Datasheet CY74FCT2827CTQCT, CY74FCT2827CTQC, CY74FCT2827ATQCT, CY74FCT2827ATQC Datasheet (Texas Instruments)

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r
CY74FCT2827T
SCCS045 - May 1994 - Revised March 2000
Data sheet acquired from Cypress Semiconductor Corporation. Data sheet modified to remove devices not offered.
Copyright © 2000, Texas Instruments Incorporated
Features
• Function and pinout compatible with FCT, F, and AM29827 logic
• FCT-C speed at 5.0 ns max. (Com’l), FCT-A speed at 8.0 ns max. (Com’l)
25outputseriesresistorstoreducetransmissionline reflection noise
• Reduced V
OH
(typically = 3.3V) versions of equivalent
FCT functions
• Edge-rate control circuitry for significantly improved noise characteristics
• Power-off disable feature
• ESD > 2000V
• Matched rise and fall times
• Fully compatible with TTL input and output logic levels
• Extended commercial temp. range of –40˚C to +85˚C
• Sink current 12 mA Source current 15 mA
Functional Description
The FCT2827T 10-bit bus driver provides high-performance bus interface buffering for wide data/address paths or buses carrying parity. This 10-bit buffer has NAND-ed output enables for maximum control flexibility. The FCT2827T is designed for high-capacitance load drive capability, while providing low-capaci­tance bus loading at both inputs and outputs. All inputs have clamp diodesandalloutputsaredesignedf orlow-capacitancebusloading in the high impedance state. On-chip termination resistors have been added to the outputs to reduce system noise caused by re­flections. The FCT2827T can be used to replace the FCT827T to reduce noise in an existing design.
The outputs are designed with a power-off disable feature to allow for live insertion of boards.
Logic Block Diagram
Pin Configurations
FCT2827T–3
Y
0
OE
1
Y1Y2Y3Y4Y
5
Y8Y
9
Y6Y
7
D0D1D2D3D4D
5
D8D
9
D6D
7
OE
2
1 2 3 4 5 6 7 8 9 10 11 12
16
17
18
19
20
24 23 22 21
13
14
V
CC
FCT2827T–2
15
SOIC/QSOP
Top View
OE
1
D
1
D
2
D
3
D
4
D
5
D
6
D
7
D
8
Y
1
Y
2
Y
3
Y
4
Y
5
Y
6
Y
7
Y
8
GND
D
0
D
9
Y
0
Y
9
OE
2
Function Table
[1]
Inputs Outputs
FunctionOE
1
OE
2
D Y
L L
L L
L H
L
H
Transparent
H X
X H
X X
Z Z
Three-State
Note:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care.
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CY74FCT2827T
2
Maximum Ratings
[2, 3]
(Above which the useful life may be impaired. For user guide­lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–65°C to +135°C
Supply Voltage to Ground Potential............... –0.5V to +7.0V
DC Input Voltage............................................–0.5V to +7.0V
DC Output Voltage......................................... –0.5V to +7.0V
DC Output Current (Maximum Sink Current/Pin) ......120 mA
Power Dissipation..........................................................0.5W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Operating Range
Range
Ambient
Temperature V
CC
Commercial –40°C to +85°C 5V ± 5%
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions Min. Typ.
[4]
Max. Unit
V
OH
Output HIGH Voltage VCC= Min., IOH= –15 mA 2.4 3.3 V
V
OL
Output LOW Voltage VCC= Min., IOL= 12 mA 0.3 0.55 V
R
OUT
Output Resistance VCC= Min., IOL= 12 mA 20 25 40
V
IH
Input HIGH Voltage 2.0 V
V
IL
Input LOW Voltage 0.8 V
V
H
Hysteresis
[5]
All inputs 0.2 V
V
IK
Input Clamp Diode Voltage VCC= Min., IIN= –18 mA –0.7 –1.2 V
I
I
Input HIGH Current VCC= Max., VIN= V
CC
5 µA
I
IH
Input HIGH Current VCC= Max., VIN= 2.7V ±1 µA
I
IL
Input LOW Current VCC= Max., VIN= 0.5V ±1 µA
I
OZH
Off State HIGH-Level Output Current
VCC= Max., V
OUT
= 2.7V 10 µA
I
OZL
Off State LOW-Level Output Current
VCC = Max., V
OUT
= 0.5V –10 µA
I
OS
Output Short Circuit Current
[6]
VCC= Max., V
OUT
= 0.0V –60 –120 –225 mA
I
OFF
Power-Off Disable VCC= 0V, V
OUT
= 4.5V ±1 µA
Capacitance
[5]
Parameter Description Typ.
[4]
Max. Unit
C
IN
Input Capacitance 5 10 pF
C
OUT
Output Capacitance 9 12 pF
Notes:
2. Unless otherwise noted, these limits are over the operating free-air temperature range.
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
4. Typical values are at V
CC
=5.0V, TA=+25˚C ambient.
5. This parameter is specified but not tested.
6. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, I
OS
tests should be performed last.
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CY74FCT2827T
3
]
Power Supply Characteristics
Parameter Description Test Conditions Typ.
[4]
Max. Unit
I
CC
Quiescent Power Supply Current VCC=Max., VIN≤ 0.2V,
V
IN
VCC-0.2V
0.1 0.2 mA
I
CC
Quiescent Power Supply Current (TTL inputs HIGH)
VCC=Max., VIN=3.4V,
[7]
f1=0, Outputs Open
0.5 2.0 mA
I
CCD
Dynamic Power Supply Current
[8]
VCC=Max., One Input Toggling, 50% Duty Cycle, Outputs Open, OE1 or OE2=GND, V
IN
0.2V or VIN ≥ VCC-0.2V
0.06 0.12 mA/ MHz
I
C
Total Power Supply Current
[9]
VCC=Max., 50% Duty Cycle, Outputs Open, One Bit Toggling at f
1
=10 MHz, OE1 or OE2=GND, V
IN
0.2V or VIN ≥ VCC-0.2V
0.7 1.4 mA
VCC=Max., 50% Duty Cycle, Outputs Open, One Bit Toggling at f
1
=10 MHz, OE1 or OE2=GND, V
IN
=3.4V or VIN=GND
1.0 2.4 mA
VCC=Max., 50% Duty Cycle, Outputs Open, Ten Bits Toggling at f
1
=2.5 MHz, OE1 or OE2=GND, V
IN
0.2V or VIN ≥ VCC-0.2V
1.6 3.2
[10]
mA
VCC=Max., 50% Duty Cycle, Outputs Open, Ten Bits Toggling at f
1
=2.5 MHz, OE1 or OE2=GND, V
IN
=3.4V or VIN=GND
4.1 13.2
[10]
mA
Notes:
7. Per TTL driven input (V
IN
=3.4V); all other inputs at VCC or GND.
8. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
9. I
C
=I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
IC=ICC+ICCDHNT+I
CCD(f0
/2 + f1N1)
I
CC
= Quiescent Current with CMOS input levels
I
CC
= Power Supply Current for a TTL HIGH input
(V
IN
=3.4V)
D
H
= Duty Cycle for TTL inputs HIGH
N
T
= Number of TTL inputs at D
H
I
CCD
= Dynamic Current caused by an input transition pair
(HLH or LHL)
f
0
= Clock frequency for registered devices, otherwise zero
f
1
= Input signal frequency
N
1
= Number of inputs changing at f
1
All currents are in milliamps and all frequencies are in megahertz.
10. Values for these conditions are examples of the ICC formula. These limits are specified but not tested.
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CY74FCT2827T
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Switching Characteristics Over the Operating Range
[11]
Param. Description Test Load
CY74FCT2827AT CY74FCT2827CT
Unit
Fig.
No.
[12]
Min. Max. Min. Max.
t
PLH
t
PHL
Propagation Delay D to Y CL=50 pF
R
L
=500
1.5 8.0 1.5 4.4 ns 1, 3
t
PLH
t
PHL
Propagation Delay D to Y
[5]
CL=300 pF
R
L
=500
1.5 15.0 1.5 10.0 ns 1, 3
t
PZH
t
PZL
Output Enable Time OE to Y CL=50 pF
R
L
=500
1.5 12.0 1.5 7.0 ns 1, 7, 8
t
PZH
t
PZL
Output Enable Time OE to Y
[5]
CL=300 pF
R
L
=500
1.5 23.0 1.5 14.0 ns 1, 7, 8
t
PHZ
t
PHL
Output Disable Time OE to Y
[5]
CL=5 pF
R
L
=500
1.5 9.0 1.5 5.7 ns 1, 7, 8
t
PHZ
t
PHL
Output Disable Time OE to Y CL=50 pF
R
L
=500
1.5 9.0 1.5 6.0 ns 1, 7, 8
Ordering Information
Speed
(ns) Ordering Code
Package
Name Package Type
Operating
Range
4.4 CY74FCT2827CTQCT Q13 24-Lead (150-Mil) QSOP Commercial
8.0 CY74FCT2827ATQCT Q13 24-Lead (150-Mil) QSOP Commercial
Note:
11. Minimum limits are specified but not tested on Propagation Delays.
12. See “Parameter Measurement Information” in the General Information section.
Document #: 38-00347-A
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CY74FCT2827T
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Package Diagram
24-Lead Quarter Size Outline Q13
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Copyright 2000, Texas Instruments Incorporated
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