Datasheet FDP2572, FDB2572 Datasheet (Fairchild Semiconductor)

Page 1
FDB2572 / FDP2572
N-Channel PowerTrench® MOSFET 150V, 29A, 54mΩ
FDB25 72 / FDP2572
September 2002
Features
•r
•Q
• Low Miller Charge
•Low Q
• UIS Capability (Single Pulse and Repetitive Pulse)
• Qualified to AEC Q101
Formerly developmental type 82860
= 45mΩ (Typ.), V
DS(ON)
(tot) = 26nC (Typ.), V
g
Body Diode
RR
= 10V, ID = 9A
GS
= 10V
GS
Applications
• DC/DC converters and Off-Line UPS
• Distributed Pow er Architectures and VRMs
• Primary Switch for 24V and 48V Systems
• High Voltage Synchronous Re ctifier
• Direct Injection / Diesel Injection Systems
• 42V Automotive Lo ad Control
• Electronic Valve T rain System s
DRAIN
SOURCE
DRAIN
GATE
DRAIN
(FLANGE)
TO-220AB
FDP SERIES
MOSFET Maximum Ratings T
GATE
SOURCE
TO-263AB
FDB SERIES
= 25°C unless otherwise noted
C
(FLANGE)
G
Symbol Parameter Ratings Units
V
DSS
V
GS
Drain to Source Voltage 150 V Gate to Source Voltage ±20 V Drain Curr e nt Continuous (T
I
D
Continuous (T Continuous (T
= 25oC, VGS = 10V)
C
= 100oC, VGS = 10V) 20 A
C
= 25oC, VGS = 10V, R
amb
= 43oC/W) 4 A
θJA
29 A
Pulsed Figure 4 A
E
AS
P
D
T
, T
J
STG
Single Pulse Avalanche Energy (Note 1) 36 mJ Power dissipation 135 W
o
Derate above 25
C0.9W/
Operating and Storage Temperature -55 t o 175
D
S
o
C
o
C
Thermal Characteristics
R
θJC
R
θJA
R
θJA
This product ha s been des igned to me et the e xtr eme test c ondit ions and envir onment deman ded by the automot ive indus t ry. For a
All Fairchild Semiconductor prod ucts are manufactured, assembled and tested under ISO9000 and QS9000 quality systems
©2002 Fairchild Semiconductor Corporation
Thermal Resistance Junction to Case TO-220,TO-263 1.11 Thermal Resistance Junction t o Ambient TO-220, TO-263 (Note 2) 62 Thermal Resistance Junction to Ambient TO-263, 1in2 copper pad ar ea 43
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.
certification.
FDB2572 / FDP2572 Rev. B
o
C/W
o
C/W
o
C/W
Page 2
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDB2572 FDB2572 TO-263AB 330mm 24mm 800 units FDP2572 FDP2572 TO-220AB Tube N/A 50 units
FDB25 72 / FDP2572
Electrical Characteristics
TC = 25°C unless otherwise noted
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
B I
DSS
I
GSS
VDSS
Drain t o Source Breakdown Volta ge ID = 250µA, VGS = 0V 150 - - V
V
= 120V - - 1
Zero Gate Voltage Drain Current
DS
= 0V TC = 150
V
GS
o
--250
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA2-4V
=9A, VGS=10V - 0.045 0.054
I
Drain to Source On Resistance
D
= 4A, VGS = 6V, - 0.050 0.075
D
=9A, VGS=10V, TC=175oC - 0.126 0.146
I
D
Dynamic Characteristics
C C C Q Q Q Q Q
ISS OSS RSS
g(TOT) g(TH) gs gs2 gd
Input Capacitance Output Capacitance - 183 - pF Reverse Transfer Capacitance - 40 - pF
= 25V, VGS = 0V,
V
DS
f = 1MHz
Total G ate Ch arg e at 10 V VGS = 0V to 10V Threshold Gate Charge VGS = 0V to 2V - 3.3 4.3 nC Gate to Source Gate Charge - 8 - nC Gate Charge Threshold to Plateau - 5 - nC
V
DD
I
= 9A
D
I
= 1.0m A
g
= 75V
Gate to Drain “Miller” Charge - 6 - nC
-1770- pF
-2634nC
µA
ΩI
Resistive Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time Turn-On Delay Time - 11 - ns Rise Time - 14 - ns T u rn-Off Delay Time - 31 - ns Fall Time - 14 - ns Turn-Off Time - - 66 ns
(VGS = 10V)
V
DD
V
GS
--36ns
= 75V, ID = 9A = 10V, RGS = 11.0Ω
Drain-Source Diode Characteristics
I
= 9A - - 1 .25 V
V
SD
t
rr
Q
RR
Notes: 1: Starting T 2: Pulse Width = 100s
©2002 Fairchild Semiconductor Corporation FDB2572 / FDP2572 Rev. B
Source to Drain Di ode Voltage Reverse Recovery Time ISD = 9A, dISD/dt =100A/µs- -74ns
Reverse Recovered Charge ISD = 9A, dISD/dt =100A/µs - - 169 nC
= 25°C, L = 0.2mH, IAS = 19A.
J
SD
I
= 4A - - 1.0 V
SD
Page 3
FDB25 72 / FDP2572
Typical Characteristics T
= 25°C unless otherwise noted
C
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0255075100 175
125
TC, CASE TEMPERATURE (oC)
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2.0
DUTY CYCLE - DESCENDING ORDER
0.5
0.2
0.1
0.05
0.02
0.01
-5
10
-4
10
SINGLE PULSE
, NORMALIZED Z
1.0
0.1
θJC
THERMAL IMPEDANCE
0.01
40
V
= 10V
GS
35
30
25
20
15
, DRAIN CURRENT (A)
10
D
I
5
150
0
25 50 75 100 125 150 175
Figure 2. Maximum Continuous Drain Curr ent vs
-3
10
t, RECTANGULAR PULSE DURATION (s)
-2
10
TC, CASE TEMPERATURE (oC)
Case Temperature
P
DM
NOTES: DUTY FACTOR: D = t
PEAK TJ = PDM x Z
-1
10
θJC
10
1/t2
x R
0
t
1
t
2
+ T
θJC
C
1
10
Figure 3. Normalized Maximum Transient Thermal Impedance
500
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
100
, PEAK CURRENT (A)
DM
I
VGS = 10V
20
-5
10
-4
10
-3
10
t, PULSE WIDT H (s)
-2
10
-1
10
TC = 25oC FOR TEMPERATURES
o
ABOVE 25
C DERATE PEAK
CURRENT AS FOLLOWS:
175 - T
I = I
25
10
C
150
0
1
10
Figure 4. Peak Current Capability
©2002 Fairchild Semiconductor Corporation FDB2572 / FDP2572 Rev. B
Page 4
FDB25 72 / FDP2572
Typical Characteristics T
1000
100
10
OPERATION IN THIS
AREA MAY BE
, DRAIN CURRENT (A)
D
I
LIMITED BY r
1
SINGLE PULSE TJ = MAX R ATED
T
= 25oC
C
0.1 1 10 100
DS(ON)
VDS, DRAIN TO SOURCE VOLTAGE (V)
= 25°C unless otherwise noted
C
10µs 100µs
1ms
10ms
DC
Figure 5. Forward Bias Safe Operating Area
60
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
V
DD
= 15V
TJ = 175oC
50
40
30
100
STARTING TJ = 25oC
10
STARTING TJ = 150oC
1
If R = 0
, AVALANCHE CURRENT (A)
200
tAV = (L)(IAS)/(1.3*RATED BV
AS
I
If R ≠ 0 t
= (L/R)ln[(IAS*R)/(1.3*RATED BV
AV
0.1
0.001 0.01 0.1 1 tAV, TIME IN AVALANCHE (ms)
DSS
- VDD)
DSS
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
Figure 6. Unclamped Inductive Switching
Capability
60
TC = 25oC
50
40
30
VGS = 10V
VGS = 6V
- VDD) +1]
VGS = 7V
20
, DRAIN CURRENT (A)
D
I
10
0
3.0 3.5 4.0 4.5 5.0 5.5 6.0 6.5
TJ = 25oC
TJ = -55oC
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 7. Transfer Characteristics Figure 8. Saturation Characteristics
60
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
55
50
45
40
DRAIN TO SOURCE ON RESISTANCE (m Ω)
0102030
VGS = 6V
VGS = 10V
I
, DRAIN CURRENT (A)
D
Figure 9. Drain to So urce On Resistanc e v s Drai n
Current
20
, DRAIN CURRENT (A)
D
I
10
0
012345
3.0
2.5
2.0
1.5
1.0
ON RESISTANCE
0.5
NORMALIZED DRAIN TO SOURCE
0
-80 -40 0 40 80 120 160 200
VDS, DRAIN TO SOURCE VOLTAGE (V)
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
TJ, JUNCTION TEMPERATURE (oC)
VGS = 5V
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
VGS = 10V, ID =9A
Figure 10. Normalized Drain to Source On
Resistance vs Junction Temperature
©2002 Fairchild Semiconductor Corporation FDB2572 / FDP2572 Rev. B
Page 5
FDB25 72 / FDP2572
Typical Characteristics T
1.4
1.2
1.0
0.8
NORMALIZED GATE
THRESHOLD VOLTAGE
0.6
0.4
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
= 25°C unless otherwise noted
C
VGS = VDS, ID = 250µA
Figure 11. Normalized G ate Threshol d Voltage vs
Junction Temperatur e
1000
C
= CGS + C
1000
100
ISS
C
≅ C
+ C
OSS
DS
GD
C
= C
RSS
GD
GD
1.2 ID = 250µA
1.1
1.0
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.9
-80 -40 0 40 80 120 160 200 T
, JUNCTION TEMPERATURE (oC)
J
Figure 12. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
10
VDD = 75V
8
6
4
C, CAPACITANCE (pF)
V
= 0V, f = 1MHz
GS
10
0.1 1 10 150 VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 13. Capacitance vs Drain to Sour ce
Voltage
2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
0 5 10 15 20 25 30
Qg, GATE CHARGE (nC)
WAVEFORMS IN DESCENDING ORDER:
ID = 9A I
= 4A
D
Figure 14. Gat e Charge Waveforms for Constant
Gate Currents
©2002 Fairchild Semiconductor Corporation FDB2572 / FDP2572 Rev. B
Page 6
Test Circuits and Waveforms
FDB25 72 / FDP2572
BV
DSS
t
P
V
DS
TO OBTAIN
VARY t
P
REQUIRED PEAK I
V
GS
V
DS
L
I
AS
R
AS
G
+
V
DD
-
DUT
t
0V
P
I
AS
0.01Ω
0
t
AV
Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms
V
I
g(REF)
DS
L
V
GS
+
V
DD
-
DUT
Q
V
0
g(TH)
I
g(REF)
0
DD
V
GS
V
= 2V
GS
Q
gs2
Q
gs
Q
g(TOT)
V
DS
Q
gd
V
DD
V
= 10V
GS
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms
V
DS
R
L
V
GS
R
GS
V
GS
DUT
+
V
DD
-
V
DS
0
V
GS
10%
0
t
d(ON)
90%
t
ON
t
r
t
d(OFF)
t
OFF
t
f
90%
10%
10%
90%
PULSE WIDTH
50%50%
Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms
©2002 Fairchild Semiconductor Corporation FDB2572 / FDP2572 Rev. B
Page 7
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maxi mum al lowab le de vice p ower di ssip ation, P application. Therefore the application’s ambient temperature, T must be reviewed to ensure that T Equation 1 mathematically represents the relationship and
(oC), and th ermal res istance R
A
is never exceeded.
JM
serve s as the basis for establ ishing the rating of the part.
TJMTA–()
P
----------------- ------------=
DM
R
θJA
In using surface mount devices such as the TO-263 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power d issipati on rating s. Precise d etermin ation of P comple x and influenced by many factors:
1. Mou nting pad area ont o which the device is attached and whet her the re is copp er on one s ide or both side s of the board.
2. The number of copper layers and the thickness of the board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For no n steady state applic ations, th e pulse widt h, the duty cycle and the transient thermal response of the part, the boa rd and the environment they are in.
Fairchild provides thermal information to assist the designer’s preliminary application evaluation. Figure 21 defines the R copper (component side) area. This is for a horizontally
for the device as a function of the top
θJA
positi on ed FR-4 bo ar d with 1oz c opper af t er 1000 se c on ds of stea dy st ate pow er w ith n o air flow . Th is gr aph prov ides the necessary inf ormation for calculation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice t hermal model or manu ally utilizin g the normal ized maximum transient thermal impedance curve.
DM
(oC/W)
θJA
(EQ. 1)
, in an
is
DM
C/W)
o
(
θJA
R
Figure 21. Thermal Resistance vs Mounting
80
R
= 26.51+ 19.84/(0.262+Area) EQ.2
θJA
R
= 26.51+ 128/(1.69+Area) EQ.3
θJA
60
40
20
(0.645) (6.45) (64.5)
AREA, TOP COPPER AREA in2 (cm2)
1100.1
Pad Area
FDB25 72 / FDP2572
Therma l resi stances correspondi ng to other copper are as can be obtained from Figure 21 or by calculation using Equation 2 or 3. Equation 2 is used for copper area defined in inches square and equation 3 is for area in centimeter square. The area, in square inches or square centimeters is the top copper area including the gate and source pads.
19.84
26.51
=
R
θJA
26.51
=
R
θJA
©2002 Fairchild Semiconductor Corporation FDB2572 / FDP2572 Rev. B
-------------------------------------+
0.262 Area+()
Area in Inches Squared
128
----------------------------------+
1.69 Area+()
Area in Centimeters Squared
(EQ. 2)
(EQ. 3)
Page 8
PSPICE Electrical Model
.SUBCKT FDB 2572 2 1 3 ; rev April 2002 CA 12 8 5.5e -10 Cb 15 14 7.4e-10 Cin 6 8 1.7e-9
Dbod y 7 5 DbodyMOD Dbreak 5 11 Db reakMOD Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 160 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1
It 8 17 1 Lgat e 1 9 9.56e-9
Ldrain 2 5 1.0e -9 Lsource 3 7 7.71e-9
RLgate 1 9 95.6 RLdr ai n 2 5 10 RLsource 3 7 77.1
Mmed 16 6 8 8 M m edMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD
Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 35e-3 Rgate 9 20 1.6 RSLC1 5 51 RSL CM OD 1.0e-6 RSLC2 5 50 1.0e 3 Rsource 8 7 RsourceMOD 3.0e-3 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BM OD S2a 6 15 14 13 S2AM OD S2b 13 15 14 13 S2BM OD
Vbat 22 19 DC 1
GATE
1
LGATE
RLGATE
RGATE
9
CA
ESG
+
EVTEMP
+
18 22
20
S1A
12
13
8
S1B
EGS EDS
FDB25 72 / FDP2572
17 18
-
7
RVTEMP 19
-
+
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
6
-
S2A
14 13
S2B
13
+
+
6 8
-
-
5
RSLC1
51
+
5
ESLC
51
­50
RDRAIN
16
21
-
19
8
MSTRO
CIN
15
CB
8
14
+
5 8
-
MMED
DBREAK
EBREAK
MWEAK
RSOURCE
RBREAK
17 18
IT
8
RVTHRES
11
+
ESLC 51 50 VALUE={(V(5,5 1)/ABS(V(5,51)))*(PWR (V (5,51)/(1e-6*52),3))} .MODEL DbodyMOD D (IS=6.0E-11 N=1.14 RS=3.9e-3 TRS1=3.5e-3 TRS2=3.0e-6
+ CJO=1.1e-9 M= 0.63 TT=6.2e-8 X T I=4.5) .MODEL Db reakMOD D (RS=10 T RS 1=5.0e-3 TRS2=-5.0e-6) .MODEL DplcapMOD D (CJO=3.5e-10 IS=1.0e-30 N=10 M=0.65)
.MODEL MmedMOD NMOS (VTO= 3.5 5 K P=3 IS=1e-40 N=10 T OX = 1 L=1u W=1u RG=1.6) .MODEL MstroMOD NMOS (VTO=4. 0 KP=25 IS=1e-30 N=10 TOX=1 L=1u W=1 u) .MODEL Mwe akMOD NMOS (VTO=2.95 KP=0.05 IS=1e-30 N=10 TO X = 1 L=1u W=1u RG=16 R S=0.1)
.MODEL Rb reakMOD RES (TC1=1.15e-3 TC 2=-9.5e-7) .MODEL Rd rai nMOD RES (TC 1=9. 0 e-3 TC2=2.5e-5) .MODEL RSLCMOD RES (TC1=3.0e-3 TC2=2.5e-6) .MODEL RsourceMOD RES (TC 1=4.0e-3 TC2=1.0e-6) .MODEL RvthresMOD RES (TC1=-4.1e-3 TC 2=-1.0e-5) .MODEL RvtempMOD RES (T C1=-4.0e-3 TC 2=1. 0e-6)
.MODEL S1AMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 5. 0 VOFF =-3 .5 ) .MODEL S1BMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 3. 5 VOFF =-5 .0 ) .MODEL S2AMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= - 0.5 VO FF=0.3) .MODEL S2BMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= 0 .3 VOFF= -0.5) .ENDS Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronic s S pecialist Conf erence Records, 1991, written by Wi l liam J. Hepp and C. Frank Wheatley.
©2002 Fairchild Semiconductor Corporation FDB2572 / FDP2572 Rev. B
Page 9
SABER Electrical Model
REV April 2002 ttemplate F DB 2572 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=6.0e-11,nl=1.14,rs=3.9e-3,trs1=3.5e-3,trs2=3.0e-6,cjo=1.1e-9,m=0.63,tt=6.2e-8,xti=4.5) dp..model dbreakmod = (rs=10 ,trs1=5.0e-3, tr s2=-5.0e-6) dp..model dplcapmod = (cjo=3.5e-10,isl=10.0e-30,nl=10,m=0.65) m..model mmedmod = (type=_n,vto=3.55,kp=3,is=1e-40, tox=1) m..model mstrongmod = (type=_n,vto=4.0,kp=25,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=2.95,kp=0.05,is=1e-30, tox=1,rs=0.1) sw_vcsp.. mo del s1amod = (ron=1e- 5,roff=0.1,vo n=-5.0,voff=-3 .5) sw_vcsp.. mo del s1bmod = (ron=1e- 5,roff=0.1,vo n=-3.5,voff=-5 .0) sw_vcsp.. mo del s2amod = (ron=1e- 5,roff=0.1,vo n=-0.5,voff=0.3) sw_vcsp.. mo del s2bmod = (ron=1e- 5,roff=0.1,vo n=0.3,voff=-0.5) c.ca n12 n8 = 5.5e -10 c.cb n15 n14 = 7.4e-10 c.cin n6 n8 = 1.7e -9
dp.dbody n7 n5 = model=dbodymod dp.dbreak n5 n11 = model=dbreak m od
ESG
dp.dplcap n10 n5 = model=dplca pm od spe.ebreak n11 n7 n17 n18 = 160
spe.eds n14 n8 n5 n8 = 1 spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1
GATE
1
LGATE
RLGATE
RGATE
9
EVTEMP +
18 22
20
spe.evthres n6 n21 n19 n8 = 1 spe.evtemp n20 n6 n18 n22 = 1
i.it n8 n17 = 1
S1A
12
l.lgate n1 n9 = 9.56e-9 l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 7.71e-9
S1B
CA
res.rlgate n1 n9 = 95.6 res.rldrai n n2 n5 = 10 res.rlsource n3 n7 = 77.1
m.mmed n16 n6 n8 n8 = m odel=mmedmod, l=1u, w=1u m.mstrong n16 n6 n8 n8 = model=ms tr ongmod, l=1u, w=1 u m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u
DPLCAP
10
RSLC2
-
6 8
EVTHRES
+
+
19
8
6
-
S2A
14
13
13
8
S2B
13
+
+
6
EGS EDS
8
-
-
5
RSLC1
51
ISCL
MMED
8
DBREAK
11
MWEAK
EBREAK
RSOURCE
RBREAK
17 18
IT
RVTHRES
50 RDRAIN
16
21
-
MSTRO
CIN
15
CB
8
14
+
5 8
-
RLDRAIN
DBODY
+
17 18
LSOURCE
­7
RLSOURCE
RVTEMP 19
­VBAT
+
22
LDRAIN
DRAIN
2
SOURCE
3
FDB25 72 / FDP2572
res.rbreak n17 n18 = 1, tc1=1.15e-3,tc2=-9.5 e-7 res.rdrain n50 n16 = 35e-3, tc1= 9.0 e-3,tc2=2.5e-5 res.rgate n9 n20 = 1.6 res.rslc1 n5 n51 = 1.0e-6, tc1=3.0e-3,tc2=2.5e-6 res.rslc2 n5 n50 = 1.0e3 res.rsour ce n8 n7 = 3.0e-3, tc1=4. 0e-3,tc2=1.0e-6 res.rvthres n22 n8 = 1, tc1=-4.1e-3,tc2=-1.0e-5 res.rvtemp n18 n19 = 1, tc1=-4.0e-3,tc2=1.0e-6 sw_vcsp.s1 a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1 b n13 n12 n13 n8 = model= s1 bmod sw_vcsp.s2 a n6 n15 n14 n13 = model= s2 amod sw_vcsp.s2 b n13 n15 n14 n13 = model=s2bmod
v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5, n51)/(1e-9+abs(v(n5,n51) )))*((abs(v(n5,n51)*1e6/ 52))** 3))} }
©2002 Fairchild Semiconductor Corporation FDB2572 / FDP2572 Rev. B
Page 10
FDB25 72 / FDP2572
SPICE Thermal Model
REV 26 April 2002 FDB2572 CTHERM1 TH 6 3.8e-3
CTHERM2 6 5 4. 0e-3 CTHERM3 5 4 4. 2e-3 CTHERM4 4 3 4. 3e-3 CTHERM5 3 2 8. 5e-3 CTHERM6 2 TL 3.0e-2
RTHERM1 TH 6 5.5e-4 RTHERM2 6 5 5. 0e-3 RTHERM3 5 4 4. 5e-2 RTHERM4 4 3 10.5e-2 RTHERM5 3 2 3. 7e-1 RTHERM6 2 TL 3.8e-1
SABER Thermal Model
SABER therm al m odel F DB2572 template thermal_model th tl thermal_ c th , tl { ctherm.c th erm 1 th 6 =3.8e-3 ctherm.ctherm2 6 5 =4.0e-3 ctherm.ctherm3 5 4 =4.2e-3 ctherm.ctherm4 4 3 =4.3e-3 ctherm.ctherm5 3 2 =8.5e-3 ctherm.ctherm6 2 tl =3.0e-2
rtherm.rtherm1 th 6 =5.5e-4 rtherm.rt herm2 6 5 =5.0e-3 rtherm.rt herm3 5 4 =4.5e-2 rtherm.rt he rm4 4 3 =10. 5 e-2 rtherm.rt herm5 3 2 =3.7e-1 rthe r m.rtherm6 2 tl =3.8 e-1 }
RTHERM1
RTHERM2
RTHERM3
RTHERM4
RTHERM5
JUNCTION
th
CTHERM1
6
CTHERM2
5
CTHERM3
4
CTHERM4
3
CTHERM5
RTHERM6
2
CTHERM6
CASE
tl
©2002 Fairchild Semiconductor Corporation FDB2572 / FDP2572 Rev. B
Page 11
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Rev. I1
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