Page 1
l Fully Isolated Package
l Easy to Use and Parallel
l Very Low On-Resistance
l Dynamic dv/dt Rating
l Fully Avalanche Rated
l Simple Drive Requirements
l Low Drain to Case Capacitance
l Low Internal Inductance
G
Description
Fifth Generation, high current density HEXFETS are
paralled into a compact, high power module providing
the best combination of switching, ruggedized design,
very low ON resistance and cost effectiveness.
The isolated SOT-227 package is preferred for all
commercial - industrial applications at power
dissipation levels to approximately 500 watts. The low
thermal resistance and easy connection to the SOT227 package contribute to its universal acceptance
throughout the industry.
PD- 91651C
FB180SA10
HEXFET® Power MOSFET
D
S
V
R
DS(on)
SOT-227
= 100V
DSS
= 0.0065W
ID = 180A
Absolute Maximum Ratings
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 180
ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 120 A
I
DM
PD @TC = 25°C Power Dissipation 480 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt 5.7 V/ns
T
J
T
STG
V
ISO
Pulsed Drain Current 720
Linear Derating Factor 2.7 W/°C
Gate-to-Source Voltage ± 20 V
Single Pulse Avalanche Energy 700 mJ
Avalanche Current 180 A
Repetitive Avalanche Energy 48 mJ
Operating Junction and -55 to + 150 °C
Storage Temperature Range
Insulation Withstand Voltage (AC-RMS) 2.5 kV
Mounting torque, M4 srew 1.3 N•m
Thermal Resistance
Parameter Typ. Max. Units
R
q JC
R
q CS
Junction-to-Case ––– 0.26
Case-to-Sink, Flat, Greased Surface 0.05 ––– °C/W
1 www.irf.com
2/1/99
Page 2
FB180SA10
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
D V
(BR)DSS
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
s
C
iss
C
oss
C
rss
Drain-to-Source Breakdown Voltage 100 ––– ––– V VGS = 0V, ID = 250µA
/D T
Breakdown Voltage Temp. Coefficient ––– 0.093 ––– V/°C Reference to 25°C, ID = 1mA
J
Static Drain-to-Source On-Resistance ––– ––– 0.0065 W VGS = 10V, ID = 108A
Gate Threshold Voltage 2.0 ––– 4.0 V VDS = VGS, ID = 250µA
Forward Transconductance 93 ––– ––– S VDS = 25V, ID = 108A
Drain-to-Source Leakage Current
––– ––– 50
––– ––– 500 VDS = 80V, VGS = 0V, TJ = 125°C
Gate-to-Source Forward Leakage ––– ––– 200 VGS = 20V
Gate-to-Source Reverse Leakage ––– ––– -200
VDS = 100V, VGS = 0V
µA
nA
VGS = -20V
Total Gate Charge ––– 250 380 ID = 180A
Gate-to-Source Charge ––– 40 60 nC VDS = 80V
Gate-to-Drain ("Miller") Charge ––– 110 165 VGS = 10.0V, See Fig. 6 and 13
Turn-On Delay Time ––– 45 ––– VDD = 50V
Rise Time ––– 351 ––– ID = 180A
Turn-Off Delay Time ––– 181 ––– RG = 2.0W (Internal)
ns
Fall Time ––– 335 ––– RD = 0.27W, See Fig. 10
Internal Source Inductance ––– 5.0 ––– nH Between lead,
and center of die contact
Input Capacitance ––– 10700 ––– VGS = 0V
Output Capacitance ––– 2800 ––– pF VDS = 25V
Reverse Transfer Capacitance ––– 1300 ––– ƒ = 1.0MHz, See Fig. 5
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Continuous Source Current MOSFET symbol
(Body Diode)
Pulsed Source Current integral reverse
(Body Diode)
––– –––
––– –––
180
720
showing the
A
p-n junction diode.
Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 180A, VGS = 0V
Reverse Recovery Time ––– 300 450 ns TJ = 25°C, IF = 180A
Reverse Recovery Charge ––– 2.6 3.9 µC di/dt = 100A/µs
Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
Starting T
RG = 25W , I
= 25°C, L =43µH
J
= 180A. (See Figure 12)
AS
I
£ 180A, di/dt £83A/µs, V
SD
DD
£ V
(BR)DSS
TJ £ 150°C
Pulse width £ 300µs; duty cycle £ 2%.
,
2 www.irf.com
Page 3
FB180SA10
1000
100
TOP
BOTTOM
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
4.5V
4.5V
10
D
I , Drain-to-Source Current (A)
20µs PULSE WIDTH
°
T = 25 C
1
0.1 1 10 100
V , Drain-to-Source Voltage (V)
DS
J
Fig 1. Typical Output Characteristics
1000
°
T = 150 C
J
1000
100
TOP
BOTTOM
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
4.5V
4.5V
10
D
I , Drain-to-Source Current (A)
20µs PULSE WIDTH
1
0.1 1 10 100
V , Drain-to-Source Voltage (V)
DS
T = 150 C
°
J
Fig 2. Typical Output Characteristics
2.5
2.0
I =
D
180A
100
1.5
°
T = 25 C
J
1.0
10
D
I , Drain-to-Source Current (A)
V = 25V
DS
1
4 5 6 7 8 9 10
V , Gate-to-Source Voltage (V)
GS
20µs PULSE WIDTH
Fig 3. Typical Transfer Characteristics
(Normalized)
0.5
DS(on)
R , Drain-to-Source On Resistance
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160
T , Junction Temperature( C)
J
Fig 4. Normalized On-Resistance
V =
GS
°
10V
Vs. Temperature
www.irf.com 3
Page 4
FB180SA10
20000
15000
10000
C, Capacitance (pF)
5000
0
1 10 100
V
=
0V,
GS
C
=
iss gs gd , ds
C
=
rss gd
C
=
oss ds gd
C
iss
C
oss
C
rss
V , Drain-to-Source Voltage (V)
DS
f = 1MHz
C
+ C
C
C
C SHORTED
+ C
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000
°
T = 150 C
100
J
20
I =
180 A
D
V = 80V
DS
V = 50V
DS
V = 20V
15
10
5
GS
V , Gate-to-Source Voltage (V)
0
0 50 100 150 200 250 300 350 400
Q , Total Gate Charge (nC)
G
DS
FOR TEST CIRCUIT
SEE FIGURE
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
10000
OPERATION IN THIS AREA LIMITED
1000
BY R
DS(on)
10us
13
10
°
T = 25 C
J
1
SD
I , Reverse Drain Current (A)
V = 0 V
0.1
0.2 0.6 1.0 1.4 1.8
V ,Source-to-Drain Voltage (V)
SD
GS
Fig 7. Typical Source-Drain Diode
100
D
I , Drain Current (A) I , Drain Current (A)
10
°
= 25 C
C
T T= 150 C
Single Pulse
1
1 10 100 1000
°
J
V , Drain-to-Source Voltage (V)
DS
Fig 8. Maximum Safe Operating Area
100us
1ms
10ms
Forward Voltage
4 www.irf.com
Page 5
200
175
150
125
100
FB180SA10
V
DS
V
GS
R
G
10V
Pulse Width £ 1 µs
Duty Factor £ 0.1 %
R
D.U.T.
D
+
V
DD
-
75
D
I , Drain Current (A)
50
25
0
25 50 75 100 125 150
T , Case Temperature ( C)
C
°
Fig 10a. Switching Time Test Circuit
V
DS
90%
10%
V
GS
Fig 9. Maximum Drain Current Vs.
t
d(on)tr
t
d(off)tf
Case Temperature
Fig 10b. Switching Time Waveforms
1
thJC
D = 0.50
0.1
0.20
0.10
0.05
0.01
0.02
0.01
SINGLE PULSE
(THERMAL RESPONSE)
Thermal Response (Z )
Notes:
1. Duty factor D = t / t
2. Peak T = P x Z + T
0.001
0.00001 0.0001 0.001 0.01 0.1
t , Rectangular Pulse Duration (sec)
1
J DM thJC C
1 2
P
DM
t
1
t
2
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
www.irf.com 5
Page 6
FB180SA10
15V
DRIVER
+
-
R
G
20V
V
DS
t
L
D.U.T
I
AS
0.01
p
Ω
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
1500
TOP
I
D
71A
100A
1200
900
V
DD
600
300
AS
E , Single Pulse Avalanche Energy (mJ)
0
25 50 75 100 125 150
Starting T , Junction Temperature( C)
J
BOTTOM
160A
°
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
10 V
Q
GS
V
G
Q
GD
Charge
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
50KΩ
12V
.2µ F
V
GS
.3µ F
D.U.T.
3mA
I
G
Current Sampling Resistors
I
+
V
-
D
Fig 13b. Gate Charge Test Circuit
DS
6 www.irf.com
Page 7
FB180SA10
Peak Diode Recovery dv/dt Test Circuit
D.U.T
+
-
R
G
Driver Gate Drive
P.W.
+
Circuit Layout Considerations
· Low Stray Inductance
· Ground Plane
· Low Leakage Inductance
Current Transformer
-
-
· dv/dt controlled by R
G
· Driver same type as D.U.T.
· I SD controlled by Duty Factor "D"
· D.U.T. - Device Under Test
Period
D =
Period
P.W.
+
+
V
DD
-
VGS=10V
*
D.U.T. ISDWaveform
Reverse
Recovery
Current
Re-Applied
Voltage
D.U.T. VDSWaveform
Inductor Curent
* V
= 5V for Logic Level Devices
GS
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
V
DD
I
SD
Fig 14. For N-Channel HEXFETS
www.irf.com 7
Page 8
FB180SA10
SOT-227 Package Details
38.30 ( 1.508 )
4
1
37.80 ( 1.488 )
-A-
30.20 ( 1.189 )
29.80 ( 1.173 )
4X
Tube
8.10 ( .319 )
7.70 ( .303 )
4.40 (.173 )
4.20 (.165 )
12.50 ( .492 )
7.50 ( .295 )
2.10 ( .082 )
1.90 ( .075 )
3
6.25 ( .246 )
2
15.00 ( .590 )
CHA MFE R
2.00 ( .079 ) X 457
25.70 ( 1.012 )
25.20 ( .992 )
-B-
R FULL
0.25 ( .01 0 ) M C A M B M
2.10 ( .082 )
1.90 ( .075 )
-C-
0.12 ( .005 )
LEAD ASSIGMENTS
C
E
G
E
IG B T
A1
K2
4
1
K1
A2
HEXF RED
3
2
S
4
1
S
HEXFET
12.30 ( .484 )
11.80 ( .464 )
D
3
2
G
QUANTITY PER TUBE IS 10
M4 SR EW AND W AS HE R INCLU DE D
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
IR GREAT BRITAIN: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020
IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086
IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 838 4630
IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673, Taiwan Tel: 886-2-2377-9936
http://www.irf.com/ Data and specifications subject to change without notice. 2/99
8 www.irf.com