The DP8212/DP8212M is an 8-bit input/output port contained in a standard 24-pin dual-in-line package. The device,
which is fabricated using Schottky Bipolar technology, is
part of National Semiconductor’s 8080A support family. The
DP8212/DP8212M can be used to implement latches, gated buffers, or multiplexers. Thus, all of the major peripheral
and input/output functions of a microcomputer system can
be implemented with this device.
The DP8212/DP8212M includes an 8-bit latch with
TRI-STATE
trol logic. Also included is a service request flip-flop for the
output buffers, and device selection and con-
É
Features
Y
8-Bit data latch and buffer
Y
Service request flip-flop for generation and control of
interrupts
Y
0.25 mA input load current
Y
TRI-STATE TTL output drive capability
Y
Outputs sink 15 mA
Y
Asynchronous latch clear
Y
3.65V output for direct interface to INS8080A
Y
Reduces system package count by replacing buffers,
latches, and multiplexers in microcomputer systems
generation and control of interrupts to the microprocessor.
8080A Microcomputer Family Block Diagram
TL/F/6824– 1
TRI-STATEÉis a registered trademark of National Semiconductor Corp.
C
1995 National Semiconductor CorporationRRD-B30M105/Printed in U. S. A.
TL/F/6824
Page 2
Absolute Maximum Ratings
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Maximum ratings indicate limits beyond which permanent damage may occur. Continuous operation at these limits is not intended and should be limited to those conditions
specified under DC electrical characteristics.
3. Between 1V and 2V Measurements made at 1.5V with 15 mA & 30 pF Test Load.
includes jig and probe capacitance.
4. C
L
e
5. C
30 pF.
L
e
6. C
30 pF except for DP8212M t
L
E (DISABLE)CL
e
5pF
Units
Test Load
TL/F/6824– 2
Alternate Test Load
(Refer to Timing Diagram)
TL/F/6824– 3
3
Page 4
Timing Diagram
TL/F/6824– 4
4
Page 5
Logic Diagram
TL/F/6824– 5
5
Page 6
Logic Tables
Logic Table A
STBMD(DS
000TRI-STATE
100TRI-STATE
010DATA LATCH
110DATA LATCH
001DATA LATCH
101DATA IN
011DATA IN
111DATA IN
CLR K resets data latch to the output low state.
The data latch clock is level sensitive, a low level clock latches the data.
CLR(DS
0 RESET0001
10001
10K10
11 RESET000
10001
*Internal Service Request flip-flop.
DS2)
#
1
Logic Table B
DS2)STBQ*INT
#
1
Data Out
Equals
Functional Pin Definitions
The following describes the function of all the DP8212/
DP8212M input/output pins. Some of these descriptions
reference internal circuits.
INPUT SIGNALS
Device Select (DS
high, the device is selected. The output buffers are enabled
and the service request flip-flop is asynchronously reset
(cleared) when the device is selected.
Mode (MD): When high (output mode), the output buffers
are enabled and the source of the data latch clock input is
the device selection logic (DS
mode), the state of the output buffers is determined by the
device selection logic (DS
data latch clock input is the strobe (STB) input.
Strobe (STB): Used as data latch clock input when the
mode (MD) input is low (input mode). Also used to synchronously set the service request flip-flop, which is negative
edge triggered.
,DS2): When DS1is low and DS2is
1
DS2). When low (input
#
1
DS2) and the source of the
#
1
Data In (DI
which consists of eight D-type flip-flops. Incorporating a level sensitive clock while the data latch clock input is high, the
Q output of each flip-flop follows the data input. When the
clock input returns low, the data latch stores the data input.
The clock input high overrides the clear (CLR
latch reset.
Clear (CLR
data latch and the service request flip-flop. The service request flip-flop is in the non-interrupting state when reset.
OUTPUT SIGNALS
Interrupt (INT
the service request flip-flop is synchronously set by the
strobe (STB) input or the device is selected.
Data Out (DO
which are TRI-STATE, non-inverting stages. These buffers
have a common control line that either enables the buffers
to transmit the data from the data latch outputs or disables
the buffers by placing them in the high-impedance state.
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SEMICONDUCTOR CORPORATION. As used herein:
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systems which, (a) are intended for surgical implantsupport device or system whose failure to perform can
into the body, or (b) support or sustain life, and whosebe reasonably expected to cause the failure of the life
failure to perform, when properly used in accordancesupport device or system, or to affect its safety or
with instructions for use provided in the labeling, caneffectiveness.
be reasonably expected to result in a significant injury
to the user.
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