Datasheet FDP2670, FDB2670 Datasheet (Fairchild Semiconductor)

Page 1
FDP2670/FDB2670
/
200V N-Channel PowerTrench

MOSFET
FDP2670
November 2001
FDB2670
This N-Channel MOSFET has been designed specifically for switching on the primary side in the isolated DC/DC converter application. Any applicat ion requiring a 200V MOSFETs with low on-resistance and fast switching will benefit.
These MOSFETs feature faster switching and lower gate charge than other MOSFETs with comparable
specifications.
RDS
(ON)
The result is a MOSFET that is easy and safer to drive (even at very high frequencies), and DC/DC power supply designs with higher overall efficiency.
G
G
D
S
TO-220
FDP Series
Absolute Maximum Ratings T
S
=25oC unless otherwise noted
A
Features
• 19 A, 200 V. R
• Low gate charge (27 nC typical)
• Fast switching speed
• High performance trench technology for extremely
low R
DS(ON)
• High power and current handling capability
D
= 130 mΩ @ VGS = 10 V
DS(ON)
G
D
TO-263AB
FDB Series
S
Symbol Parameter Ratings Units
V
DSS
V
GSS
I
D
P
D
dv/dt Peak Diode Recovery dv/dt (Note 3) 3.2 V/ns TJ, T
STG
Drain-Source Voltage 200 V Gate-Source Voltage Drain Current – Continuous (Note 1) 19 A
– Pulsed (Note 1) 40 A
Total Power Dissipation @ TC = 25°C
Derate above 25°C
Operating and Storage Junction Temperature Range –65 to +175
± 20
93 W
0.63
W°/C
V
°C
Thermal Characteristics
R
θJC
R
θJA
Thermal Resistance, Junction-to-Case 1.6 Thermal Resistance, Junction-to-Ambient 62.5
°C/W °C/W
Package Marking and Ordering Information
Device Marking Device Reel Size Tape width Quantity
FDB2670 FDB2670 13’’ 24mm 800 unit s FDP2670 FDP2670 Tube n/a 45 units
2001 Fairchild Semiconductor Corporation
FDP2670/FDB2670 Rev C1(W)
Page 2
FDP2670
/
Electrical Characteristics T
= 25°C unless otherwise noted
A
Symbol Parameter Test Conditions Min Typ Max Units Drain-Source Avalanche Ratings (Note 1)
W
DSS
I
AR
Single Pulse Drain-Source Avalanche Energy
Maximum Drain-Source Avalanche Current
VDD = 100 V, ID = 10 A
375
10 A
Off Characteristics
BV
DSS
∆BVDSS ∆T
J
I
DSS
I
GSSF
I
GSSR
Drain–Source Breakdown Voltage Breakdown Voltage Temperature
Coefficient
= 0 V, ID = 250 µA
V
GS
I
= 250 µA, Referenced to 25°C
D
Zero Gate Voltage Drain Current VDS = 160 V, VGS = 0 V 1 Gate–Body Leakage, Forward VGS = 20 V, VDS = 0 V 100 nA Gate–Body Leakage, Reverse VGS = –20 V VDS = 0 V –100 nA
200 V
241
mV/°C
On Characteristics (Note 2)
V
GS(th)
∆VGS(th) ∆T
J
R
DS(on)
I
D(on)
g
FS
Gate Threshold Voltage Gate Threshold Voltage
Temperature Coefficient Static Drain–Source
On–Resistance
= VGS, ID = 250 µA
V
DS
I
= 250 µA, Referenced to 25°C
D
VGS = 10 V, ID = 10 A
= 10V, ID = 10 A, TJ = 125°C
V
GS
On–State Drain Current VGS = 10 V, VDS = 10 V 20 A Forward Transconductance VDS = 10 V, ID = 10 A 24 S
244.5V –9 98
205
130 285
mV/°C
mΩ
Dynamic Characteristics
C
iss
C
oss
C
rss
Input Capacitance 1320 pF Output Capacitance 71 pF Reverse Transfer Capacitance
= 100 V, V
V
DS
f = 1.0 MHz
GS
= 0 V,
24 pF
Switching Characteristics (Note 2)
t t t t Q Q Q
d(on)
r
d(off)
f
g
gs
gd
Turn–On Delay Time 14 25 ns Turn–On Rise Time 5 10 ns
= 100 V, ID = 1 A,
V
DD
= 10 V, R
V
GS
GEN
= 6 Ω
Turn–Off Delay Time 26 41 ns Turn–Off Fall Time Total Gate Charge 27 38 nC Gate–Source Charge 7 nC
V
= 100 V, ID = 10 A,
DS
= 10 V
V
GS
Gate–Drain Charge
23 37 ns
10 nC
Drain–Source Diode Characteristics and Maximum Ratings
I
S
V
SD
Notes:
1. Calculated continuous current based on maximum allowable junction temperature.
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0% ≤ 3A, di/dt ≤ 100A/µs, VDD ≤ BV
3. I
SD
Maximum Continuous Drain–Source Diode Forward Current 19 A Drain–Source Diode Forward
Voltage
, Starting TJ = 25°C
DSS
V
= 0 V, IS = 10 A (Note 2) 0.8 1.3 V
GS
FDB2670
mJ
µA
FDP2670/FDB2670 Rev C1(W)
Page 3
Typical Characteristics
)
E
)
)
A
/
FDP2670
30
VGS = 10V
24
18
12
, DRAIN CURRENT (A
D
I
6
0
0 3 6 9 12 15
7.0V
6.5V
, DRAIN-SOURCE VOLTAGE (V)
V
DS
6.0V
1.5
1.4
1.3
1.2
1.1
, NORMALIZED
DS(ON)
1
R
0.9
DRAIN-SOURCE ON-RESISTANCE
0.8 0 6 12 18 24 30
VGS = 6V
, DRAIN CURRENT (A)
I
D
6.5V
7.0V
Figure 1. On-Region Characteristics. Figure 2. On-Resistance Variation with
Drain Current and Gate Voltage.
2.6 ID =10A
2.2
= 10V
V
GS
1.8
1.4
, NORMALIZED
1
DS(ON)
R
0.6
DRAIN-SOURCE ON-RESISTANC
0.2
-50 -25 0 25 50 75 100 125 150 175
, JUNCTION TEMPERATURE (oC)
T
J
0.35
0.3
0.25
0.2
0.15
, ON-RESISTANCE (OHM)
0.1 TA = 25oC
DS(ON)
R
0.05
0
5678910
V
GS
TA = 125oC
, GATE TO SOURCE VOLTAGE (V)
FDB2670
10V
ID = 5A
Figure 3. On-Resistance Variation with
Temperature.
40
VDS = 50V
30
20
TA = 125oC
, DRAIN CURRENT (A
10
D
I
0
3.5 4.5 5.5 6.5 7.5
V
, GATE TO SOURCE VOLTAGE (V)
GS
25oC
-55oC
Figure 4. On-Resistance Variation with
Gate-to-Source Voltage.
100
VGS = 0V
10
T
= 125oC
1
0.1
0.01
0.001
, REVERSE DRAIN CURRENT (A
S
I
0.0001
00.20.40.60.811.2
25oC
V
, BODY DIODE FORWARD VOLTAGE (V)
SD
-55oC
Figure 5. Transfer Characteristics. Figure 6. Body Diode Forward Voltage Variation
with Source Current and Temperature.
FDP2670/FDB2670 Rev C1(W)
Page 4
Typical Characteristics
)
)
/
FDP2670
10
ID = 10A
8
6
4
2
, GATE-SOURCE VOLTAGE (V)
GS
V
0
0 5 10 15 20 25 30
, GATE CHARGE (nC)
Q
g
VDS = 50V
100V
75V
2000
C
1500
1000
CAPACITANCE (pF)
500
C
RSS
0
0 25 50 75 100 125 150 175 200
ISS
C
OSS
V
, DRAIN TO SOURCE VOLTAGE (V)
DS
Figure 7. Gate Charge Characteristics. Figure 8. Capacitance Characteristics.
100
R
LIMIT
DS(ON)
10
VGS = 10V
1
SINGLE PULSE
, DRAIN CURRENT (A
D
I
= 1.6oC/W
R
θ
JC
T
= 25oC
C
0.1 1 10 100 1000
, DRAIN-SOURCE VO LTAGE (V)
V
DS
DC
100ms
10ms
10us
100us
1ms
2000
SINGLE PULSE
R
= 1.6°C/W
θ
JC
1500
1000
500
P(pk), PEAK TRANSIENT POWER (W)
0
0.00001 0.0001 0.001 0.01 0.1 1
, TIME (sec)
t
1
T
C
f = 1MHz V
= 25°C
GS
FDB2670
= 0 V
Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse Maximum
Power Dissipation.
1
r(t), NORMALIZED EFFECTIVE
0.1
TRANSIENT THERMAL RESISTANCE
0.01
D = 0.5
0.2
0.1
0.05
0.02
0.01 SINGLE PULSE
R
(t) = r(t) * R
JC
θ
R
= 1.6 °C/W
JC
θ
P(pk
t
1
t
2
T
- TC = P * R
J
Duty Cycle, D = t
JC
θ
(t)
θJC
/ t
1
2
0.00001 0.0001 0.001 0.01 0.1 1
t
, TIME (sec)
1
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1. Transient thermal response will change depending on the circuit board design.
FDP2670/FDB2670 Rev C1(W)
Page 5
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks.
ACEx™ Bottomless™ CoolFET™ CROSSVOLT™ DenseTrench™ DOME™ EcoSPARK™ E2CMOS EnSigna
TM
TM
FACT™ FACT Quiet Series™
STAR*POWER is used under license
FAST FASTr™ FRFET™ GlobalOptoisolator™ GTO™ HiSeC™ ISOPLANAR™ LittleFET™ MicroFET™ MicroPak™ MICROWIRE™
OPTOLOGIC™ OPTOPLANAR™ PACMAN™ POP™ Power247™ PowerTrench
QFET™ QS™ QT Optoelectronics™ Quiet Series™ SILENT SWITCHER
SMART START™ STAR*POWER™ Stealth™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SyncFET™ TinyLogic™ TruTranslation™ UHC™
UltraFET
VCX™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information
Preliminary
No Identification Needed
Formative or In Design
First Production
Full Production
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
Rev. H4
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