Datasheet FDB082N15A Datasheet (Fairchild)

Page 1
D
S
D2-PAK FDB Series
S
D
FDB082N15A
N-Channel PowerTrench® MOSFET
150V, 105A, 8.2mΩ
April 2011
FDB082N15A N-Channel PowerTrench
Features
• R
• Fast Switching Speed
• Low Gate Charge
• High Performance Trench Technology for Extremely Low
• High Power and Current Handling Capability
• RoHS Compliant
MOSFET Maximum Ratings T
V
DSS
V
GSS
I
D
I
DM
E
AS
dv/dt Peak Diode Recovery dv/dt (Note 3) 6.0 V/ns
P
D
TJ, T
T
L
*Package limitation current is 120A.
= 6.7mΩ ( Typ.)@ VGS = 10V, ID = 75A
DS(on)
R
DS(on)
= 25oC unless otherwise noted
C
Symbol Parameter Ratings Units
Drain to Source Voltage 150 V
Gate to Source Voltage ±20 V
- Continuous (TC = 25oC, Silicon Limited) 105
- Continuous (TC = 100oC, Silicon Limited) 75
(TC = 25oC) 231 W
- Derate above 25oC 1.54 W/oC
STG
Drain Current
Drain Current - Pulsed (Note 1) 420 A
Single Pulsed Avalanche Energy (Note 2) 542 mJ
Power Dissipation
Operating and Storage Temperature Range -55 to +175 Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
Description
This N-Channel MOSFET is produced using Fairchild Semi-
conductor’s advanced PowerTrench process that has been especially tailored to minimize the on-state resistance and yet maintain superior switching performance.
Application
• DC to DC Converters
• Synchronous Rectification for Server/Telecom PSU
• Battery Charger
• AC motor drives and Uninterruptible Power Supplies
• Off-line UPS
o
300
o
Thermal Characteristics
Symbol Parameter Ratings Units
R
θJC
R
θJA
Thermal Resistance, Junction to Case 0.65
Thermal Resistance, Junction to Ambient 62.5
o
C/W
®
MOSFET
A
C
C
©2011 Fairchild Semiconductor Corporation FDB082N15A Rev. A3
www.fairchildsemi.com1
Page 2
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDB082N15A FDB082N15A D2-PAK 330mm 24mm 800
FDB082N15A N-Channel PowerTrench
Electrical Characteristics T
= 25oC unless otherwise noted
C
Symbol Parameter Test Conditions Min. Typ. Max. Units
Off Characteristics
BV ∆BV
∆T
I
DSS
I
GSS
DSS
DSS
J
Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V, TC = 25oC 150 - - V Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
Gate to Body Leakage Current VGS = ±20V, V
ID = 250µA, Referenced to 25oC - 0.08 - V/oC
VDS = 120V, V
= 0V - - 1
GS
VDS = 120V, TC = 150oC - - 500
= 0V - - ±100 nA
DS
On Characteristics
V
GS(th)
R
DS(on)
g
FS
Gate Threshold Voltage VGS = VDS, ID = 250µA 2.0 - 4.0 V
Static Drain to Source On Resistance VGS = 10V, I
= 75A - 6.7 8.20 mΩ
D
Forward Transconductance VDS = 10V, ID = 75A (Note 4) - 139 - S
Dynamic Characteristics
C
C
C
iss
oss
rss
g(tot)
gs
gs2
gd
Input Capacitance
Output Capacitance - 1445 1880 pF
Reverse Transfer Capacitance - 100 - pF
VDS = 25V, VGS = 0V f = 1MHz
Total Gate Charge at 10V
Gate to Source Gate Charge - 19.1 - nC
Gate Charge Threshold to Plateau - 8.7 - nC
VDS = 75V, ID = 75A VGS = 10V
Gate to Drain “Miller” Charge - 13.5 - nC
ESR Equivalent Series Resistance(G-S) Drain Open, f = 1MHz - 2.5 - Ω
- 4645 6040 pF
- 64.5 84 nC
µA
®
MOSFET
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Turn-On Delay Time
Turn-On Rise Time - 58 126 ns
Turn-Off Delay Time - 61 132 ns
Turn-Off Fall Time - 26 62 ns
Drain-Source Diode Characteristics
I
S
I
SM
V
SD
t
rr
rr
Notes:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. Starting TJ = 25°C, L = 3 mH, ISD = 19 A
3. ISD ≤ 75A, di/dt ≤ 200A/µs, VDD ≤ BV
4. Pulse Test: Pulse width ≤ 300µs, Duty Cycle ≤ 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
Maximum Continuous Drain to Source Diode Forward Current - - 105 A
Maximum Pulsed Drain to Source Diode Forward Current - - 420 A
Drain to Source Diode Forward Voltage V
Reverse Recovery Time
Reverse Recovery Charge - 268 - nC
, Starting TJ = 25°C
DSS
VDD = 75V, ID = 75A VGS = 10V, R
= 0V, I
GS
VGS = 0V, I dIF/dt = 100A/µs
= 4.7Ω
GEN
= 75A - - 1.25 V
SD
= 75A, V
SD
DD
= 120V
- 22 54 ns
- 96 - ns
FDB082N15A Rev. A3
2
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Page 3
Typical Performance Characteristics
2 3 4 5 6
1
10
100
300
-55oC
175oC
*Notes:
1. VDS = 10V
2. 250µs Pulse Test
25oC
I
D
, Drain Current[A]
VGS, Gate-Source Voltage[V]
0.1 1 10
10
100
500
*Notes:
1. 250µs Pulse Test
2. TC = 25oC
I
D
, Drain Current[A]
VDS, Drain-Source Voltage[V]
V
GS
= 10.0V
8.0V
6.5V
6.0V
5.5V
5.0V
0 100 200 300 400
4
6
8
10
12
14
*Note: TC = 25oC
VGS = 20V
VGS = 10V
R
DS(ON)
[mΩ],
Drain-Source On-Resistance
ID, Drain Current [A]
0.0 0.5 1.0 1.5
1
10
100
500
*Notes:
1. VGS = 0V
2. 250µs Pulse Test
175oC
I
S
, Reverse Drain Current [A]
VSD, Body Diode Forward Voltage [V]
25oC
0.1 1 10 30
50
100
1000
10000
C
oss
C
iss
C
iss
= Cgs + Cgd (Cds = shorted)
C
oss
= Cds + C
gd
C
rss
= C
gd
*Note:
1. VGS = 0V
2. f = 1MHz
C
rss
Capacitances [pF]
VDS, Drain-Source Voltage [V]
0 14 28 42 56 70
0
2
4
6
8
10
*Note: ID = 75A
VDS = 30V VDS = 75V VDS = 120V
V
GS
, Gate-Source Voltage [V]
Qg, Total Gate Charge [nC]
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
FDB082N15A N-Channel PowerTrench
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperature
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
®
MOSFET
FDB082N15A Rev. A3
3
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Page 4
Typical Performance Characteristics (Continued)
-100 -50 0 50 100 150 200
0.90
0.95
1.00
1.05
1.10
*Notes:
1. VGS = 0V
2. ID = 250µA
BV
DSS
, [Normalized]
Drain-Source Breakdown Voltage
TJ, Junction Temperature [oC]
-100 -50 0 50 100 150 200
0.0
0.5
1.0
1.5
2.0
2.5
3.0
*Notes:
1. VGS = 10V
2. ID = 75A
R
DS(on)
, [Normalized]
Drain-Source On-Resistance
TJ, Junction Temperature [oC]
0.1 1 10 100 300
0.1
1
10
100
1000
10µs
100µs
1ms
10ms
I
D
, Drain Current [A]
VDS, Drain-Source Voltage [V]
Operation in This Area is Limited by R
DS(on)
*Notes:
1. TC = 25oC
2. TJ = 175oC
3. Single Pulse
DC
25 50 75 100 125 150 175
0
20
40
60
80
100
120
I
D
, Drain Current [A]
TC, Case Temperature [oC]
0.001 0.01 0.1 1 10 100 1000
1
10
50
STARTING TJ = 150oC
STARTING TJ = 25oC
I
AS
, AVALANCHE CURRENT (A)
tAV, TIME IN AVALANCHE (ms)
If R = 0 tAV = (L)(IAS)/(1.3*RATED BVDSS-VDD) If R = 0 tAV = (L/R)In[(IAS*R)/(1.3*RATED BVDSS-VDD)+1]
Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation vs. Temperature vs. Temperature
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current
vs. Case Temperature
FDB082N15A N-Channel PowerTrench
®
MOSFET
Figure 11. Unclamped Inductive Switching Capability
FDB082N15A Rev. A3
4
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Page 5
Typical Performance Characteristics
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
0.001
0.01
0.1
1
0.01
0.1
0.2
0.05
0.02
*Notes:
1. Z
θJC
(t) = 0.65oC/W Max.
2. Duty Factor, D= t1/t
2
3. TJM - TC = PDM * Z
θJC
(t)
0.5
Single pulse
Thermal Response [Z
θJC
]
Rectangular Pulse Duration [sec]
Figure 12. Transient Thermal Response Curve
FDB082N15A N-Channel PowerTrench
P
DM
t
1
t
2
®
MOSFET
FDB082N15A Rev. A3
www.fairchildsemi.com5
Page 6
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
FDB082N15A N-Channel PowerTrench
®
MOSFET
FDB082N15A Rev. A3
6
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Page 7
DUT
V
DS
+
_
Driver
R
G
Same Type
as DUT
V
GS
• dv/dt controlled by R
G
• ISDcontrolled by pulse period
V
DD
L
I
SD
10V
V
GS
( Driver )
I
SD
( DUT )
V
DS
( DUT )
V
DD
Body Diode
Forward Voltage Drop
V
SD
IFM, Body Diode Forward Current
Body Diode Reverse Current
I
RM
Body Diode Recovery dv/dt
di/dt
D =
Gate Pulse Width Gate Pulse Period
--------------------------
DUT
V
DS
+
_
Driver
R
G
Same Type
as DUT
V
GS
• dv/dt controlled by R
G
• ISDcontrolled by pulse period
V
DD
L
L
I
SD
10V
V
GS
( Driver )
I
SD
( DUT )
V
DS
( DUT )
V
DD
Body Diode
Forward Voltage Drop
V
SD
IFM, Body Diode Forward Current
Body Diode Reverse Current
I
RM
Body Diode Recovery dv/dt
di/dt
D =
Gate Pulse Width Gate Pulse Period
--------------------------
D =
Gate Pulse Width Gate Pulse Period
--------------------------
FDB082N15A N-Channel PowerTrench
Peak Diode Recovery dv/dt Test Circuit & Waveforms
®
MOSFET
FDB082N15A Rev. A3
7
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Page 8
Mechanical Dimensions
D2PAKD2PAK
FDB082N15A N-Channel PowerTrench
®
MOSFET
FDB082N15A Rev. A3
Dimensions in Millimeters
8
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Page 9
TRADEMARKS
®
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not intended to be an exhaustive list of all such trademarks.
AccuPower™ Auto-SPM™ AX-CAP™* Build it Now™ CorePLUS™ CorePOWER™
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®
®
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®
Fairchild Fairchild Semiconductor FACT Quiet Series™
®
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®
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®
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®
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®
®
®
PDP SPM™
Power-SPM™ PowerTrench
SM
PowerXS™ Programmable Active Droop™ QFET QS™
®
®
Quiet Series™ RapidConfigure™
™
Saving our world, 1mW/W/kW at a time™ SignalWise™ SmartMax™ SMART START™
®
SPM STEALTH™ SuperFET SuperSOT™-3
®
SuperSOT™-6 SuperSOT™-8 SupreMOS
®
SyncFET™ Sync-Lock™ ®*
The Power Franchise The Right Technology for Your Success™
®
TinyBoost™ TinyBuck™ TinyCalc™
®
TinyLogic TINYOPTO™ TinyPower™ TinyPWM™ TinyWire™ TriFault Detect™ TRUECURRENT®*
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®
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DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
FDB082N15A N-Channel PowerTrench
®
MOSFET
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used here in:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably
2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
expected to result in a significant injury of the user.
ANTI-COUNTERFEITING POLICY
Fairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Fairchild’s Anti-Counterfeiting Policy is also stated on our external website, www.Fairchildsemi.com, under Sales Support. Counterfeiting of semiconductor parts is a growing problem in the industry. All manufactures of semiconductor products are experiencing counterfeiting of their
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PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information Formative / In Design
Preliminary First Production
No Identification Needed Full Production
Obsolete Not In Production
FDB082N15A Rev. A3
Datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design.
Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only.
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Rev. I53
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