Datasheet DS90CP04TLQX, DS90CP04TLQ Datasheet (NSC)

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DS90CP04 4x4 Low Power 2.5 Gb/s LVDS Digital Cross-Point Switch
General Description
DS90CP04 is a 4x4 digital cross-point switch with broadside input and output pins for efficient board layout. It utilizes Low Voltage Differential Swing (LVDS) technology for low power, high-speed operation. Data paths are fully differential from input to output for low noise. The non-blocking architecture allows connections of any input to any output or outputs. The switch matrix consists of four differential 4:1 multiplexes. Each output channel connects to one of the four inputs common to all multiplexers. Each DS90CP04 output pair is capable of independent operation up to 2.5Gb/s.
A simple serial control interface or a configuration select port is activated by the state of the MODE pin. When utilizing the serial control interface a single load command will update the new switch configuration for all outputs simultaneously. When the direct configuration port is used, output configura­tions are updated immediately based on the decoded SEL0/1 logic state.
Features
n 2.5 Gbps fully differential data paths n Non-blocking architecture n Broadcast from any input n Broadside pin-out n Possible expansion to larger switch array n Accepts LVDS/BLVDS/LVPECL/2.5V-CML inputs n TRI-STATE LVDS outputs n Serial control interface with read-back capability n Double register loading n Single +2.5V supply n Low power, 575 mW Typ at 2.5 Gb/s n Lead-less LLP-32 package 6x6 mm body size) n Fabricated with advanced CMOS process technology
Functional Block Diagrams
20028701
April 2003
DS90CP04 4x4 Low Power 2.5 Gb/s LVDS Digital Cross-Point Switch
© 2003 National Semiconductor Corporation DS200287 www.national.com
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Functional Block Diagrams (Continued)
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Connection Diagram
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Order Number DS90CP04TLQ, DS90CP04TLQX (Tape and Reel)
See NS Package Number LQA32A
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Pin Descriptions
Pin
Name
Pin
Number
I/O, Type Description
DIFFERENTIAL INPUTS COMMON TO ALL MUXES
IN1+ IN1−
16 15
I, LVDS Inverting and non-inverting differential inputs.
IN2+ IN2−
14 13
I, LVDS Inverting and non-inverting differential inputs.
IN3+ IN3−
12 11
I, LVDS Inverting and non-inverting differential inputs.
IN4+ IN4−
10
9
I, LVDS Inverting and non-inverting differential inputs.
SWITCHED DIFFERENTIAL OUTPUTS
OUT1+ OUT1−
25 26
O, LVDS Inverting and non-inverting differential outputs. OUT1
±
can be connected to any
one pair IN1
±
, IN2±, IN3±,orIN4
±
OUT2+ OUT2−
27 28
O, LVDS Inverting and non-inverting differential outputs. OUT2±can be connected to any
one pair IN1
±
, IN2±, IN3±,orIN4
±
OUT3+ OUT3−
29 30
O, LVDS Inverting and non-inverting differential outputs. OUT3±can be connected to any
one pair IN1
±
, IN2±, IN3±,orIN4
OUT4+ OUT4−
31 32
O, LVDS Inverting and non-inverting differential outputs. OUT4
±
can be connected to any
one pair IN1
±
, IN2±, IN3±,orIN4
±
DIGITAL CONTROL INTERFACE
SCLK 6 I, LVCMOS Control clock to latch in programming data at SI. SCLK can be 0 MHz to
100 MHz. SCLK should be burst of clock pulses active only while accessing the device. After completion of programming, SCLK should be kept at logic low to minimize potential noise injection into the high-speed differential data paths.
SI / SEL1 7 I, LVCMOS Programming data to select the switch configuration. Data is latched into the input
buffer register at the rising edge of SCLK.
SEL0 5 I, LVCMOS Programming data to select the switch configuration.
CSO RSO
18
2
O, LVCMOS With MODE low, control data is shifted out at CSO (RSO) for cascading to the
next device in the serial chain. The control data at CSO (RSO) is identical to that shifted in at SI with the exception of the device column (row) address being decremented by one internally before propagating to the next device in the chain. CSO (RSO) is clocked out at the rising edge of SCLK.
CSCLK RSCLK
19
3
O, LVCMOS With MODE low, these pins function as a buffered control clock from SCLK.
CSCLK (RSCLK) is used for cascading the serial control bus to the next device in the serial chain.
LOAD 22 I, LVCMOS When LOAD is high and SCLK makes a LH transition, the device transfers the
programming data in the load register into the configuration registers. The new switch configuration for all outputs takes effect. LOAD needs to remain high for only one SCLK cycle to complete the process, holding LOAD high longer repeats the transfer to the configuration register.
MODE 23 I, LVCMOS When MODE is low, the SCLK is active and a buffered SCLK signal is present at
the CLKOUT output. When MODE is high, the SCLK signal is uncoupled from register and state machine internals. Internal registers will see an active low signal until MODE is brought Low again.
POWER
V
DD
1, 8, 17,
24
I, Power VDD= 2.5V±5%. At least 4 low ESR 0.01 µF bypass capacitors should be
connected from V
DD
to GND plane.
GND 4, 20, 21,
DAP
I, Power Ground reference to LVDS and CMOS circuitry.
DAP is the exposed metal contact at the bottom of the LPP-32 package. The DAP is used as the primary GND connection to the device. It should be connected to the ground plane with at least 4 vias for optimal AC and thermal performance.
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Serial Interface Truth Table
LOAD MODE SCLK Resulting Action
0 0 LH The current state on SI is clocked into the input shift register.
0 1 LH Uncouples SCLK input from register and state machine internals. Internal registers
will see and the RSCLK and CSCLK outputs will drive an active Low signal until MODE is brought Low again. See Configuration Select Truth Table below.
LH 0 X Loads OUT1– OUT4 configuration information from last valid frame. Places contents
of load register into the configuration register. The switch configuration is updated asynchronously from the SCLK input.
1 1 LH Uncouples SCLK input from register and state machine internals. Internal registers
will see and the RSCLK and CSCLK outputs will drive an active Low signal until MODE is brought Low again. See Configuration Select Truth Table below.
Configuration Select Truth Table
MODE SEL1 SEL0 Resulting Action
0 X X The SEL0/1 pins only function in configuration select mode. See below.
1 0 0 Distribution: IN1 - OUT1 OUT2 OUT3 OUT4
1 0 1 Distribution: IN2 - OUT1 OUT2 OUT3 OUT4
1 1 0 Redundancy: IN1 - OUT1 OUT2 and IN3 - OUT3 OUT4
1 1 1 Broadside: IN1 - OUT1, IN2 - OUT2, IN3 - OUT3, IN4 - OUT4
LH: Low to High (positive edge) transition. X: Don’t Care or Not Applicable.
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Configuration Select Truth Table (Continued)
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FIGURE 1. DS90CP04 Configuration Select Decode
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Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications.
Supply Voltage (V
DD
) −0.3V to +3V
CMOS/TTL Input Voltage −0.3V to (V
DD
+0.3V)
LVDS Receiver Input Voltage −0.3V to +3.3V
LVDS Driver Output Voltage −0.3V to +3V
LVDS Output Short Circuit Current 40mA
Junction Temperature +150˚C
Storage Temperature −65˚C to +150˚C
Lead Temperature
(Soldering, 4 sec.) +260˚C
Maximum Package Power Dissipation at 25˚C
LLP-32 3200 mW
Derating above 25˚C 38 mW/˚C
Thermal Resistance, θ
JA
26.4˚C/W
ESD Rating
HBM, 1.5 k, 100 pF
LVDS Outputs
>
1.0 kV
LVDS Inputs
>
1.5 kV
All Other Pins
>
4.0 kV
EIAJ, 0, 200 pF
>
100V
Recommended Operating Conditions
Min Typ Max Unit
Supply Voltage (V
DD
– GND) 2.375 2.5 2.625 V
Receiver Input Voltage 0.05 3.3 V
Operating Free Air
Temperature −40 25 85 ˚C
Junction Temperature 110 ˚C
Electrical Characteristics
Over recommended operating supply and temperature ranges unless other specified.
Symbol Parameter Conditions Min
Typ (Note
2)
Max Units
LVCMOS/LVTTL DC SPECIFICATIONS (SCLK, SI/SEL1, SEL0, LOAD, MODE , CSCLK, RSCLK, CSO, RSO)
V
IH
High Level Input Voltage 1.7 V
DD
V
V
IL
Low Level Input Voltage GND 0.7 V
I
IH
High Level Input Current VIN=VDD=V
DDMAX
−10 +10 µA
I
IL
Low Level Input Current VIN=VSS,VDD=V
DDMAX
−10 +10 µA
C
IN1
Input Capacitance Any Digital Input Pin to V
SS
3.5 pF
C
OUT1
Output Capacitance Any Digital Output Pin to V
SS
5.5 pF
V
CL
Input Clamp Voltage ICL= −18 mA −1.5 −0.8 V
V
OH
High Level Output Voltage IOH= −4.0 mA, VDD=V
DDMIN
1.9 V
I
OH
= −100 µA, VDD= 2.5V 2.4 V
V
OL
Low Level Output Voltage IOL= 4.0 mA, VDD=V
DDMIN
0.4 V
I
OL
= 100 µA, VDD= 2.5V 0.1 V
LVDS INPUT DC SPECIFICATIONS (IN1
±
, IN2±, IN3±, IN4±)
V
TH
Differential Input High Threshold (Note 3)
VCM= 0.05V or 1.2V or 2.45V, V
DD
= 2.5V
050mV
V
TL
Differential Input Low Threshold VCM= 0.05V or 1.2V or 2.45V,
V
DD
= 2.5V
−50 0 mV
V
ID
Differential Input Voltage VDD= 2.5V, VCM= 0.05V to 2.45V 100 V
DD
mV
V
CMR
Common Mode Voltage Range VID= 100 mV, VDD= 2.5V 0.05 3.25 V
C
IN2
Input Capacitance IN+ or IN− to V
SS
3.5 pF
I
IN
Input Current VIN= 2.5V, VDD=V
DDMAX
or 0V −10 +10 µA
V
IN
= 0V, VDD=V
DDMAX
or 0V −10 +10 µA
LVDS OUTPUT DC SPECIFICATIONS (OUT1
±
, OUT2±, OUT3±, OUT4±)
V
OD
Differential Output Voltage (Note3)RL= 100between OUT+ and
OUT−Figure 2
250 400 475 mV
V
OD
Change in VODbetween Complementary States
−35 35 mV
V
OS
Offset Voltage (Note 4) 1.125 1.25 1.375 V
V
OS
Change in VOSbetween Complementary States
−35 35 mV
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Electrical Characteristics (Continued)
Over recommended operating supply and temperature ranges unless other specified.
Symbol Parameter Conditions Min
Typ (Note
2)
Max Units
I
OZ
Output TRI-STATE Current TRI-STATE Output
V
OUT=VDD
or V
SS
−10 +10 µA
I
OFF
Power Off Leakage Current VDD= 0V, V
OUT
= 2.5V or GND −10 +10 µA
I
OS
Output Short Circuit Current, One Complementary Output
OUT+ or OUT− Short to GND −15 -40 mA
OUT+ or OUT− Short to V
DD
15 40 mA
I
OSB
Output Short Circuit Current, both Complementary Outputs
OUT+ and OUT− Short to GND −15 -30 mA
OUT+ and OUT− Short to V
CM
15 30 mA
C
OUT2
Output Capacitance OUT+ or OUT− to GND when
TRI-STATE
5.5 pF
SUPPLY CURRENT
I
CCD
Total Supply Current All inputs and outputs enabled,
terminated with differential load of 100between OUT+ and OUT-.
220 300 mA
I
CCZ
TRI-STATE Supply Current TRI-STATE All Outputs 10 20 mA
SWITCHING CHARACTERISTICS — LVDS OUTPUTS (Figures 3, 5, 6)
t
LHT
Differential Low to High Transition Time
Use an alternating 1 and 0 pattern at 200 Mb/s, measure between 20% and 80% of V
OD
.
100 135 160 ps
t
HLT
Differential High to Low Transition Time
100 135 160 ps
t
PLHD
Differential Low to High Propagation Delay
Use an alternating 1 and 0 pattern at 200 Mb/s, measure at 50% V
OD
between input to output.
500 750 1200 ps
t
PHLD
Differential High to Low Propagation Delay
500 750 1200 ps
t
SKD1
Pulse Skew |t
PLHD–tPHLD
| 0 30 ps
t
SKCC
Output Channel to Channel Skew
Difference in propagation delay (t
PLHD
or t
PHLD
) among all output channels in Broadcast mode (any one input to all outputs).
0 50 100 ps
t
JIT
Jitter (Note 5)
Alternating 1 and 0 Pattern
750 MHz 1.6 2.5 psrms
1.25 GHz 1.6 2.5 psrms
K28.5 Pattern
1.5 Gb/s 10 40 psp-p
2.5 Gb/s 27 60 psp-p
PRBS 2
23
-1 Pattern
1.5 Gb/s 25 40 psp-p
2.5 Gb/s 40 70 psp-p
t
ON
LVDS Output Enable Time Time from LOAD = LH or SELx to
OUT
±
change from TRI-STATE to
active.
50 150 300 ns
t
OFF
LVDS Output Disable Time Time from LOAD = LH or SELx to
OUT
±
change from active to
TRI-STATE.
35ns
t
SW
LVDS Switching Time Time from LOAD = LH to new
switch configuration effective for OUT
±
.
50 150 ns
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Electrical Characteristics (Continued)
Over recommended operating supply and temperature ranges unless other specified.
Symbol Parameter Conditions Min
Typ (Note
2)
Max Units
t
SEL
SELx to OUT
±
Configuration select to new data at OUT
±
.
50 150 ns
SWITCHING CHARACTERISTICS — Serial control Interface (Figures 4, 8, 9)
F
SCLK
SCLK Clock Frequency 0 100 MHz
T
DCCLK
CSCLK Duty Cycle RSCLK Duty Cycle
Input SCLK Duty Cycle set at 50%
45 55 %
t
S
SI–SCLK or MODE–SCLK Setup Time
From SI or MODE Input Data to SCLK Rising Edge
1.5 ns
t
H
SCLK–SI or SCLK–MODE Hold Time
From SCLK Rising Edge to SI or MODE Input Data
1ns
t
DSO
SCLK to RSO or CSO Delay From SCLK to RSO or CSO 1.5 4 ns
t
DSCLK
SCLK to RSCLK or CSCLK Delay
From SCLK to RSCLK or CSCLK
4.0 8.5 ns
t
DSDIF
|SCLK to RSCLK or CSCLK–SCLK to RSO or CSO|
Propagation Delay Difference between t
DSO
and t
DSCLK
1.5 4.5 ns
T
RISE
Logic Low to High Transition Time
20% to 80% at RSO, CSO, RSCLK, or CSCLK
1.5 ns
T
FALL
Logic High to Low Transition Time
80% to 20% at RSO, CSO, RSCLK, or CSCLK
1.5 ns
Note 1: “Absolute Maximum Ratings” are the ratings beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the device should be operated at these limits.
Note 2: Typical parameters are measured at V
DD
= 2.5V, TA= 25˚C. They are for reference purposes, and are not production-tested.
Note 3: Differential output voltage V
OD
is defined as |OUT+–OUT−|. Differential input voltage VIDis defined as |IN+–IN−|.
Note 4: Output offset voltage V
OS
is defined as the average of the LVDS single-ended output voltages at logic high and logic low states.
Note 5: Characterized from any input to any one differential LVDS output running at the specified data rate and data pattern, with all other 3 channels running K28.5 pattern at 1.25 Gb/s asynchronously to the channel under test. Jitter is not production-tested, but guaranteed through characterization on sample basis. Random Jitter is measured peak to peak with a histogram including 1000 histogram window hits. K28.5 pattern is repeating bit streams of (0011111010 1100000101). This deterministic jitter or DJ pattern is measured to a histogram mean with a sample size of 350 hits. Like RJ the Total Jitter or TJ is measured peak to peak with a histogram including 3500 window hits.
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FIGURE 2. Differential Driver DC Test Circuit
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Electrical Characteristics (Continued)
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FIGURE 3. Differential Driver AC Test Circuit
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FIGURE 4. LVCMOS Driver AC Test Circuit (Note 6)
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Electrical Characteristics (Continued)
Note 6: The LVCMOS input and output AC specifications may also be verified and tested using an input attenuation network instead of a power splitter as shown
in Figure 4.
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FIGURE 5. LVDS Signals
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FIGURE 6. LVDS Output Transition Time
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FIGURE 7. LVDS Output Propagation Delay
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20028718
FIGURE 8. Serial Interface Propagation Delay and Input Timing Waveforms
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FIGURE 9. Serial Interface — MODE Timing and Functionality
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Functional Descriptions
PROGRAMMING WITH THE SERIAL INTERFACE
The configuration of the internal multiplexer is programmed through a simple serial interface consisting of serial clock SCLK and serial input data line SI. The serial interface is designed for easy expansion to larger switch array. A repli­cated output serial interface (RSCLK, RSO) is provided for propagating the control data to the downstream device in the row of an array of DS90CP04 devices in a matrix. A similar replicated serial interface (CSCLK, CSO) is provided for propagating the control data to the downstream devices in the first column of the device matrix. Through this scheme, user can program all the devices in the matrix through one
serial control bus (SCLK and SI) with the use of the feed­through replicated control bus at RSCLK and RSO, CSCLK and CSO.
To program the configuration of the switch, a 30-bit control word is sent to the device. The first 6 bits shift the start frame into SI. The only two valid start frames are 1F’h for a con­figuration load and 1E’h for a configuration read. The start frame is followed by the row and column addresses of the device to be accessed, as well as the switch configuration of the four channels of the device. Table 1 and Table 2 are the bit definitions of the control word. D29 is the first bit that shifts into SI.
TABLE 1. 30-Bit Control Word
Bit Bit Length Descriptions
D29–D24 6 The start frame for control word synchronization (01 1111’b = LOAD).
D23–D18 6 Specify the row address of the device to be access. The serial interface can access up to 64
devices in the row.
D17–D12 6 Specify the column address of the device to be access. The serial interface can access up to 64
devices in the column.
D11–D9 3 Specify the switch configuration for Output 1. See Table 2.
D8–D6 3 Specify the switch configuration for Output 2. See Table 2.
D5–D3 3 Specify the switch configuration for Output 3. See Table 2.
D2–D0 3 Specify the switch configuration for Output 4. See Table 2.
TABLE 2. Switch Configuration Data
MSB LSB OUT1±Connects to OUT2±Connects to OUT3±Connects to OUT4±Connects to
0 0 0 Output 1 Tri-Stated Output 2 Tri-Stated Output 3 Tri-Stated Output 4 Tri-Stated
001IN1
±
IN1
±
IN1
±
IN1
±
010IN2
±
IN2
±
IN2
±
IN2
±
011IN3
±
IN3
±
IN3
±
IN3
±
100IN4
±
IN4
±
IN4
±
IN4
±
1 0 1 Invalid.
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FIGURE 10. Configuration and Output Enable/Disable Timing
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Functional Descriptions (Continued)
TABLE 2. Switch Configuration Data (Continued)
MSB LSB OUT1±Connects to OUT2±Connects to OUT3±Connects to OUT4±Connects to
1 1 0 Use of these invalid combinations may cause loss of synchronization.
111
ROW AND COLUMN ADDRESSING
The upper left device in an array of NxN devices is assigned row address 0, and column address 0. The devices to its right have column addresses of 1 to N, whereas devices below it have row addresses of 1 to N. The Serial Control Interface (SCLK and SI) is connected to the first device with the row and column addresses of 0. The Serial Control Interface shifts in a control word containing the row and column address of the device it wants to access. When the control data propagates through each device, the control word’s address is internally decremented by one before it is sent to the next row or column device. When the control data is sent out the column interface (CSO and CSCLK) the row address is decremented by one. Similarly, when the column address data is shifted out the row interface (RSO and RSCLK) the column address is decremented by one. By the time the control word reaches the device it has been in­tended to program, both the row and column addresses have been decremented to 0.
Each device constantly checks for the receipt of a frame start (D29-24=01 1111’b or 01 1110’b). When it detects the proper start frame string, and the row and column addresses it receives are both 0, the device responds by storing the switch configuration data of the 30-bit control word into its load register.
Each device in the array is sequentially programmed through the serial interface. When programming is completed for the entire array, LOAD is pulsed high and the load register’s content is transferred to the configuration register of each device. The LOAD pulse must wait until the final bit of the control word has been placed into the "load" register. This timing is guaranteed to take place two clock cycles after programming has been completed.
Due to internal shift registers additional SCLK cycles will be necessary to complete array programming. It takes 7 clock (SCLK) positive edge transitions for the control data to ap­pear at RSO and CSO for its near neighbor. Users must provide the correct number of clock transitions for the control
READ-BACK SWITCH CONFIGURATION
The DS90CP04 is put into read-back mode by sending a special “Read” start frame (01 1110’b). Upon receipt of the special read start frame the configuration register informa­tion is transferred into the shift register and output at both RSO and CSO in the OUT1 to OUT4 bit segments of the read control word. Each time the read-back data from a device passes through its downstream device, its default address (11 1111’b) is internally decremented by one. The “relative” column address emerges at RSO of the last device in the row and is used to determine (11 1111’b - N) the column of the sending device. Similarly, the row address emerges at CSO of the sending device. After inserting the channel configuration information in the “read” control word, the device will automatically revert to write mode, ready to accept a new control word at SI.
Table 4 shows an example of reading back the configuration registers of 4 devices in the first row of a 4x4 device array. Again, due to internal shift registers additional SCLK cycles will be necessary to complete the array read. It takes 4x30 SCLK clock cycles to shift out 4 30-bit configuration registers plus 7 SCLK cycles per device to account for device latency making for a total SCLK count of 148. The serialized read data is sampled at RSO and synchronized with RSCLK of the last device in the row. The user is recommended to backfill with all 0’s at SI after the four reads have been shifted in.
TABLE 3. Example to Program a 4 Device Array
Frame
D29:D24
Row Address D23:D18
Column Address D17:D12
OUT1
D11:D9
OUT2
D8:D6
OUT3 D5:D3
OUT4
D2:D0
Number of
SCLK
Cycles
Control Word
Destination
Device in
Array
Row, Column
01 1111 00 0000 00 0011 001 010 011 100 30 0, 3
01 1111 00 0000 00 0010 001 010 011 100 30 0, 2
01 1111 00 0000 00 0001 001 010 011 100 30 0, 1
01 1111 00 0000 00 0000 001 010 011 100 30 0, 0
Shift in configuration information from device furthest from system SI input first to minimize array
latency during the programming process.
The 2 clock cycle delay ensures all channel information has reached the “load” register and all
switches are ready to be configured.
2
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Functional Descriptions (Continued)
TABLE 4. A Read-Back Example from a 4 Device Array
Frame
D29:D24
Row Address D23:D18
Column Address D17:D12
OUT1
D11:D9
OUT2
D8:D6
OUT3
D5:D3
OUT4
D2:D0
Number of
SCLK
Cycles
Descriptions
01 1110 00 0000 11 1111 0 00 00 0 000 00 0 30
Read-Back (R,C)=0, 3
01 1110 00 0000 11 1110 000 000 000 000 30
Read-Back (R,C)=0, 2
01 1110 00 0000 11 1101 000 000 000 000 30
Read-Back (R,C)=0, 1
01 1110 00 0000 11 1100 001 010 011 100 30
Read-Back (R,C)=0, 0
Note 7: LOAD and READ programming example is based on the 16x16 array configuration shown in Figure 11. Alternative expansion array configurations will require a slightly different programming sequence.
SWITCH EXPANSION FOR MINIMUM PROGRAMMING LATENCY
Programming data ripples through the array through RSO and RSCLK in the row and CSO and CSCLK in the first column. LOAD pins of all devices are electrically tied to-
gether and driven by the same “load” signal. To prevent excessive stub length in the array from affecting the signal quality of LOAD, it is recommended that the load signal is distributed to each row or column in large crosspoint array applications.
20028707
FIGURE 11.
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Programming Example
CONFIGURATION WRITE
30 Bit Control Word: [WRITE FRAME] [ROW ADDRESS][COLUMN ADDRESS] [OUT1][OUT2][OUT3][OUT4]
ARRAY WRITE:
[0 1 1111 ] [0][1] [1][1][1][1] //
*
Array position 1, Broadcast IN1*//
[0 1 1111 ] [0][0] [2][2][4][4] //
*
Array position 0, Connect IN2 to OUT1 and 2, IN4 to OUT3 and OUT4*//
LOAD = H and SCLK = LH
20028710
DEVICE 0 WRITE PROGRAMMING SEQUENCE
SCLK
Number
Event Description
6 Device 0 (R=0, C=0) detects “WRITE” frame of first Control Word.
18 Device 0 (R=0, C=0) sees Row = 1, Column = 0 of first Control Word. The Row address of the first Control
Word is decremented by 1 (Row Address = 0) and sent out RSO.
36 Device 0 (R=0, C=0) detects “WRITE” frame of second Control Word.
48 Device 0 (R=0, C=0) sees Row = 0, Column = 0 of second Control Word. This is a valid configuration write
address, Device 1 prepares to receive configuration information.
60 Device 0 (R=0, C=0) has received configuration information and is waiting for a LOAD.
DEVICE 1 WRITE PROGRAMMING SEQUENCE
SCLK
Number
Event Description
13 Device 1 (R=1, C=0) detects “WRITE” frame of first Control Word.
25 Device 1 (R=1,C=0) sees Row = 0, Column=0offirst Control Word. This is a valid configuration write
address, Device 1 prepares to receive configuration information.
37 Device 1 (R=1,C=0) has received configuration information and is waiting for a LOAD.
43 Device 1 (R=1, C=0) detects “WRITE” frame of second Control Word.
55 Device 1 (R=1,C=0) sees Row = 3F, Column=0ofsecond Control Word. The Row address of the second
Control Word is decremented by 1 (Row Address = 3E) and sent out RSO.
CONFIGURATION READ
30 Bit Control Word: [READ FRAME] [ROW ADDRESS][COLUMN ADDRESS] [OUT1][OUT2][OUT3][OUT4]
ARRAY WRITE:
[01 1110] [1][0] [0][0][0][0] //
*
Array position 1, Return Configuration Information*//
[01 1110] [0][0] [0][0][0][0] //
*
Array position 0, Return Configuration Information*//
DS90CP04
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Programming Example (Continued)
20028711
DEVICE 0 READ PROGRAMMING SEQUENCE
SCLK
Number
Event Description
6 Device 0 (R=0, C=0) detects “READ” frame of first Control Word.
18 Device 0 (R=0,C=0) sees Row = 1, Column=0offirst Control Word. The Row address of the first Control
Word is decremented by 1 (Row Address = 0) and sent out RSO.
36 Device 0 (R=0,C=0) detects "READ" frame of second Control Word.
48 Device 0 (R=0,C=0) sees Row = 0, Column=0ofsecond Control Word. This is a valid configuration read
address, Device 0 prepares to transmit configuration information. The Row address of the last Control Word is decremented by 1 (Row Address = 3F) and sent out RSO.
60 Device 0 (R=0,C=0) has transmitted configuration information.
74 Finished transmitting configuration information at Array Output (RSO of Device 1).
DEVICE 1 READ PROGRAMMING SEQUENCE
SCLK
Number
Event Description
13 Device 1 (R=1, C=0) detects “READ” frame of first Control Word.
25 Device 1 (R=1,C=0) sees Row = 0, Column=0offirst Control Word. This is a valid configuration read
address, Device 1 prepares to transmit configuration information. The Row address of the last Control Word is decremented by 1 (Row Address = 3F) and sent out RSO.
37 Device 1 (R=1,C=0) has transmitted configuration information at Array Output (RSO of Device 1).
DS90CP04
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Physical Dimensions inches (millimeters) unless otherwise noted
LLP, Plastic, QUAD,
Order Number DS90CP04TLQ, DS90CP04TLQX (Tape and Reel)
NS Package Number LQA032A
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user.
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
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DS90CP04 4x4 Low Power 2.5 Gb/s LVDS Digital Cross-Point Switch
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.
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