Datasheet FDB86135 Datasheet (Fairchild)

Page 1
tm

FDB86135

D
G
S
D2-PAK FDB Series
G
S
D
N-Channel PowerTrench® MOSFET
100V, 176A, 3.5mΩ
FDB86135 N-Channel PowerTrench
Features
•Max R
• Fast Switching Speed
• Low Gate Charge
• High Performance Trench Technology for Extremely Low R
DS(on)
• High Power and Current Handling Capability
• RoHS Compliant
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DSS
V
GSS
I
D
E
AS
P
D
, T
T
J
STG
= 3.5mΩ at VGS = 10V, ID = 75A
DS(on)
o
= 25
C unless otherwise noted
C
Drain to Source Voltage 100 V Gate to Source Voltage ±20 V Drain Curren - Continuous (Silicon Limited) TC = 25oC 176
- Continuous T
- Pulsed 704 A Single Pulsed Avalanche Energy (Note 3) 658 mJ
- T
= 25oC (Note 1a) 227 W
Power Dissipation Operating and Storage Temperature Range -55 to +175
C
= 25oC (Note 1b) 2.4 W/oC
- T
A
General Description
This N-Channel MOSFET is produced using Fairchild Semiconductor’s advanced PowerTrench process that has been especially tailored to minimize the on-state resistance and yet maintain superior switching performance.
Applications
• DC-DC primary bridge
• DC-DC Synchronous rectification
• Hot swap
= 25oC 120
C
= 25oC(Note 1a) 75
C
®
MOSFET
A - Continuous( Package Limited) T
o
C

Thermal Characteristics

Symbol Parameter Ratings Units
R
θJC
R
θJA
Thermal Resistance, Junction to Case (Note 1) 0.66 Thermal Resistance, Junction to Ambient (Note 1a) 62.5

Package Marking and Ordering Information

Device Marking Device Package Reel Size Tape Width Quantity
FDB86135 FDB86135 D2-PAK 330mm 24mm 800
©2011 Fairchild Semiconductor Corporation FDB86135 Rev. C
o
C/W
www.fairchildsemi.com1
Page 2
FDB86135 N-Channel PowerTrench
NOTES:
1. R
θJA
is determined with the device mounte d on a 1 in2 pad 2 oz copper pad on a 1.5 x 1.5 i n. boar d of FR-4 ma terial. R
θJC
is guaranteed by design while R
θCA
is determined by
the user's board design.
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0 %.
3. Starting TJ = 25 °C, L = 1 mH, IAS = 36.3 A, VDD = 100 V, VGS = 10 V.
40 °C/W when mounted on a 1 in
2
pad of 2 oz copper
a)
62.5 °C/W when mounted on a minimum pad of 2 oz copper
b)
Electrical Characteristics T
= 25oC unless otherwise noted
C
Symbol Parameter Test Conditions Min. Typ. Max. Units
Off Characteristics
BV ΔBV
ΔT I
DSS
I
GSS
DSS
DSS
J
Drain to Source Breakdown Voltage ID = 250μA, VGS = 0V, TC = 25oC 100 - - V Breakdown Voltage Temperature
Coefficient Zero Gate Voltage Drain Current VDS = 80V, V Gate to Body Leakage Current VGS = ±20V, V
I
= 250μA, Referenced to 25oC - 0.07 - V/oC
D
= 0V - - 1 μA
GS
= 0V - - ±100 nA
DS
On Characteristics
V
GS(th)
R
DS(on)
g
FS
Gate Threshold Voltage VGS = VDS, ID = 250μA2.0-4.0V Static Drain to Source On Resistance VGS = 10V, ID = 75A - 3.0 3.5 mΩ Forward Transconductance VDS = 10V, ID = 75A - 167 - S
Dynamic Characteristics
C C C Q Q Q Q
iss oss rss g(tot) gs gs2 gd
Input Capacitance Output Capacitance - 2430 3230 pF Reverse Transfer Capacitance - 210 - pF Total Gate Charge at 10V Gate to Source Gate Charge - 24 - nC Gate Charge Threshold to Plateau - 8 - nC Gate to Drain “Miller” Charge - 25 - nC
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Turn-On Delay Time Turn-On Rise Time - 54 118 ns Turn-Off Delay Time - 37 84 ns Turn-Off Fall Time - 11 32 ns
= 25V, VGS = 0V
V
DS
f = 1MHz
= 80V, ID = 75A
V
DS
V
= 10V
GS
VDD = 50V, ID = 75A V
= 10V, R
GS
GEN
= 4.7Ω
- 5485 7295 pF
- 89 116 nC
-2254ns
®
MOSFET
Drain-Source Diode Characteristics
V
SD
t
rr
Q
rr
Drain to Source Diode Forward Voltage V Reverse Recovery Time Reverse Recovery Charge - 129 - nC
= 0V, I
GS
V
= 0V, I
GS
dI
/dt = 100A/μs
F
= 75A (Note 2) - - 1.25 V
SD
= 75A, V
SD
= 80V
DD
-72-ns
FDB86135 Rev. C
2
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Page 3
Typical Performance Characteristics
0.02 0.1 1 10
2
10
100
600
*Notes:
1. 250
μs Pulse Test
2. T
C
= 25oC
V
GS
= 15.0 V
10.0 V
8.0 V
7.0 V
6.0 V
5.5 V
5.0 V
I
D
, Drain Current[A]
VDS, Drain-Source Voltage[V]
23456
1
10
100
300
-55oC
150oC
*Notes:
1. V
DS
= 10V
2. 250
μs Pulse Test
25oC
I
D
, Drain Current[A]
VGS, Gate-Source Voltage[V]
0.2 0.4 0.6 0.8 1.0 1.2
1
10
100
500
*Notes:
1. VGS = 0V
2. 250
μs Pulse Test
150oC
I
S
, Reverse Drain Current [A]
VSD, Body Diode Forward Voltage [V]
25oC
0 60 120 180 240 300 360
0.0025
0.0030
0.0035
0.0040
*Note: TC = 25oC
VGS = 20V
VGS = 10V
R
DS(ON)
[Ω],
Drain-Source On-Resistance
ID, Drain Current [A]
0306090
0
2
4
6
8
10
*Note: ID = 75A
VDS = 20V V
DS
= 50V
V
DS
= 80V
V
GS
, Gate-Source Voltage [V]
Qg, Total Ga te C h arge [nC]
0.1
110
30
100
5000
10000
C
oss
C
iss
C
iss
= Cgs + Cgd (Cds = shorted)
C
oss
= Cds + C
gd
C
rss
= C
gd
*Note:
1. V
GS
= 0V
2. f = 1MH z
C
rss
Capacitances [pF]
VDS, Drain-Source Voltage [V]
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperature
FDB86135 N-Channel PowerTrench
®
MOSFET
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
FDB86135 Rev. C
3
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Page 4
Typical Performance Characteristics
-100 -50 0 50 100 150 200
0.6
0.9
1.2
1.5
1.8
2.1
*Notes:
1. V
GS
= 10V
2. I
D
= 75A
R
DS(on)
, [Normalized]
Drain-Source On-Resistance
TJ, Junction Temperature [oC]
-100 -50 0 50 100 150 200
0.90
0.95
1.00
1.05
1.10
*Notes:
1. V
GS
= 0V
2. I
D
= 10mA
BV
DSS
, [Normalized]
Drain-Source Breakdown Voltage
TJ, Junction Temperature [oC]
0.1 1 10 100 300
0.1
1
10
100
1000
3000
1ms
100μs
10ms
100ms
I
D
, Drain Current [A]
VDS, Drain-Source Voltage [V]
Operation in This Area is Limited by R
DS(on)
*Notes:
1. T
C
= 25oC
2. T
J
= 175oC
3. Single Pulse
DC
25 50 75 100 125 150 175
0
50
100
150
200
I
D
, Drain Current [A]
TC, Case Tempera ture [oC]
Limited by package
0.01 0.1 1 10 100 1000
1
10
100
STARTING TJ = 150oC
STARTING TJ = 25oC
I
AS
, AVALANCHE CURRENT (A)
tAV, TIME IN AVALANCHE (ms)
If R = 0 t
AV = (L)(IAS)/(1.3*RATED BVDSS-VDD)
If R = 0 t
AV = (L/R)In[(IAS*R)/(1.3*RATED BVDSS-VDD)+1]
Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation vs. Temperature vs. Temperature
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current
vs. Case Temperature
FDB86135 N-Channel PowerTrench
®
MOSFET
Figure 11. Unclamped Inductive Switching Capability
FDB86135 Rev. C
4
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Page 5
Typical Performance Characteristics
10
-5
10
-4
10
-3
10
-2
10
-1
110
0.001
0.01
0.1
1
3
0.01
0.1
0.2
0.05
0.02
*Notes:
1. Z
θ JC
(t) = 0 .6 6oC/W Max.
2. Du ty F a c t o r, D = t
1/t2
3. TJM - TC = PDM * Z
θ JC
(t)
0.5
Sin g le p u ls e
Thermal Response [Z
θJC
]
Rectangular Pulse Duration [sec]
Figure 12. Transient Thermal Response Curve
P
DM
t
1
t
2
FDB86135 N-Channel PowerTrench
®
MOSFET
FDB86135 Rev. C
www.fairchildsemi.com5
Page 6
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
FDB86135 N-Channel PowerTrench
®
MOSFET
FDB86135 Rev. C
6
www.fairchildsemi.com
Page 7
DUT
V
DS
+
_
Driver
R
G
Same Type
as DUT
V
GS
• dv/dt controlled by R
G
•ISDcontrolled by pulse period
V
DD
L
I
SD
10V
V
GS
( Driver )
I
SD
( DUT )
V
DS
( DUT )
V
DD
Body Diode
Forward Voltage Drop
V
SD
IFM, Body Diode Forward Current
Body Diode Reverse Current
I
RM
Body Diode Recoverydv/dt
di/dt
D =
Gate Pulse Width Gate Pulse Period
--------------------------
DUT
V
DS
+
_
Driver
R
G
Same Type
as DUT
V
GS
• dv/dt controlled by R
G
•ISDcontrolled by pulse period
V
DD
LL
I
SD
10V
V
GS
( Driver )
I
SD
( DUT )
V
DS
( DUT )
V
DD
Body Diode
Forward Voltage Drop
V
SD
IFM, Body Diode Forward Current
Body Diode Reverse Current
I
RM
Body Diode Recoverydv/dt
di/dt
D =
Gate Pulse Width Gate Pulse Period
--------------------------
D =
Gate Pulse Width Gate Pulse Period
--------------------------
FDB86135 N-Channel PowerTrench
Peak Diode Recovery dv/dt Test Circuit & Waveforms
®
MOSFET
FDB86135 Rev. C
7
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Page 8
Mechanical Dimensions
LAND PATTERN RECOMMENDATION
DETAIL A, ROTATED 90
SCALE: 2X
2
SEATING
PLANE
3
4
GAGE PL AN E
1
2
1
4
3
SEE DETAIL A
10.67
9.65
1.68
1.00
9.65
8.38
1.78 MAX
1.78
1.14
0.99
0.51
5.08
(2.12)
6.22 MIN
6.86 MIN
15.88
14.61
1.65
1.14
4.83
4.06
0.74
0.33
8
0
80
2.79
1.78
(5.38)
0.25 MAX
0.25
0.25 ABM M
-A-
-B-
0.10 B
NOTE S: UN L ESS OTHERW ISE SP EC IF IED A) ALL DIMENSIONS ARE IN MILLIMETERS. B) REFERENCE JEDEC, TO-263, VARIATION AB. C) DIMENSIONING AND TOLERANCING PER ANSI Y14.5M - 1994. D) LOCATION OF THE PIN HOLE MAY VARY (LOWER LEFT CORNER, LOWER CENTER AND CENTER OF TH E PACKAG E). E) LANDPATTERN RECOMMENDATION PER IPC TO254P1524X482-3N F) FILENAME: TO263A02REV6
12.70
9.45
3.80
1.05
(6.40)
10.00
UNLESS NOTED, ALL DIMS TYPICAL
5.08
FDB86135 N-Channel PowerTrench
D2-PAK
®
MOSFET
FDB86135 Rev. C
8
Dimensions in Millimeters
www.fairchildsemi.com
Page 9
TRADEMARKS
tm
®
tm
tm
The following includes registered and unregistered trademarks and service marks, own ed by Fairchild Semiconductor and/or its global su bsidiaries, and is not intended to be an exhaustive list of all such trademarks.
AccuPower™ Auto-SPM™ AX-CAP™*
®
BitSiC Build it Now™ CorePLUS™ CorePOWER™
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Fairchild Fairchild Semiconductor FACT Quiet Series™ FACT FAST FastvCore™ FETBench™ FlashWriter
®
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®
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max™
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®
®
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PDP SPM™
Power-SPM™ PowerTrench PowerXS™
SM
Programmable Active Droop™ QFET QS™ Quiet Series™ RapidConfigure™
Saving our world, 1mW/W/kW at a time™ SignalWise™ SmartMax™ SMART START™ SPM STEALTH™ SuperFET SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SupreMOS SyncFET™ Sync-Lock™ ®*
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TranSiC TriFault Detect™ TRUECURRENT
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UHC Ultra FRFET™ UniFET™ VCX™ VisualMax™ XS™
®
®
®
*
FDB86135 N-Channel PowerTrench
®
MOSFET
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.
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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used here in:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) sup port or su stain li fe, and (c) whose failure to perform when properly used in acco rdance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user.
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Fairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Fairchild’s Anti-Counterfeiting Policy is also stated on our external website, www.Fairchildsemi.com, under Sales Support Counterfeiting of semiconductor parts is a growing problem in the i ndustry. All manufactures of semicond uctor products are experiencing counterfeiting of their
parts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failed application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the proliferation of counterfeit parts. Fairchild strongly encourages customers to purchase Fairchild parts either di rectly from Fairch ild or from Authorized Fairchi ld Distributors who are listed by country on our web page cited above. Products customers buy either from Fairchild directly or from Authorized Fairchild Distributors are genuine parts, have full traceability, meet Fairchild’s quality standards for handing and storage and provide access to Fairchild’s full range of up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address and warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Fair child is committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributor s.
PRODUCT STATUS DEFINITIONS Definition of Terms
.
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Datasheet Identification Product Status Definition
Advance Information Formative / In Design
Preliminary First Production
No Identification Needed Full Production
Obsolete Not In Production
FDB86135 Rev. C
Datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
Datasheet contains preliminary data; supplementa ry data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design.
Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for refe rence information only.
9
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Rev. I54
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