as 2,097,152 words × 16 bits × 4 banks. The Mobile
RAM achieved low power consumption and high-speed
data transfer using the pipeline architecture. All inputs
and outputs are synchronized with the positive edge of
the clock.
This product is packaged in 54-ball FBGA (µBGA
).
Features
• Low voltage power supply
VDD: 2.5V ± 0.2V
VDDQ: 1.8V ± 0.15V
• Wide temperature range (−25°C to 85°C)
• Programmable partial self refresh
• Programmable driver strength
• Programmable temperature compensated self refresh
(Option)
• Deep power down mode
• Small package (54-ball FBGA (µBGA))
• Fully Synchronous Dynamic RAM, with all signals
referenced to a positive clock edge
• Pulsed interface
• Possible to assert random column address in every
cycle
• Quad internal banks controlled by BA0 and BA1
• Byte control by LDQM and UDQM
• Wrap sequence = Sequential/ Interleave
• /CAS latency (CL) = 2, 3
• Automatic precharge and controlled precharge
• Auto refresh and self refresh
• ×16 organization
• 4,096 refresh cycles/64ms
• Burst termination by Burst stop command and
Precharge command
• FBGA(µBGA) package is lead free solder (Sn-Ag-Cu)
Applications
Mobile cellular handsets, PDAs, wireless PDAs,
handheld PCs, home electronic appliances, and
information appliances, etc.
Pin Configurations
/xxx indicates active low signal.
54-ball FBGA (
1
23456789
A
VSS
DQ15
VSSQ
B
DQ14
DQ13
VDDQ
C
DQ12
DQ11
VSSQ
D
DQ10
DQ9
VDDQ
E
DQ8
NC
VSS
F
UDQM
CLK
CKE
G
NC
A11
A9
H
A8
A7
A6
J
VSS
A5
A4
(Top view)
A0 to A11 Address inputs
BA0, BA1 Bank select
DQ0 to DQ15 Data inputs/ outputs
CLK Clock input
CKEClock enable
/CS Chip select
/RAS Row address strobe
/CAS Column address strobe
/WE Write enable
UDQM Upper DQ mask enable
LDQM Lower DQ mask enable
VDD Power supply
VSS Ground
VDDQPower supply for DQ
VSSQ Ground for DQ
NC No connection
BGA)
VDDQ
VSSQ
VDDQ
VSSQ
VDD
/CAS
BA0
A0
A3
DQ0
DQ2
DQ4
DQ6
LDQM
/RAS
BA1
A1
A2
VDD
DQ1
DQ3
DQ5
DQ7
/WE
/CS
A10
VDD
Document No. E0196E30 (Ver. 3.0)
Date Published June 2002 (K) Japan
URL: http://www.elpida.com
Elpida Memory, Inc. 2001-2002
Features ........................................................................................................................................................1
Ordering Information .....................................................................................................................................2
Pin Function .................................................................................................................................................. 9
Truth Table .................................................................................................................................................. 14
Simplified State Diagram............................................................................................................................. 19
Revision History .......................................................................................................................................... 60
Data Sheet E0196E30 (Ver. 3.0)
3
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EDL1216AASA
Electrical Specifications
• All voltages are referenced to VSS (GND).
• After power up, wait more than 200 µs and then, execute Power on sequence and two Auto Refresh before proper
device operation is achieved.
Absolute Maximum Ratings
Parameter Symbol Rating Unit Note
Voltage on any pin relative to VSS VT –0.5 to +3.6 V
Supply voltage relative to VSS VDD, VDDQ –0.5 to +3.6 V
Short circuit output current IOS 50 mA
Power dissipation PD 1.0 W
Operating ambient temperature TA –25 to +85 °C
Storage temperature Tstg –55 to +125 °C
Caution
Exposing the device to stress above those listed in Absolute Maximum Ratings could cause
permanent damage. The device is not meant to be operated under conditions outside the limits
described in the operational section of this specification. Exposure to Absolute Maximum Rating
conditions for extended periods may affect device reliability.
Recommended Operating Conditions (TA = –25 to +85°°°°C)
/CAS latency Symbol Grade max. Unit Test condition Notes
Operating current
(CL = 2)
(CL = 3) IDD1 65 mA
Standby current in power down IDD2P 1 mA CKE ≤ VIL max., tCK = 15ns
Standby current in power down
(input signal stable)
Standby current in non power
down
Standby current in non power
down (input signal stable)
Active standby current in power
down
Active standby current in power
down (input signal stable)
Active standby current in non
power down
Active standby current in non
power down (input signal stable)
Burst operating current
(CL = 2)
(CL = 3) IDD4 80 mA
Refresh current
(CL = 2)
(CL = 3) IDD5 155 mA
Self refresh current
PASR="000" (Full)
PASR="001" (2BK) 0.25 mA CKE ≤ 0.2V
PASR="010" (1BK) 0.18 mA
PASR="101" (1/2 BK) 0.12 mA
PASR="110" (1/4 BK) 0.09 mA
PASR="000" (Full) IDD6 0.20 mA TCSR="01" (Ts*
PASR="001" (2BK) 0.15 mA CKE ≤ 0.2V
PASR="010" (1BK) 0.10 mA
PASR="101" (1/2 BK) 0.08 mA
PASR="110" (1/4 BK) 0.07 mA
PASR="000" (Full) IDD6 0.60 mA TCSR="11" (Ts*
PASR="001" (2BK) 0.50 mA CKE ≤ 0.2V
PASR="010" (1BK) 0.43 mA
PASR="101" (1/2 BK) 0.37 mA
PASR="110" (1/4 BK) 0.34 mA
Standby current in deep power
down mode
IDD1 65 mA 1
IDD2PS 0.6 mA CKE ≤ VIL max., tCK = ∞
IDD2N 5.5 mA
IDD2NS 2 mA
IDD3P 1.5 mA
IDD3PS 1 mA
IDD3N 17 mA
IDD3NS 12 mA
IDD4 60 mA
IDD5 155 mA tRC ≥ tRC min. 3
IDD6 0.35 mA TCSR="00" (Ts*
IDD7 10 µA CKE ≤ 0.2V
Burst length = 1
tRC ≥ tRC min., IO = 0mA,
One bank active
CKE ≥ VIH min., tCK = 15ns,
/CS ≥ VIH min.,
Input signals are changed one
time during 30ns.
CKE ≥ VIH min., tCK = ∞,
Input signals are stable.
CKE ≤ VIL max., tCK = 15ns
CKE ≤ VIL max., tCK = ∞
CKE ≥ VIH min., tCK = 15 ns,
/CS ≥ VIH min.,
Input signals are changed one
time during 30ns.
CKE ≥ VIH min., tCK = ∞,
Input signals are stable.
tCK ≥ tCK min.,
IOUT = 0mA, All banks active
4
≤ 70°C)
4
≤ 45°C)
4
≤ 85°C)
2
Data Sheet E0196E30 (Ver. 3.0)
5
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EDL1216AASA
Notes: 1. IDD1 depends on output loading and cycle rates. Specified values are obtained with the output open. In
addition to this, IDD1 is measured condition that addresses are changed only one time during tCK (min.).
2. IDD4 depends on output loading and cycle rates. Specified values are obtained with the output open. In
addition to this, IDD4 is measured condition that addresses are changed only one time during tCK (min.).
3. IDD5 is measured on condition that addresses are changed only one time during tCK (min.).
• AC high level input voltage / low level input voltage: 1.6 / 0.2V
• Input timing measurement reference level: 0.9V
• Transition time (Input rise and fall time): 1ns
• Output timing measurement reference level: 0.9V
t
CK
t
CLK
Input
1.6 V
0.9 V
0.2 V
1.6 V
0.9 V
0.2 V
t
SETUPtHOLD
CH
t
AC
t
OH
t
CL
Output
Data Sheet E0196E30 (Ver. 3.0)
7
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EDL1216AASA
Synchronous Characteristics
Parameter Symbol min. max. Unit Note
Clock cycle time
(CL= 2)
(CL= 3) tCK3 7.5 — ns
Access time from CLK
(CL= 2)
(CL= 3) tAC3 — 5.4 ns 1
CLK high level width tCH 2.5 — ns
CLK low level width tCL 2.5 — ns
Data-out hold time tOH 2.5 — ns 1
Data-out low-impedance time tLZ 0 — ns
Data-out high-impedance time
(CL= 2)
(CL= 3) tHZ3 2.5 5.4 ns
Data-in setup time tDS 1.5 — ns
Data-in hold time tDH 0.8 — ns
Address setup time tAS 1.5 — ns
Address hold time tAH 0.8 — ns
CKE setup time tCKS 1.5 — ns
CKE hold time tCKH 0.8 — ns
CKE setup time (Power down exit) tCKSP 1.5 — ns
Command (/CS, /RAS, /CAS, /WE,
UDQM, LDQM) setup time
Command (/CS, /RAS, /CAS, /WE,
UDQM, LDQM) hold time
Note: 1. Output load.
tCK2 10 — ns
tAC2 — 6 ns 1
tHZ2 2.5 6 ns
tCMS 1.5 — ns
tCMH 0.8 — ns
Z = 50 Ω
Output
30 pF
Output load
Asynchronous Characteristics
Parameter Symbol min. max. Unit Notes
ACT to REF/ACT command period (operation) tRC 67.5 ns
ACT to REF/ACT command period (refresh) tRC1 67.5 ns
ACT to PRE command period tRAS 45 120000 ns
PRE to ACT command period tRP 20
Delay time ACT to READ/WRITE command tRCD 20
ACT (one) to ACT (another) command period tRRD 15
Data-in to PRE command period tDPL 15
Data-in to ACT (REF) command period
(Auto precharge)
(CL = 2)
(CL = 3) TDAL3 2CLK + 20
Mode register set cycle time tRSC 2
Transition time tT 0.5 30 ns
Refresh time (4,096 refresh cycles) tREF 64 ms
TDAL2 2CLK + 20
ns
ns
ns
ns
ns
ns
CLK
Data Sheet E0196E30 (Ver. 3.0)
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EDL1216AASA
Pin Function
CLK (input pin)
CLK is the master clock input. Other inputs signals are referenced to the CLK rising edge.
CKE (input pins)
CKE determine validity of the next CLK (clock). If CKE is high, the next CLK rising edge is valid; otherwise it is
invalid. If the CLK rising edge is invalid, the internal clock is not issued and the Mobile RAM suspends operation.
When the Mobile RAM is not in burst mode and CKE is negated, the device enters power down mode. During power
down mode, CKE must remain low.
/CS (input pins)
/CS low starts the command input cycle. When /CS is high, commands are ignored but operations continue.
/RAS, /CAS, and /WE (input pins)
/RAS, /CAS and /WE have the same symbols on conventional DRAM but different functions. For details, refer to the
command table.
A0 to A11 (input pins)
Row Address is determined by A0 to A11 at the CLK (clock) rising edge in the active command cycle. It does not
depend on the bit organization.
Column Address is determined by A0 to 8 at the CLK rising edge in the read or write command cycle.
A10 defines the precharge mode. When A10 is high in the precharge command cycle, all banks are precharged;
when A10 is low, only the bank selected by BA0 and BA1 is precharged.
When A10 is high in read or write command cycle, the precharge starts automatically after the burst access.
BA0 and BA1 (input pin)
BA0 and BA1 are bank select signal. (See Bank Select Signal Table)
[Bank Select Signal Table]
BA0 BA1
Bank A L L
Bank B H L
Bank C L H
Bank D H H
Remark: H: VIH. L: VIL. ×: VIH or VIL
UDQM and LDQM(input pins)
UDQM and LDQM control upper byte and lower byte I/O buffers, respectively. In read mode, DQM controls the
output buffers like a conventional /OE pin. DQM high and DQM low turn the output buffers off and on, respectively.
The DQM latency for the read is two clocks. In write mode, DQM controls the word mask. Input data is written to the
memory cell if DQM is low but not if DQM is high. The DQM latency for the write is zero.
DQ0 to DQ15 (input/output pins)
DQ pins have the same function as I/O pins on a conventional DRAM.
VDD, VSS, VDDQ, VSSQ (Power supply)
VDD and VSS are power supply pins for internal circuits. VDDQ and VSSQ are power supply pins for the output
buffers.
The Mobile RAM has an extended mode register that defines low power functions. In this command, A0 through A11
are the data input pins.
After power on, the extended mode register set command must be executed to fix low power functions.
The extended mode register can be set only when all banks are in idle state.
During tRSC following this command, the Mobile RAM can not accept any other commands.
The Mobile RAM has a mode register that defines how the device operates. In this command, A0 through A11 are
the data input pins. After power on, the mode register set command must be executed to initialize the device. The
mode register can be set only when all banks are in idle state. During tRSC following this command, the Mobile
RAM cannot accept any other commands.
The Mobile RAM has four banks, each with 4,096 rows. This command activates the bank selected by BA0 and BA1
and a row address selected by A0 through A11. This command corresponds to a conventional DRAM's /RAS falling.
This command begins precharge operation of the bank selected by BA0 and BA1. When A10 is High, all banks are
precharged, regardless of BA0 and BA1. When A10 is Low, only the bank selected by BA0 and BA1 is precharged.
After this command, the Mobile RAM can’t accept the activate command to the precharging bank during tRP
(precharge to activate command period). This command corresponds to a conventional DRAM’s /RAS rising.
CLK
CKE
H
/CS
/RAS
/CAS
/WE
BA0, BA1
(Precharge select)
Write command (/CS, /CAS, /WE = Low, /RAS = High)
This command sets the burst start address given by the column address to begin the burst write operation. The first
write data in burst mode can input with this command with subsequent data on following clocks.
A10
Add
Precharge command
CLK
CKE
H
/CS
/RAS
/CAS
/WE
BA0, BA1
A10
Add
Col.
Write command
Read command (/CS, /CAS = Low, /RAS, /WE = High)
Read data is available after /CAS latency requirements have been met. This command sets the burst start address
given by the column address.
This command is a request to begin the Auto refresh operation. The refresh address is generated internally.
Before executing Auto refresh, all banks must be precharged. After this cycle, all banks will be in the idle
(precharged) state and ready for a row activate command. During tRC1 period (from refresh command to refresh or
activate command), the Mobile RAM cannot accept any other command
After the command execution, self refresh operation continues while CKE remains low. When CKE goes high, the
Mobile RAM exits the self refresh mode. During self refresh mode, refresh interval and refresh operation are
performed internally, so there is no need for external control. Before executing self refresh, all banks must be
precharged.
CLK
CKE
/CS
/RAS
/CAS
/WE
BA0, BA1
A10
Add
Self refresh entry command
Power down entry command (/CS, CKE = Low, /RAS, /CAS, /WE = High)
After the command execution, power down mode continues while CKE remains low. When CKE goes high, the
Mobile RAM exits the power down mode. Before executing power down, all banks must be precharged.
CLK
CKE
/CS
/RAS
/CAS
/WE
BA0, BA1
A10
Add
Power down entry command
Data Sheet E0196E30 (Ver. 3.0)
12
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EDL1216AASA
Deep power down entry command( /CS, CKE, /WE = Low, /RAS, /CAS = High)
After the command execution, deep power down mode continues while CKE remains low. When CKE goes high, the
Mobile RAM exits the deep power down mode. Before executing deep power down, all banks must be precharged.
This command can stop the current burst operation.
CLK
CKE
H
/CS
/RAS
/CAS
/WE
BA0, BA1
A10
Add
Burst stop command
No operation (/CS = Low, /RAS, /CAS, /WE = High)
This command is not an execution command. No operations begin or terminate by this command.
CLK
CKE
H
/CS
/RAS
/CAS
/WE
BA0, BA1
A10
Add
No operation
Data Sheet E0196E30 (Ver. 3.0)
13
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EDL1216AASA
Truth Table
Command Truth Table
CKE A11,
Function Symbol n – 1 n /CS /RAS /CAS /WE BA1 BA0 A10 A9 - A0
Device deselect DESL H × H × × × × × × ×
No operation NOP H × L H H H × × × ×
Burst stop BST H H L H H L × × × ×
Read READ H × L H L H V V L V
Read with auto precharge READA H × L H L H V V H V
Write WRIT H × L H L L V V L V
Write with auto precharge WRITA H × L H L L V V H V
Bank activate ACT H × L L H H V V V V
Precharge select bank PRE H × L L H L V V L ×
Precharge all banks PALL H × L L H L × × H ×
Mode register set MRS H × L L L L L L L V
Extended mode register set EMRS H × L L L L H L L V
Remark: H: VIH. L: VIL. ×: VIH or VIL, V = Valid data
DQM Truth Table
CKE DQM
Function Symbol n – 1 n U L
Data write / output enable ENB H × L L
Data mask / output disable MASK H × H H
Upper byte write enable / output enable ENBU H × L ×
Lower byte write enable / output enable ENBL H × × L
Upper byte write inhibit / output disable MASKU H × H ×
Lower byte write inhibit / output disable MASKL H × × H
Remark: H: VIH. L: VIL. ×: VIH or VIL
CKE Truth Table
CKE
Current state Function Symbol n – 1 n /CS /RAS /CAS /WE Address
Activating Clock suspend mode entry H L × × × × ×
Any Clock suspend mode L L × × × × ×
Clock suspend Clock suspend mode exit L H × × × × ×
Idle Auto refresh command REF H H L L L H ×
Idle Self refresh entry SELF H L L L L H
Idle Power down entry PD H L L H H H × H L H × × × ×
Idle Deep power down entry DPD H L L H H L ×
Self refresh Self refresh exit L H L H H H × L H H × × × ×
Power down Power down exit L H L H H H × L H H × × × ×
Deep power down
Deep power down exit L H × × × × ×
×
Remark: H: VIH. L: VIL. ×: VIH or VIL
Data Sheet E0196E30 (Ver. 3.0)
14
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EDL1216AASA
Function Truth Table
Current state /CS /RAS /CAS /WE Address Command Action Notes
Idle H × × × ×DESL Nop L H H H ×NOP Nop L H H L ×BST Nop
L H L H BA, CA, A10
L H L L BA, CA, A10
L L H H BA, RA ACT → Row activating
L L H L BA, A10 PRE/PALL Nop
L L L H × REF Auto refresh
L L L L OC, BA1= L MRS Mode register set
L L L L OC, BA1= H EMRS Extended mode register set
Row active H × × × ×DESL Nop L H H H ×NOP Nop L H H L ×BST Nop
L H L H BA, CA, A10
L H L L BA, CA, A10
L L H H BA, RA ACT ILLEGAL 2
L L H L BA, A10 PRE/PALL Precharge/Precharge all banks 4
L L L H × REF ILLEGAL
L L L L OC, BA MRS/EMRS ILLEGAL
Read H × × × ×DESL Continue burst to end → Row active L H H H ×NOP Continue burst to end → Row active L H H L ×BST Burst stop → Row active
L H L H BA, CA, A10 READ/READA Terminate burst, begin new read 5
L H L L BA, CA, A10 WRIT/WRITA Terminate burst, begin write 5, 6
L L H H BA, RA ACT ILLEGAL 2
L L H L BA, A10 PRE/PALL Terminate burst → Precharging L L L H × REF ILLEGAL
L L L L OC, BA MRS/EMRS ILLEGAL
Write H × × × ×DESL Continue burst to end → Write recovering L H H H ×NOP Continue burst to end → W rite recovering L H H L ×BST Burst stop → Row active
L H L H BA, CA, A10 READ/READA Terminate burst, start read : Determine AP 5, 6
L H L L BA, CA, A10 WRIT/WRITA Terminate burst, new write : Determine AP 5
L L H H BA, RA ACT ILLEGAL 2
L L H L BA, A10 PRE/PALL Terminate burst → Precharging 7
L L L H × REF ILLEGAL
L L L L OC, BA MRS/EMRS ILLEGAL
READ/READA
WRIT/ WRITA
READ/READA
WRIT/ WRITA
ILLEGAL 2
ILLEGAL 2
Begin read 3
Begin write 3
Data Sheet E0196E30 (Ver. 3.0)
15
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EDL1216AASA
Current state /CS /RAS /CAS /WE Address Command Action Notes
Read with auto
precharge L H H H ×NOP Continue burst to end → Precharging L H H L ×BST ILLEGAL
L H L H BA, CA, A10
L H L L BA, CA, A10
L L H H BA, RA ACT ILLEGAL 2
L L H L BA, A10 PRE/PALL ILLEGAL 2
L L L H × REF ILLEGAL
L L L L OC, BA MRS/EMRS ILLEGAL
H × × × ×DESL Continue burst to end → Precharging
READ/READA
WRIT/ WRITA
ILLEGAL 2
ILLEGAL 2
Write with auto
precharge
L H H H × NOP
L H H L ×BST ILLEGAL
L H L H BA, CA, A10
L H L L BA, CA, A10
L L H H BA, RA ACT ILLEGAL 2
L L H L BA, A10 PRE/PALL ILLEGAL 2
L L L H × REF ILLEGAL
L L L L OC, BA MRS/EMRS ILLEGAL
Precharging H × × × ×DESL Nop → Enter idle after tRP L H H H ×NOP Nop → Enter idle after tRP L H H L ×BST ILLEGAL
L H L H BA, CA, A10 READ/READA ILLEGAL 2
L H L L BA, CA, A10 WRIT/WRITA ILLEGAL 2
L L H H BA, RA ACT ILLEGAL 2
L L H L BA, A10 PRE/PALL Nop → Enter idle after tRP L L L H × REF ILLEGAL
L L L L OC, BA MRS/EMRS ILLEGAL
Row activating
L H H H ×NOP Nop → Enter bank active after tRCD L H H L ×BST ILLEGAL
L H L H BA, CA, A10 READ/READA ILLEGAL 2
L H L L BA, CA, A10 WRIT/WRITA ILLEGAL 2
L L H H BA, RA ACT ILLEGAL 2, 8
L L H L BA, A10 PRE/PALL ILLEGAL 2
L L L H × REF ILLEGAL
L L L L OC, BA MRS/EMRS ILLEGAL
H × × × ×DESL
READ/READA
WRIT/ WRITA
H × × × ×DESL Nop → Enter bank active after tRCD
Continue burst to end → Write recovering
with auto precharge
Continue burst to end → Write recovering
with auto precharge
ILLEGAL 2
ILLEGAL 2
Data Sheet E0196E30 (Ver. 3.0)
16
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EDL1216AASA
Current state /CS /RAS /CAS /WE Address Command Action Notes
Write recovering
L H H H ×NOP Nop → Enter row active after tDPL L H H L ×BST Nop → Enter row active after tDPL
L H L H BA, CA, A10
L H L L BA, CA, A10
L L H H BA, RA ACT ILLEGAL 2
L L H L BA, A10 PRE/PALL ILLEGAL 2
L L L H × REF ILLEGAL
L L L L OC, BA MRS/EMRS ILLEGAL
Write recovering
with auto L H H H ×NOP Nop → Enter precharge after tDPL
precharge L H H L ×BST Nop → Enter row active after tDPL
L H L H BA, CA, A10 READ/READA ILLEGAL
L H L L BA, CA, A10 WRIT/WRITA ILLEGAL 2, 6
L L H H BA, RA ACT ILLEGAL 2
L L H L BA, A10 PRE/PALL ILLEGAL 2
L L L H × REF ILLEGAL
L L L L OC, BA MRS/EMRS ILLEGAL
Refresh
L H H H ×NOP Nop → Enter idle after tRC1 L H H L ×BST Nop → Enter idle after tRC1
L H L H BA, CA, A10 READ/READA ILLEGAL
L H L L BA, CA, A10 WRIT/WRITA ILLEGAL
L L H H BA, RA ACT ILLEGAL
L L H L BA, A10 PRE/PALL ILLEGAL
L L L H × REF ILLEGAL
L L L L OC, BA MRS/EMRS ILLEGAL
Mode register
accessing L H H H ×NOP Nop → Enter idle after tRSC L H H L ×BST Nop → Enter idle after tRSC
L H L L BA, CA, A10 WRIT/WRITA ILLEGAL
L L H H BA, RA ACT ILLEGAL
L L H L BA, A10 PRE/PALL ILLEGAL
L L L H × REF ILLEGAL
L L L L OC, BA MRS/EMRS ILLEGAL
H × × × ×DESL Nop → Enter row active after tDPL
READ/READA
WRIT/ WRITA
H × × × ×DESL Nop → Enter precharge after tDPL
H × × × ×DESL Nop → Enter idle after tRC1
H × × × ×DESL Nop → Enter idle after tRSC
L H L H BA, CA, A10 READ/READA ILLEGAL
Begin read 6
Begin new write
Data Sheet E0196E30 (Ver. 3.0)
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EDL1216AASA
Current state /CS /RAS /CAS /WE Address Command Action Notes
Extended mode
register L H H H ×NOP Nop → Enter idle after tRSC
accessing L H H L ×BST Nop → Enter idle after tRSC
L H L H BA, CA, A10 READ/READA ILLEGAL
L H L L BA, CA, A10 WRIT/WRITA ILLEGAL
L L H H BA, RA ACT ILLEGAL
L L H L BA, A10 PRE/PALL ILLEGAL
L L L H × REF ILLEGAL
L L L L OC, BA0,BA1 MRS/EMRS ILLEGAL
Remark: H: VIH. L: VIL. ×: VIH or VIL, V = Valid data
Notes: 1. All entries assume that CKE is active (CKE
2. Illegal to bank in specified states; Function may be legal in the bank indicated by Bank Address (BA),
3. Illegal if tRCD is not satisfied.
4. Illegal if tRAS is not satisfied.
5. Must satisfy burst interrupt condition.
6. Must satisfy bus contention, bus turn around, and/or write recovery requirements.
7. Must mask preceding data which don't satisfy tDPL.
The synchronous DRAM is initialized in the power-on sequence according to the following.
(1) To stabilize internal circuits, when power is applied, a 200 µs or longer pause must precede any signal toggling.
(2) After the pause, all banks must be precharged using the Precharge command (The Precharge all banks
command is convenient).
(3) Once the precharge is completed and the minimum tRP is satisfied, two or more Auto refresh must be performed.
(4) Both the mode register and the extended mode register must be programmed. After the mode register set cycle
or the extended mode register set cycle, tRSC (2 CLK minimum) pause must be satisfied.
Remarks:
1 The sequence of Auto refresh, mode register programming and extended mode register programming above may
be transposed.
2 CKE and DQM must be held high until the Precharge command is issued to ensure data-bus High-Z.
Programming Mode Registers
The mode register and extended mode register are programmed by the Mode register set command and Extended
mode register command, respectively using address bits A11 through A0, BA0 and BA1 as data inputs. The
registers retain data until they are re-programmed, or the device enters into the deep power down or the device
loses power.
Mode register
The mode register has three fields;
Options : A11 through A7
/CAS latency : A6 through A4
Wrap type : A3
Burst length : A2 through A0
Following mode register programming, no command can be issued before at least 2 CLK have elapsed.
/CAS Latency
/CAS latency is the most critical of the parameters being set. It tells the device how many clocks must elapse before
the data will be available. The value is determined by the frequency of the clock and the speed grade of the device.
Burst Length
Burst Length is the number of words that will be output or input in a read or write cycle. After a read burst is
completed, the output bus will become High-Z. The burst length is programmable as 1, 2, 4, 8 or full page.
Wrap Type (Burst Sequence)
The wrap type specifies the order in which the burst data will be addressed.
“Sequential” or “Interleave”. The method chosen will depend on the type of CPU in the system.
Some microprocessor cache systems are optimized for sequential addressing and others for interleaved addressing.
“Burst Length Sequence” shows the addressing sequence for each burst length using them. Both sequences
support bursts of 1, 2, 4 and 8. Additionally, sequence supports the full page length.
This order is programmable as either
Data Sheet E0196E30 (Ver. 3.0)
20
Page 21
EDL1216AASA
Extended Mode Register
The extended mode register has four fields;
Options : A11 through A7
Drive Strength : A6 through A5
Temperature Compensated Self Refresh
: A4 through A3
Partial Array Self Refresh
: A2 through A0
Following extended mode register programming, no command can be issued before at least 2 CLK have elapsed.
Drive Strength
Driving capability of data output drivers.
Temperature Compensated Self Refresh
Programmable refresh rate for self refresh mode to allow the system to control power as a function of temperature.
Partial Array Self Refresh
Memory array size to be refreshed during self refresh operation is programmable in order to reduce power. Data
outside the defined area will not be retained during self refresh.
Data Sheet E0196E30 (Ver. 3.0)
21
Page 22
Mode Register Definition
BA1BA0
00
LTMODE
EDL1216AASA
A0A1A2A3A4A5A7A6A8A9A10A11
BLWT00000Mode Register Set
Bits2-0
000
001
010
011
100
101
110
111
0
1
Bits2-0
000
001
010
011
100
101
110
111
000
001
010
011
100
101
110
111
/CAS latency
R
R
2
3
R
R
R
R
Burst length
Wrap type
A0A1A2A3A4A5A7A6A8A9A10A11
PASRTCSRDS00000Extended Mode Register Set
Partial Array
Self Refresh
Bits6-4
Latency
mode
BA1BA0
10
WT = 0
1
2
4
8
R
R
R
Full page
Sequential
Interleave
Refresh Array
All banks
Bank A & Bank B (BA1=0)
Bank A (BA0=BA1=0)
R
R
1/2 of Bank A (RA11=0)
1/4 of Bank A (RA11=RA10=0)
R
WT = 1
1
2
4
8
R
R
R
R
Drive Strength
Bits6-5
00
01
10
11
Strength
Normal
1/2 strength
1/4 strength
R
Temprature
Bits4-3
Compensated
Self Refresh
Remark R : Reserved
00
01
10
11
Max Temperature
70
°
C
45
°
C
15
°
C
85
°
C
Data Sheet E0196E30 (Ver. 3.0)
22
Page 23
EDL1216AASA
Burst Length and Sequence
[Burst of Two]
Starting address
(column address A0, binary)
0 0, 1 0, 1
1 1, 0 1, 0
[Burst of Four]
Starting address
(column address A1−A0, binary)
00 0, 1, 2, 3 0, 1, 2, 3
01 1, 2, 3, 0 1, 0, 3, 2
10 2, 3, 0, 1 2, 3, 0, 1
11 3, 0, 1, 2 3, 2, 1, 0
[Burst of Eight]
Starting address
(column address A2−A0, binary)
000 0, 1, 2, 3, 4, 5, 6, 7 0, 1, 2, 3, 4, 5, 6, 7
001 1, 2, 3, 4, 5, 6, 7, 0 1, 0, 3, 2, 5, 4, 7, 6
010 2, 3, 4, 5, 6, 7, 0, 1 2, 3, 0, 1, 6, 7, 4, 5
011 3, 4, 5, 6, 7, 0, 1, 2 3, 2, 1, 0, 7, 6, 5, 4
100 4, 5, 6, 7, 0, 1, 2, 3 4, 5, 6, 7, 0, 1, 2, 3
101 5, 6, 7, 0, 1, 2, 3, 4 5, 4, 7, 6, 1, 0, 3, 2
110 6, 7, 0, 1, 2, 3, 4, 5 6, 7, 4, 5, 2, 3, 0, 1
111 7, 0, 1, 2, 3, 4, 5, 6 7, 6, 5, 4, 3, 2, 1, 0
Full page burst is an extension of the above tables of sequential addressing, with the length being 512.
Sequential addressing sequence
(decimal)
Sequential addressing sequence
(decimal)
Sequential addressing sequence
(decimal)
Interleave addressing sequence
(decimal)
Interleave addressing sequence
(decimal)
Interleave addressing sequence
(decimal)
Data Sheet E0196E30 (Ver. 3.0)
23
Page 24
Address Bits of Bank-Select and Precharge
Row
(Activate command)
(Precharge command)
Col.
(/CAS strobes)
EDL1216AASA
A11A10A9A8A7A6A4A5A3A2A1A0
BA1 BA0
BA1 BA0
A10
A11
A11A10A9A8A7A6A4A5A3A2A1A0
BA1 BA0
A9A8A7A6A4A5A3A2A1A0
BA1BA0
0
0
1
1
A10
0
0
0
0
1
x : Don’t care
0
1
Result
Select Bank A
0
“Activate” command
Select Bank B
1
“Activate” command
Select Bank C
0
“Activate” command
Select Bank D
1
“Activate” command
BA1BA0
0
0
1
1
x
disables Auto-Precharge
(End of Burst)
enables Auto-Precharge
(End of Burst)
Result
Precharge Bank A
0
Precharge Bank B
1
Precharge Bank C
0
Precharge Bank D
1
Precharge All Banks
x
BA1BA0
0
0
0
1
1
0
1
1
Result
enables Read/Write
commands for Bank A
enables Read/Write
commands for Bank B
enables Read/Write
commands for Bank C
enables Read/Write
commands for Bank D
Data Sheet E0196E30 (Ver. 3.0)
24
Page 25
Operation of the Mobile RAM
Precharge
EDL1216AASA
The precharge command can be issued anytime after tRAS
min. is satisfied. Soon after the precharge command is
issued, precharge operation performed and the synchronous DRAM enters the idle state after tRP is satisfied. The
parameter tRP is the time required to perform the precharge. The earliest timing in a read cycle that a precharge
command can be issued without losing any data in the burst is as follows.
Burst length=4
/CAS latency = 2
Command
/CAS latency = 3
Command
CLK
DQ
DQ
T0T1T2T3T4T5T6T7
READ
Q1Q2Q3Q4
READ
Q1Q2Q3Q4
PRE
PRE
RAS must be satisfied)
(t
T8
Hi-Z
Hi-Z
Precharge
In order to write all data to the memory cell correctly, the asynchronous parameter tDPL must be satisfied. The tDPL
(min.) specification defines the earliest time that a precharge command can be issued. Minimum number of clocks is
calculated by dividing tDPL (min.) with clock cycle time. In summary, the precharge command can be issued relative
to reference clock that indicates the last data word is valid. In the following table, minus means clocks before the
reference; plus means time after the reference.
/CAS latency Read W rite
2 -1 +tDPL(min.)
3 -2 +tDPL(min.)
Data Sheet E0196E30 (Ver. 3.0)
25
Page 26
EDL1216AASA
Auto Precharge
During a read or write command cycle, A10 controls whether auto precharge is selected. A10 high in the Read or
Write command (Read with Auto precharge command or Write with Auto precharge command), auto precharge is
selected and begins automatically. The tRAS must be satisfied with a read with auto precharge or a write with auto
precharge operation. In addition, the next activate command to the bank being precharged cannot be executed until
the precharge cycle ends.
In read cycle, once auto precharge has started, an activate command to the bank can be issued after tRP has been
satisfied.
In write cycle, the tDAL must be satisfied to issue the next activate command to the bank being precharged.
The timing that begins the auto precharge cycle depends on whether read or write cycle.
Read with Auto Precharge
During a read cycle, the auto precharge begins one clock earlier (/CAS latency of 2) or two clocks earlier (/CAS
latency of 3) the last data word output.
Burst length = 4
T0T2T1T3T4T5T6T7T8
CLK
T9
/CAS latency = 2
Command
DQ
/CAS latency = 3
Command
DQ
READA B
QB1QB2QB3QB4
READA B
Auto precharge starts
Auto precharge starts
QB1QB2QB3QB4
Hi-Z
(t
RAS
must be satisfied)
Hi-Z
Read with Auto Precharge
Remark: READA means Read with Auto precharge
Write with Auto Precharge
During a write cycle, the auto precharge starts at the timing that is equal to the value of the tDPL (min.) after the
last data word input to the device.
Burst length = 4
T0T2T1T3T4T5T6T7T8
CLK
Command
DQ
WRITA B
DB1DB2DB3DB4
Auto precharge starts
t
DPL(MIN.)
Hi-Z
(t
RAS
must be satisfied)
Write with Auto Precharge
Remark: WRITA means Write with Auto Precharge
Data Sheet E0196E30 (Ver. 3.0)
26
Page 27
EDL1216AASA
Read / Write Command Interval
Read to Read Command Interval
During a read cycle, when new Read command is issued, it will be effective after /CAS latency, even if the previous
read operation does not completed. READ will be interrupted by another READ. The interval between the
commands is 1 cycle minimum. Each Read command can be issued in every clock without any restriction.
Burst length = 4, /CAS latency = 2
T0T2T1T3T4T5T6T7T8
CLK
T9
Command
DQ
READ A
1cycle
READ B
QA1
QB1QB2QB3QB4
Hi-Z
Read to Read Command Interval
Write to Write Command Interval
During a write cycle, when a new Write command is issued, the previous burst will terminate and the new burst will
begin with a new Write command. WRITE will be interrupted by another WRITE. The interval between the
commands is minimum 1 cycle. Each Write command can be issued in every clock without any restriction.
Burst length = 4
T0T2T1T3T4T5T6T7T8
CLK
Command
WRITE A
WRITE B
DQ
DA1
DB1DB2DB3DB4
1cycle
Hi-Z
Write to Write Command Interval
Data Sheet E0196E30 (Ver. 3.0)
27
Page 28
EDL1216AASA
Write to Read Command Interval
Write command and Read command interval is also 1 cycle. Only the write data before Read command will be
written. The data bus must be High-Z at least one cycle prior to the first DOUT.
Burst length = 4
T0T2T1T3T4T5T6T7T8
CLK
/CAS latency = 2
Command
DQ
/CAS latency = 3
Command
DQ
WRITE A
DA1
WRITE A
DA1
READ B
Hi-Z
READ B
Hi-Z
QB1QB2QB3QB4
Write to Read Command Interval
QB1QB2QB3QB4
Data Sheet E0196E30 (Ver. 3.0)
28
Page 29
EDL1216AASA
Read to Write Command Interval
During a read cycle, READ can be interrupted by WRITE. The Read and Write command interval is 1 cycle
minimum. There is a restriction to avoid data conflict. The Data bus must be High-Z using DQM before WRITE.
Burst length = 4
T0T2T1T3T4T5T6T7T8
CLK
Command
DQM
DQ
READ
Hi-Z
WRITE
D1D2D3D4
1cycle
Read to Write Command Interval 1
READ can be interrupted by WRITE. DQM must be High at least 3 clocks prior to the Write command.
Burst length = 8
CLK
/CAS latency = 2
Command
DQM
DQ
/CAS latency = 3
Command
T0T2T1T3T4T5T6T7T8
READ
Q1Q2Q3
Hi-Z is
necessary
READ
WRITE
D1D2D3
WRITE
T9
DQM
DQ
Q1Q2
Hi-Z is
necessary
D1D2D3
Read to Write Command Interval 2
Data Sheet E0196E30 (Ver. 3.0)
29
Page 30
EDL1216AASA
Burst Termination
There are two methods to terminate a burst operation other than using a Read or a Write command. One is the
burst stop command and the other is the precharge command.
Burst Termination in READ Cycle
During a read cycle, when the burst stop command is issued, the burst read data are terminated and the data bus
goes to High-Z after the /CAS latency from the burst stop command.
Burst length = X
T0T2T1T3T4T5T6T7
CLK
READCommand
/CAS latency = 2
Q1Q2Q3DQ
/CAS latency = 3
BST
Q1Q2Q3DQ
Hi-Z
Hi-Z
Burst Termination in READ Cycle
Remark: BST: Burst stop command
Burst Termination in WRITE Cycle
During a write cycle, when the burst stop command is issued, the burst write data are terminated and data bus goes
to High-Z at the same clock with the burst stop command.
Burst length = X
T0T2T1T3T4T5T6T7
CLK
Command
DQ
WRITE
D1
D2D3D4
BST
Hi-Z
Burst Termination in WRITE Cycle
Remark: BST: Burst stop command
Data Sheet E0196E30 (Ver. 3.0)
30
Page 31
EDL1216AASA
Precharge Termination in READ Cycle
During a read cycle, the burst read operation is terminated by a precharge command. When the precharge
command is issued, the burst read operation is terminated and precharge starts. The same bank can be activated
again after tRP from the precharge command. To issue a precharge command, tRAS must be satisfied.
When /CAS latency is 2, the read data will remain valid until one clock after the precharge command.
Burst length = X, /CAS latency = 2
T0T2T1T3T4T5T6T7
CLK
Command
READ
Q1DQ
Q2Q3Q4
PRE
ACT
t
RP
(t
RAS
must be satisfied)
Hi-Z
Precharge Termination in READ Cycle (CL = 2)
When /CAS latency is 3, the read data will remain valid until two clocks after the precharge command.
Burst length = X, /CAS latency = 3
T8
ACT
Hi-Z
must be satisfied)
CLK
Command
DQ
T0T2T1T3T4T5T6T7
READ
Q1Q2Q3
PRE
Q4
t
RP
(t
RAS
Precharge Termination in READ Cycle (CL = 3)
Data Sheet E0196E30 (Ver. 3.0)
31
Page 32
EDL1216AASA
Precharge Termination in WRITE Cycle
During a write cycle, the burst write operation is terminated by a precharge command. When the precharge
command is issued, the burst write operation is terminated and precharge starts. The same bank can be activated
again after tRP from the precharge command. To issue a precharge command, tRAS must be satisfied.
The write data written prior to the precharge command will be correctly stored. However, invalid data may be written
at the same clock as the precharge command. To prevent this from happening, DQM must be high at the same
clock as the precharge command. This will mask the invalid data.
Burst length = X, /CAS latency = 3
T0T2T1T3T4T5T6T7
CLK
T8
Command
DQM
DQ
WRITE
D1D2D3
D4
Precharge Termination in WRITE Cycle
PRE
D5
Hi-Z
t
RP
ACT
(t
RAS
must be satisfied)
Data Sheet E0196E30 (Ver. 3.0)
32
Page 33
Timing Waveforms
AC Parameters for Read Timing with Manual Precharge
Please consult with our sales offices for soldering conditions of the EDL1216AASA.
Type of Surface Mount Device
EDL1216AASA: 54-ball FBGA (µBGA) < Lead free (Sn-Ag-Cu) >
EDL1216AASA
Data Sheet E0196E30 (Ver. 3.0)
57
Page 58
EDL1216AASA
NOTES FOR CMOS DEVICES
1PRECAUTION AGAINST ESD FOR MOS DEVICES
Exposing the MOS devices to a strong electric field can cause destruction of the gate
oxide and ultimately degrade the MOS devices operation. Steps must be taken to stop
generation of static electricity as much as possible, and quickly dissipate it, when once
it has occurred. Environmental control must be adequate. When it is dry, humidifier
should be used. It is recommended to avoid using insulators that easily build static
electricity. MOS devices must be stored and transported in an anti-static container,
static shielding bag or conductive material. All test and measurement tools including
work bench and floor should be grounded. The operator should be grounded using
wrist strap. MOS devices must not be touched with bare hands. Similar precautions
need to be taken for PW boards with semiconductor MOS devices on it.
2HANDLING OF UNUSED INPUT PINS FOR CMOS DEVICES
No connection for CMOS devices input pins can be a cause of malfunction. If no
connection is provided to the input pins, it is possible that an internal input level may be
generated due to noise, etc., hence causing malfunction. CMOS devices behave
differently than Bipolar or NMOS devices. Input levels of CMOS devices must be fixed
high or low by using a pull-up or pull-down circuitry. Each unused pin should be connected
to V
DD
or GND with a resistor, if it is considered to have a possibility of being an output
pin. The unused pins must be handled in accordance with the related specifications.
3STATUS BEFORE INITIALIZATION OF MOS DEVICES
Power-on does not necessarily define initial status of MOS devices. Production process
of MOS does not define the initial operation status of the device. Immediately after the
power source is turned ON, the MOS devices with reset function have not yet been
initialized. Hence, power-on does not guarantee output pin levels, I/O settings or
contents of registers. MOS devices are not initialized until the reset signal is received.
Reset operation must be executed immediately after power-on for MOS devices having
reset function.
CME0107
Data Sheet E0196E30 (Ver. 3.0)
58
Page 59
EDL1216AASA
µBGA is a registered trademark of Tessera, Inc.
The information in this document is subject to change without notice. Before using this document, confirm that this is the latest version.
No part of this document may be copied or reproduced in any form or by any means without the prior
written consent of Elpida Memory, Inc.
Elpida Memory, Inc. does not assume any liability for infringement of any intellectual property rights
(including but not limited to patents, copyrights, and circuit layout licenses) of Elpida Memory, Inc. or
third parties by or arising from the use of the products or information listed in this document. No license,
express, implied or otherwise, is granted under any patents, copyrights or other intellectual property
rights of Elpida Memory, Inc. or others.
Descriptions of circuits, software and other related information in this document are provided for
illustrative purposes in semiconductor product operation and application examples. The incorporation of
these circuits, software and information in the design of the customer's equipment shall be done under
the full responsibility of the customer. Elpida Memory, Inc. assumes no responsibility for any losses
incurred by customers or third parties arising from the use of these circuits, software and information.
[Product applications]
Elpida Memory, Inc. makes every attempt to ensure that its products are of high quality and reliability.
However, users are instructed to contact Elpida Memory's sales office before using the product in
aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment,
medical equipment for life support, or other such application in which especially high quality and
reliability is demanded or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury.
[Product usage]
Design your application so that the product is used within the ranges and conditions guaranteed by
Elpida Memory, Inc., including the maximum ratings, operating supply voltage range, heat radiation
characteristics, installation conditions and other related characteristics. Elpida Memory, Inc. bears no
responsibility for failure or damage when the product is used beyond the guaranteed ranges and
conditions. Even within the guaranteed ranges and conditions, consider normally foreseeable failure
rates or failure modes in semiconductor devices and employ systemic measures such as fail-safes, so
that the equipment incorporating Elpida Memory, Inc. products does not cause bodily injury, fire or other
consequential damage due to the operation of the Elpida Memory, Inc. product.
[Usage environment]
This product is not designed to be resistant to electromagnetic waves or radiation. This product must be
used in a non-condensing environment.
If you export the products or technology described in this document that are controlled by the Foreign
Exchange and Foreign Trade Law of Japan, you must follow the necessary procedures in accordance
with the relevant laws and regulations of Japan. Also, if you export products/technology controlled by
U.S. export control regulations, or another country's export control laws or regulations, you must follow
the necessary procedures in accordance with such laws or regulations.
If these products/technology are sold, leased, or transferred to a third party, or a third party is granted
license to use these products, that third party must be made aware that they are responsible for
compliance with the relevant laws and regulations.
M01E0107
Data Sheet E0196E30 (Ver. 3.0)
59
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