analyzing, evaluating and troubleshooting
digital communications systems
Operates at speeds from DC to 52 MHz
Programmable polynomial length and
feedback taps for generation of any other
pseudorandom pattern up to 32 bits in length
including: 26-1, 29-1, 211-1, 215-1, 220-1, 223-1,
and 232-1
Programmable user-defined pattern and
length for generation of any repetitive pattern
up to 32 bits in length
Large 32-bit error count and bit count
registers
Software programmable bit error insertion
Fully independent transmit and receive
sections
8-bit parallel control port
Detects test patterns with bit error rates up to
-2
10
PIN ASSIGNMENT
TDATA
TDIS
TCLK
VSS
VDD
RCLK
RDIS
RDATA
TL
AD0
AD1
TEST
VSS
AD2
AD3
AD4
32 31 30 29 28 27 26 25
1
2
3
4
DS2172
32-Pin TQFP
5
6
7
8
9 10 11 12 13 14 15 16
AD5
AD6
AD7
BTS
VSS
VDD
24
23
22
21
20
19
18
17
RD(DS)
RL
RLOS
LC
VSS
VDD
INT
WR(R/W)
LE(AS)
CS
ORDERING INFORMATION
DS2172T(00 C to 700 C)
DS2172TN(-400 C to + 850 C)
DESCRIPTION
The DS2172 Bit Error Rate Tester (BERT) is a software programmable test pattern generator, receiver,
and analyzer capable of meeting the most stringent error performance requirements of digital
transmission facilities. Two categories of test pattern generation (Pseudo-random and Repetitive)
conform to CCITT/ITU O.151, O.152, O.153, and O.161 standards. The DS2172 operates at clock rates
ranging from DC to 52 MHz. This wide range of operating frequenc y allows the DS2172 to be used in
existing and future test equipment, transmission facilities, switching equipment, multiplexers, DACs,
Routers, Bridges, CSUs, DSUs, and CPE equipment.
The DS2172 user-programmable pattern registers provide the unique ability to generate loopback patterns
required for T1, Fractional-T1, Smart Jack, and other test procedures. Hence the DS2172 can initiate the
loopback, run the test, check for errors, and finally deactivate the loopback.
The DS2172 consists of four functional blocks: the pattern generator, pattern detector, error counter, and
control interface. The DS2172 can be programmed to generate an y pseudorandom pattern with length up
32
-1 bits (see Table 5, Note 9) or any user programmable bit pattern from 1 to 32 bits in length. Logic
to 2
inputs can be used to configure the DS2172 for applications requiring gap clocking such as Fractional-T1,
Switched-56, DDS, normal framing requirements, and per-channel test procedures. In addition, the
DS2172 can insert single or 10-1 to 10-7 bit errors to verify equipment operation and connectivity.
1 of 21051700
Page 2
DS2172
1.0 GENERAL OPERATION
1.1 PATTERN GENERATION
The DS2172 is programmed to generate a particular test pattern by programming the following registers:
- Pattern Set Registers (PSR)
- Pattern Length Register (PLR)
- Polynomial Tap Register (PTR)
- Pattern Control Register (PCR)
- Error Insertion Register (EIR)
Please see Tables 4 and 5 for examples of how to program these registers in order to generate some
standard test patterns. Once these registers are programmed, the user will then toggle the TL (Transmit
Load) bit or pin to load the pattern into the onboard pattern generation circuitry and the pattern will begin
appearing at the TDATA pin.
1.2 PATTERN SYNCHRONIZATION
The DS2172 expects to receive the same pattern that it transmitted. The synchronizer examines the data at
RDATA and looks for characteristics of the transmitted pattern. The user can control the onboard
synchronizer with the Sync Enable and Resync bits in the Pattern Control Register.
In pseudorandom mode, the received pattern is tested to see if it fits the polynomial generator as defined
in the transmit side. For pseudorandom patterns, only the original pattern and an all ones pattern or an all
0s pattern will satisfy this test. Synchronization in pseudorandom pattern mode should be qualified by
using the RA1 and RA0 indicators in the Status Register. Synchronization is declared after 34 + n bits are
received without error, where n is the exponent in the polynomial from table 4. Once in synchronization
(SR0. = 1) any deviation from this pattern will be counted by the Bit Error Count Register.
In repetitive pattern mode a received pattern of the same length as being transmitted will satisfy this test.
Synchronization in repetitive pattern mode should be qualified by using the RA1 and RA0 indicators in
the Status Register and examining the Pattern Receive Register (PRR0--3). See section 10 for an
explanation of the Pattern Receive Register. Once in synchronization (SR.0 = 1) an y deviation from this
pattern will be counted by the Bit Error Count Register.
1.3 BER CALCULATION
Users can calculate the actual Bit Error Rate (BER) of the digital communications channel by reading the
bit error count out of the Bit Error Count Register (BECR) and reading the bit count out of the Bit Count
Register (BCR) and then dividing the BECR value with the BCR value. The user has total control over
the integration period of the measurement. The LC (Load Count) bit or pin is used to set the integration
period.
1.4 GENERATING ERRORS
Via the Error Insertion Register (EIR), the user can intentionally inject a particular error rate into the
transmitted data stream. Injecting errors allows users to stress communication links and to check the
functionality of error monitoring equipment along the path.
1.5 POWER-UP SEQUENCE
On power-up, the registers in the DS2172 will be in a random state. The user must program all the
internal registers to a known state before proper operation can be insured.
2 of 21
Page 3
DS2172 FUNCTIONAL BLOCK DIAGRAM Figure 1
DS2172
DS2172 PATTERN GENERATION BLOCK DIAGRAM Figure 2
NOTES:
1. Tap A always equals length (N-1) of pseudorandom or repetitive pattern.
2. Tab B can be programmed to any feedback tap for pseudorandom pattern generation.
3 of 21
Page 4
DETAILED PIN DESCRIPTION Table 1
PINSYMBOLTYPEDESCRIPTION
DS2172
1TL I
Transmit Load. A positive-going edge loads the pattern generator with
the contents of the Pattern Set Registers. The MSB of the repetitive or
pseudorandom pattern appears at TDATA after the third positive edge of
TCLK from asserting TL. TL is logically OR’ed with PCR.7 and should
be tied to VSS if not used. See Figure 8 for timing information.
2AD0I/OData Bus. An 8-bit multiplexed address/data bus.
3AD1I/OData Bus. An 8-bit multiplexed address/data bus.
4TESTI
Test. Set high to 3-state all output pins ( INT , ADx, TDATA, RLOS).
Should be tied to VSS to enable all outputs.
5VSS-Signal Ground. 0.0V. Should be tied to local ground plane.
6AD2I/OData Bus. An 8-bit multiplexed address/data bus.
7AD3I/OData Bus. An 8-bit multiplexed address/data bus.
8AD4I/OData Bus. An 8-bit multiplexed address/data bus.
9AD5I/OData Bus. An 8-bit multiplexed address/data bus.
10AD6I/OData Bus. An 8-bit multiplexed address/data bus.
11AD7I/OData Bus. An 8-bit multiplexed address/data bus.
12V
13V
SS
DD
-Signal Ground. 0.0V. Should be tied to local ground plane.
-Positive Supply. 5.0V.
14BTSIBus Type Select. Strap high to select Motorola bus timing; strap low to
select Intel bus timing. This pin controls the function of the RD (DS),
ALE(AS), and WR (R/W ) pins. If BTS = 1, then these pins assume the
function listed in parenthesis ().
15
16
RD (DS)
CS
I
Read Input (Data Strobe).
IChip Select. Must be low to read or write the port.
17ALE(AS)IAddress Latch Enable (Address Strobe). A positive going edge serves
to demultiplex the bus.
18
19
WR (R/W )
INT
I
Write Input (Read/Write).
OAlarm Interrupt. Flags host controller during conditions defined in
Status Register. Active low, open drain output.
20V
21V
DD
SS
-Positive Supply. 5.0V.
-Signal Ground. 0.0V. Should be tied to local ground plane.
22LCILoad Count. A positive-going edge latches the current bit and bit error
count into the user accessible BCR and BECR registers and clears the
internal count registers. LC is logically OR’ed with control bit PCR.4.
Should be tied to VSS if not used.
23RLOSO
Receive Loss Of Sync. Indicates the real time status of the receive
synchronizer. Active high output.
4 of 21
Page 5
DS2172
PINSYMBOLTYPEDESCRIPTION
24RLIReceive Load. A positive-going edge loads the previous 32 bits of data
received at RDATA into the Pattern Receive Registers. RL is logicall y
OR’ed with control bit PCR.3. Should be tied to VSS if not used.
25RDATAIReceive Data. Received NRZ serial data, s ampled on the rising edge of
RCLK.
26RDISIReceive Disable. Set high to prevent the data at RDATA from being
sampled. Set low to allow bits at RDATA to be sampled. Should be tied
to VSS if not used. See Figure 6 for timing information. All receive side
operations are disabled when RDIS is high.
27RCLKIReceive Clock. Input clock from transmission link. 0 to 52 MHz. Can be
a gapped clock. Fully independent from TCLK.
28V
29V
DD
SS
-Positive Supply. 5.0V.
-Signal Ground. 0.0V. Should be tied to local ground plane.
30TCLKITransmit Clock. Transmit demand clock. 0 to 52 MHz. Can be a gapped
clock. Fully independent of RCLK.
31TDISI
Transmit Disable. Set high to hold the current bit being transmitted at
TDATA. Set low to allow the next bit to appear at TD ATA. Should be
tied to VSS if not used. See Figure 7 for timing information. All transmit
side operations are disabled when TDIS is high.
32TDATAOTransmit Data. Transmit NRZ serial data, updated on the rising ed ge of
1. The Test Register must be set to 00 hex to insure proper operation of the DS2172.
5 of 21
Page 6
DS2172
2.0 PARALLEL CONTROL INTERFACE
The DS2172 is controlled via a multiplexed bi-directional address/data bus by an external microcontroller
or microprocessor. The DS2172 can operate with either Intel or Motorola bus timin g configurations. If
the BTS pin is tied low, Intel timing will be selected; if tied high, Motorola timing will be selected. All
Motorola bus signals are listed in parenthesis (). See the timing diagrams in the A.C. Electrical
Characteristics for more details. The multiplexed bus on the DS2172 saves pins because the address
information and data information share the same signal paths. The addresses are presented to the pins in
the first portion of the bus cycle and data will be transferred on the pins durin g second portion of the bus
cycle. Addresses must be valid prior to the falling edge of ALE(AS), at which time the DS2172 latches
the address from the AD0 to AD7 pins. Valid write data must be present and held stable during the later
portion of the DS or WR pulses. In a read cycle, the DS2172 outputs a byte of data during the latter
portion of the DS or RD pulses. The read cycle is terminated and the bus returns to a high impedance
state as RD transitions high in Intel timing or as DS transitions low in Motorola timing. The DS2172 can
also be easily connected to non-multiplexed buses. RCLK and TCLK are used to update counters and
load transmit and receive pattern registers. At slow clock rates, sufficient time must be allowed for these
port operations.
3.0 PATTERN SET REGISTERS
The Pattern Set Registers (PSR) are loaded each time a new pattern (whether it be pseudorandom or
repetitive) is to be generated. When a pseudorandom pattern is generated, all four PSRs must be loaded
with FF Hex. When a repetitive pattern is to be created, the four PSRs are loaded with the pattern that is
to be repeated. Please see Tables 4 and 5 for some programming examples.
Length Bits LB4 to LB0 determine the length of the pseudorandom polynomial or programmable
repetitive pattern that is generated and detected. With the pseudorandom patterns, the “Tap A” feedback
position of the pattern generator is always equal to the value in the Pattern Length Register (PLR). Please
refer to Figure 2 for a block diagram of the pattern generator and to Tables 4 and 5 for some
programming examples.
6 of 21
Page 7
DS2172
PLR: PATTERN LENGTH REGISTER (Address=04 Hex)
(MSB) (LSB)
---LB4LB3LB2LB1LB0
SYMBOLPOSITIONNAME AND DESCRIPTION
-PLR1.7Not Assigned. Should be set to 0 when written to.
-PLR1.6Not Assigned. Should be set to 0 when written to.
-PLR1.5Not Assigned. Should be set to 0 when written to.
LB4PLR1.4
LB3PLR1.3
LB2PLR1.2
LB1PLR1.1
LB0PLR1.0
Length Bit 4.
Length Bit 3.
Length Bit 2.
Length Bit 1.
Length Bit 0.
5.0 POLYNOMIAL TAP REGISTER
Polynomial Tap Bits PT4 - PT0 determine the feedback position of Tap B connected to the XOR input of
the pattern generator. Feedback Tap B provides one of two feedback paths within the pattern generator.
Please refer to Figure 2 for a block diagram of the pattern generator and to Tables 4 and 5 for register
programming examples.
PTR: POLYNOMIAL TAP REGISTER (Address=05 Hex)
(MSB) (LSB)
---PT4PT3PT2PT1PT0
SYMBOLPOSITIONNAME AND DESCRIPTION
-PTR.7Not Assigned. Should be set to 0 when written to.
-PTR.6Not Assigned. Should be set to 0 when written to.
-PTR.5Not Assigned. Should be set to 0 when written to.
PT4PTR.4
PT3PTR.3
PT2PTR.2
PT1PTR.1
PT0PTR.0
Polynomial Tap Bit 4.
Polynomial Tap Bit 3.
Polynomial Tap Bit 2.
Polynomial Tap Bit 1.
Polynomial Tap Bit 0.
7 of 21
Page 8
DS2172
6.0 PATTERN CONTROL REGISTER
The Pattern Control Register (PCR) is used to configure the operating parameters of the DS2172 and to
control the patterns being generated and received. Also the PCR is used to control the pattern
synchronizer and the error and bit counters.
PCR: PATTERN CONTROL REGISTER (Address=06 Hex)
(MSB) (LSB)
TLQRSSPSLCRLSYNCERESYNCLPBK
SYMBOLPOSITIONNAME AND DESCRIPTION
TLPCR.7Transmit Load. A low to high transition loads the pattern
generator with the contents of the Pattern Set Registers. PCR.7 is
logically ORed with the input pin TL. Must be cleared and set
again for subsequent loads.
QRSSPCR.6Zero Suppression Select. Forces a 1 into the pattern whenever
the next 14 bit positions are all 0s. Should only be set when
using the QRSS pattern.
0 = Zero suppression disabled
1 = Zero suppression enabled
PSPCR.5
LCPCR.4Latch Count Registers. A low to high transition latches the bit
RLPCR.3Receive Data Load. A transition from low to high loads the
SYNCEPCR.2
RESYNCPCR.1Initiate Manual Resync Process. A low to high transition will
Pattern Select.
0 = Repetitive Pattern
1 = Pseudorandom Pattern
and error counts into the user accessible registers BCR and
BECR and clears the internal register count. PCR.4 is logically
OR’ed with input pin LC. Must be cleared and set again for
subsequent loads.
previous 32 bits of data received at RDATA into the Pattern
Receive Registers (PRR). PCR.3 is logically OR’ed with input
pin RL. Must be cleared and set again for subsequent latches.
SYNC Enable.
0 = auto resync is enabled.
1 = auto resync is disabled.
force the DS2172 to resynchronize to the incoming pattern at
RDATA. Must be cleared and set again for a subsequent resync.
LPBKPCR.0Transmit/Receive Loopback Select. When enabled, the
RDATA input is disabled; TDATA continues to output data as
normal. See Figure 1.
0 = loopback disabled
1 = loopback enabled
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Page 9
DS2172
7.0 ERROR INSERT REGISTER
The Error Insertion Register (EIR) controls circuitry within the DS2172 that allows the generated pattern
to be intentionally corrupted. Bit errors can be inserted automatically at regular intervals by properly
programming the EIR0 to EIR2 bits or bit errors can be inserted at random (under microcontroller
control) via the EIR.3 bit.
EIR: ERROR INSERT REGISTER (Address=07 Hex)
(MSB) (LSB)
--TINVRINVSBEEIR2EIR1EIR0
SYMBOLPOSITIONNAME AND DESCRIPTION
-EIR.7Not Assigned. Should be set to 0 when written to.
-EIR.6Not Assigned. Should be set to 0 when written to.
TINVEIR.5
Transmit Data Inversion Select.
0 = do not invert data to be transmitted at TDATA
1 = invert data to be transmitted at TDATA
RINVEIR.4
Receive Data Inversion Select.
0 = do not invert data received at RDATA
1 = invert data received at RDATA
SBEEIR.3Single Bit Error Insert. A low to high transition will create a
single bit error. Must be cleared and set again for a subsequent
bit error to be inserted. Can be used to accomplish rates not
addressed in Table 3 (e.g., BER of less than 10-7).
all 1s0000FFFFFFFF00
all 0s0000FFFFFFFE00
alternating 1s and 0s0001FFFFFFFE00
double alternating 1s and 0s0003FFFFFFFC00
3 in 240017FF20002200
1 in 16000FFFFF000100
1 in 80007FFFFFF0100
1 in 40003FFFFFFF100
D4 Line Loopback Activate0004FFFFFFF000
D4 Line Loopback Deactivate0002FFFFFFFC00
10 of 21
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DS2172
NOTES FOR TABLES 4 AND 5:
1. PTR = Polynomial Tap Register (address = 05)
2. PLR = Pattern Length Register (address = 04)
3. PSR3 = Pattern Set Register 3 (address = 00)
4. PSR2 = Pattern Set Register 2 (address = 01)
5. PSR1 = Pattern Set Register 1 (address = 02)
6. PSR0 = Pattern Set Register 0 (address = 03)
7. TINV = Transmit Data Inversion Select Bit (EIR.5)
8. RINV = Receive Data Inversion Select Bit (EIR.4)
32
9. For the 2
32
2
- 1.
-1 pattern, the random pattern actually repeats every (4093 x 220) + 1046529 bits instead of
8.0 BIT COUNT REGISTERS
The Bit Count Registers (BCR3 to BCR0) comprise a 32-bit count of bits (actually RCLK cycles)
received at RDATA. BC31 is the MSB of the 32-bit count. The bit counter increments for each c ycle of
RCLK when input pin RDIS is low. The bit counter is disabled during loss of SYNC. The Status Register
bit BCOF is set when this 32-bit register overflows. Upon an overflow condition, the user must clear the
BCR by either toggling the LC bit or pin. The DS2172 latches the bit count into the BCR registers and
clears the internal bit count when either the PCR.4 bit or the LC input pin toggles f rom low to high. The
bit count and bit error count (available via the BECRs) are used by an external processor to compute the
BER performance on a loop or channel basis.
The Bit Error Count Registers (BECR3 to BECR0) comprise a 32-bit count of bits received in error at
RDATA. The bit error counter is disabled during loss of SYNC. BEC31 is the MSB of th e 32-bit count.
The Status Register bit BECOF is set when this 32-bit register overflows. Upon an overflow condition,
the user must clear the BECR by either toggling the LC bit or pin. The DS2172 latches the bit error count
into the BECR registers and clears the internal bit error count when either the PCR.4 bit or the LC input
pin toggles from low to high. The bit count (available via the BCRs) and bit error count are used by an
external processor to compute the BER performance on a loop or channel basis.
11 of 21
Page 12
DS2172
BIT ERROR COUNT REGISTERS
(MSB) (LSB)
BEC31BEC30BEC29BEC28BEC27BEC26BEC25BEC24BECR3
(addr.=0C Hex)
BEC23BEC22BEC21BEC20BEC19BEC18BEC17BEC16BECR2
(addr.=0D Hex)
BEC15BEC14BEC13BEC12BEC11BEC10BEC9BEC8BECR1
(addr.=0E Hex)
BEC7BEC6BEC5BEC4BEC3BEC2BEC1BEC0BECR0
(addr.=0F Hex)
10.0 PATTERN RECEIVE REGISTERS
The Pattern Receive Register (PRR) provides access to the data patterns received at RDATA. The
operation of these registers depends on the synchronization status of the DS2172. Asserting the RL bit
(PCR.3) or pin during an out-of -sync condition (SR.0 = 0) will latch the previous 32 bits of data received
at RDATA into the PRR registers. When the DS2172 is in sync (SR.0 = 1) asserting RL will latch the
pattern that to which the device has established synchronization. Since the receiver has no knowledge of
the start or end of the pattern, the data in the PRR registers will have no particular alignment. As an
example, if the receiver has synchronized to the pattern 00100110, PRR1 may report 10011000,
11000100 or any rotation thereof. Once synchronization is established, bit errors cannot be viewed in the
PRR registers.
The Status Register (SR) contains information on the current real time status of the DS2172. When a
particular event has occurred, the appropriate bit in the register will be set to a 1. All of the bits in these
registers (except for the SYNC bit) operate in a latched fashion. This means that if an ev ent occu rs and a
bit is set to a 1 in any of the registers, it will remain set until the user reads that bit. For the BED, BCOF,
and BECOF status bits, they will be cleared when read and will not be set again until the event has
occurred again. For RLOS, RA0, and RA1 status bits, they will be cleared when read if the condition no
longer persists.
The SR register has the unique ability to initiate a hardware interrupt via the INT pin. Each of the alarms
and events in the SR can be either masked or unmasked from the interrupt pins via the Interrupt Mask
Register (IMR).
12 of 21
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DS2172
SR: STATUS REGISTER (Address=14 Hex)
(MSB) (LSB)
-RA1RA0RLOSBEDBCOFBECOFSYNC
SYMBOLPOSITIONNAME AND DESCRIPTION
-SR.7Not Assigned. Could be any value when read.
RA1SR.6Receive All Ones. Set when 32 consecutive 1s are received;
allowed to be cleared when a 0 is received.
RA0SR.5Receive All Zeros. Set when 32 consecutive 0s are received;
allowed to be cleared when a 1 is received.
RLOSSR.4Receive Loss Of Sync. Set when the device is searchin g for
synchronization. Once sync is achieved, will remain set until
read.
BEDSR.3Bit Error Detection. Set when bit errors are detected.
BCOFSR.2Bit Counter Overflow. Set when the 32-bit BCR overflows.
BECOFSR.1Bit Error Count Overflow. Set when the 32-bit BECR
overflows.
SYNCSR.0Sync. Real time status of the synchronizer (this bit is not
latched). Will be set when synchronization is declared. Will be
cleared when 6 or more bits out of 64 ar e received in error (if
PCR.2 = 0).
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DS2172
IMR: INTERRUPT MASK REGISTER (Address=15 Hex)
(MSB) (LSB)
-RA1RA0RLOSBEDBCOFBECOFSYNC
SYMBOLPOSITIONNAME AND DESCRIPTION
-IMR.7Not Assigned. Should be set to 0 when written to.
RA1IMR.6
RA0IMR.5
RLOSIMR.4
BEDIMR.3
BCOFIMR.2
BECOFIMR.1
Receive All 1s.
0 = interrupt masked
1 = interrupt enabled
Receive All 0s.
0 = interrupt masked
1 = interrupt enabled
Receive Loss Of Sync.
0 = interrupt masked
1 = interrupt enabled
Bit Error Detection.
0 = interrupt masked
1 = interrupt enabled
Bit Counter Overflow.
0 = interrupt masked
1 = interrupt enabled
Bit Error Count Overflow.
0 = interrupt masked
1 = interrupt enabled
SYNCIMR.0
Sync.
0 = interrupt masked
1 = interrupt enabled
14 of 21
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DS2172
12.0 AC TIMING AND DC OPERATING CHARACTERISTICS
ABSOLUTE MAXIMUM RATINGS*
Voltage on Any Pin Relative to Ground -1.0V to +7.0V
Operating Temperature for DS2172TN -40°C to +85°C
Storage Temperature -55°C to +125°C
Soldering Temperature See J-STD-020A specification
* This is a stress rating only and functional operation of the device at these or any other conditions above
those indicated in the operation sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods of time may affect reliability.
RECOMMENDED DC OPERATING CONDITIONS
(0ºC TO 70ºC for DS2172T;
-40ºC TO +85ºC for DS2172TN)
PARAMETERSYMBOLMINTYPMAXUNITSNOTES
Logic 1V
Logic 0V
SupplyV
IH
IL
DD
2.0VDD+0.3V
-0.3+0.8V
4.505.50V
CAPACITANCE (tA=25ºC)
PARAMETERSYMBOLMINTYPMAXUNITSNOTES
Input CapacitanceC
Output CapacitanceC
IN
OUT
5pF
7pF
DC CHARACTERISTICS (0ºC TO 70ºC for DS2172T; VDD=5V±10%;
-40ºC TO +85ºC for DS2172TN; VDD=5V±10%)
PARAMETERSYMBOLMINTYPMAXUNITSNOTES
Supply Current @ 5VI
Input LeakageI
Output LeakageI
Output Current @ 2.4VI
Output Current @ 0.4VI
DD
IL
LO
OH
OL
-1.0+1.0
-1.0mA
+4.0mA
10mA1
µA
1.0
µA
2
3
NOTES:
1. TCLK = RCLK = 1.544 MHz; outputs open circuited.
2. 0.0V < VIN < VDD.
3. Applies to
INT when tri-stated.
15 of 21
Page 16
AC CHARACTERISTICS - PARALLEL PORT
DS2172
(0ºC to 70ºC for DS2172T; V
-40ºC to +85ºC for DS2172TN; V
=5V±10%;
DD
=5V±10%)
DD
PARAMETERSYMBOLMINTYPMAXUNITSNOTES
Cycle Timet
Pulse Width, DS Low or RD High
Pulse Width, DS High or RD Lo w
CYC
PW
PW
Input Rise/Fall TimestR, t
R/W Hold Times
R/W Setup Time Before DS High
CS Setup Time Before DS, WR or RD
t
RWH
t
RWS
t
CS
EL
EH
F
200ns
100ns
100ns
20ns
10ns
50ns
20ns
Active
CS Hold Time
Read Data Hold Timet
Write Data Hold Timet
Mux'ed Address Valid to AS or ALE
t
CH
DHR
DHW
t
ASL
0ns
550ns
0ns
15ns
Fall
Mux'ed Address Hold Timet
Delay Time DS, WR or RD to AS or
t
ALE Rise
Pulse Width AS or ALE HighPW
Delay Time, AS or ALE to DS, WR or
RD
Output Data Delay Time from DS or
RD
t
ASED
t
Data Setup Timet
AHL
ASD
ASH
DDR
DSW
10ns
20ns
30ns
10ns
550ns
50ns
16 of 21
Page 17
INTEL BUS READ AC TIMING (BTS=0) Figure 3
DS2172
17 of 21
Page 18
INTEL BUS WRITE AC TIMING (BTS=0) Figure 4
MOTOROLA BUS AC TIMING (BTS=1) Figure 5
DS2172
18 of 21
Page 19
DS2172
AC CHARACTERISTICS - RECEIVE SIDE
(0ºC TO 70ºC for DS2172T; VDD=5V±10%;
-40ºC TO +85ºC for DS2172TN; VDD=5V±10%)
PARAMETERSYMBOLMINTYPMAXUNITSNOTES
RCLK Periodt
RCLK Pulse Widtht
RDATA Set Up to RCLK Risingt
RDATA Hold from RCLK Risingt
RDIS Set Up to RCLK Risingt
RDIS Hold from RCLK Risingt
RL and LC Pulse Widtht
CP
CH
t
CL
SU1
HD1
SU2
HD2
WRL
RCLK Rise and Fall TimestR, t
F
19ns
8
8
ns
ns
4ns
0ns
4ns
0ns
25ns
10ns1
AC CHARACTER ISTIC S - TRAN SMIT SIDE
(0ºC TO 70ºC for DS2172T; VDD=5V±10%;
-40ºC TO +85ºC for DS2172TN; VDD=5V±10%)
PARAMETERSYMBOLMINTYPMAXUNITSNOTES
TCLK Periodt
TCLK Pulse Widtht
TDATA Delay from TCLK Risingt
TDIS Set Up to TCLK Risingt
TDIS Hold from TCLK Risingt
TL Pulse Widtht
TL Set Up to TCLK Risingt
TL Hold Off from TCLK Risingt
CP
CH
t
CL
DD
SU
HD
WTL
STL
HTL
TCLK Rise and Fall TimetR, t
F
19ns
8
8
ns
ns
9ns
4ns
0ns
15ns
4ns
0ns
10ns1
NOTE:
1. The maximum rise and fall time is either 10 ns or 10% of tCP whichever is less.
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Page 20
RECEIVE AC TIMING Figure 6
TR AN SMIT AC TIMING Figure 7
DS2172
NOTE:
When TDIS is high about the rising edge of TCLK, TDATA will not be updated and will be held with the
previous valve until TDIS is low about the rising edge of TCLK.
TRANSMIT AC TIMING FOR THE TL INPUT Figure 8
NOTE:
The rising edge of TL causes the internal pattern generation circuitry to be reloaded; the first bit of the
new pattern (the shaded one) will appear after two TCLK periods.
20 of 21
Page 21
DS2172 32-PIN TQFP
DS2172
DIMMINMAX
A
A1
A2
D
D1
E
E1
L
e
B
C
-1.20
0.050.15
0.951.05
8.809.20
7.00 BSC
8.809.20
7.00 BSC
0.450.75
0.80 BSC
0.300.45
0.090.20
21 of 21
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