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© 2000 Fairchild Semiconductor Corporation DS006358 www.fairchildsemi.com
August 1986
Revised March 2000
DM74LS26 Quad 2-Input NAND Gate with High Voltage Open-Collector Outputs
DM74LS26
Quad 2-Input NAND Gate
with High Voltage Open-Collector Outputs
General Description
This device contains four independent gates each of which
performs the logic NA ND functio n. The open -collector outputs require external pull-up resistors for proper logical
operation.
These gates feature high-voltage output ratings (up to 15V)
for interfacing with 12V systems. Although the outputs are
rated for 15V, the device supply is still rated for 5V.
Pull-Up Resistor Equations
Where: N1 (IOH) = total maximum output high c urrent
for all outputs tied to pull-up resistor
N
2
(IIH) = total maximum input high current for
all inputs tied to pull-up resistor
N
3
(IIL) = total maximum input low current for
all inputs tied to pull-up resistor
Ordering Code:
Devices also availab le in Tape and Reel. Specify by appending th e s uffix let t er “X” to the ordering code.
Connection Diagram Function Table
Y = AB
H = HIGH Logic Level
L = LOW Logic Level
Order Number Package Number Package Description
DM74LS26M M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow
DM74LS26N N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Inputs Output
ABY
LLH
LHH
HLH
HHL
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DM74LS26
Absolute Maximum Ratings(Note 1)
Note 1: The “Absolute Maximum Ratings” are those values beyond which
the safety of the dev ice cannot be guaranteed. T he device sh ould not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum ratings.
The “Recommend ed O peratin g Cond itions” t able w ill defin e the co ndition s
for actual device operation.
Recommended Operating Conditions
Electrical Characteristics
over recommended operating free air temperature range (unless otherwise noted)
Note 2: All typicals are at VCC = 5V, TA = 25°C.
Switching Characteristics
at VCC = 5V and TA = 25°C
Supply Voltage 7V
Input Voltage 7V
Output Voltage 15V
Operating Free Air Temperature Range 0°C to +70°C
Storage Temperature Range −65°C to +150°C
Symbol Parameter Min Nom Max Units
V
CC
Supply Voltage 4.75 5 5.25 V
V
IH
HIGH Level Input Voltage 2 V
V
IL
LOW Level Input Voltage 0.8 V
V
OH
HIGH Level Output Voltage 15 V
I
OL
LOW Level Output Current 8 mA
T
A
Free Air Operating Temperature 0 70 °C
Symbol Parameter Conditions Min
Typ
Max Units
(Note 2)
V
I
Input Clamp Voltage VCC = Min, II = −18 mA −1.5 V
I
CEX
HIGH Level VCC = Min VO = 15V 1000
µA
Output Current VIL = Max VO = 12V 50
V
OL
LOW Level VCC = Min, IOL = Max
0.35 0.5
Output Voltage VIH = Min V
IOL = 4 mA, VCC = Min 0.25 0.4
I
I
Input Current @ Max VCC = Max, VI = 7V
0.1 mA
Input Voltage VI = 5.5V
I
IH
HIGH Level Input Current VCC = Max, VI = 2.7V 20 µA
I
IL
LOW Level Input Current VCC = Max, VI = 0.4V −0.36 mA
I
CCH
Supply Current with Outputs HIGH VCC = Max 0.8 1.6 mA
I
CCL
Supply Current with Outputs LOW VCC = Max 2.4 4.4 mA
Symbol Parameter
RL = 2 kΩ
UnitsCL = 15 pF CL = 50 pF
Min Max Min Max
t
PLH
Propagation Delay Time
20 45 ns
LOW-to-HIGH Level Output
t
PHL
Propagation Delay Time
15 20 ns
HIGH-to-LOW Level Output
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DM74LS26
Physical Dimensions inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow
Package Number M14A
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DM74LS26 Quad 2-Input NAND Gate with High Voltage Open-Collector Outputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N14A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit pate nt licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or syste ms
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant inju ry to the
user.
2. A critical component i n any compon ent of a lif e support
device or system whose failu re to perform can be reasonably expected to ca use the fa i lure of the life su pp ort
device or system, or to affect its safety or effectiveness.
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