Datasheet DAC0832LCWMX, DAC0832LCWM, DAC0832LCVX, DAC0832LCV, DAC0832LCN Datasheet (NSC)

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DAC0830/DAC0832 8-Bit µP Compatible, Double-Buffered D to A Converters
General Description
The DAC0830 is an advanced CMOS/Si-Cr 8-bit multiplying DAC designed to interface directly with the 8080, 8048, 8085, Z80
®
, andother popular microprocessors.Adeposited silicon-chromium R-2R resistor ladder network divides the reference current and provides the circuit with excellent tem­perature tracking characteristics (0.05%of Full Scale Range maximum linearity error over temperature). The circuit uses CMOS current switches and control logic to achieve low power consumption and low output leakage current errors. Special circuitry provides TTL logic input voltage level com­patibility.
Double buffering allows these DACs to output a voltage cor­responding to one digital word while holding the next digital word. This permits the simultaneous updating of any number of DACs.
The DAC0830 series are the 8-bit members of a family of microprocessor-compatible DACs (MICRO-DAC
).
Features
n Double-buffered, single-buffered or flow-through digital
data inputs
n Easy interchange and pin-compatible with 12-bit
DAC1230 series
n Direct interface to all popular microprocessors n Linearity specified with zero and full scale adjust
only—NOT BEST STRAIGHT LINE FIT.
n Works with
±
10V reference-full 4-quadrant multiplication
n Can be used in the voltage switching mode n Logic inputs which meet TTL voltage level specs (1.4V
logic threshold)
n Operates “STAND ALONE” (without µP) if desired n Available in 20-pin small-outline or molded chip carrier
package
Key Specifications
n Current settling time: 1 µs n Resolution: 8 bits n Linearity: 8, 9, or 10 bits (guaranteed over temp.) n Gain Tempco: 0.0002%FS/˚C n Low power dissipation: 20 mW n Single power supply: 5 to 15 V
DC
Typical Application
BI-FET™and MICRO-DAC™are trademarks of National Semiconductor Corporation. Z80
®
is a registered trademark of Zilog Corporation.
DS005608-1
May 1999
DAC0830/DAC0832 8-Bit µP Compatible, Double-Buffered D to A Converters
© 1999 National Semiconductor Corporation DS005608 www.national.com
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Connection Diagrams (Top Views)
Dual-In-Line and
Small-Outline Packages
DS005608-21
Molded Chip Carrier Package
DS005608-22
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Absolute Maximum Ratings (Notes 1, 2)
If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications.
Supply Voltage (V
CC
)17V
DC
Voltage at Any Digital Input VCCto GND Voltage at V
REF
Input
±
25V Storage Temperature Range −65˚C to +150˚C Package Dissipation
at T
A
=
25˚C (Note 3) 500 mW
DC Voltage Applied to
I
OUT1
or I
OUT2
(Note 4) −100 mV to V
CC
ESD Susceptability (Note 4) 800V
Lead Temperature (Soldering, 10 sec.)
Dual-In-Line Package (plastic) 260˚C Dual-In-Line Package (ceramic) 300˚C Surface Mount Package
Vapor Phase (60 sec.) 215˚C Infrared (15 sec.) 220˚C
Operating Conditions
Temperature Range T
MIN≤TA≤TMAX
Part numbers with “LCN” suffix 0˚C to +70˚C Part numbers with “LCWM” suffix 0˚C to +70˚C Part numbers with “LCV” suffix 0˚C to +70˚C Part numbers with “LCJ” suffix −40˚C to +85˚C Part numbers with “LJ” suffix −55˚C to +125˚C
Voltage at Any Digital Input V
CC
to GND
Electrical Characteristics
V
REF
=
10.000 V
DC
unless otherwise noted. Boldface limits apply over temperature, T
MIN≤TA≤TMAX
. For all other limits
T
A
=
25˚C.
Parameter Conditions
See
Note
V
CC
=
4.75 V
DC
V
CC
=
15.75 V
DC
V
CC
=
5V
DC
±
5
%
V
CC
=
12 V
DC
±
5
%
to 15 V
DC
±
5
%
Limit
Units
Typ
(Note 12)
Tested
Limit
(Note 5)
Design
Limit
(Note 6)
CONVERTER CHARACTERISTICS
Resolution 88 8 bits Linearity Error Max Zero and full scale adjusted 4, 8
−10VV
REF
+10V
DAC0830LJ & LCJ 0.05 0.05
%
FSR
DAC0832LJ & LCJ 0.2 0.2
%
FSR
DAC0830LCN, LCWM & LCV
0.05 0.05
%
FSR
DAC0831LCN 0.1 0.1
%
FSR
DAC0832LCN, LCWM & LCV
0.2 0.2
%
FSR
Differential Nonlinearity Zero and full scale adjusted 4, 8
Max −10VV
REF
+10V
DAC0830LJ & LCJ 0.1 0.1
%
FSR
DAC0832LJ & LCJ 0.4 0.4
%
FSR
DAC0830LCN, LCWM & LCV
0.1 0.1
%
FSR
DAC0831LCN 0.2 0.2
%
FSR
DAC0832LCN, LCWM & LCV
0.4 0.4
%
FSR
Monotonicity −10VV
REF
LJ & LCJ 4 88bits
+10V LCN, LCWM & LCV 8 8 bits
Gain Error Max Using Internal R
fb
7
±
0.2
±
1
±
1
%
FS
−10VV
REF
+10V
Gain Error Tempco Max Using internal R
fb
0.0002 0.0006
%
FS/˚C
Power Supply Rejection All digital inputs latched high
V
CC
=
14.5V to 15.5V 0.0002 0.0025
%
11.5V to 12.5V 0.0006 FSR/V
4.5V to 5.5V 0.013 0.015 Reference Max 15 20 20 k Input Min 15 10 10 k Output Feedthrough Error V
REF
=
20 Vp-p, f=100 kHz
All data inputs latched low
3 mVp-p
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Electrical Characteristics (Continued)
V
REF
=
10.000 V
DC
unless otherwise noted. Boldface limits apply over temperature, T
MIN≤TA≤TMAX
. For all other limits
T
A
=
25˚C.
Parameter Conditions
See
Note
V
CC
=
4.75 V
DC
V
CC
=
15.75 V
DC
V
CC
=
5V
DC
±
5
%
V
CC
=
12 V
DC
±
5
%
to 15 V
DC
±
5
%
Limit Units
Typ
(Note 12)
Tested
Limit
(Note 5)
Design
Limit
(Note 6)
CONVERTER CHARACTERISTICS
Output Leakage Current Max
I
OUT1
All data inputs LJ & LCJ 10 100 100 nA
latched low LCN, LCWM & LCV 50 100
I
OUT2
All data inputs LJ & LCJ 100 100 nA latched high LCN, LCWM & LCV 50 100
Output I
OUT1
All data inputs 45 pF
Capacitance I
OUT2
latched low 115
I
OUT1
All data inputs 130 pF
I
OUT2
latched high 30
DIGITAL AND DC CHARACTERISTICS
Digital Input Max Logic Low LJ: 4.75V 0.6 Voltages LJ: 15.75V 0.8
LCJ: 4.75V 0.7 V
DC
LCJ: 15.75V 0.8 LCN, LCWM, LCV 0.95 0.8
Min Logic High LJ & LCJ 2.0 2.0 V
DC
LCN, LCWM, LCV 1.9 2.0
Digital Input Max Digital inputs
<
0.8V
Currents LJ & LCJ −50 −200 −200 µA
LCN, LCWM, LCV −160 −200 µA
Digital inputs
>
2.0V LJ & LCJ 0.1 +10 +10 µA LCN, LCWM, LCV +8 +10
Supply Current Max LJ & LCJ 1.2 3.5 3.5 mA
Drain LCN, LCWM, LCV 1.7 2.0
Electrical Characteristics
V
REF
=
10.000 V
DC
unless otherwise noted. Boldface limits apply over temperature, T
MIN≤TA≤TMAX
. For all other limits
T
A
=
25˚C.
Symbol Parameter Conditions
See
Note
V
CC
=
15.75 V
DC
V
CC
=
12 V
DC
±
5
%
to 15 V
DC
±
5
%
V
CC
=
4.75 V
DC
V
CC
=
5
V
DC
±
5
%
Limit
Units
Typ
(Note 12)
Tested
Limit
(Note 5)
Design Limit
(Note 6)
Typ
(Note 12)
Tested
Limit
(Note 5)
Design
Limit
(Note 6)
AC CHARACTERISTICS
t
s
Current Setting V
IL
=
0V, V
IH
=
5V 1.0 1.0 µs
Time
t
W
Write and XFER V
IL
=
0V, V
IH
=
5V 11 100 250 375 600
Pulse Width Min 9 320 320 900 900
t
DS
Data Setup Time V
IL
=
0V, V
IH
=
5V 9 100 250 375 600
Min 320 320 900 900
t
DH
Data Hold Time V
IL
=
0V, V
IH
=
5V 9 30 50 ns
Min 30 50
t
CS
Control Setup Time V
IL
=
0V, V
IH
=
5V 9 110 250 600 900
Min 320 320 1100 1100
t
CH
Control Hold Time V
IL
=
0V, V
IH
=
5V 9 0 0 10 00
Min 00
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating the device beyond its specified operating conditions.
Note 2: All voltages are measured with respect to GND, unless otherwise specified.
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Electrical Characteristics (Continued)
Note 3: The maximum power dissipation must be derated at elevated temperatures and is dictated by T
JMAX
, θJA, and the ambient temperature, TA. The maximum
allowable power dissipation at any temperature is P
D
=
(T
JMAX−TA
)/θJAor the number given in the Absolute Maximum Ratings, whichever is lower. For this device,
T
JMAX
=
125˚C (plastic) or 150˚C (ceramic), and the typical junction-to-ambient thermal resistance of the J package when board mounted is 80˚C/W.For the N pack-
age, this number increases to 100˚C/W and for the V package this number is 120˚C/W. Note 4: For current switching applications, both I
OUT1
and I
OUT2
must go to ground or the “Virtual Ground” of an operational amplifier. The linearity error is degraded
by approximately V
OS
÷
V
REF
. For example, if V
REF
=
10Vthena1mVoffset, V
OS
,onI
OUT1
or I
OUT2
will introduce an additional 0.01%linearity error.
Note 5: Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level). Note 6: Guaranteed, but not 100%production tested. These limits are not used to calculate outgoing quality levels. Note 7: Guaranteed at V
REF
=
±
10 VDCand V
REF
=
±
1VDC.
Note 8: The unit “FSR” stands for “Full Scale Range.” “Linearity Error” and “Power Supply Rejection” specs are based on this unit to eliminate dependence on a par­ticular V
REF
value and to indicate the true performance of the part. The “Linearity Error” specification of the DAC0830 is “0.05%of FSR (MAX)”. This guarantees that
after performing a zero and full scale adjustment (see Sections 2.5 and 2.6), the plot of the 256 analog voltage outputs will each be within 0.05%xV
REF
of a straight
line which passes through zero and full scale.
Note 9: Boldface tested limits apply to the LJ and LCJ suffix parts only. Note 10: A 100nA leakage current with R
fb
=
20k and V
REF
=
10V corresponds to a zero error of (100x10
−9
x20x103)x100/10 which is 0.02%of FS.
Note 11: The entire write pulse must occur within the valid data interval for the specified t
W,tDS,tDH
, and tSto apply.
Note 12: Typicals are at 25˚C and represent most likely parametric norm. Note 13: Human body model, 100 pF discharged through a 1.5 kresistor.
Switching Waveform
DS005608-2
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Definition of Package Pinouts
Control Signals (All control signals level actuated) CS:
Chip Select (active low). The CS in combination
with ILE will enable WR1.
ILE: InputLatch Enable (active high). The ILE in combi-
nation with CS enables WR
1
.
WR1: Write1. The active low WR1is used to load the digi-
tal input data bits (DI) into the input latch. The data in the input latch is latched when WR
1
is high. To update the input latch–CS and WR1must be low while ILE is high.
WR
2
: Write2 (active low). This signal, in combination with
XFER, causes the 8-bit data which is available in the input latch to transfer to the DAC register.
XFER:
Transfercontrol signal (active low). The XFER will
enable WR2.
Other Pin Functions DI
0
-DI7: Digital Inputs. DI0is the least significant bit (LSB)
and DI
7
is the most significant bit (MSB).
I
OUT1
: DAC Current Output 1. I
OUT1
is a maximum for a digital code of all 1’s in the DAC register, and is zero for all 0’s in DAC register.
I
OUT2
: DAC Current Output 2. I
OUT2
is a constant minus I
OUT1
,orI
OUT1+IOUT2
=
constant (I full scale for
a fixed reference voltage).
R
fb
: Feedback Resistor. The feedback resistor is pro-
vided on the IC chip for use as the shunt feedback resistor for the external op amp which is used to provide an output voltage for the DAC. This on­chip resistor should always be used (not an exter­nal resistor) since it matches the resistors which are used in the on-chip R-2R ladder and tracks these resistors over temperature.
V
REF
: Reference Voltage Input. This input connects an
external precision voltage source to the internal R-2R ladder. V
REF
can be selected over the range of +10 to −10V. This is also the analog voltage in­put for a 4-quadrant multiplying DAC application.
V
CC
: Digital Supply Voltage. This is the power supply
pin for the part. V
CC
can be from +5 to +15VDC.
Operation is optimum for +15V
DC
GND: The pin 10 voltage must be at the same ground
potential as I
OUT1
and I
OUT2
for current switching
applications. Any difference of potential (V
OS
pin
10) will result in a linearity change of
For example, if V
REF
= 10V and pin 10 is 9mV offset from
I
OUT1
and I
OUT2
the linearity change will be 0.03%.
Pin 3 can be offset
±
100mV with no linearity change, but the
logic input threshold will shift.
Linearity Error
Definition of Terms
Resolution: Resolution is directly related to the number of
switches or bits within the DAC. For example, the DAC0830 has 2
8
or 256 steps and therefore has 8-bit resolution.
Linearity Error: Linearity Error is the maximum deviation from a
straight line passing through the endpoints of the
DAC transfer characteristic
. It is measured after adjusting for zero and full-scale. Linearity error is a parameter intrinsic to the device and cannot be externally adjusted.
National’s linearity “end point test” (a) and the “best straight line” test (b,c) used by other suppliers are illustrated above. The “end point test’’ greatly simplifies the adjustment proce­dure by eliminating the need for multiple iterations of check­ing the linearity and then adjusting full scale until the linearity is met. The “end point test’’ guarantees that linearity is met after a single full scale adjust. (One adjustment vs. multiple
iterations of the adjustment.) The “end point test’’ uses a standard zero and F.S. adjustment procedure and is a much more stringent test for DAC linearity.
Power Supply Sensitivity: Power supply sensitivity is a measure of the effect of power supply changes on the DAC full-scale output.
Settling Time: Settling time is the time required from a code transition until the DAC output reaches within
±
1
⁄2LSB of the final output value. Full-scale settling time requires a zero to full-scale or full-scale to zero output change.
Full Scale Error: Full scale error is a measure of the output error between an ideal DAC and the actual device output. Ideally, for the DAC0830 series, full scale is V
REF
−1LSB.
For V
REF
=
10V and unipolar operation, V
FULL-SCALE
= 10,0000V–39mV 9.961V. Full-scale error is adjustable to zero.
DS005608-23
a) End point test after
zero and fs adj.
DS005608-24
b) Best straight line
DS005608-25
c) Shifting fs adj. to pass
best straight line test
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Definition of Terms (Continued)
Differential Nonlinearity: The difference between any two
consecutive codes in the transfer curve from the theoretical 1 LSB to differential nonlinearity.
Typical Performance Characteristics
DS005608-4
FIGURE 1. DAC0830 Functional Diagram
Digital Input Threshold vs. Temperature
DS005608-26
Digital Input Threshold vs. V
CC
DS005608-27
Gain and Linearity Error Variation vs. Temperature
DS005608-28
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Typical Performance Characteristics (Continued)
DAC0830 Series Application Hints
These DAC’s are the industry’s first microprocessor compat­ible, double-buffered 8-bit multiplying D to A converters. Double-buffering allows the utmost application flexibility from a digital control point of view. This 20-pin device is also pin for pin compatible (with one exception) with the DAC1230, a 12-bit MICRO-DAC. In the event that a system’s analog out­put resolution and accuracy must be upgraded, substituting the DAC1230 can be easily accomplished. By tying address bit A
0
to the ILE pin, a two-byte µP write instruction (double precision) which automatically increments the address for the second byte write (starting with A
0
=
“1”) can be used. This allows either an 8-bit or the 12-bit part to be used with no hardware or software changes. For the simplest 8-bit ap­plication, this pin should be tied to V
CC
(also see other uses
in section 1.1). Analog signal control versatility is provided by a precision
R-2R ladder network which allows full 4-quadrant multiplica­tion of a wide range bipolar reference voltage by an applied digital word.
1.0 DIGITAL CONSIDERATIONS
The timing requirements and logic level convention of the register control signals have been designed to minimize or eliminate external interfacing logic when applied to most popular microprocessors and development systems. It is easy to think of these converters as 8-bit “write-only” memory locations that provide an analog output quantity.All inputs to these DAC’s meet TTL voltage level specs and can also be driven directly with high voltage CMOS logic in non-microprocessor based systems. To prevent damage to the chip from static discharge, all unused digital inputs should be tied to V
CC
or ground. If any of the digital inputs are inadvertantly left floating, the DAC interprets the pin as a logic “1”.
1.1 Double-Buffered Operation
Updating the analog output of these DAC’s in a double-buffered manner is basically a two step or double write operation. In a microprocessor system two unique sys­tem addresses must be decoded, one for the input latch con­trolled by the CS pin and a second for the DAC latch which is controlled by the XFER line. If more than one DAC is being driven,
Figure 2
, the CS line of each DAC would typically be decoded individually, but all of the converters could share a common XFER address to allow simultaneous updating of any number of DAC’s. The timing for this operation is shown,
Figure 3
.
It is important to note that the analog outputs that will change after a simultaneous transfer are those from the DAC’s whose input register had been modified prior to the XFER command.
Gain and Linearity Error Variation vs. Supply Voltage
DS005608-29
Write Pulse Width
DS005608-30
Data Hold Time
DS005608-31
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DAC0830 Series Application Hints (Continued)
The ILE pin is an active high chip select which can be de­coded from the address bus as a qualifier for the normal CS signal generated during a write operation. This can be used to provide a higher degree of decoding unique control sig­nals for a particular DAC, and thereby create a more efficient addressing scheme.
Another useful application of the ILE pin of each DAC in a multiple DAC system is to tie these inputs together and use this as a control line that can effectively “freeze” the outputs of all the DAC’s at their present value. Pulling this line low latches the input register and prevents new data from being written to the DAC. This can be particularly useful in multi­processing systems to allow a processor other than the one
controlling the DAC’s to take over control of the data bus and control lines. If this second system were to use the same ad­dresses as those decoded for DAC control (but for a different purpose) the ILE function would prevent the DAC’s from be­ing erroneously altered.
In a “Stand-Alone” system the control signals are generated by discrete logic. In this case double-buffering can be con­trolled by simply taking CS and XFER to a logic “0”, ILE to a logic “1” and pulling WR1low to load data to the input latch. Pulling WR2low will then update the analog output. A logic “1” on either of these lines will prevent the changing of the analog output.
DS005608-35
*
TIE TO LOGIC 1 IF NOT NEEDED (SEE SEC. 1.1).
FIGURE 2. Controlling Mutiple DACs
DS005608-36
FIGURE 3.
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DAC0830 Series Application Hints (Continued)
1.2 Single-Buffered Operation
In a microprocessor controlled system where maximum data throughput to the DAC is of primary concern, or when only one DAC of several needs to be updated at a time, a single-buffered configuration can be used. One of the two in­ternal registers allows the data to flow through and the other register will serve as the data latch.
Digital signal feedthrough (see Section 1.5) is minimized if the input register is used as the data latch. Timing for this mode is shown in
Figure 4
.
Single-buffering in a “stand-alone” system is achieved by strobing WR
1
low to update the DAC with CS, WR2and
XFER grounded and ILE tied high.
1.3 Flow-Through Operation
Though primarily designed to provide microprocessor inter­face compatibility, the MICRO-DAC’s can easily be config­ured to allow the analog output to continuously reflect the state of an applied digital input. This is most useful in appli­cations where the DAC is used in a continuous feedback control loop and is driven by a binary up-down counter, or in function generation circuits where a ROM is continuously providing DAC data.
Simply grounding CS, WR
1
,WR2, and XFER and tying ILE high allows both internal registers to follow the applied digital inputs (flow-through) and directly affect the DAC analog out­put.
1.4 Control Signal Timing
When interfacing these MICRO-DAC to any microprocessor, there are two important time relationships that must be con­sidered to insure proper operation. The first is the minimum WR strobe pulse width which is specified as 900 ns for all valid operating conditions of supply voltage and ambient temperature, but typically a pulse width of only 180ns is ad­equate if V
CC
=
15V
DC
. A second consideration is that the
guaranteed minimum data hold time of 50ns should be met
or erroneous data can be latched. This hold time is defined as the length of time data must be held valid on the digital in­puts
after
a qualified (via CS) WR strobe makes a low to high
transition to latch the applied data. If the controlling device or system does not inherently meet
these timing specs the DAC can be treated as a slow memory or peripheral and utilize a technique to extend the write strobe. A simple extension of the write time, by adding a wait state, can simultaneously hold the write strobe active and data valid on the bus to satisfy the minimum WR pulse­width. If this does not provide a sufficient data hold time at the end of the write cycle, a negative edge triggered one-shot can be included between the system write strobe and the WR pin of the DAC. This is illustrated in
Figure 5
for an exemplary system which provides a 250ns WR strobe time with a data hold time of less than 10ns.
The proper data set-up time prior to the latching edge (LO to HI transition) of the WR strobe, is insured if the WR pulse­width is within spec and the data is valid on the bus for the duration of the DAC WR strobe.
1.5 Digital Signal Feedthrough
When data is latched in the internal registers, but the digital inputs are changing state, a narrow spike of current may flow out of the current output terminals. This spike is caused by the rapid switching of internal logic gates that are responding to the input changes.
There are several recommendations to minimize this effect. When latching data in the DAC, always use the input register as the latch. Second, reducing the V
CC
supply for the DAC from +15V to +5V offers a factor of 5 improvement in the magnitude of the feedthrough, but at the expense of internal logic switching speed. Finally, increasing C
C
(
Figure 8
)toa value consistent with the actual circuit bandwidth require­ments can provide a substantial damping effect on any out­put spikes.
DS005608-7
ILE=LOGIC “1”; WR2 and XFER GROUNDED
FIGURE 4.
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DAC0830 Series Application Hints (Continued)
2.0 ANALOG CONSIDERATIONS
The fundamental purpose of any D to A converter is to pro­vide an accurate analog output quantity which is representa­tive of the applied digital word. In the case of the DAC0830, the output, I
OUT1
, is a current directly proportional to the product of the applied reference voltage and the digital input word. For application versatility, a second output, I
OUT2
,is provided as a current directly proportional to the complement of the digital input. Basically:
where the digital input is the decimal (base 10) equivalent of the applied 8-bit binary word (0 to 255), V
REF
is the voltage at pin 8 and 15 kis the nominal value of the internal resis­tance, R, of the R-2R ladder network (discussed in Section
2.1). Several factors external to the DAC itself must be consid-
ered to maintain analog accuracy and are covered in subse­quent sections.
2.1 The Current Switching R-2R Ladder
The analog circuitry,
Figure 6
, consists of a silicon-chromium (SiCr or Si-chrome) thin film R-2R ladder which is deposited on the surface oxide of the monolithic chip. As a result, there are no parasitic diode problems with the ladder (as there may be with diffused resistors) so the reference voltage, V
REF
, can range −10V to +10V even if VCCfor the device is
5V
DC
.
The digital input code to the DAC simply controls the position of the SPDT current switches and steers the available ladder current to either I
OUT1
or I
OUT2
as determined by the logic in-
put level (“1” or “0”) respectively, as shown in
Figure 6
. The MOS switches operate in the current mode with a small volt­age drop across them and can therefore switch currents of either polarity. This is the basis for the 4-quadrant multiplying feature of this DAC.
2.2 Basic Unipolar Output Voltage
To maintain linearity of output current with changes in the ap­plied digital code, it is important that the voltages at both of the current output pins be as near ground potential (0V
DC
)
as possible. With V
REF
=
+10V every millivolt appearing at ei-
ther I
OUT1
or I
OUT2
will cause a 0.01%linearity error. In most applications this output current is converted to a voltage by using an op amp as shown in
Figure 7
.
The inverting input of the op amp is a “virtual ground” created by the feedback from its output through the internal 15 kre­sistor, R
fb
. All of the output current (determined by the digital
input and the reference voltage) will flow through R
fb
to the output of the amplifier. Two-quadrant operation can be ob­tained by reversing the polarity of V
REF
thus causing I
OUT1
to flow into the DAC and be sourced from the output of the am­plifier. The output voltage, in either case, is always equal to I
OUT1xRfb
and is the opposite polarity of the reference volt-
age. The reference can be either a stable DC voltage source or
an AC signal anywhere in the range from −10V to +10V. The DAC can be thought of as a digitally controlled attenuator: the output voltage is always less than or equal to the applied reference voltage. The V
REF
terminal of the device presents
a nominal impedance of 15 kto ground to external circuitry. Always use the internal R
fb
resistor to create an output volt­age since this resistor matches (and tracks with tempera­ture) the value of the resistors used to generate the output current (I
OUT1
).
DS005608-8
FIGURE 5. Accommodating a High Speed System
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DAC0830 Series Application Hints (Continued)
2.3 Op Amp Considerations
The op amp used in
Figure 7
should have offset voltage null-
ing capability (See Section 2.5). The selected op amp should have as low a value of input
bias current as possible. The product of the bias current times the feedback resistance creates an output voltage er­ror which can be significant in low reference voltage applica­tions. BI-FET
op amps are highly recommended for use
with these DACs because of their very low input current. Transient response and settling time of the op amp are im-
portant in fast data throughput applications. The largest sta­bility problem is the feedback pole created by the feedback resistance, R
fb
, and the output capacitance of the DAC. This appears from the op amp output to the (−) input and includes the stray capacitance at this node. Addition of a lead capaci­tance, C
C
in
Figure 8
, greatly reduces overshoot and ringing
at the output for a step change in DAC output current. Finally, the output voltage swing of the amplifier must be
greater than V
REF
to allow reaching the full scale output volt­age. Depending on the loading on the output of the amplifier and the available op amp supply voltages (only
±
12 volts in many development systems), a reference voltage less than 10 volts may be necessary to obtain the full analog output voltage range.
2.4 Bipolar Output Voltage with a Fixed Reference
The addition of a second op amp to the previous circuitry can be used to generate a bipolar output voltage from a fixed ref­erence voltage. This, in effect, gives sign significance to the MSB of the digital input word and allows two-quadrant multi­plication of the reference voltage. The polarity of the refer­ence can also be reversed to realize full 4-quadrant multipli­cation:
±
V
REF
x±Digital Code
=
±
V
OUT
. This circuit is shown
in
Figure 9
.
This configuration features several improvements over exist­ing circuits for bipolar outputs with other multiplying DACs. Only the offset voltage of amplifier 1 has to be nulled to pre­serve linearity of the DAC. The offset voltage error of the second op amp (although a constant output voltage error) has no effect on linearity. It should be nulled only if absolute output accuracy is required. Finally, the values of the resis­tors around the second amplifier do not have to match the in­ternal DAC resistors, they need only to match and tempera­ture track each other. A thin film 4-resistor network available from Beckman Instruments, Inc. (part no. 694-3-R10K-D) is ideally suited for this application. These resistors are matched to 0.1%and exhibit only 5 ppm/˚C resistance track­ing temperature coefficient. Two of the four available 10 k resistors can be paralleled to form R in
Figure 9
and the other two can be used independently as the resistances la­beled 2R.
2.5 Zero Adjustment
The fundamental purpose of zeroing is to make the voltage appearing at the DAC outputs as near 0V
DC
as possible. This is accomplished for the typical DAC — op amp connec­tion (
Figure 7
) by shorting out Rfb, the amplifier feedback re-
sistor, and adjusting the V
OS
nulling potentiometer of the op amp until the output reads zero volts. This is done, of course, with an applied digital code of all zeros if I
OUT1
is driving the
op amp (all one’s for I
OUT2
). The short around Rfbis then re-
moved and the converter is zero adjusted.
DS005608-37
FIGURE 6.
DS005608-38
FIGURE 7.
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DAC0830 Series Application Hints (Continued)
2.6 Full-Scale Adjustment
In the case where the matching of R
fb
to the R value of the
R-2R ladder (typically
±
0.2%) is insufficient for full-scale ac-
curacy in a particular application, the V
REF
voltage can be adjusted or an external resistor and potentiometer can be added as shown in
Figure 10
to provide a full-scale adjust-
ment. The temperature coefficientsof the resistors used for this ad-
justment are of an important concern. To prevent degrada­tion of the gain error temperature coefficient by the external
resistors, their temperature coefficients ideally would have to match that of the internal DAC resistors, which is a highly im­practical constraint. For the values shown in
Figure 10
,ifthe resistor and the potentiometer each had a temperature coef­ficient of
±
100 ppm/˚C maximum, the overall gain error tem-
perature coefficent would be degraded a maximum of
0.0025%/˚C for an adjustment pot setting of less than 3%of R
fb
.
DS005608-39
t
s
OP Amp C
C
(O to Full Scale)
LF356 22 pF 4 µs LF351 22 pF 5 µs LF357
*
10 pF 2 µs
*2.4 kRESISTOR ADDED FROM−INPUT TO GROUND TO INSURE STABILITY
FIGURE 8.
DS005608-40
Input Code IDEAL V
OUT
MSB LSB +V
REF
−V
REF
1 1111111 1 1000000 1 0000000 0 1111111 0 0111111 0 0000000
*THESE RESISTORS ARE AVAILABLE FROM BECKMAN INSTRUMENTS, INC. AS THEIR PART NO. 694-3-R10K-D
FIGURE 9.
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DAC0830 Series Application Hints
(Continued)
2.7 Using the DAC0830 in a Voltage Switching Configuration
The R-2R ladder can also be operated as a voltage switch­ing network. In this mode the ladder is used in an inverted manner from the standard current switching configuration.
The reference voltage is connected to one of the current out­put terminals (I
OUT1
for true binary digital control, I
OUT2
is for complementary binary) and the output voltage is taken from the normal V
REF
pin. The converter output is now a voltage
in the range from 0V to 255/256 V
REF
as a function of the ap-
plied digital code as shown in
Figure 11
.
This configuration offers several useful application advan­tages. Since the output is a voltage, an external op amp is not necessarily required but the output impedance of the DAC is fairly high (equal to the specified reference input re­sistance of 10 kto 20 k) so an op amp may be used for buffering purposes. Some of the advantages of this mode are illustrated in
Figures 12, 13, 14, 15
.
There are two important things to keep in mind when using this DAC in the voltage switching mode. The applied refer­ence voltage must be positive since there are internal para­sitic diodes from ground to the I
OUT1
and I
OUT2
terminals which would turn on if the applied reference went negative. There is also a dependence of conversion linearity and gain error on the voltage difference between V
CC
and the voltage applied to the normal current output terminals. This is a re­sult of the voltage drive requirements of the ladder switches. To ensure that all 8 switches turn on sufficiently (so as not to add significant resistance to any leg of the ladder and thereby introduce additional linearity and gain errors) it is recommended that the applied reference voltage be kept less than +5V
DC
and VCCbe at least 9V more positive than
V
REF
. These restrictions ensure less than 0.1%linearity and
gain error change.
Figures 16, 17, 18
characterize the ef-
fects of bringing V
REF
and VCCcloser together as well as typical temperature performance of this voltage switching configuration.
DS005608-11
FIGURE 10. Adding Full-Scale Adjustment
DS005608-12
FIGURE 11. Voltage Mode Switching
DS005608-41
Voltage switching mode eliminates output signal inver­sion and therefore a need for a negative power supply.
Zero code output voltage is limited by the low level output saturation voltage of the op amp. The 2 kpull-down re­sistor helps to reduce this voltage.
VOSof the op amp has no effect on DAC linearity.
FIGURE 12. Single Supply DAC
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DAC0830 Series Application Hints (Continued)
DS005608-42
FIGURE 13. Obtaining a Bipolar Output from a Fixed
Reference with a Single Op Amp
DS005608-60
FIGURE 14. Bipolar Output with Increased Output Voltage Swing
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DAC0830 Series Application Hints (Continued)
DS005608-14
FIGURE 15. Single Supply DAC with Level Shift and Span-
Adjustable Output
Gain and Linearity Error
Variation vs. Supply Voltage
DS005608-32
Note: For these curves, V
REF
is the voltage applied to pin 11 (I
OUT1
) with
pin 12 (I
OUT2
) grounded.
FIGURE 16.
Gain and Linearity Error
Variation vs. Reference Voltage
DS005608-33
FIGURE 17.
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DAC0830 Series Application Hints
(Continued)
2.8 Miscellaneous Application Hints
These converters are CMOS products and reasonable care should be exercised in handling them to prevent catastrophic failures due to static discharge.
A “good” ground is most desirable.A single point ground dis­tribution technique for analog signals and supply returns keeps other devices in a system from affecting the output of the DACs.
During power-up supply voltage sequencing, the −15V (or
−12V) supply of the op amp may appear first. This will cause
the output of the op amp to bias near the negative supply po­tential. No harm is done to the DAC, however, as the on-chip 15 kfeedback resistor sufficiently limits the current flow from I
OUT1
when this lead is internally clamped to one diode
drop below ground. Careful circuit construction with minimization of lead lengths
around the analog circuitry, is a primary concern. Good high frequency supply decoupling will aid in preventing inadvert­ant noise from appearing on the analog output.
Overall noise reduction and reference stability is of particular concern when using the higher accuracy versions, the DAC0830 and DAC0831, or their advantages are wasted.
3.0 GENERAL APPLICATION IDEAS
The connections for the control pins of the digital input regis­ters are purposely omitted. Any of the control formats dis­cussed in Section 1 of the accompanying text will work with any of the circuits shown. The method used depends on the overall system provisions and requirements.
The digital input code is referred to as D and represents the decimal equivalent value of the 8-bit binary input, for ex­ample:
Binary Input D
Pin 13 Pin 7 Decimal
MSB LSB Equivalent
1111111 1 255 1000000 0 128 0001000 0 16 0000001 0 2 0000000 0 0
Gain and Linearity Error
Variation vs. Temperature
DS005608-34
FIGURE 18.
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Page 18
Applications
DAC Controlled Amplifier (Volume Control)
DS005608-43
Capacitance Multiplier
DS005608-44
Variable fO, Variable QO, Constant BW Bandpass Filter
DS005608-17
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Page 19
Applications (Continued)
DAC Controlled Function Generator
DS005608-18
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Page 20
Applications (Continued)
Two Terminal Floating 4 to 20 mA Current Loop Controller
DS005608-19
DAC0830 linearly controls the current flow from the input terminal to the output terminal to be 4 mA (for D=0) to 19.94 mA (for D=255).
Circuit operates with a terminal voltage differential of 16V to 55V.
P2adjusts the magnitude of the output current and P1adjusts the zero to full scale range of output current.
Digital inputs can be supplied from a processor using opto isolators on each input or the DAC latches can flow-through (con­nect control lines to pins 3 and 10 of the DAC) and the input data can be set by SPST toggle switches to ground (pins 3 and
10).
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Applications (Continued)
Ordering Information
Temperature Range 0˚C to +70˚ −40˚C to
+85˚C
−55˚C to +125˚C
Non
0.05
%
FSR
DAC0830LCN DAC0830LCM DAC0830LCV DAC0830LCJ DAC0830LJ
Linearity 0.1
%
FSR
DAC0831LCN
0.2
%
FSR
DAC0832LCN DAC0832LCM DAC0832LCV DAC0832LCJ DAC0832LJ
Package Outline N20A — Molded
DIP
M20B Small
Outline
V20A Chip Carrier J20A—Ceramic DIP
DAC Controlled Exponential Time Response
DS005608-20
Output responds exponentially to input changes and automatically stops when V
OUT
=
V
IN
Output time constant is directly proportional to the DAC input code and capacitor C
Input voltage must be positive (See section 2.7)
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Page 22
Physical Dimensions inches (millimeters) unless otherwise noted
Ceramic Dual-In-Line Package (J)
Order Number DAC0830LCJ,
DAC0830LJ, DAC0832LJ or DAC0832LCJ
NS Package Number J20A
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Page 23
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
Molded Small Outline Package (M)
Order Number DAC0830LCM
or DAC0832LCM
NS Package Number M20B
Molded Dual-In-Line Package (N)
Order Number DAC0830LCN,
or DAC0832LCN
NS Package Number N20A
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Page 24
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user.
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
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Americas Tel: 1-800-272-9959 Fax: 1-800-737-7018 Email: support@nsc.com
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Fax: +49 (0) 1 80-530 85 86
Email: europe.support@nsc.com Deutsch Tel: +49 (0) 1 80-530 85 85 English Tel: +49 (0) 1 80-532 78 32 Français Tel: +49 (0) 1 80-532 93 58 Italiano Tel: +49 (0) 1 80-534 16 80
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National Semiconductor Japan Ltd.
Tel: 81-3-5639-7560 Fax: 81-3-5639-7507
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Molded Chip Carrier (V)
Order Number DAC0830LCV
or DAC0832LCV
NS Package Number V20A
DAC0830/DAC0832 8-Bit µP Compatible, Double-Buffered D to A Converters
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.
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