Datasheet FDA59N30 Datasheet (Fairchild)

Page 1
FDA59N30
FDA59N30 300V N-Channel MOSFET
TM
UniFET
Features
• 59A, 300V, R
• Low gate charge ( typical 77 nC)
• Low C
( typical 80 pF)
rss
• Fast switching
• 100% avalanche tested
• Improved dv/dt capability
= 0.056Ω @V
DS(on)
GS
= 10 V
Description
These N-Channel enhancement mode power field effect transis­tors are produced using Fairchild’s proprietary, planar stripe, DMOS technology.
This advanced technology has been especially tailored to mini­mize on-state resistance, provide superior switching perfor­mance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high effi­cient switched mode power supplies and active power factor correction.
D
!
!
"
"
"
"
!
!
"
" "
"
!
!
S
GSD
TO-3PN
FDA Series
!
!
G
Absolute Maximum Ratings
Symbol Parameter FDA59N30 Unit
V
DSS
I
D
I
DM
V
GSS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt
P
D
T
J, TSTG
T
L
Drain-Source Voltage 300 V
Drain Current - Continuous (T
- Continuous (T
Drain Current - Pulsed
= 25°C)
C
= 100°C)
C
(Note 1)
59 35
236 A
Gate-Source voltage ±30 V
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Power Dissipation (T
= 25°C)
C
- Derate above 25°C
(Note 2)
(Note 1)
(Note 1)
(Note 3)
1734 mJ
59 A
50 mJ
4.5 V/ns
500
4
Operating and Storage Temperature Range -55 to +150 °C
Maximum Lead Temperature for Soldering Purpose, 1/8” from Case for 5 Seconds
300 °C
A A
W
W/°C
Thermal Characteristics
Symbol Parameter Min. Max. Unit
R
θJC
R
θCS
R
θJA
©2005 Fairchild Semiconductor Corporation
FDA59N30 Rev. A
Thermal Resistance, Junction-to-Case -- 0.25 °C/W Thermal Resistance, Case-to-Sink 0.24 -- °C/W Thermal Resistance, Junction-to-Ambient -- 40 °C/W
1
www.fairchildsemi.com
Page 2
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDA59N30 FDA59N30 TO-3PN - - 30
FDA59N30 300V N-Channel MOSFET
Electrical Characteristics
TC = 25°C unless otherwise noted
Symbol Parameter Conditions Min. Typ. Max Units
Off Characteristics
BV
DSS
∆BV / ∆T
I
DSS
I
GSSF
I
GSSR
Drain-Source Breakdown Voltage VGS = 0V, I
Breakdown Voltage Temperature
DSS
J
Coefficient
= 250µA, Referenced to 25°C--0.3--V/°C
I
D
Zero Gate Voltage Drain Current VDS = 300V, VGS = 0V
V
DS
Gate-Body Leakage Current, Forward VGS = 30V, VDS = 0V -- -- 100 nA
Gate-Body Leakage Current, Reverse VGS = -30V, VDS = 0V -- -- -100 nA
On Characteristics
V
GS(th)
R
DS(on)
g
FS
Gate Threshold Voltage VDS = VGS, I
Static Drain-Source On-Resistance
V
GS
Forward Transconductance VDS = 40V, ID = 29.5A
Dynamic Characteristics
C
iss
C
oss
C
rss
Input Capacitance VDS = 25V, VGS = 0V,
Output Capacitance -- 710 920 pF
f = 1.0MHz
Reverse Transfer Capacitance -- 80 120 pF
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
Q
Q
g
gs
gd
Turn-On Delay Time VDD = 150V, ID = 59A
= 25Ω
R
Turn-On Rise Time -- 575 1160 ns
G
Turn-Off Delay Time -- 120 250 ns
Turn-Off Fall Time -- 200 410 ns
Total Gate Charge VDS = 240V, ID = 59A
V
Gate-Source Charge -- 22 -- nC
GS
Gate-Drain Charge -- 40 -- nC
Drain-Source Diode Characteristics and Maximum Ratings
I
S
I
SM
V
SD
t
rr
Q
rr
Maximum Continuous Drain-Source Diode Forward Current -- -- 59 A
Maximum Pulsed Drain-Source Diode Forward Current -- -- 236 A
Drain-Source Diode Forward Voltage VGS = 0V, IS = 59A -- -- 1.4 V
Reverse Recovery Time VGS = 0V, IS = 59A
/dt =100A/µs
dI
Reverse Recovery Charge -- 6.9 -- µC
F
= 250µA 300 -- -- V
D
= 240V, T
= 10V, I
--
= 125°C
C
= 250µA3.0--5.0V
D
= 29.5A -- 0.047 0.056 Ω
D
(Note 4)
--
-- 52 -- S
--
--
-- 3590 4670 pF
-- 140 290 ns
(Note 4, 5)
-- 77 100 nC
= 10V
(Note 4, 5)
-- 246 -- ns
(Note 4)
10
1
µA µA
NOTES:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 0.83mH, IAS = 59A, VDD = 50V, R
3. I
≤ 59A, di/dt ≤ 200A/µs, VDD ≤ BV
SD
4. Pulse Test: Pulse width ≤ 300 µs, Duty Cycle ≤ 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
= 25Ω, Starting TJ = 25°C
G
, Starting T
DSS
= 25°C
J
FDA59N30 Rev. A
2
www.fairchildsemi.com
Page 3
Typical Performance Characteristics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
FDA59N30 300V N-Channel MOSFET
2
10
1
10
, Drain Current [A]
D
I
0
10
10
V Top : 15.0 V
10.0 V
8.0 V
7.0 V
6.5 V
6.0 V Bottom : 5.5 V
-1
GS
0
10
VDS, Drain-Source Voltage [ V]
2
10
Notes :
※
1. 250µ s Pulse Test
2. T
= 25
℃
C
1
10
1
10
, Drain Current [A]
D
I
0
10
24681012
150oC
25oC
VGS, Gate-Source Voltage [V]
-55oC
※
1. VDS = 40V
2. 250µ s Pulse Test
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperatue
0.12
0.11
0.10
0.09
[Ω ],
0.08
DS(ON)
R
0.07
0.06
Drain-Source On-Resistance
0.05
0.04 0 25 50 75 100 125 150 175
VGS = 10V
ID, Drain Current [A]
※
VGS = 20V
Note : T
2
10
= 25
℃
J
1
10
, Reverse Dr ain Current [A]
DR
I
0
10
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
150
℃
VSD, Source-Drain voltage [V]
25
℃
Notes :
※
1. VGS = 0V
2. 250µ s Pul se Test
Notes :
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
9000
6000
3000
Capacitances [pF]
FDA59N30 Rev. A
C
= Cgs + Cgd (Cds = shorted)
iss
C
= Cds + C
oss
gd
C
= C
rss
gd
C
oss
C
iss
Note ;
※
10
1
1. VGS = 0 V
2. f = 1 MHz
C
rss
0
-1
10
0
10
VDS, Drain-Source Voltage [V]
12
10
8
VDS = 60V
VDS = 150V
VDS = 240V
6
4
, Gate-Source Voltage [V]
2
GS
V
0
0 1020304050607080
QG, Total Gate Charge [nC]
3
※
Note : I
= 59A
D
www.fairchildsemi.com
Page 4
FDA59N30 300V N-Channel MOSFET
Typical Performance Characteristics
(Continued)
Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation
vs. Temperature vs. Temperature
1.2
1.1
1.0
, (Normalized)
DSS
BV
0.9
Drain-Source Breakdown Voltag e
0.8
-100 -50 0 50 100 150 200
Notes :
※
1. VGS = 0 V
2. I
TJ, Juncti on Temperature [oC]
= 250 µ A
D
3.0
2.5
2.0
1.5
, (Normalized)
1.0
DS(ON)
R
Drain-Source On-Resistance
0.5
0.0
-100 - 50 0 50 100 150 200
TJ, Junction Temperature [oC]
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current
vs. Case Temperature
3
10
2
10
1
10
0
10
, Drain Current [A]
D
I
-1
10
-2
10
10
0
Operation in Thi s Area is Limited by R
10 ms
100 ms
DC
DS(on)
Notes :
※
1. TC = 25 oC
2. T
J
3. Single Pul se
1
10
VDS, Drain-Source Voltage [V]
1 ms
= 150 oC
10
2
100 µs
10 µs
70
60
50
40
30
, Drain Current [A]
20
D
I
10
0
25 50 75 100 125 150
TC, Case Temperature [ ]
℃
Notes :
※
1. VGS = 10 V
2. I
= 29.5 A
D
Figure 11. Transient Thermal Response Curve
D=0.5
-1
10
0.2
FDA59N30 Rev. A
0.1
0.05
-2
0.02
10
0.01
(t), Thermal Response
θ JC
Z
10
-5
single pulse
-4
10
-3
10
-2
10
t1, Square W ave Pulse Duration [sec]
4
Note s :
※
1. Z
(t) = 0.25 /W Max.
℃
θ JC
2. Du ty Factor, D =t1/t
3. TJM - TC = PDM * Z
P
DM
t
1
t
2
-1
10
10
2
(t)
θ JC
0
1
10
www.fairchildsemi.com
Page 5
12V
12V
200nF
200nF
3mA
3mA
50KΩ
50KΩ
V
V
Gate Charge Test Circuit & Waveform
V
V
GS
GS
GS
300nF
300nF
Same Type
Same Type
as DUT
as DUT
DUT
DUT
V
V
DS
DS
GS
10V
10V
Resistive Switching Test Circuit & Waveforms
FDA59N30 300V N-Channel MOSFET
Q
Q
g
g
Q
Q
gs
gs
Q
Q
gd
gd
Charge
Charge
10V
10V
10V
10V
R
R
L
DUT
DUT
L
V
V
DD
DD
V
V
DS
DS
V
V
GS
GS
R
R
G
G
V
V
DS
DS
90%
90%
10%
10%
V
V
GS
GS
t
t
d(on)tr
d(on)tr
t
t
on
on
t
t
d(off)
d(off)
t
t
f
f
t
t
off
off
Unclamped Inductive Switching Test Circuit & Waveforms
BV
BV
DSS
L
LL
V
V
DS
DS
BV
BV
DSS
V
V
DSS
I
I
AS
AS
DD
DD
I
IDI
D
D
R
R
G
G
DUT
DUT
t
t
p
p
V
V
DD
DD
1
1
1
1
----
----
----
----
E
=LI
E
=LI
=LI
E
AS
AS
AS
2
2
2
2
2
2
2
AS
AS
AS
(t)
(t)
I
I
D
D
t
t
p
p
DSS
--------------------
-------------------­BV
BV
DSS-VDD
DSS-VDD
Time
Time
V
(t)
V
(t)
DS
DS
FDA59N30 Rev. A
5
www.fairchildsemi.com
Page 6
Peak Diode Recovery dv /dt Test Circuit & Waveforms
+
DUT
DUT
I
I
SD
SD
Driver
Driver
R
R
G
G
V
V
GS
GS
+
V
V
DS
DS
_
_
L
LL
Same Type
Same Type
as DUT
as DUT
• dv/dt controlled by R
• dv/dt controlled by R
•ISDcontrolled by pulse period
•ISDcontrolled by pulse period
G
G
FDA59N30 300V N-Channel MOSFET
V
V
DD
DD
V
V
GS
GS
( Driver )
( Driver )
I
I
SD
SD
( DUT )
( DUT )
V
V
DS
DS
( DUT )
( DUT )
Gate Pulse Width
Gate Pulse Width
Gate Pulse Width
--------------------------
--------------------------
--------------------------
D =
D =
D =
Gate Pulse Period
Gate Pulse Period
Gate Pulse Period
IFM, Body Diode Forward Current
IFM, Body Diode Forward Current
I
I
RM
RM
Body Diode Reverse Current
Body Diode Reverse Current
Body Diode Recovery dv/dt
Body Diode Recovery dv/dt
V
V
SD
SD
Body Diode
Body Diode
Forward Voltage Drop
Forward Voltage Drop
di/dt
di/dt
10V
10V
V
V
DD
DD
FDA59N30 Rev. A
6
www.fairchildsemi.com
Page 7
Mechanical Dimensions
FDA59N30 300V N-Channel MOSFET
TO-3PN
FDA59N30 Rev. A
Dimensions in Millimeters
7
www.fairchildsemi.com
Page 8
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks.
ACEx™ ActiveArray™ Bottomless™ CoolFET™
CROSSVOLT™
DOME™ EcoSPARK™
2
CMOS™
E EnSigna™ FACT™ FACT Quiet Series™
Across the board. Around the world.™ The Power Franchise
®
Programmable Active Droop™
®
FAST FASTr™ FPS™ FRFET™ GlobalOptoisolator™ GTO™ HiSeC™ I2C™
i-Lo™
ImpliedDisconnect™
IntelliMAX™ ISOPLANAR™ LittleFET™ MICROCOUPLER™ MicroFET™ MicroPak™ MICROWIRE™ MSX™ MSXPro™ OCX™ OCXPro™ OPTOLOGIC
®
OPTOPLANAR™ PACMAN™
POP™ Power247™ PowerEdge™ PowerSaver™ PowerTrench QFET
®
®
QS™ QT Optoelectronics™ Quiet Series™ RapidConfigure™ RapidConnect™
µSerDes™
SILENT SWITCHER SMART START™
SPM™ Stealth™ SuperFET™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SyncFET™ TinyLogic TINYOPTO™ TruTranslation™ UHC™ UltraFET
®
UniFET™ VCX™
®
®
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FDA59N30 300V N-Channel MOSFET
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user.
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information Formative or In
Design
Preliminary First Production This datasheet contains preliminary data, and
No Identification Needed Full Production This datasheet contains final specifications. Fairchild
This datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Obsolete Not In Production This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
8
FDA59N30 Rev. A
Rev. I15
www.fairchildsemi.com
Loading...