature -55 to 175
DRAIN
(FLANGE)
= 25°C unless otherwise noted
C
= 25oC, VGS = 10V) (Note 1) = 25oC, VGS = 4.5V) (Note 1) 150 A
= 25oC, VGS = 10V, with R
o
C1.07W/
Features
•r
•r
• High performance trench technology for extremely low
• Low gate charge
• High power and current handling capability
= 43oC/W) 23 A
θJA
DS(ON)
DS(ON)
r
DS(ON)
= 3.9mΩ, V = 4.4mΩ, V
G
= 10V, ID = 35A
GS
= 4.5V, ID = 35A
GS
D
S
160 A
tm
o
C
o
C
Thermal Characteristics
R
θJC
R
θJA
R
θJA
Thermal Resistance Junction to Case TO-263 0.94 Thermal Resistance Junction to Ambient TO-263 ( Note 3) 62 Thermal Resistance Junction to Ambient TO-263, 1in2 copper pad area 43
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDB8870 FDB8870 TO-263AB 330mm 24mm 800 units
©2008 Fairchild Semiconductor Corporation
o
C/W
o
C/W
o
C/W
FDB8870 Rev. A3
Page 2
FDB8870
Electrical Characteristics T
= 25°C unless otherwise noted
C
Symbol Parameter Tes t Cond itions Min Typ Max Units
Off Characteristics
B
VDSS
I
DSS
I
GSS
Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V 30 - - V
V
= 24V - - 1
Zero Gate Voltage Drain Current
DS
= 0V TC = 150oC - - 250
V
GS
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA 1.2 - 2.5 V
I
= 35A, VGS = 10V - 0.0032 0.0039
D
= 35A, VGS = 4.5V - 0.0038 0.0044
I
Drain to Source On Resistance
D
I
= 35A, VGS = 10V,
D
= 175oC
T
J
- 0.0051 0.0065
Dynamic Characteristics
C
ISS
C
OSS
C
RSS
R
G
Q
g(TOT)
Q
g(5)
Q
g(TH)
Q
gs
Q
gs2
Q
gd
Input Capacitance Output Capacitance - 970 - pF Reverse Transfer Capacitance - 570 - pF
= 15V, VGS = 0V,
V
DS
f = 1MHz
Gate Resistance VGS = 0.5V, f = 1MHz - 2.1 - Ω Total Gate Charge at 10V VGS = 0V to 10V Total Gate Charge at 5V VGS = 0V to 5V - 56 69 nC
V
= 15V
Threshold Gate Charge VGS = 0V to 1V - 5.0 6.5 nC Gate to Source Gate Charge - 15 - nC Gate Charge Threshold to Plateau - 10 - nC
DD
= 35A
I
D
= 1.0mA
I
g
Gate to Drain “Miller” Charge - 23 - nC
- 5200 - pF
- 106 132 nC
µA
Ω
Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time Turn-On Delay Time - 10 - ns Rise Time - 98 - ns Turn-Off Delay Time - 75 - ns Fall Time - 47 - n s Turn-Off Time - - 183 ns
(VGS = 10V)
Drain-Source Diode Characteristics
V
SD
t
rr
Q
RR
Notes: 1: Package current limitation is 80A. 2: Starting T 3: Pulse width = 100s. 4
Source to Drain Diode Voltage Reverse Recovery Time ISD = 35A, dISD/dt = 100A/µs- -37ns
Reverse Recovered Charge ISD = 35A, dISD/dt = 100A/µs- -21nC
= 25°C, L = 0.15mH, IAS = 64A, VDD = 27V, VGS = 10V.
J
- - 162 ns
= 15V, ID = 35A
V
DD
= 10V, RGS = 3.3Ω
V
GS
I
= 35A - - 1.25 V
SD
I
= 15A - - 1.0 V
SD
©2008 Fairchild Semiconductor Corporation FDB8870 Rev. A3
Page 3
FDB8870
Typical Characteristics T
= 25°C unless otherwise noted
C
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULT IPL I ER
0
0 25 50 75 100 175
125
150
TC, CASE TEMPERATURE (oC)
Figure 1. Normali ze d Po we r Dis sip ation vs Case
Temperature
2
DUTY CYCLE - DESCENDING ORDER
0.5
1
0.2
0.1
0.05
0.02
0.01
0.1
, NORMALIZED
θJC
Z
THERMAL IMPEDANCE
0.01
-5
10
SINGLE PULSE
-4
10
-3
10
t, RECTANGULAR PULSE DURATION (s)
175
150
125
CURRENT LIMITED BY PACKAGE
100
75
, DRAIN CURRENT (A)
50
D
I
25
0
25 50 75 100 125 150
175
TC, CASE TEMPERATURE (oC)
Figure 2. Maximum Contin uous Drain Current vs
Case Temperature
P
DM
t
1
t
x R
θJC
+ T
2
C
1
10
NOTES: DUTY FACTOR: D = t
PEAK TJ = PDM x Z
-2
10
-1
10
θJC
10
1/t2
0
Figure 3. Normalized Maximum Transient Thermal Impedance
1000
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
VGS = 4.5V
, PEAK CURRENT (A)
DM
I
100
50
-5
10
-4
10
-3
10
-2
10
-1
10
t, PUL SE WIDTH (s)
TC = 25oC FOR TEMPERATURES
o
ABOVE 25
C DERATE PEAK
CURRENT AS FOLLOWS:
175 - T
I = I
25
10
C
150
0
1
10
Figure 4. Peak Current Capability
©2008 Fairchild Semiconductor Corporation FDB8870 Rev. A3
Page 4
FDB8870
Typical Characteristics T
1000
100
10
OPERATION IN THIS
AREA MAY BE
, DRAIN CURRENT (A)
D
I
LIMITED BY r
1
SINGLE PULSE TJ = MAX RA TE D
= 25oC
T
C
0.1 110
DS(ON)
V
, DRAIN TO SOURCE VOLTAGE (V)
DS
= 25°C unless otherwise noted
C
Figure 5. Forward Bias Safe Operating Area
160
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
V
= 15V
DD
120
TJ = 175oC
80
, DRAIN CURRENT (A)
D
I
40
0
1.5 2.0 2.5 3.0 3.5
TJ = 25oC
TJ = -55oC
VGS, GATE TO SOURCE VOLTAGE (V)
10µs
100µs
1ms 10ms
DC
500
If R = 0 tAV = (L)(IAS)/(1.3*RATED BV
If R ≠ 0 t
= (L/R)ln[(IAS*R)/(1.3*RATED BV
AV
100
10
, AVALANCHE CURRENT (A)
AS
I
1
60
0.01 0.1 1 10
STARTING TJ = 150oC
tAV, TIME IN AVALANCHE (ms)
- VDD)
DSS
- VDD) +1]
DSS
STARTING TJ = 25oC
NOTE: Refer to Fairchild Applica ti on Note s AN75 14 and AN75 15
Figure 6. Unclamped Inductive Switching
Capability
160
120
80
, DRAIN CURRENT (A)
D
I
40
0
0 0.25 0.5 0.75 1.0
VGS = 5V
VGS = 4V
VGS = 10V
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VDS, DRAIN TO SOURCE VOLTAGE (V)
100
VGS = 3V
TC = 25oC
Figure 7. Transfer Characteristics Figure 8. Saturation Characteristics
10
ID = 35A
8
6
, DRAIN TO SOURCE
ON RESISTANCE (mΩ)
4
DS(ON)
r
ID = 1A
2
246810
V
, GATE TO SOURCE VOLTAGE (V)
GS
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
Figure 9. Drain to Source On Resis tanc e vs Ga te
Voltage and Drain Current
©2008 Fairchild Semiconductor Corporation FDB8870 Rev. A3
1.6
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
1.4
1.2
1.0
ON RESISTANCE
0.8
NORMALIZED DRAIN TO SOURCE
0.6
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
VGS = 10V, ID = 35A
Figure 10. Normalized Drain to Source On
Resistance vs Junction Temperature
Page 5
FDB8870
Typical Characteristics T
1.4
1.2
1.0
0.8
NORMALIZED GATE
THRESHOLD VOLTAGE
0.6
0.4
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
= 25°C unless otherwise noted
C
VGS = VDS, ID = 250µA
Figure 11. Normalized Gate Thresho ld Voltage vs
Junction Temperature
10000
C
= CGS + C
C
= C
RSS
GD
1000
C, CAPACITANCE (pF)
V
= 0V, f = 1MHz
GS
400
0.1 1 10 VDS, DRAIN TO SOURCE VOLTAGE (V)
ISS
C
OSS
≅ C
DS
+ C
GD
GD
30
1.2 ID = 250µA
1.1
1.0
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.9
-80 -40 0 40 80 120 160 200 T
, JUNCTION TEMPERATURE (oC)
J
Figure 12. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
10
VDD = 15V
8
6
4
2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
0 20406080100
Qg, GATE CHARGE (nC)
WAVEFORMS IN DESCENDING ORDER:
ID = 35A I
= 5A
D
Figure 13. Capacitance vs Drain to Source
Voltage
©2008 Fairchild Semiconductor Corporation FDB8870 Rev. A3
Figure 14. Gate Charge Waveforms for Constant
Gate Current
Page 6
Test Circuits and Waveforms
V
DS
L
TO OBTAIN
VARY t
P
REQUIRED PEAK I
V
GS
R
AS
G
+
V
DD
-
I
AS
DUT
t
0V
P
I
AS
0.01Ω
0
Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms
V
DS
V
DD
V
Q
I
g(REF)
L
V
GS
DUT
+
V
DD
-
V
GS
0
I
g(REF)
= 1V
Q
gs2
Q
g(TH)
Q
gs
0
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms
BV
DSS
t
P
t
AV
Q
g(TOT)
DS
Q
g(5)
V
V
GS
VGS = 5V
gd
FDB8870
DS
V
DD
V
= 10V
GS
V
DS
R
L
V
GS
R
GS
V
GS
DUT
+
V
DD
-
V
DS
0
V
GS
10%
0
t
d(ON)
90%
t
ON
50%
10%
t
r
PULSE WIDTH
t
d(OFF)
90%
t
OFF
t
f
90%
10%
50%
Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms
©2008 Fairchild Semiconductor Corporation FDB8870 Rev. A3
Page 7
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, P application. Therefore the application’s ambient temperature, T must be reviewed to ensure that T Equation 1 mathematically represents the relationship and
(oC), and thermal resistance R
A
is never exceeded.
JM
DM
θJA
, in an
(oC/W)
serves as the basis for establishing the rating of the part.
P
DM
TJMTA–()
------------------- ----------=
R
θJA
(EQ. 1)
In using surface mount devices such as the TO-263 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power dissipation ratings. Precise determination of P complex and influenced by many factors:
DM
is
1. Mounting pad area onto which the device is attached and whether there is copper on one side or both sides of t he board.
2. The number of copper layers and the thickness of the board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For non steady state applications, the pulse width, the duty cycle and the transient thermal response of the part, the board and the environment they are in.
Fairchild provides thermal information to assist the designer’s preliminary application evaluation. Figure 21 defines the R copper (component side) area. This is for a horizontally
for the device as a function of the top
θJA
positioned FR-4 board with 1oz copper after 1000 seconds of steady state power with no air flow. This graph provides the necessary information for calculation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice thermal model or manually utilizing the normalized maximum transient thermal impedance curve.
80
60
C/W)
o
(
θJA
R
40
20
Figure 21. Thermal Resistance vs Mounting
R
= 26.51+ 19.84/(0.262+Area) EQ.2
θJA
R
= 26.51+ 128/(1.69+Area) EQ.3
θJA
0.1
(0.645) (6.45) (64.5)
AREA, TOP COPPER AREA in2 (cm2)
110
Pad Area
FDB8870
Thermal resistances corresponding to other copper area s can be obtained from Figure 21 or by calculation using Equation 2 or 3. Equation 2 is used for copper area defined in inches square and equation 3 is for area in centimeters square. The area, in square inches or square centimeters is the top copper area including the gate and source pads.
θJA
θJA
26.51
26.51
R
R
©2008 Fairchild Semiconductor Corporation FDB8870 Rev. A3
19.84
-------------------------------------+=
0.262 Area+()
Area in Inches Squared
128
----------------------------------+=
1.69 Area+()
Area in Centimeters Squared
(EQ. 2)
(EQ. 3)
Page 8
PSPICE Electrical Model
.SUBCKT FDB8870 2 1 3 ; rev December 2003 Ca 12 8 4.5e-9 Cb 15 14 4.5e-9 Cin 6 8 4.7e-9
Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 33.45 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1
It 8 17 1 Lgate 1 9 3.6e-9
Ldrain 2 5 1.0e-9 Lsource 3 7 3.3e - 9
RLgate 1 9 36 RLdrain 2 5 10 RLsource 3 7 33
Mmed 16 6 8 8 MmedMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD
Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 1.95e-3 Rgate 9 20 2.1 RSLC1 5 51 RSLCMOD 1e-6 RSLC2 5 50 1e3 Rsource 8 7 RsourceMOD 9e-4 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BMOD S2a 6 15 14 13 S2AMOD S2b 13 15 14 13 S2BMOD
GATE
1
LGATE
RLGATE
RGATE
9
CA
ESG
+
EVTEMP +
-
18 22
20
S1A
12
13
8
S1B
EGS EDS
-
13
6 8
10
RSLC2
6
14 13
+
+
6 8
-
-
DPLCAP
EVTHRES
+
19
8
S2A
S2B
15
CIN
CB
-
+
-
5
51
5
51
21
MSTRO
14
5 8
RSLC1
+
ESLC
­50
RDRAIN
16
8
MMED
8
DBREAK
11
+
17
EBREAK
IT
18
-
MWEAK
RSOURCE
RBREAK
17 18
RVTHRES
7
RVTEMP 19
-
+
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
FDB8870
Vbat 22 19 DC 1 ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*500),10))} .MODEL DbodyMOD D (IS=7.5E-12 IKF=17 N=1.01 RS=2.1e-3 TRS1=2e-3 TRS2=2e-7
+ CJO=1.9e-9 M=0.57 TT=9e-11 XTI=2.6) .MODEL Dbrea kM O D D ( R S=8e-2 TRS1=1e- 3 TRS2=-8.9e-6) .MODEL DplcapMOD D (CJO=1 .75e-9 IS=1e-30 N=10 M=0.4)
.MODEL MmedMOD NMOS (VTO=2.1 KP=30 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=2.1 T_ABS=25) .MODEL MstroMOD NMOS (VTO=2.51 KP=650 IS=1e-30 N=10 TOX=1 L=1u W=1u T_ABS=25) .MODEL MweakMOD NMOS (VTO=1.67 KP=0.1 IS=1e-3 0 N=10 TOX=1 L=1u W=1u RG=21 RS=0.1 T_ABS=25)
.MODEL RbreakMOD RES (TC1 =8.3e-4 TC2=-9e-7) .MODEL RdrainMOD RES (TC1=2.4e-3 TC2=5 .5e-6) .MODEL RSLCMOD RES (TC1=1e -4 TC2=1e-6) .MODEL RsourceMOD RES (TC1=8e-3 TC2=1e-6) .MODEL RvthresMOD RES (TC1=-2.3e-3 TC2=-9e-6) .MODEL RvtempMOD RES (TC1=- 3e-3 TC2=2e-7)
.MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-4 VOFF=-2) .MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-2 VOFF=-4) .MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-1 VOFF=-0.5) .MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-0.5 VOFF=-1) .ENDS
Note: For further discussio n of the PSP ICE mode l, consul t A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Confere nce Records, 1991, written by William J. Hepp and C. Frank Wheatley.
©2008 Fairchild Semiconductor Corporation FDB8870 Rev. A3
Page 9
SABER Electrical Model
rev December 2003 template FDB8870 n2,n1,n3 =m_temp electrical n2,n1,n3 number m_temp=25 { var i iscl dp..model dbodymod = (isl=7.5e-12,ikf=17,nl=1.01,rs=2.1e-3,trs1=2e-3,trs2=2e-7,cjo=1.9e-9,m=0.57,tt=9e-11,xti=2.6) dp..model dbreakmod = (rs=8e-2,trs1=1e-3,trs2=-8.9e-6) dp..model dplcapmod = (cjo=1.75e-9,isl=10e-30,nl=10,m=0.4) m..model mmedmod = (type=_n,vto=2.1,kp=30,is=1e-30, tox=1) m..model mstrong mod = (type=_n,vto=2.51,kp=650,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=1.67,kp=0.1,is=1e-30, tox=1,rs=0.1) sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-4,voff=-2) sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-2,voff=-4) sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-1,voff=-0.5)
DPLCAP
10
sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=-0.5,voff=-1) c.ca n12 n8 = 4.5e-9 c.cb n15 n14 = 4.5e-9
RSLC2
c.cin n6 n8 = 4.7e-9 dp.dbody n7 n5 = model= dbodymod
dp.dbreak n5 n11 = model=dbreakmod dp.dplcap n10 n5 = model=dplcapmod
spe.ebreak n11 n7 n17 n18 = 33.45 spe.eds n14 n8 n5 n8 = 1
GATE
spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1
LGATE
1
RLGATE
RGATE
9
ESG
EVTEMP +
18 22
20
­6
8
EVTHRES
+
+
6
-
spe.evthres n6 n 21 n19 n8 = 1 spe.evtemp n20 n6 n18 n22 = 1
i.it n8 n17 = 1 l.lgate n1 n9 = 3.6e-9
l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 3.3e-9
res.rlgate n1 n9 = 36 res.rldrain n2 n5 = 10 res.rlsource n3 n7 = 33
12
CA
S1A
14
13
13
8
S1B
13
+
+
6
EGS EDS
8
-
-
S2A
S2B
m.mmed n16 n6 n8 n8 = model=mmed mod, l=1u, w=1u, temp=m_temp m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u, temp=m_temp m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u, temp=m_temp
res.rbreak n17 n18 = 1, tc1=8.3e-4,tc2=-9e-7 res.rdrain n50 n16 = 1.95e-3, tc1=2.4e-3,tc2=5.5e-6 res.rgate n9 n20 = 2.1 res.rslc1 n5 n51 = 1e-6, tc1=1e-4,tc2=1e-6 res.rslc2 n5 n50 = 1e3 res.rsource n8 n7 = 9e-4, tc1=8e-3,tc2=1e-6 res.rvthres n22 n8 = 1, tc1=-2.3e-3,tc2=-9e-6 res.rvtemp n18 n19 = 1, tc1=-3e-3,tc2=2e-7 sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod
5
RSLC1
51
ISCL
8
MMED
8
DBREAK
11
MWEAK
EBREAK
+
RSOURCE
RBREAK
17 18
IT
RVTHRES
50 RDRAIN
16
21
-
19
8
MSTRO
CIN
15
CB
14
+
5 8
-
17 18
­7
RVTEMP 19
-
+
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
FDB8870
v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/500))** 10)) } }
©2008 Fairchild Semiconductor Corporation FDB8870 Rev. A3
Page 10
FDB8870
PSPICE Thermal Model
REV 23 Decemb er 20 03 FDB8870T CTHERM1 TH 6 1e-3
CTHERM2 6 5 2e-3 CTHERM3 5 4 3e-3 CTHERM4 4 3 9e-3 CTHERM5 3 2 1e-2 CTHERM6 2 TL 2e-2
RTHERM1 TH 6 3e-2 RTHERM2 6 5 8e-2 RTHERM3 5 4 1.1e-1 RTHERM4 4 3 1.6e-1 RTHERM5 3 2 1.72e-1 RTHERM6 2 TL 2e-1
SABER Thermal Model
SABER thermal model FDB8870T template thermal_model th tl thermal_c th, tl { ctherm.ctherm1 th 6 =1e-3 ctherm.ctherm2 6 5 =2e-3 ctherm.ctherm3 5 4 =3e-3 ctherm.ctherm4 4 3 =9e-3 ctherm.ctherm5 3 2 =1e-2 ctherm.ctherm6 2 tl =2e-2
rtherm.rtherm1 th 6 =3e-2 rtherm.rtherm2 6 5 =8e- 2 rtherm.rtherm3 5 4 =1.1e-1 rtherm.rtherm4 4 3 =1.6e-1 rtherm.rtherm5 3 2 =1.72e-1 rtherm.rtherm6 2 tl =2e-1 }
RTHERM1
RTHERM2
RTHERM3
RTHERM4
RTHERM5
JUNCTION
th
CTHERM1
6
CTHERM2
5
CTHERM3
4
CTHERM4
3
CTHERM5
RTHERM6
2
CTHERM6
tl
CASE
©2008 Fairchild Semiconductor Corporation FDB8870 Rev. A3
Page 11
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FDB8870
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Rev. I34
FDD8870 Rev A3
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