
FDB86135
D
G
S
D2-PAK
FDB Series
G
S
D
N-Channel PowerTrench® MOSFET
100V, 176A, 3.5mΩ
FDB86135 N-Channel PowerTrench
June 2011
Features
•Max R
• Fast Switching Speed
• Low Gate Charge
• High Performance Trench Technology for Extremely Low
R
DS(on)
• High Power and Current Handling Capability
• RoHS Compliant
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DSS
V
GSS
I
D
E
AS
P
D
, T
T
J
STG
= 3.5mΩ at VGS = 10V, ID = 75A
DS(on)
o
= 25
C unless otherwise noted
C
Drain to Source Voltage 100 V
Gate to Source Voltage ±20 V
Drain Curren - Continuous (Silicon Limited) TC = 25oC 176
- Continuous T
- Pulsed 704 A
Single Pulsed Avalanche Energy (Note 3) 658 mJ
- T
= 25oC (Note 1a) 227 W
Power Dissipation
Operating and Storage Temperature Range -55 to +175
C
= 25oC (Note 1b) 2.4 W/oC
- T
A
General Description
This N-Channel MOSFET is produced using Fairchild
Semiconductor’s advanced PowerTrench process that has been
especially tailored to minimize the on-state resistance and yet
maintain superior switching performance.
Applications
• DC-DC primary bridge
• DC-DC Synchronous rectification
• Hot swap
= 25oC 120
C
= 25oC(Note 1a) 75
C
®
MOSFET
A - Continuous( Package Limited) T
o
C
Thermal Characteristics
Symbol Parameter Ratings Units
R
θJC
R
θJA
Thermal Resistance, Junction to Case (Note 1) 0.66
Thermal Resistance, Junction to Ambient (Note 1a) 62.5
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDB86135 FDB86135 D2-PAK 330mm 24mm 800
©2011 Fairchild Semiconductor Corporation
FDB86135 Rev. C
o
C/W
www.fairchildsemi.com1

FDB86135 N-Channel PowerTrench
NOTES:
1. R
θJA
is determined with the device mounte d on a 1 in2 pad 2 oz copper pad on a 1.5 x 1.5 i n. boar d of FR-4 ma terial. R
θJC
is guaranteed by design while R
θCA
is determined by
the user's board design.
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0 %.
3. Starting TJ = 25 °C, L = 1 mH, IAS = 36.3 A, VDD = 100 V, VGS = 10 V.
40 °C/W when mounted on a
1 in
2
pad of 2 oz copper
a)
62.5 °C/W when mounted on
a minimum pad of 2 oz copper
b)
Electrical Characteristics T
= 25oC unless otherwise noted
C
Symbol Parameter Test Conditions Min. Typ. Max. Units
Off Characteristics
BV
ΔBV
ΔT
I
DSS
I
GSS
DSS
DSS
J
Drain to Source Breakdown Voltage ID = 250μA, VGS = 0V, TC = 25oC 100 - - V
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current VDS = 80V, V
Gate to Body Leakage Current VGS = ±20V, V
I
= 250μA, Referenced to 25oC - 0.07 - V/oC
D
= 0V - - 1 μA
GS
= 0V - - ±100 nA
DS
On Characteristics
V
GS(th)
R
DS(on)
g
FS
Gate Threshold Voltage VGS = VDS, ID = 250μA2.0-4.0V
Static Drain to Source On Resistance VGS = 10V, ID = 75A - 3.0 3.5 mΩ
Forward Transconductance VDS = 10V, ID = 75A - 167 - S
Dynamic Characteristics
C
C
C
Q
Q
Q
Q
iss
oss
rss
g(tot)
gs
gs2
gd
Input Capacitance
Output Capacitance - 2430 3230 pF
Reverse Transfer Capacitance - 210 - pF
Total Gate Charge at 10V
Gate to Source Gate Charge - 24 - nC
Gate Charge Threshold to Plateau - 8 - nC
Gate to Drain “Miller” Charge - 25 - nC
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Turn-On Delay Time
Turn-On Rise Time - 54 118 ns
Turn-Off Delay Time - 37 84 ns
Turn-Off Fall Time - 11 32 ns
= 25V, VGS = 0V
V
DS
f = 1MHz
= 80V, ID = 75A
V
DS
V
= 10V
GS
VDD = 50V, ID = 75A
V
= 10V, R
GS
GEN
= 4.7Ω
- 5485 7295 pF
- 89 116 nC
-2254ns
®
MOSFET
Drain-Source Diode Characteristics
V
SD
t
rr
Q
rr
Drain to Source Diode Forward Voltage V
Reverse Recovery Time
Reverse Recovery Charge - 129 - nC
= 0V, I
GS
V
= 0V, I
GS
dI
/dt = 100A/μs
F
= 75A (Note 2) - - 1.25 V
SD
= 75A, V
SD
= 80V
DD
-72-ns
FDB86135 Rev. C
2
www.fairchildsemi.com

Typical Performance Characteristics
0.02 0.1 1 10
2
10
100
600
*Notes:
1. 250
μs Pulse Test
2. T
C
= 25oC
V
GS
= 15.0 V
10.0 V
8.0 V
7.0 V
6.0 V
5.5 V
5.0 V
I
D
, Drain Current[A]
VDS, Drain-Source Voltage[V]
23456
1
10
100
300
-55oC
150oC
*Notes:
1. V
DS
= 10V
2. 250
μs Pulse Test
25oC
I
D
, Drain Current[A]
VGS, Gate-Source Voltage[V]
0.2 0.4 0.6 0.8 1.0 1.2
1
10
100
500
*Notes:
1. VGS = 0V
2. 250
μs Pulse Test
150oC
I
S
, Reverse Drain Current [A]
VSD, Body Diode Forward Voltage [V]
25oC
0 60 120 180 240 300 360
0.0025
0.0030
0.0035
0.0040
*Note: TC = 25oC
VGS = 20V
VGS = 10V
R
DS(ON)
[Ω],
Drain-Source On-Resistance
ID, Drain Current [A]
0306090
0
2
4
6
8
10
*Note: ID = 75A
VDS = 20V
V
DS
= 50V
V
DS
= 80V
V
GS
, Gate-Source Voltage [V]
Qg, Total Ga te C h arge [nC]
0.1
110
30
100
5000
10000
C
oss
C
iss
C
iss
= Cgs + Cgd (Cds = shorted)
C
oss
= Cds + C
gd
C
rss
= C
gd
*Note:
1. V
GS
= 0V
2. f = 1MH z
C
rss
Capacitances [pF]
VDS, Drain-Source Voltage [V]
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperature
FDB86135 N-Channel PowerTrench
®
MOSFET
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
FDB86135 Rev. C
3
www.fairchildsemi.com

Typical Performance Characteristics
-100 -50 0 50 100 150 200
0.6
0.9
1.2
1.5
1.8
2.1
*Notes:
1. V
GS
= 10V
2. I
D
= 75A
R
DS(on)
, [Normalized]
Drain-Source On-Resistance
TJ, Junction Temperature [oC]
-100 -50 0 50 100 150 200
0.90
0.95
1.00
1.05
1.10
*Notes:
1. V
GS
= 0V
2. I
D
= 10mA
BV
DSS
, [Normalized]
Drain-Source Breakdown Voltage
TJ, Junction Temperature [oC]
0.1 1 10 100 300
0.1
1
10
100
1000
3000
1ms
100μs
10ms
100ms
I
D
, Drain Current [A]
VDS, Drain-Source Voltage [V]
Operation in This Area
is Limited by R
DS(on)
*Notes:
1. T
C
= 25oC
2. T
J
= 175oC
3. Single Pulse
DC
25 50 75 100 125 150 175
0
50
100
150
200
I
D
, Drain Current [A]
TC, Case Tempera ture [oC]
Limited by package
0.01 0.1 1 10 100 1000
1
10
100
STARTING TJ = 150oC
STARTING TJ = 25oC
I
AS
, AVALANCHE CURRENT (A)
tAV, TIME IN AVALANCHE (ms)
If R = 0
t
AV = (L)(IAS)/(1.3*RATED BVDSS-VDD)
If R = 0
t
AV = (L/R)In[(IAS*R)/(1.3*RATED BVDSS-VDD)+1]
Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation
vs. Temperature vs. Temperature
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current
vs. Case Temperature
FDB86135 N-Channel PowerTrench
®
MOSFET
Figure 11. Unclamped Inductive Switching Capability
FDB86135 Rev. C
4
www.fairchildsemi.com

Typical Performance Characteristics
10
-5
10
-4
10
-3
10
-2
10
-1
110
0.001
0.01
0.1
1
3
0.01
0.1
0.2
0.05
0.02
*Notes:
1. Z
θ JC
(t) = 0 .6 6oC/W Max.
2. Du ty F a c t o r, D = t
1/t2
3. TJM - TC = PDM * Z
θ JC
(t)
0.5
Sin g le p u ls e
Thermal Response [Z
θJC
]
Rectangular Pulse Duration [sec]
Figure 12. Transient Thermal Response Curve
P
DM
t
1
t
2
FDB86135 N-Channel PowerTrench
®
MOSFET
FDB86135 Rev. C
www.fairchildsemi.com5

Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
FDB86135 N-Channel PowerTrench
®
MOSFET
FDB86135 Rev. C
6
www.fairchildsemi.com

DUT
V
DS
+
_
Driver
R
G
Same Type
as DUT
V
GS
• dv/dt controlled by R
G
•ISDcontrolled by pulse period
V
DD
L
I
SD
10V
V
GS
( Driver )
I
SD
( DUT )
V
DS
( DUT )
V
DD
Body Diode
Forward Voltage Drop
V
SD
IFM, Body Diode Forward Current
Body Diode Reverse Current
I
RM
Body Diode Recoverydv/dt
di/dt
D =
Gate Pulse Width
Gate Pulse Period
--------------------------
DUT
V
DS
+
_
Driver
R
G
Same Type
as DUT
V
GS
• dv/dt controlled by R
G
•ISDcontrolled by pulse period
V
DD
LL
I
SD
10V
V
GS
( Driver )
I
SD
( DUT )
V
DS
( DUT )
V
DD
Body Diode
Forward Voltage Drop
V
SD
IFM, Body Diode Forward Current
Body Diode Reverse Current
I
RM
Body Diode Recoverydv/dt
di/dt
D =
Gate Pulse Width
Gate Pulse Period
--------------------------
D =
Gate Pulse Width
Gate Pulse Period
--------------------------
FDB86135 N-Channel PowerTrench
Peak Diode Recovery dv/dt Test Circuit & Waveforms
®
MOSFET
FDB86135 Rev. C
7
www.fairchildsemi.com

Mechanical Dimensions
LAND PATTERN RECOMMENDATION
DETAIL A, ROTATED 90
SCALE: 2X
2
SEATING
PLANE
3
4
GAGE PL AN E
1
2
1
4
3
SEE
DETAIL A
10.67
9.65
1.68
1.00
9.65
8.38
1.78 MAX
1.78
1.14
0.99
0.51
5.08
(2.12)
6.22 MIN
6.86 MIN
15.88
14.61
1.65
1.14
4.83
4.06
0.74
0.33
8
2.79
1.78
(5.38)
0.25 MAX
0.25
0.25 ABM M
-A-
-B-
0.10 B
NOTE S: UN L ESS OTHERW ISE SP EC IF IED
A) ALL DIMENSIONS ARE IN MILLIMETERS.
B) REFERENCE JEDEC, TO-263, VARIATION AB.
C) DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M - 1994.
D) LOCATION OF THE PIN HOLE MAY VARY
(LOWER LEFT CORNER, LOWER CENTER
AND CENTER OF TH E PACKAG E).
E) LANDPATTERN RECOMMENDATION PER IPC
TO254P1524X482-3N
F) FILENAME: TO263A02REV6
12.70
9.45
3.80
1.05
(6.40)
10.00
UNLESS NOTED, ALL DIMS TYPICAL
5.08
FDB86135 N-Channel PowerTrench
D2-PAK
®
MOSFET
FDB86135 Rev. C
8
Dimensions in Millimeters
www.fairchildsemi.com

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The following includes registered and unregistered trademarks and service marks, own ed by Fairchild Semiconductor and/or its global su bsidiaries, and is not
intended to be an exhaustive list of all such trademarks.
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®
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FAST
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®
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Global Power Resource
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Green FPS™ e-Series™
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GTO™
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®
®
®
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QS™
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Saving our world, 1mW/W/kW at a time™
SignalWise™
SmartMax™
SMART START™
SPM
STEALTH™
SuperFET
SuperSOT™-3
SuperSOT™-6
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SupreMOS
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Sync-Lock™
®*
®
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The Power Franchise
The Right Technology for Your Success™
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®
TranSiC
TriFault Detect™
TRUECURRENT
μSerDes™
®
UHC
Ultra FRFET™
UniFET™
VCX™
VisualMax™
XS™
®
®
®
*
FDB86135 N-Channel PowerTrench
®
MOSFET
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.
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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE
RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY
PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY
THEREIN, WHICH COVERS THESE PRODUCTS.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE
EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used here in:
1. Life support devices or systems are devices or systems which, (a) are
intended for surgical implant into the body or (b) sup port or su stain li fe,
and (c) whose failure to perform when properly used in acco rdance with
instructions for use provided in the labeling, can be reasonably
expected to result in a significant injury of the user.
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Counterfeiting of semiconductor parts is a growing problem in the i ndustry. All manufactures of semicond uctor products are experiencing counterfeiting of their
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PRODUCT STATUS DEFINITIONS
Definition of Terms
.
2. A critical component in any component of a life support, device, or
system whose failure to perform can be reasonably expected to cause
the failure of the life support device or system, or to affect its safety or
effectiveness.
Datasheet Identification Product Status Definition
Advance Information Formative / In Design
Preliminary First Production
No Identification Needed Full Production
Obsolete Not In Production
FDB86135 Rev. C
Datasheet contains the design specifications for product development. Specifications
may change in any manner without notice.
Datasheet contains preliminary data; supplementa ry data will be published at a later
date. Fairchild Semiconductor reserves the right to make changes at any time without
notice to improve design.
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to
make changes at any time without notice to improve the design.
Datasheet contains specifications on a product that is discontinued by Fairchild
Semiconductor. The datasheet is for refe rence information only.
9
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Rev. I54