Datasheet DALC208SC6 Datasheet (SGS Thomson Microelectronics)

Page 1
®
DALC208SC6
Application Specific Discretes
A.S.D.
MAIN APPLICATIONS
Where ESD and/or over and undershoot protection for datalines is required :
Sensitive logic input protection Microprocessor based equipment Audio / Video inputs Portable electronics Networks ISDN equipment USB interface
DESCRIPTION
The DALC208SC6 diode array is designed to protect components which are connected to data and transmission lines from overvoltages caused by electrostatic discharge (ESD) or other transients. It is a rail-to-rail protection device also suited for overshoot and under shoot suppression on sensitive logic inputs.
The low capacitance of the DALC208SC6 prevents from significant signal distortion.
TM
LOW CAPACITANCE
DIODE ARRAY
1
SOT23-6L (SC74)
FUNCTIONAL DIAGRAM
FEATURES
PROTECTION OF 4 LINES PEAK RE VER SE V OLTA GE :
= 9 V per diode
V
RRM
VERY LOW CA PA CIT ANCE PER DIODE: C < 5 pF
VERY LOW LEAKAGE CURRE NT: IR < 1 µA
BENEFITS
Cost-effectiveness compared to discrete solution High efficiency in ESD s uppression No significant signal distortion thanks to very low
capacitance High reliability offered by monolithic integration Lower PCB area consumption versus discrete
solution
February 1999 - Ed: 3A
I/O 1
REF 2 REF 1
I/O 2 I/O 3
COMPLIES WITH THE FOLLOWING STANDARDS :
IEC 1000- 4-2 level 4 MIL STD 883C - M ethod 3015-6
(human body test) class 3
I/O 4
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Page 2
DALC208SC6
ABSOLUTE MAXIMUM RATINGS
(T
= 25° C) .
amb
Symbol Parameter Value Unit
V
PP
IEC1000-4-2, air discharge IEC1000-4-2, contact discharge
V
RRM
V
REF
max.
V
In
min. Minimum operating signal input voltage V
V
In
I
F
I
FRM
I
FSM
Peak reverse voltage per diode 9 V Reference voltage gap between V
REF2
and V
REF1
Maximum operating signal input voltage
Continuous forward current (single diode loaded) 200 mA Repetitive peak forward current (tp = 5 µs, F = 50 kHz) Surge non repetitive forward current -
15
8
9V
V
REF2 REF1
700 mA
rectangular waveform (see curve on figure 1) t
= 2.5 µs
p
= 1 ms
t
p
= 100 ms
t
p
T
stg
T
j
Storage temperature range Maximum junction temperature
6 2 1
-55 to + 150 150
THERMAL RESISTANCE
Symbol Parameter Value Unit
R
th(j-a)
Note 1:
device mounted on FR4 PCB with recommended footprint dimensions.
Junction to ambient (note 1)
500 ° C/W
kV
V V
A
° °
C C
ELECTRICAL CHARACTERI STICS
(T
= 25° C) .
amb
Symbol Parameter Conditions Typ. Max. Unit
V
F
I
R
C
Note 2:
The dynamical behavior is described in the Technical Information section, on page 4.
Note 3:
Forward voltage IF = 50 mA 1.2 V Reverse leakage current per diode VR = 5 V 1 Input capacitance between Line and G ND see note 3 7 pF
Input capacitance measurement
REF2
REF1 connected to GND
I/O
+V
CC
REF2 connected to +Vcc Input applied :
R
V
G
Vcc = 5V,Vsign = 30 mV, F = 1 MH z
REF1
µ
A
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Page 3
DALC208SC6
Fig. 1:
Maximum non-repet itive pea k forwar d curre nt
versus rec tangular puls e duration (Tj initial = 25°C).
IFSM(A)
8 7
I/O vs
REF1 or
REF2
6 5 4 3 2 1 0
0.001 0.01 0.1 1 10 100 1000
tp(ms)
Fig. 3:
Variation of leakage current versus junction
temperature (typical values).
IR(µA)
100
10
Fig. 2:
Reverse clamping voltage versus peak pulse current (Tj initial = 25°C), typical values. Rectangular waveform tp = 2.5 µs.
Ipp(A)
2.0
tp=2.5µs
1.0
I/O vs REF1
or REF2
0.1
5 1015202530
Vcl(V)
Fig. 4:
Input capacitance versus reverse applied
voltage (typical values).
C(pF)
8.0
7.5
7.0
1
0.1
0.01 25 50 75 100 125 150
Tj(°C)
Fig. 5:
Peak forward voltage drop versus peak for­ward current (typical values). Rectangular waveform tp = 2.5 µs.
IFM(A)
10.0
Tj=25°C
Tj=150°C
1.0
I/O vs REF 1
or REF2
6.5
6.0
5.5
5.0 012345
F=1MHz
Vsign=30mV
Vref1/ref2=5V
VR(V)
0.1 0 2 4 6 8 10 12 14 16 18 20
VFM(V)
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Page 4
DALC208SC6
TECHNICAL INFORMA TION SURGE PROTECTION
The DALC208SC6 is particularly optimized to perform surge protection based on the rail to rail topology.
The clamping voltage V follow :
+ = V
V
CL
- = V
V
CL
with : V (V
= Vt + rd.Ip
F
forward drop voltage) / (Vt forward drop
F
REF2 REF1 -
+ V
threshold voltage)
can be calculated as
CL
for positive surges
F
VF for negative surges
APPLICATION EXAMPLE
If we consider that the connections from the pin REF
to VCC and from REF1 to GND are done by
2
two tracks of 10mm long and 0.5mm large; we assume that the parasitic inductances of these tracks are about 6nH.
So when an IEC 1000-4-2 surge occurs, due to the rise time of this spike (tr=1ns), the voltage V
CL
has
an extra value equal to Lw.dI/dt. The dI/dt is calculated as: di/dt = Ip/tr ≈ 24 A/ns The overvoltage due to the parasitic inductances
is: Lw.di/dt = 6 x 24 ≈ 144V
According to the curve Fig.5 on page 3, we assume that the value of the dynamic resistance of the clamping diode is typically rd = 0.7Ω and V
=
t
1.2V. For an IEC 1000-4-2 surge Level 4 (Contact
Discharge: Vg=8kV, Rg=330Ω), V V
= 0V, and if in first approximation, we
REF1
REF2
= +5V,
assume that : Ip=Vg/Rg ≈ 24A. So, we find:
+ ≈ +23V
V
CL
V
- ≈ -18V
CL
Note:
the calculations do not take into account
phenomena due to parasitic inductances
Fig. A1:
ESD behavior; parasitic phenomena due to unsuitable layout.
ESD
SURGE
Vf
I/O
By taking into account the effect of these parasitic inductances due to unsuitable layout, the clamping voltage will be :
+ = +23 + 144 ≈ 167V
V
CL
V
- = -18 - 144 ≈ -162V
CL
We can reduce as much as possible these phenomena with simple layout optimization.
It’s the reason why some recommendations have to be followed (
good ESD protection"
Lw
Lw
di
dt
REF2=+Vcc
see paragraph "How to ensure a
).
4/10
167V
Lw
Vcc+Vf
di
Lw
Lw
dt
-Vf
di dt
-162V
di
dt
tr=1ns
surge >0
surge <0
t
NEGATIVE
SURGE
Vcl-
Vcc+Vf+
Vcl+ =
VI/O
Vcl+
di dt
tr=1ns
di
Lw
dt
POSITIVE
SURGE
REF1=GND
Vcl- =
t
-Vf-
-Lw
Page 5
DALC208SC6
HOW TO ENSURE A GOOD ESD PROTECTION
While the DALC208SC6 provides a high immunity to ESD surge, an eff icient protection depends on the layout of the board. In the same way, with the rail to rail topology, the track from the V the power supply +V
and from the V
CC
REF2
REF1
pin to
pin to GND must be as short as possible to avoid overvoltages due to parasitic phenomena (see Fig. A1).
It’s often harder to connect the power supply near to the DALC208SC6 unlike the ground thanks to the ground plane that allows a short connection.
To ensure the same efficiency for positive surges when the connections can’t be short enough, we recommend to put close to the DALC208SC6, between V
and ground, a capacitance of
REF2
100nF to prevent from these kinds of overvoltage disturbances (see Fig. A2).
The add of this capacitance will allow a better protection by providing during surge a constant voltage.
Fig. A3, A4a and A4b show the improvement of the ESD protection according to the recommendations described above.
Fig. A2:
ESD behavior: optimized layout and add
of a capacitance of 100nF.
C=100nF
Lw
REF2=+Vcc
ESD
SURGE
Fig. A3:
ESD behavior: measurements conditions
(with coupling capacitance).
TEST BOARD
DALC
208
+5V
Fig. A4a:
DALC208SC6 during positive ESD surge.
Remaining voltage after the
IEC 1000-4-2 Air Discharge
(150pF/330) Vpp=15kV
ESD
SURGE
I/O
Vcc+Vf
VI/O
Vcl+
Vcl+ = Vcl- =
REF1=GND
POSITIVE
SURGE
t
-Vf
surge >0 surge <0
t
NEGATIVE
SURGE
Vcl-
Important:
A main precaution to take is to put the protection device closer to the disturbance source (generally the connector).
Note:
The measurements have been done with the DALC208SC6
in open circuit.
Fig. A4b:
Remaining voltage after the
DALC208SC6 during negative ESD surge.
IEC 1000-4-2 Air Discharge
(150pF/330) Vpp=15kV
5/10
Page 6
DALC208SC6
CROSSTALK BE HAV IOR 1- Crosstalk phenomena
Fig. A4:
Crosstalk phenomena.
V
G1
V
G2
R
G1
R
G2
DRIVERS
Line 1
Line 2
The crosstalk phenomena are due to the coupling between 2 lines. The coupling factor (β12 or β21) increases when the gap across lines decreases, particularly in silicon dice. In the example above the expected signal on load R
L2
is
2VG2
, in fact
α
the real voltage at this point has got an extra value
β
. This part of the VG1 signal represents the
21VG1
effect of the crosstalk phenomenon of the line 1 on the line 2. This phenomenon has to be t aken into account when the drivers impose fast digital data or high frequency analog signals in the disturbing line. The perturbed line will be more affected if it works with low voltage signal or high load impedance (few kΩ). The following chapters give the value of both digital and analog crosstalk.
R
L2
RECEIVERS
β
α
V
V
+
R
L1
1
α
β
+
V
G2
21
2
G2
G1
12
V
G1
2- Digital Crosstalk Fig. A5:
Square Pulse Generator 5KHz
Digital crosstalk measurements.
+5V
+5V +5V
74HC04
Line 1
V
Line 2
G1
+5V
DALC208SC6
β
100nF
21
V
G1
74HC04
Figure A5 shows the measurement circuit used to quantify the crosstalk effect in a classical digital application.
Figure A6 shows that in such a condition: signal from 0V to 5V and a rise time of 5 ns, the impact on the disturbed line is less than 100mV peak to peak. No data disturbance was noted on the concerned line. The same results were obtained with falling edges.
Note:
The measurements have been done in the worst case i.e. on
two adjacent cells (I/O1 & I/O4).
Fig. A6:
Digital crosstalk results.
6/10
Page 7
3- Analog Crosstalk
DALC208SC6
Fig. A7:
Analog crosstalk measurements.
TRACKING GENERATOR
50
+5V
Vg
Vin
TEST BOARD
C=100nF
Figure A7 gives the measurement circuit for the analog application. In usual frequency range of analog signals (up to 100MHz) the effect on disturbed line is less than -45 dBm (please s ee Fig. A8).
Fig. A8:
dBm
Analog crosstalk results.
0
-20
-40
-60
DALC
208
Fig. A9:
TRACKING GENERATOR
Vg
SPECTRUM ANALYSER
50
Vout
Measurement conditions.
Vin
+5V
TEST BOARD
C=100nF
DALC
208
50
SPECTRUM ANAL YSER
Vout
50
-80
-100 1 10 100 1,000
f(MHz)
As the DALC208SC6 is designed to protect high speed data lines, it must ensure a good transmission of operating signals. The attenuation curve give such an information.
Fig. A10 shows that the DALC208SC6 is well suitable for data line transmission up to 100 M bit/s while it works as a filter for undesirable signals as GSM (900MHz).
Fig. A10:
DALC206SC6 attenuation.
dBm
0
-10
-20
-30 1 10 100 1,000
f(MHz)
7/10
Page 8
DALC208SC6
APPLICATION EXAMPLES
Video line protection
T1/E1 protection
Tx
SMP75-8
100nF
Rx
SMP75-8
+Vcc
100nF
100nF
+Vcc
+Vcc
5
15
DALC
208
DALC
208
DALC
1
208
DAT A
TRANSCEIVER
Pin N° Signal
1 RED VIDEO 2 GREEN VIDEO
or COMPOSITE SYNC with GREEN VIDEO 3 BLUE VIDEO 4 GROUND 5 DDC (Display Data Channel) GROUND 6 RED GROUND 7 GREEN GROUND 8 BLUE GROUND 9 NC
10 SYNC GROUND 11 GROUND 12 SDA (Sérial Data) 13 HORIZONTAL SYNC
14 VERTICAL SYNC (VCLK) 15 SCL (Serial Clock)
or COMPOSITE SYNC
USB port protection
VBUS D+
D­GND
+V
100nF
VBUS D+
D­GND
DALC
208
15k 15k
+V
1.5k (1)
(1) Full speed
(2) Low speed
1.5k (2)
USB TRANS­CEIVER
only
only
USB TRANS­CEIVER
Another way to connect the DALC208SC6
I/O2
I/O1
DALC208
I/O3
GND
I/O4
Note It's absolutely necessary to connect
the pin 5 (REF1) to GND !
8/10
Page 9
PSPICE MODEL
DALC208SC6
Fig. A11:
PSpice model of one DALC208SC6 cell.
Vref2
0.8nH
0.3 Dpos
0.8nH 0.3
I/O
Dneg
0.5
1.45nH
Vref1
Figure A11 shows the PSpice model of one DALC208SC6 cell. In this model, the diodes are defined by the PSpice parameters given in table below (Fig A12).
Fig. A12:
PSpice parameters.
DPOS DNEG BV CJO IBV IKF IS ISR M N NR RS VJ
99 7p 7p 1u 1u
28.357E-3 1000
118.78E-15 5.6524E-9 100E-12 472.3E-9
0.3333 0.3333
1.3334 2.413 22
0.68377 0.71677
0.6 0.6
Fig. A13a:
PSpice model simulation: surge > 0
IEC 1000-4-2 contact dis charge r esponse.
Current (A) /Voltage (V )
60 50 40 30 20 10
0
0 50 100
t(ns)
Fig. A13b:
PSpice model simulation: surge < 0
Current
V oltage
IEC 1000-4-2 contact dis charge r esponse.
Current (A) /Voltage (V )
0
-10
-20
-30
-40
-50 0 50 100
t(ns)
Fig. A14:
dBm
0
-10
Attenuation comparison.
Current
V oltage
Measured
Surge
I/O
Surge
I/O
PSpice
Note:
This simulation mo del is available only for an ambient tem-
perature of 27°C.
The simulations done (Fig. A13, A14, A15) shows that the PSpice model is close to the product behavior.
-20
-30 1 10 100 1,000
f(MHz)
9/10
Page 10
DALC208SC6
MARKING
Type Marking Order Code Packaging (Base Qty)
DALC208SC6 DALC DALC208SC6 tape & r eel ( 3000)
PACKAGE MECHANICAL DATA
SOT23-6L (Plastic)
H
e
D
e
L
M
E
FOOTPRINT DIMENSIONS
b
c
(in millimeters)
0.65
0.025
A
A2
A1
DIMENSIONS
REF.
Millimeters Inches
Min. Typ. Max. Min. Typ. Max.
A 0.90 1.45 0.035 0.057 A1 0 0.15 0 0.006 A2 0.90 1.30 0.035 0.0512
b 0.35 0.50 0.0137 0.02
C 0.09 0.20 0.004 0.008
D 2.80 3.00 0.11 0.118
E 1.50 1.75 0.059 0.0689
e 0.95 0.0374
H 2.60 3.00 0.102 0.118
L 0.10 0.60 0.004 0.024
M 10° 10°
1.3
0.051
1
0.040
3.6
0.137
0.95
0.037
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwi se un der any pat ent or patent rights of STMic roelec tronics. S pecifications ment ioned in t his publ ication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products ar e not authorized for use as crit ic al components in life support devices or systems wi thout express wri tten ap­proval of STMicroelectronics.
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