Datasheet FDB2552 Datasheet (Fairchild Semiconductor)

Page 1
FDB2552 / FDP2552
N-Channel PowerTrench® MOSFET 150V, 37A, 36mΩ
FDB25 52 / FDP2552
October 2002
Features
•r
•Q
• Low Miller Charge
•Low Q
• UIS Capability (Single Pulse and Repetitive Pulse)
• Qualified to AEC Q101
Formerly developmental type 82869
= 32mΩ (Typ.), V
DS(ON)
(tot) = 39nC (Typ.), V
g
Body Diode
RR
= 10V, ID = 16A
GS
= 10V
GS
Applications
• DC/D C C onverters an d Of f- li ne UPS
• Distributed P ower Arc hitectures and VRMs
• Primary Switch for 24V and 48V Syst ems
• High Voltage Synchronous Rectifier
• Direct Injection / Diesel Injection Systems
• 42V Automotiv e Load Control
• Elec tr on ic Valve Train Sys tems
D
DRAIN
(FLANGE)
SOURCE
DRAIN
GA TE
TO-220AB
FDP SERIES
MOSFET Maximum Ratings T
= 25°C unless otherwise not ed
C
GATE
SOURCE
TO-263AB
FDB SERIES
DRAIN
(FLANGE)
G
S
Symbol Parameter Ratings Units
V
DSS
V
GS
Drain to Source Voltage 150 V Gate to Source Voltage ±20 V Drain Curr e nt Continuous (T
I
D
Continuous (T Continuous (T
= 25oC, VGS = 10V)
C
= 100oC, VGS = 10V) 26 A
C
= 25oC, VGS = 10V) with R
amb
= 43oC/W 5 A
θJA
37 A
Pulsed Figure 4 A
E
AS
P
D
, T
T
J
STG
Single Pulse Avalanche Energy (Note 1) 390 mJ Power dissipation 150 W
o
Derate above 25
C1.0W/
Operating and Storage Temperature -55 to 175
o
C
o
C
Thermal Characteristics
R
θJC
R
θJA
R
θJA
This product has been designed to meet the extreme test conditions an d environment dem anded by the au tomotive industry. For a
All Fairchild Semiconductor products are manufactu red, assembled and tested under ISO9000 and QS9000 quality systems
©2002 Fairchild Semiconductor Corporation
Thermal Resistance Junction to Case TO-220, TO-263 1.0 Thermal Resistance Junction t o Ambient TO- 220, TO-263 (Note 2) 62 Thermal Resistance Junction to Ambient TO-263, 1in2 copper pad ar ea 43
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/
Reliability data can be fou nd a t: http://ww w.f airc hilds e m i.co m /pr oduc ts/dis c rete/reliab ility/ind ex.html.
certification.
FDB2552 / FDP2552 Rev. B
o
C/W
o
C/W
o
C/W
Page 2
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDB2552 FDB2552 TO-263AB 330mm 24mm 800 units FDP2552 FDP2552 TO-220AB Tube N/A 50 units
FDB25 52 / FDP2552
Electrical Characteristics
TC = 25°C unless otherwise noted
Symbol Parameter Test Con ditions Min Typ Max Units
Off Characteristics
B I
DSS
I
GSS
VDSS
Drain to Sou r c e Br ea k down Voltag e ID = 250µA, VGS = 0V 150 - - V
V
= 120V - - 1
Zero Gate Voltage Drain Current
DS
= 0V TC = 150oC- -250
V
GS
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA2-4V
= 16A, VGS = 10V - 0.032 0.036
I
D
I
= 8A, VGS = 6V - 0.036 0.054
Drain to S ou r c e On Re si st ance
D
= 16A, VGS = 10V,
I
D
T
= 175oC
J
- 0.084 0.097
Dynamic Characteristics
C C C Q Q Q Q Q
ISS OSS RSS
g(TOT) g(TH) gs gs2 gd
Input Capacitance Output Capacitanc e - 285 - pF Reverse Transfer Capacitance - 55 - pF
= 25V, VGS = 0V,
V
DS
f = 1MHz
Total Gate Charge at 10V VGS = 0V to 10V Threshold Gate Charge VGS = 0V to 2V - 5.2 6.8 nC Gate to Source Gate Charg e - 13.5 - nC Gate Charge Threshold to Plateau - 8.4 - nC
V
DD
I
= 16A
D
I
= 1.0m A
g
= 75V
Gate to Drain “Miller” Charge - 8.3 - nC
- 2800 - pF
39 51 nC
µA
Ω
Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time Turn-On Delay Time - 12 - ns Rise Time - 29 - ns Turn-Off D elay Time - 36 - ns Fall Time - 29 - ns Turn-Off Time - - 97 ns
(VGS = 10V)
V
= 75V, ID = 16A
DD
V
= 10V, RGS = 8.2Ω
GS
- - 62 ns
Drain-Source Diode Characteristics
I
= 16A - - 1.25 V
V
SD
t
rr
Q
RR
Notes: 1: Starting TJ = 25°C, L = 7.8mH, IAS = 10A. 2: Pulse Width = 100s
©2002 Fairchild Semiconductor Corporation FDB2552 / FDP2552 Rev. B
Source to Drain Diode Voltage Reverse Recovery Time ISD = 16A, dISD/dt = 100A/µs- -90ns
Reverse Recovered Charge ISD = 16A, dISD/dt = 100A/µs - - 242 nC
SD
= 8A - - 1.0 V
I
SD
Page 3
FDB25 52 / FDP2552
Typical Characteristics T
= 25°C unless otherwise noted
C
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0255075100 175
125
TC, CASE TEMPERATURE (oC)
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2
DUTY CYCLE - DESCENDING ORDER
0.5
1
0.2
0.1
0.05
0.02
0.01
0.1
, NORMALIZED
θJC
Z
THERMAL IMPEDANCE
0.01
-5
10
SINGLE PULSE
-4
10
10
40
30
20
, DRAIN CURRENT (A)
D
I
10
150
0
25 50 75 100 125 150 175
Figure 2. Maximum Continuous Drain Curr ent vs
-3
t, RECTANGULAR PULSE DURATION (s)
-2
10
TC, CASE TEMPERATURE (oC)
Case Temperature
P
DM
NOTES: DUTY FACTOR: D = t1/t PEAK TJ = PDM x Z
-1
10
θJC
10
0
x R
t
1
t
2
2
+ T
θJC
C
1
10
Figure 3. Normalized Maximum Transient Thermal Impedance
700
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
VGS = 10V
100
, PEAK CURRENT (A)
DM
I
30
-5
10
-4
10
-3
10
-2
10
-1
10
t, PULSE WIDTH (s)
TC = 25oC FOR TEMPERATURES ABOVE 25oC DERATE PEAK CURRENT AS FOLLOWS:
175 - T
I = I
25
10
C
150
0
1
10
Figure 4. Peak Current Capability
©2002 Fairchild Semiconductor Corporation FDB2552 / FDP2552 Rev. B
Page 4
Typical Characteristics T
= 25°C unless otherwise noted
C
FDB25 52 / FDP2552
300
100
10
OPERATION IN THIS
AREA MAY BE
, DRAIN CURRENT (A)
D
I
LIMITED BY r
1
SINGLE PULSE TJ = MAX RATED
TC = 25oC
0.1 1 10 100
DS(ON)
VDS, DRAIN TO SOURCE VOLTAGE (V)
10µs
100µs
1ms
10ms
DC
Figure 5. Forward Bias Safe Operating Area
80
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX V
= 15V
DD
60
40
TJ = 25oC
, DRAIN CURRENT (A)
D
I
20
TJ = 175oC
0
3.0 3.5 4.0 4.5 5.0 5.5 6.0 VGS, GATE TO SOURCE VOLTAGE (V)
TJ = -55oC
100
If R = 0
300
tAV = (L)(IAS)/(1.3*RATED BV If R ≠ 0
= (L/R)ln[(IAS*R)/(1.3*RATED BV
t
AV
10
, AVALANCHE CURRENT (A)
AS
I
1
STARTING TJ = 150oC
0.1 1 100.01
tAV, TIME IN AVALANCHE (ms)
- VDD)
DSS
- VDD) +1]
DSS
STARTING TJ = 25oC
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
Figure 6. Unclamped Inductive Switching
Capability
80
VGS = 10V
60
VGS = 6V
40
VGS = 5V
, DRAIN CURRENT (A)
D
I
20
PULSE DURATION = 80µs
0
012345
VDS, DRAIN TO SOURCE VOLTAGE (V)
DUTY CYCLE = 0.5% MAX
TC = 25oC
Figure 7. Transfer Characteristics Figure 8. Saturation Characteristics
42
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
40
38
36
34
32
DRAIN TO SOURCE ON RESISTANCE(mΩ)
30
0 10203040
VGS = 6V
VGS = 10V
ID, DRAIN CURRENT (A)
Figure 9. Drain to So urce On Resistanc e v s Drai n
Current
©2002 Fairchild Semiconductor Corporation FDB2552 / FDP2552 Rev. B
3.0
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
2.5
2.0
1.5
ON RESISTANCE
1.0
NORMALIZED DRAIN TO SOURCE
0.5
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
VGS = 10V, ID = 16A
Figure 10. Normalized Drain to Source On
Resistance vs Junction Temperature
Page 5
FDB25 52 / FDP2552
Typical Characteristics T
1.4
1.2
1.0
0.8
NORMALIZED GATE
THRESHOLD VOLTAGE
0.6
0.4
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
= 25°C unless otherwise noted
C
VGS = VDS, ID = 250µA
Figure 11. Normalized G ate Threshol d Voltage vs
Junction Temperatur e
4000
C
= CGS + C
ISS
C
≅ C
+ C
OSS
DS
1000
C
RSS
C, CAPACITANCE (pF)
100
V
GS
10
0.1 1 10 150
GD
= C
GD
= 0V, f = 1MHz
VDS, DRAIN TO SOURCE VOLTAGE (V)
GD
1.2 ID = 250µA
1.1
1.0
BREAKDOWN VOLTAGE
0.9
NORMALIZED DRAIN TO SOURCE
0.8
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
Figure 12. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
10
VDD = 75V
8
6
4
, GATE TO SOURCE VOLTAGE (V)
2
GS
V
0
0 10203040
Qg, GATE CHARGE (nC)
WAVEFORMS IN DESCENDING ORDER:
ID = 37A ID = 16A
Figure 13. Capacitance vs Drain to Sour ce
Voltage
©2002 Fairchild Semiconductor Corporation FDB2552 / FDP2552 Rev. B
Figure 14. Gat e Charge Waveforms for Constant
Gate Currents
Page 6
Test Circuits and Waveforms
V
DS
L
VARY tP TO OBTAIN REQUIRED PEAK I
V
GS
R
AS
G
+
V
DD
-
I
AS
DUT
t
0V
P
I
AS
0.01Ω
0
Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms
V
DS
V
DD
V
Q
I
g(REF)
L
V
GS
DUT
+
V
DD
-
V
0
I
g(REF)
GS
= 2V
Q
gs2
Q
g(TH)
Q
gs
0
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms
BV
DSS
t
P
t
AV
Q
g(TOT)
DS
gd
V
GS
FDB25 52 / FDP2552
V
DS
V
DD
V
= 10V
GS
V
DS
R
L
V
GS
R
GS
V
GS
DUT
+
V
DD
-
V
DS
0
V
GS
10%
0
t
d(ON)
90%
t
ON
t
r
t
d(OFF)
t
OFF
t
f
90%
10%
10%
90%
PULSE WIDTH
50%50%
Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms
©2002 Fairchild Semiconductor Corporation FDB2552 / FDP2552 Rev. B
Page 7
Thermal Resistance vs. Mounting Pad Area
80
The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, P application. Therefore the application’s ambient temperature, T must be reviewed to ensure that T Equation 1 mathematically represents the relationship and
(oC), and th ermal res istance R
A
is never exceeded.
JM
serve s as the basis for establ ishing the rating of the part.
TJMTA–()
P
----------------- ------------=
DM
R
θJA
In using surface mount devices such as the TO-263 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power d issipati on rating s. Precise d etermin ation of P comple x and influenced by many factors:
1. Mou nting pad area ont o which the device is attached and whet her the re is copp er on one s ide or both side s of the board.
2. The number of copper layers and the thickness of the board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For no n steady state applic ations, th e pulse widt h, the duty cycle and the transient thermal response of the part, the boa rd and the environment they are in.
Fairchild provides thermal information to assist the designer’s preliminary application evaluation. Figure 21 defines the R copper (component side) area. This is for a horizontally
for the device as a function of the top
θJA
positi on ed FR-4 bo ar d with 1oz c opper af t er 1000 se c on ds of stea dy st ate pow er w ith n o air flow . Th is gr aph prov ides the necessary information for calculation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice t hermal model or manu ally utilizin g the normal ized maximum transient thermal impedance curve.
DM
(oC/W)
θJA
(EQ. 1)
, in an
is
DM
60
C/W)
o
(
θJA
R
40
20
Figure 21. Thermal Resistance vs Mounting
R
= 26.51+ 19.84/(0.262+Area) EQ.2
θJA
R
= 26.51+ 128/(1.69+Area) EQ.3
θJA
(0.645) (6.45) (64.5)
AREA, TOP COPPER AREA in2 (cm2)
1100.1
Pad Area
FDB25 52 / FDP2552
Therma l resi stances correspondi ng to other copper are as can be obtained from Figure 21 or by calculation using Equation 2 or 3. Equation 2 is used for copper area defined in inch es squ are and equ ation 3 is for area in cent imeters square. The area, in square inches or square centimeters is the top copper area including the gate and source pads.
19.84
26.51
=
R
θJA
26.51
=
R
θJA
©2002 Fairchild Semiconductor Corporation FDB2552 / FDP2552 Rev. B
-------------------------------------+
0.262 Area+()
Area in Inches Squared
128
----------------------------------+
1.69 Area+()
Area in Centimeters Squared
(EQ. 2)
(EQ. 3)
Page 8
PSPICE Electrical Model
.SUBCKT FDP 2552 2 1 3 ; rev May 20 02 Ca 12 8 1e-9 Cb 15 14 1e-9 Cin 6 8 2.65e-9
Dbod y 7 5 DbodyMOD Dbreak 5 11 Db reakMOD Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 178 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1
It 8 17 1 Lgat e 1 9 7.15e-9
Ldrain 2 5 1.0e -9 Lsou rce 3 7 2.3e-9
RLgate 1 9 71.5 RLdr ai n 2 5 10 RLsource 3 7 23
Mmed 16 6 8 8 M m edMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD
Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 2.5e-2 Rgate 9 20 1.04 RSLC1 5 51 RSL CM OD 1.0e-6 RSLC2 5 50 1.0e 3 Rsource 8 7 RsourceMOD 4.6e-3 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BM OD S2a 6 15 14 13 S2AM OD S2b 13 15 14 13 S2BM OD Vbat 22 19 DC 1
GATE
1
LGATE
RLGATE
RGATE
9
CA
ESG
+
EVTEMP
+
-
18 22
20
S1A
12
13814
S1B
EGS EDS
-
13
10
6 8
+
+
RSLC2
6
S2A
13
S2B
6 8
-
-
DPLCAP
EVTHRES
+
19
8
CIN
15
CB
-
+
-
5
5
51
MSTRO
14
5 8
RSLC1
51
+
ESLC
­50
RDRAIN
16
21
8
MMED
8
DBREAK
11
+
17
EBREAK
IT
18
-
MWEAK
RSOURCE
RBREAK
17 18
RVTHRES
7
+
RVTEMP 19
-
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
FDB25 52 / FDP2552
ESLC 51 50 VALUE={(V(5,5 1)/ABS(V(5,51)))*(PWR (V (5,51)/(1e-6*75),3))} .MODEL DbodyMOD D (IS=2.6E-11 N=1.09 RS=2.6e-3 TRS1=3.0e-3 TRS2=1.5e-6
+ CJO=1.9e-9 M= 0.62 TT=5.1e-8 X T I=4.2) .MODEL DbreakMOD D (RS=0.3 TRS1=3.0e-3 TR S 2=-8.9e-6) .MODEL DplcapMOD D (CJO=5.7e-10 IS=1.0e-30 N=10 M=0.58)
.MODEL MmedMOD NMOS (VTO=3.5 KP=6 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=1.04) .MODEL Mstro M OD NMOS (VTO=4.15 KP=80 IS=1e-30 N=10 T OX = 1 L=1u W=1u) .MODEL Mwe akMOD NMOS (VTO=2.91 KP=0.03 IS=1e-30 N=10 TO X = 1 L=1u W=1u RG=10. 4 RS=0.1)
.MODEL RbreakMOD RES (TC1=1.1e-3 TC2=-2e-6) .MODEL Rd rai nMOD RES (TC 1=8. 5 e-3 TC2=2.5e-5) .MODEL RSLCMOD RES (TC1=3.4e-3 TC2=1.5e-6) .MODEL RsourceMOD RES (TC 1=4.0e-3 TC2=1.0e-6) .MODEL RvthresMOD RES (TC1=-4.3e-3 TC 2=-1.6e-5) .MODEL RvtempMOD RES (T C1=-4.1e-3 TC 2=1. 5e-6)
.MODEL S1AMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 6. 0 VOFF =-4 .0 ) .MODEL S1BMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 4. 0 VOFF =-6 .0 ) .MODEL S2AMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 2 VOFF =-0 .5 ) .MODEL S2BMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= - 0.5 VO FF=- 2)
.ENDS Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global
Temperature Options; IEEE Power Electronic s S pecialist Conf erence Records, 1991, written by Wi l liam J. Hepp and C. Frank Wheatley.
©2002 Fairchild Semiconductor Corporation FDB2552 / FDP2552 Rev. B
Page 9
SABER Electrical Model
REV May 2002 template FDP2552 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=2.6e-11,nl=1.09,rs=2.6e-3,trs1=3.0e-3,trs2=1.5e-6,cjo=1.9e-9,m=0.62,tt=5.1e-8,xti=4.2) dp..model dbreakmod = (rs=0.3, t rs1=3.0e-3,trs2=-8.9e-6) dp..model dplcapmod = (cjo=5.7e-10,isl=10.0e-30,nl=10,m=0.58) m..model mmedmod = (type=_n,vto=3.5,kp=6,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=4.15,kp=80,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=2.91,kp=0.03,is=1e-30, tox=1,rs=0.1) sw_vcsp.. mo del s1amod = (ron=1e- 5,roff=0.1,vo n=-6.0,voff=-4 .0) sw_vcsp.. mo del s1bmod = (ron=1e- 5,roff=0.1,vo n=-4.0,voff=-6 .0) sw_vcsp.. mo del s2amod = (ron=1e- 5,roff=0.1,vo n=-2,voff=-0.5 ) sw_vcsp.. mo del s2bmod = (ron=1e- 5,roff=0.1,vo n=-0.5,voff=-2 ) c.ca n12 n8 = 1e- 9 c.cb n15 n14 = 1e- 9 c.cin n6 n8 = 2.65 e-9
dp.dbody n7 n5 = model=dbodymod dp.dbreak n5 n11 = model=dbreak m od dp.dplcap n10 n5 = model=dplca pm od
spe.ebreak n11 n7 n17 n18 = 178 spe.eds n14 n8 n5 n8 = 1
GATE
spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1
LGATE
1
RLGATE
9
RGATE
ESG
EVTEMP +
20
18 22
spe.evthres n6 n21 n19 n8 = 1 spe.evtemp n20 n6 n18 n22 = 1
i.it n8 n17 = 1 l.lgate n1 n9 = 7.15e-9
l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 2.3e-9
S1A
12
S1B
CA
res.rlgate n1 n9 = 71.5 res.rldrai n n2 n5 = 10 res.rlsource n3 n7 = 23
m.mmed n16 n6 n8 n8 = m odel=mmedmod, l=1u, w=1u m.mstrong n16 n6 n8 n8 = model=ms tr ongmod, l=1u, w=1 u m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
+
19
8
6
-
S2A
14
13
13
8
S2B
13
+
+
6
EGS EDS
8
-
-
5
RSLC1
51
ISCL
8
MMED
8
DBREAK
11
MWEAK
EBREAK
RSOURCE
RBREAK
17 18
IT
RVTHRES
50 RDRAIN
16
21
-
MSTRO
CIN
15
CB
14
+
5 8
-
RLDRAIN
DBODY
+
17 18
LSOURCE
­7
RLSOURCE
RVTEMP 19
­VBAT
+
22
LDRAIN
DRAIN
2
SOURCE
3
FDB25 52 / FDP2552
res.rbreak n17 n18 = 1, tc1=1.1e-3, tc 2=-2e-6 res.rdrain n50 n16 = 2.5e-2, tc1=8. 5e-3,tc2=2.5e-5 res.rgate n9 n20 = 1.04 res.rslc1 n5 n51 = 1.0e-6, tc1=3.4e-3,tc2=1.5e-6 res.rslc2 n5 n50 = 1.0e3 res.rsour ce n8 n7 = 4.6e-3, tc1=4. 0e-3,tc2=1.0e-6 res.rvthres n22 n8 = 1, tc1=-4.3e-3,tc2=-1.6e-5 res.rvtemp n18 n19 = 1, tc1=-4.1e-3,tc2=1.5e-6 sw_vcsp.s1 a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1 b n13 n12 n13 n8 = model= s1 bmod sw_vcsp.s2 a n6 n15 n14 n13 = model= s2 amod sw_vcsp.s2 b n13 n15 n14 n13 = model=s2bmod
v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5, n51)/(1e-9+abs (v(n5,n51))))*((abs(v(n5,n51)*1e6/ 75))** 3)) }
©2002 Fairchild Semiconductor Corporation FDB2552 / FDP2552 Rev. B
Page 10
FDB25 52 / FDP2552
SPICE Thermal Model
REV 23 May 2002 FDP2552T CTHERM1 TH 6 1e-2
CTHERM2 6 5 1. 5e-2 CTHERM3 5 4 2e-2 CTHERM4 4 3 2. 1e-2 CTHERM5 3 2 2. 2e-2 CTHERM6 2 TL 9e-2
RTHERM1 TH 6 2.7e-2 RTHERM2 6 5 2. 8e-2 RTHERM3 5 4 7. 8e-2 RTHERM4 4 3 9e-2 RTHERM5 3 2 2. 7e-1 RTHERM6 2 TL 2.87e-1
SABER Thermal Model
SABER therm al m odel F DP2552T template thermal_model th tl thermal_ c th , tl { ctherm.c th erm 1 th 6 =1e-2 ctherm.ctherm2 6 5 =1.5e-2 ctherm.ctherm3 5 4 =2e-2 ctherm.ctherm4 4 3 =2.1e-2 ctherm.ctherm5 3 2 =2.2e-2 ctherm.ctherm6 2 tl =9e-2
rtherm.rtherm1 th 6 =2.7e-2 rtherm.rt herm2 6 5 =2.8e-2 rtherm.rt herm3 5 4 =7.8e-2 rtherm.rt he rm4 4 3 =9e-2 rtherm.rt herm5 3 2 =2.7e-1 rthe r m.rtherm6 2 tl =2.8 7e-1 }
RTHERM1
RTHERM2
RTHERM3
RTHERM4
RTHERM5
JUNCTION
th
CTHERM1
6
CTHERM2
5
CTHERM3
4
CTHERM4
3
CTHERM5
2
RTHERM6
tl
©2002 Fairchild Semiconductor Corporation FDB2552 / FDP2552 Rev. B
CTHERM6
CASE
Page 11
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Rev. I1
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