Datasheet DAC1208LCJ-1, DAC1208LCJ Datasheet (NSC)

Page 1
February 1995
MICRO-DACTMDAC1208/DAC1209/DAC1210/DAC1230/ DAC1231/DAC1232 12-Bit, mP Compatible, Double-Buffered D to A Converters
MICRO-DAC DAC1208/DAC1209/DAC1210/DAC1230/DAC1231/DAC1232
12-Bit, mP Compatible, Double-Buffered D to A Converters
General Description
The DAC1208 and the DAC1230 series are 12-bit multiply­ing D to A converters designed to interface directly with a wide variety of microprocessors (8080, 8048, 8085, Z-80, etc.). Double buffering input registers and associated con­trol lines allow these DACs to appear as a two-byte ‘‘stack’’ in the system’s memory or I/O space with no additional in­terfacing logic required.
The DAC1208 series provides all 12 input lines to allow sin­gle buffering for maximum throughput when used with 16-bit processors. These input lines can also be externally config­ured to permit an 8-bit data interface. The DAC1230 series can be used with an 8-bit data bus directly as it internally formulates the 12-bit DAC data from its 8 input lines. All of these DACs accept left-justified data from the processor.
The analog section is a precision silicon-chromium (Si-Cr) R-2R ladder network and twelve CMOS current switches. An inverted R-2R ladder structure is used with the binary weighted currents switched between the I maintaining a constant current in each ladder leg indepen-
OUT1
and I
OUT2
dent of the switch state. Special circuitry provides TTL logic input voltage level compatibility.
The DAC1208 series and DAC1230 series are the 12-bit members of a family of microprocessor compatible DACs (MICRO-DACs
TM
). For applications requiring other resolu­tions, the DAC1000 series for 10-bit and DAC0830 series for 8-bit are available alternatives.
Typical Application
Features
Y
Linearity specified with zero and full-scale adjust only
Y
Direct interface to all popular microprocessors
Y
Double-buffered, single-buffered or flow through digital data inputs
Y
Logic inputs which meet TTL voltage level specs (1.4V logic threshold)
Y
Works withg10V referenceÐfull 4-quadrant multiplication
Y
Operates stand-alone (without mP) if desired
Y
All parts guaranteed 12-bit monotonic
Y
DAC1230 series is pin compatible with the DAC0830 series 8-bit MICRO-DACs
Key Specifications
Y
Current Settling Time 1 ms
Y
Resolution 12 Bits
Y
Linearity (Guaranteed over temperature) 10, 11, or 12 Bits of FS
Y
Gain Tempco 1.3 ppm/§C
Y
Low Power Dissipation 20 mW
Y
Single Power Supply 5 VDCto 15 V
DC
TL/H/5690– 1
TRI-STATEÉis a registered trademark of National Semiconductor Corp.
TM
MICRO-DAC
C
1995 National Semiconductor Corporation RRD-B30M115/Printed in U. S. A.
is a trademark of National Semiconductor Corp.
TL/H/5690
Page 2
Absolute Maximum Ratings
If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications.
(Notes 1 and 2)
Supply Voltage (V
Voltage at Any Digital Input VCCto GND
Voltage at V
Storage Temperature Range
Package Dissipation at T
(Note 3)
DC Voltage Applied to I
(Note 4)
ESD Susceptability 800V
Electrical Characteristics
e
V
10.000 VDC,V
REF
Note 13); all other limits T
Parameter Conditions Notes
)17V
REF
CC
Input
b
e
25§C.
65§Ctoa150§C
b
100 mV to V
e
25§C 500 mW
A
or I
OUT1
OUT2
e
11.4 VDCto 15.75 VDCunless otherwise noted. Boldface limits apply from T
CC
e
T
A
J
DC
g
25V
CC
Operating Conditions
Lead Temperature (Soldering, 10 sec.) 300§C
Temperature Range T
DAC1208LCJ, DAC1209LCJ, DAC1210LCJ, DAC1230LCJ, DAC1231LCJ, DAC1232LCJ, DAC1231LIN, DAC1232LIN DAC1208LCJ-1, DAC1210LCJ-1, DAC1230LCJ-1, DAC1231LCJ-1, DAC1232LCJ-1, DAC1231LCN, DAC1232LCN, DAC1231LCWM, DAC1232LCWM 0
Range of V
CC
Voltage at Any Digital Input VCCto GND
Typ
(Note 10)
Tested Design
Limit Limit Units
(Note 5) (Note 6)
s
MIN
b
40§CsT
CsT
§
4.75 VDCto 16 V
to T
MIN
A
A
T
A
s
s
MAX
s
a
a
Resolution 12 12 12 Bits
Linearity Error Zero and Full-Scale 4, 7, 13 (End Point Linearity) Adjusted
Differential Non-Linearity Zero and Full-Scale 4, 7, 13
DAC1208, DAC1230 DAC1209, DAC1231 DAC1210, DAC1232
Adjusted DAC1208, DAC1230 DAC1209, DAC1231 DAC1210, DAC1232
g
0.018g0.018 %ofFSR
g
0.024g0.024 %ofFSR
g
0.050g0.05 %ofFSR
g
0.018g0.018 %ofFSR
g
0.024g0.024 %ofFSR
g
0.050g0.05 %ofFSR
Monotonicity 4 12 12 12 Bits
Gain Error (Min) Using Internal R
Gain Error (Max)
e
V
ref
g
10V,g1V
Fb
Gain Error Tempco 7
Power Supply Rejection All Digital Inputs
Reference Input Resistance (Min) Reference Input Resistance (Max) 15 20 20
Output Feedthrough Error V
Output Capacitance All Data Inputs I
Latched High
13
e
20 Vp-p, fe100 kHz
REF
All Data Inputs Latched 9 3.0 mVp-p Low
Latched High I All Data Inputs I Latched Low I
OUT1 OUT2 OUT1 OUT2
b
7
7
7
0.1 0.0 % of FSR
b
0.1
g
1.3
g
3.0
b
0.2 % of FSR
g
6.0 ppm of FS/§C
g
30 ppm of FSR/V
15 10 10
200 pF
70 pF 70 pF
200 pF
kX
Supply Current Drain 13 2.0 2.5 mA
Output Leakage Current
I
OUT1
I
OUT2
Digital Input Threshold Low Threshold 13 0.8 0.8 V
Digital Input Currents Digital Inputsk0.8V 13
All Data Inputs Latched 11, 13 0.1 15 15 nA Low All Data Inputs Latched 11, 13 0.1 15 15 nA High
High Threshold 13 2.2 2.2 V
b
Digital Inputsl2.2V 13 10 10 mA
200
b
200 mA
DC DC
T
DC DC
MAX
85§C
70§C
DC
(see
2
Page 3
Electrical Characteristics (Continued)
e
V
10.000 VDC,V
REF
Note 13); all other limits T
Symbol Parameter Conditions
e
11.4 VDCto 15.75 VDCunless otherwise noted. Boldface limits apply from T
CC
e
e
T
A
25§C.
J
See Typ
Note (Note 10)
to T
MIN
MAX
Tested Design
Limit Limit Units
(Note 5) (Note 6)
AC CHARACTERISTICS
OUT1
IL
IL
IL
IL
IL
IL
REF
e
e
e
e
e
e
or I
b
e
t
s
t
W
t
DS
t
DH
t
CS
t
CH
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating the device beyond its specified operating conditions.
Note 2: All voltages are measured with respect to GND, unless otherwise specified.
Note 3: This 500 mW specification applies for all packages. The low intrinsic power dissipation of this part (and the fact that there is no way to significantly modify
the power dissipation) removes concern for heat sinking.
Note 4: Both I example, if V
Note 5: Tested and guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 6: Design limits are guaranteed but not 100% tested. These limits are not used to calculate outgoing quality levels. Guaranteed for V
and V
Note 7: The unit FSR stands for full-scale range. Linearity Error and Power Supply Rejection specs are based on this unit to eliminate dependence on a particular V
REF
performing a zero and full-scale adjustment, the plot of the 4096 analog voltage outputs will each be within 0.012% zero and full-scale. The unit ppm of FSR(parts per million of full-scale range) and ppm of FS(parts per million of full-scale) are used for convenience to define specs of very small percentage values, typical of higher accuracy converters. In this instance, 1 ppm of FSR output voltage quantity. For example, the gain error tempco spec of
b
40§Ctoa85§Cofg(6)(V
Note 8: This spec implies that all parts are guaranteed to operate with a write pulse or transfer pulse width (t 100 ns. The entire write pulse must occur within the valid data interval for the specified t
Note 9: To achieve this low feedthrough in the D package, the user must ground the metal lid. If the lid is left floating the feedthrough is typically 6 mV.
Note 10: Typicals are at 25
Note 11: A 10 nA leakage current with R
Note 12: Human body model, 100 pF discharged through a 1.5 kX resistor.
Note 13: Tested limit for
Current Setting Time V
Write and XFER V Pulse Width Min. 320
Data Setup Time Min. V
Data Hold Time Min. V
Control Setup Time Min. V
Control Hold Time Min. V
and I
OUT1
e
REF
eb
10V toa10V.
REF
value to indicate the true performance of the part. The Linearity Error specification of the DAC1208 is 0.012% of FSR(max). This guarantees that after
must go to ground or the virtual ground of an operational amplifier. The linearity error is degraded by approximately V
OUT2
10Vthena1mVoffset, VOS,onI
/106)(125§C) org0.75 (10
REF
C and represent the most likely parametric norm.
§
b
1 suffix parts applies only at 25§C.
e
Fb
20k and V
e
0V, V
0V, V
0V, V
0V, V
0V, V
0V, V
OUT2
3
)V
10V corresponds to a zero error of (10c10
5V 1.0 ms
IH
e
5V
IH
e
5V 70 320
IH
e
5V 30 90
IH
e
5V 60 320
IH
e
5V 0 10
IH
will introduce an additional 0.01% linearity error.
g
6 ppm of FS/§C represents a worst-case full-scale gain error change with temperature from
which isg0.075% of V
REF
8
W,tDS,tDH
50 320
c
V
e
V
/106is the conversion factor to provide an actual
REF
.
REF
) of 320 ns. A typical part will operate with tWof only
W
and tSto apply.
b
9
c
20c103)c100% 10V or 0.002% of FS.
CC
of a straight line which passes through
REF
320
90
320
e
11.4V to 15.75V
d
OS
Connection Diagrams
Dual-In-Line Package Dual-In-Line Package
(see
ns
V
. For
REF
See Ordering Information
TL/H/5690– 2
3
Page 4
Switching Waveforms
Typical Performance Characteristics
Digital Input Threshold vs V
CC
Digital Input Threshold vs Temperature
TL/H/5690– 3
Gain and Linearity Error Variation vs Temperature
Gain and Linearity Error Variation vs Supply Voltage Control Set-Up Time, t
Write Pulse Width, t
W
4
CS
Data Set-Up Time, t
Data Hold Time, t
DS
DH
TL/H/5690– 4
Page 5
Definition of Package Pinouts
CONTROL SIGNALS (all control signals are level actuated)
CS: Chip Select (active low). The CS will enable WR1.
WR1: Write 1. The active low WR1 is used to load the digital
data bits (DI) into the input latch. The data in the input latch is latched when WR1 into two latches. One holds the first 8 bits, while the other holds 4 bits. The Byte 1/Byte 2 both latches when Byte 1/Byte 2 4-bit input latch when in the low state.
Byte 1/Byte 2
high, all 12 locations of the input latch are enabled. When low, only the four least significant locations of the input latch are enabled.
WR2
: Write 2 (active low). The WR2 will enable XFER.
XFER: Transfer Control Signal (active low). This signal, in
combination with WR2 available in the input latches to transfer to the DAC register.
DI
to DI11: Digital Inputs. DI0is the least significant digital
0
input (LSB) and DI (MSB).
I
: DAC Current Output 1. I
OUT1
digital code of all 1s in the DAC register, and is zero for all 0s in the DAC register.
I
: DAC Current Output 2. I
OUT2
I
,orI
OUT1
voltage). This constant current is
OUT1
divided by the reference input resistance.
: Feedback Resistor. The feedback resistor is provided
R
Fb
on the IC chip for use as the shunt feedback resistor for the external op amp which is used to provide an output voltage for the DAC. This on-chip resistor should always be used (not an external resistor) since it matches the resistors in the on-chip R-2R ladder and tracks these resistors over temperature.
V
: Reference Voltage Input. This input connects an ex-
REF
ternal precision voltage source to the internal R-2R ladder. V
can be selected over the range of 10V tob10V. This
REF
is also the analog voltage input for a 4-quadrant multiplying DAC application.
V
: Digital Supply Voltage. This is the power supply pin for
CC
the part. V optimum for 15 V
CC
GND: Pins 3 and 12 of the DAC1208, DAC1209, and DAC1210 must be connected to ground. Pins 3 and 10 of
is high. The 12-bit input latch is split
control pin is used to select
is high or to overwrite the
: Byte Sequence Control. When this control is
, causes the 12-bit data which is
is the most significant digital input
11
is a maximum for a
OUT1
is a constant minus
a
I
OUT2
V
REF
OUT2
e
constant (for a fixed reference
c
1
b
1
4096
#
J
can be from 5 VDCto 15 VDC. Operation is
.
DC
the DAC1230, DAC1231, and DAC1232 must be connected to ground. It is important that I potential for current switching applications. Any difference of potential (V change of
For example, if V mV offset from I
0.03%.
on these pins) will result in a linearity
OS
e
10V and these ground pins are 9
REF
and I
OUT
1
and I
3V
OUT
OUT
V
OS
REF
OUT
1
, the linearity change will be
2
2
are at ground
Definition of Terms
Resolution: Resolution is defined as the reciprocal of the
number of discrete steps in the DAC output. It is directly related to the number of switches or bits within the DAC. For example, the DAC1208 has 2 has 12-bit resolution.
Linearity Error: Linearity error is the maximum deviation from a
straight line passing through the endpoints of the
DAC transfer characteristic
for zero and full-scale. Linearity error is a parameter intrinsic to the device and cannot be externally adjusted.
National’s linearity test (a) and the best straight line test (b) used by other suppliers are illustrated below. The best straight line (b) requires a special zero and FS adjustment for each part, which is almost impossible for the user to determine. The end point test uses a standard zero FS ad­justment procedure and is a much more stringent test for DAC linearity.
Power Supply Sensitivity: Power supply sensitivity is a measure of the effect of power supply changes on the DAC full-scale output.
Settling Time: Full-scale current settling time requires zero to full-scale or full-scale to zero output change. Settling time is the time required from a code transition until the DAC output reaches within
Full-Scale Error: Full-scale error is a measure of the output error between an ideal DAC and the actual device output. Ideally, for the DAC1208 or DAC1230 series, full-scale is
b
V
1 LSB. For V
REF
V
FULL-SCALE
error is adjustable to zero.
e
10.0000Vb2.44 mVe9.9976V. Full-scale
Differential Non-Linearity: The difference between any two consecutive codes in the transfer curve from the theo­retical 1 LSB is differential non-linearity.
Monotonic: If the output of a DAC increases for increasing digital input code, then the DAC is monotonic. A 12-bit DAC which is monotonic to 12 bits simply means that input in­creasing digital input codes will produce an increasing ana­log output.
12
or 4096 steps and therefore
. It is measured after adjusting
g
(/2 LSB of the final output value.
e
10V and unipolar operation,
REF
a) End Point Test After Zero
and FS Adjust
b) Shifting FS Adjust to Pass
TL/H/5690– 5
Best Straight Line Test
5
Page 6
Application Hints
1.0 DIGITAL INTERFACE
These DACs are designed to provide all of the necessary digital input circuitry to permit a direct interface to a wide variety of microprocessor systems. The timing and logic lev­el convention of the input control signals allow the DACs to be treated as a typical memory device or I/O peripheral with no external logic required in most systems. Essentially these DACs can be mapped as a two-byte stack in memory (or I/O space) to receive their 12 bits of input data in two successive 8-bit data writing sequences. The DAC1230 se­ries is intended for use in systems with an 8-bit data bus. The DAC1208 series provides all 12 digital input lines which can be externally configured to be controlled from an 8-bit bus or can be driven directly from a 16-bit data bus.
All of the digital inputs to these DACs contain a unique threshold regulator circuit to maintain TTL voltage level compatibility independent of the applied V Any input can also be driven from higher voltage CMOS logic levels in non-microprocessor based systems. To pre­vent damage to the chip from static discharge, all unused digital inputs should be tied to V shooting aid, if any digital input is inadvertently left floating, the DAC will interpret the pin as a logic ‘‘1’’.
Double buffered digital inputs allow the DAC to internally format the 12-bit word used to set the current switching R­2R ladder network (see section 2.0) from two 8-bit data write cycles. ters and their controlling logic circuitry. The timing diagrams for updating the DAC output are shown in sections 1.1, 1.2 and 1.3 for three possible control modes. The method used depends strictly upon the particular application.
Figures 1
and2show the internal data regis-
or ground. As a trouble-
CC
to the DAC.
CC
FIGURE 1. DAC1208, DAC1209, DAC1210 Functional Diagram
FIGURE 2. DAC1230, DAC1231, DAC1232 Functional Diagram
6
TL/H/5690– 6
Page 7
Application Hints (Continued)
1.1 Automatic Transfer
The 12-bit DAC word is automatically transferred to the DAC register and the R-2R ladder when the second write (the 4 LSBs of the data) occurs.
TL/H/5690– 7
1.2 Independent Processor Transfer Control
In this case a separate address is decoded to provide the XFER signal. This allows the processor to load the next required DAC word but not change the analog output until some time later, most useful for the simultaneous updating of several DACs in a system where their XFER
lines would be tied together.
TL/H/5690– 8
1.3 Transfer via an External Strobe
This method is basically the same as the previous operation except the XFER signal is provided by a device other than the processor. This allows the DAC to hold the code for a conditional analog output signal which will be required on demand from an external monitoring device (an analog voltage comparator for instance).
WR2 tied to a logic low (0V) TL/H/5690– 9
7
Page 8
Application Hints (Continued)
1.4 Left-Justified Data Format
It is important to realize that the input registers of these DACs are arranged to accept a left-justified data word from the microprocessor with the most significant 8 bits coming first (Byte 1) and the lower 4 bits second. Left justification simply means that the binary point is assumed to be located to the left of the most significant bit. 12 bits of DAC data should be arranged in 2 8-bit registers of an 8-bit processor before being written to the DAC.
Xedon’t care
FIGURE 3. Left-Justified Data Format
Figure 3
shows how the
TL/H/5690-10
Interface Timing
1.5 16-Bit Data Bus Interface
The DAC1208 series provides all 12 digital input lines to permit a direct parallel interface to a 16-bit data bus. In this instance, double buffering is not always necessary (unless a simultaneous updating of several DACs or a data transfer via an external strobe is desired) so the 12-bit DAC register can be wired to flow-through whereby its Q outputs always reflect the state of its D inputs. The external connections required and the timing diagram for this single buffered ap­plication are shown in
Figure 4
. Note that either left or right­justified data from the processor can be accommodated with a 16-bit data bus.
1.6 Flow-Through Operation
Through primarily designed to provide microprocessor inter­face compatibility, the MICRO-DACs can easily be config­ured to allow the analog output to continuously reflect the state of an applied digital input. This is most useful in appli-
XFER and WR2 grounded; Byte 1/Byte 2 tied to VCC.
FIGURE 4. 16-Bit Data Bus Interface for the DAC1208 Series
8
TL/H/5690-11
Page 9
Application Hints (Continued)
cations where the DAC is used in a continuous feedback control loop and is driven by a binary up/down counter, or in function generation circuits where a ROM is continuously providing DAC data.
Only the DAC1208, DAC1209, DAC1210 devices can have all 12 inputs flow-through. Simply grounding CS and XFER and tying Byte 1/Byte 2 high allows both internal registers to follow the applied digital inputs (flow-through) and directly affect the DAC analog output.
1.7 Address Decoding Tips
It is possible to map the MICRO-DACs into system ROM space to allow more efficient use of existing address decod­ing hardware. The DAC in effect can share the same ad­dresses of any number of ROM locations. The ROM outputs will only be enabled by a READ of its address (gated by the system READ strobe) and the DAC will only accept data that is written to the same address (gated by the system WRITE strobe).
The Byte 1/Byte 2 by the processor’s least significant address bit (A0) by plac­ing the DAC at two consecutive address locations and utiliz­ing double-byte WRITE instructions which automatically in­crement or decrement the address. The CS nals can then be decoded from the remaining address bits. Care must be taken in selecting the actual address used for Byte 1 of the DAC to prevent a carry (as a result of
control function can easily be generated
Write Address Bits Cycle
First (Byte 1) Decoded to
Second Address DAC 1 0 (Byte 2)
, WR1, WR2
and XFER sig-
15 2 1* 0**
X ä Y
*Starting with a 0 prevents a carry on address incrementing.
**Used as Byte 1/Byte2
incrementing the address for Byte 2) from propagating through the address word and changing any of the bits de­coded for CS effect.
The same problem can occur from a borrow when an auto­decremented address is used; but only if the processor’s address outputs are inverted before being decoded.
1.8 Control Signal Timing
When interfacing these MICRO-DACs to any microproces­sor, there are two important time relationships that must be considered to insure proper operation. The first is the mini­mum WR
e
V
CC
typically a pulse width of only 250 ns is adequate. A second consideration is that the guaranteed minimum data hold time of 90 ns should be met or erroneous data can be latched. This hold time is defined as the length of time data must be held valid on the digital inputs CS
)WRstrobe makes a low to high transition to latch the
applied data.
If the controlling device or system does not inherently meet these timing specs the DAC can be treated as a slow mem­ory or peripheral and utilize a technique to extend the write strobe. A simple extension of the write time, by adding a wait state, can simultaneously hold the write strobe active and data valid on the bus to satisfy the minimum WR
Control.
FIGURE 5
or XFER.
Figure 5
shows how to prevent this
strobe pulse width which is specified as 320 ns for
11.4V to 15.75V and operation over temperature, but
01
after
a qualified (via
pulse
FIGURE 6. Accommodating a High Speed System
9
TL/H/5690-12
Page 10
Application Hints (Continued)
width. If this does not provide a sufficient data hold time at the end of the write cycle, a negative edge triggered one­shot can be included between the system write strobe and the WR
pin of the DAC. This is illustrated in exemplary system which provides a 250 ns WR with a data hold time of only 10 ns.
The proper data set-up time prior to the latching edge (low to high transition) of the WR pulse width is within spec and the data is valid on the bus for the duration of the DAC WR
1.9 Digital Signal Feedthrough
A typical microprocessor is a tremendous potential source of high frequency noise which can be coupled to sensitive analog circuitry. The fast edges of the data and address bus signals generate frequency components of 10’s of mega­hertz and may cause fast transients to appear at the DAC output, even when data is latched internally.
In low frequency or DC applications, low pass filtering can reduce the magnitude of any fast transients. This is most
strobe, is insured if the WR
strobe.
Figure 6
strobe time
for an
easily accomplished by over-compensating the DAC output amplifier by increasing the value of its feedback capacitor.
In applications requiring a fast output response from the DAC and op amp, filtering may not be feasible. In this event, digital signals can be completely isolated from the DAC circuitry, by the use of a DM74LS374 latch, until a valid CS
signal is applied to update the DAC. This is shown in
Figure 7
.
A single TRI-STATEÉdata buffer such as the DM81LS95 can be used to isolate any number of DACs in a system.
Figure 8
ware for a multiple DAC analog output card. Pull-up resis­tors are used on the buffer outputs to limit the impedance at the DAC digital inputs when the card is not selected. A unique feature of this card is that the DAC XFER controlled by the data bus. This allows a very flexible update of any combination of analog outputs via a transfer word which would contain a zero in the bit position assigned to any of the DACs required to change to a new output value.
shows this isolating circuitry and decoding hard-
strobes are
FIGURE 7. Isolating Data Bus from DAC Circuitry to Eliminate Digital Noise Coupling
10
TL/H/5690-13
Page 11
Application Hints (Continued)
FIGURE 8. TRI-STATEÉBuffers Isolate the Data and Control Lines from the DACs.
A Transfer Word Provides a Flexible Update.
11
TL/H/5690-14
Page 12
Application Hints (Continued)
2.0 ANALOG APPLICATIONS
The analog output signal for these DACs is derived from a conventional R-2R current switching ladder network. A de­tailed description of this network can be found on the DAC1000 series data sheet. Basically, output I vides a current directly proportional to the product of the applied reference voltage and the digital input word. A sec­ond output, I plement of the digital input. Specifically:
e
I
OUT1
e
I
OUT2
will be a current proportional to the com-
OUT2
V
V
REF
R
REF
R
c
4096
4095bD
c
D
4096
;
where D is the decimal equivalent of the applied 12-bit bina­ry word (ranging from 0 to 4095), V plied to the V the R-2R ladder. R is nominally 15 kX.
terminal and R is the internal resistance of
REF
is the voltage ap-
REF
2.1 Obtaining a Unipolar Output Voltage
To maintain linearity of output current with changes in the applied digital code, it is important that the voltages at both of the current output pins be as near ground potential (0 V
) as possible. With V
DC
ing at either I error. In most applications this output current is converted to
OUT1
a voltage by using an op amp as shown in
or I
ea
10V every millivolt appear-
REF
will cause a 0.01% linearity
OUT2
Figure 9
OUT1
.
pro-
The inverting input of the op amp is a virtual ground created by the feedback from its output through the internal 15 kX resistor, R digital input and the reference voltage) will flow through R
. All of the output current (determined by the
Fb
to the output of the amplifier. Two-quadrant operation can be obtained by reversing the polarity of V I
to flow into the DAC and be sourced from the output
OUT1
of the amplifier. The output voltage, in either case, is always equal to I erence voltage.
c
RFband is the opposite polarity of the ref-
OUT1
The reference can be either a stable DC voltage source or an AC signal anywhere in the range from
thus causing
REF
b
10V toa10V. The DAC can be thought of as a digitally controlled attenua­tor: the output voltage is always less than the applied refer­ence voltage. The V nominal impedance of 15 kX to ground to external circuitry.
Always use the internal R voltage since this resistor matches (and tracks with temper-
terminal of the device presents a
REF
resistor to create an output
Fb
ature) the value of the resistors used to generate the output current (I
OUT1
).
The selected op amp should have as low a value of input bias current as possible. The product of the bias current times the feedback resistance creates an output voltage er­ror which can be significant in low reference voltage appli­cations. BI-FET
TM
op amps are highly recommended for use
with these DACs because of their very low input current.
Fb
BI-FETTMis a trademark of National Semiconductor Corp.
V
OUT
for 0
eb
e
sDs
c
(I
RFb)
OUT1
b
V
(D)
REF
4096
4095
FIGURE 9. Unipolar Output Configuration
12
TL/H/5690– 15
Page 13
Application Hints (Continued)
Transient response and settling time of the op amp are im­portant in fast data throughput applications. The largest sta­bility problem is the feedback pole created by the feedback resistance, R This appears from the op amp output to the ( includes the stray capacitance at this node. Addition of a lead capacitance, C and ringing at the output for a step change in DAC output current.
2.1.1 Zero and Full-Scale Adjustments
For accurate conversions, the input offset voltage of the output amplifier must always be nulled. Amplifier offset er­rors create an overall degradation of DAC linearity.
The fundamental purpose of zeroing is to make the voltage appearing at the DAC outputs as near 0 V This is accomplished by shorting out R back resistor, and adjusting the v the op amp until the output reads zero volts. This is done, of course, with an applied digital code of all zeros if I driving the op amp (all ones for I R
is then removed and the converter is zero adjusted.
Fb
A unique feature of this series of DACs is that the full-scale or gain error is guaranteed to be negative. The gain error specification is a measure of how close the value of the
, and the output capacitance of the DAC.
Fb
in
Figure 9
C
, greatly reduces overshoot
nulling potentiometer of
OS
OUT2
b
) input and
as possible.
DC
, the amplifier feed-
Fb
). The short around
OUT1
internal feedback resistor, R resistors. A negative gain error indicates that R
, matches the R-2R ladder
Fb
er resistance value than it should be. To adjust this gain error, some resistance must always be added in series with R
. The 50X potentiometer shown is sufficient to adjust
Fb
the worst-case gain error for these devices.
2.2 Bipolar Output Voltage from a Fixed Reference
The addition of a second op amp to the unipolar circuit can generate a bipolar output voltage from a fixed reference voltage. This, in effect, gives sign significance to the MSB of the digital input word to allow two quadrant multiplication of the reference voltage. The polarity of the reference can also be reversed to realize full 4-quadrant multiplication. This cir­cuit is shown in
Figure 10
.
This configuration features several improvements over ex­isting circuits for a bipolar output shown with other multiply­ing DACs. Only the offset voltage of amplifier 1 affects the linearity of the DAC. The offset voltage error of the second op amp (although a constant output error) has no effect on
is
linearity. In addition, this configuration offers a non-interac­tive positive and negative full-scale calibration procedure.
is a small-
Fb
Input Code Ideal V
MSB......LSB
111111111111 V
110000000000 V
REF
a
V
b
REF
REF
1 LSB
/2
OUT
b
b
V
V
l
REF
b
V
l
100000000000 0 0
011111111111
001111111111
000000000000
b
b
1 LSB
V
REF
b
1 LSB
2
b
V
REF
a
1 LSB
V
l
l
REF
2
a
V
l
FIGURE 10. Bipolar Output Voltage Configuration
13
REF
l
REF
a
REF
a
1 LSB
/2
l
1 LSB
l
e
V
V
OUT
REF
for 0sDs4095
1 LSB
#
V
l
l
REF
e
2048
Db2048
2048
TL/H/5690-16
J
Page 14
Application Hints (Continued)
2.2.1 Zero and Full-Scale Adjustments
To calibrate the bipolar output circuit, three adjustments are required. The first step is to set all of the digital inputs LOW (to force I setting the voltage at its inverting input (pin 2) to zero volts. Next, with a code of all zeros still applied, adjust ‘‘ scale adjust’’, the reference voltage, for V eal
. The polarity of the output voltage at this time will be
l
opposite that of the applied reference. Finally, set all of the digital inputs HIGH and adjust ‘‘
to 0) then null the VOSof amplifier 1 by
OUT1
OUT
a
full-scale adjust’’ for
2047
e
V
V
OUT
REF
2048
.
Composite Amplifier for Good DC Characteristics and Fast Output Response
Combines the low VOS,
#
low V
drift and low
OS
bias current of the
LM11 with the fast
response of the LF351.
Settling time&8 mS
#
for a zero to full-
scale transition
b
e
full-
g
V
l
REF
The polarity of the output will be the same as that of the reference voltage.
3.0 APPLICATION IDEAS
In this section the digital input word is represented by the
id-
letter D and is equal to the decimal equivalent of the 12-bit binary input. Hence D can be any integer value between 0 and 4095.
High Voltage, Power DAC
b
V
D
R2
REF
e
V
OUT
4096
Ð
R2
a
a
1
R
R1
(
Fb
TL/H/5690– 17
14
Page 15
Application Hints (Continued)
1 Amp(D)
e
I
O
4096
High Current Controller
TL/H/5690– 18
8-Bit Course, 4-Bit Vernier DAC
TL/H/5690– 20
15
Page 16
Ordering Information
Part Number Non-Linearity Package
DAC1208LCJ 0.018% J24A Cerdip
DAC1208LCJ-1 0.018% J24A Cerdip 0§Ctoa70§C
DAC1209LCJ 0.024% J24A Cerdip
DAC1210LCJ 0.050% J24A Cerdip
DAC1210LCJ-1 0.050% J24A Cerdip 0§Ctoa70§C
DAC1230LCJ 0.018% J20A Cerdip
DAC1230LCJ-1 0.018% J20A Cerdip 0§Ctoa70§C
DAC1231LCJ 0.024% J20A Cerdip
DAC1231LCJ-1 0.024% J20A Cerdip 0§Ctoa70§C
DAC1231LCN 0.024% N20A Plastic 0§Ctoa70§C
DAC1231LCWM 0.024% M20B SO 0§Ctoa70§C
DAC1231LIN 0.024% N20A Plastic
DAC1232LCJ 0.050% J20A Cerdip
DAC1232LCJ-1 0.050% J20A Cerdip 0§Ctoa70§C
DAC1232LCN 0.050% N20A Plastic 0§Ctoa70§C
DAC1232LCWM 0.050% M20B SO 0§Ctoa70§C
DAC1232LIN 0.050% N20A Plastic
Temperature
Range
b
40§Ctoa85§C
b
40§Ctoa85§C
b
40§Ctoa85§C
b
40§Ctoa85§C
b
40§Ctoa85§C
b
40§Ctoa85§C
b
40§Ctoa85§C
b
40§Ctoa85§C
16
Page 17
Physical Dimensions inches (millimeters)
20-Lead Ceramic Dual-In-Line Package (J)
Order Number DAC1230LCJ, DAC1230LCJ-1,
DAC1231LCJ, DAC1231LCJ-1, DAC1232LCJ or DAC1232LCJ-1
NS Package Number J20A
24-Lead Ceramic Dual-In-Line Package (J)
Order Number DAC1208LCJ, DAC1208LCJ-1,
DAC1209LCJ, DAC1210LCJ or DAC1210LCJ-1
NS Package Number J24A
17
Page 18
Physical Dimensions inches (millimeters) (Continued)
20-Lead Molded Small Outline Package (M)
Order Number DAC1231LCWM or DAC1232LCWM
NS Package Number M20B
12-Bit, mP Compatible, Double-Buffered D to A Converters
Order Number DAC1231LCN, DAC1231LIN, DAC1232LCN or DAC1232LIN
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
MICRO-DAC DAC1208/DAC1209/DAC1210/DAC1230/DAC1231/DAC1232
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or 2. A critical component is any component of a life systems which, (a) are intended for surgical implant support device or system whose failure to perform can into the body, or (b) support or sustain life, and whose be reasonably expected to cause the failure of the life failure to perform, when properly used in accordance support device or system, or to affect its safety or with instructions for use provided in the labeling, can effectiveness. be reasonably expected to result in a significant injury to the user.
National Semiconductor National Semiconductor National Semiconductor National Semiconductor Corporation Europe Hong Kong Ltd. Japan Ltd.
1111 West Bardin Road Fax: ( Arlington, TX 76017 Email: cnjwge@tevm2.nsc.com Ocean Centre, 5 Canton Rd. Fax: 81-043-299-2408 Tel: 1(800) 272-9959 Deutsch Tel: ( Fax: 1(800) 737-7018 English Tel: (
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.
20-Lead Molded Dual-In-Line Package (N)
NS Package Number N20A
a
49) 0-180-530 85 86 13th Floor, Straight Block, Tel: 81-043-299-2309
a
49) 0-180-530 85 85 Tsimshatsui, Kowloon
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