CY62148V MoBL™
5
Switching Characteristics
Over the Operating Range
[5]
(2.7V–3.6V
Operation)
Parameter Description Min. Max. Unit
READ CYCLE
t
RC
Read Cycle Time 70 ns
t
AA
Address to Data Valid 70 ns
t
OHA
Data Hold from Address Change 10 ns
t
ACE
CE LOW to Data Valid 70 ns
t
DOE
OE LOW to Data Valid 35 ns
t
LZOE
OE LOW to Low Z
[6]
5 ns
t
HZOE
OE HIGH to High Z
[7 ]
25 ns
t
LZCE
CE LOW to Low Z
[6]
10 ns
t
HZCE
CE HIGH to High Z
[6, 7]
25 ns
t
PU
CE LOW to Power-Up 0 ns
t
PD
CE HIGH to Power-Do wn 70 ns
WRITE CYCLE
[8, 9]
t
WC
Write Cycle Time 70 ns
t
SCE
CE LOW to Write End 60 ns
t
AW
Address Set-Up to Write End 60 ns
t
HA
Address Hold from Write End 0 ns
t
SA
Address Set-Up to Write Start 0 ns
t
PWE
WE Pulse Width 50 ns
t
SD
Data Set-Up to Write End 30 ns
t
HD
Data Hold from Write End 0 ns
t
HZWE
WE LOW to High Z
[6, 7]
25 ns
t
LZWE
WE HIGH to Low Z
[6]
10 ns
Notes:
5. Test conditions assume signal transition time of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to V
CC(typ.)
, and output loading of the
specified I
OL/IOH
and 30 pF load capacitance.
6. At any given temperature and voltage condition, t
HZCE
is less than t
LZCE
, t
HZOE
is less than t
LZOE
, and t
HZWE
is less than t
LZWE
for any given device.
7. t
HZOE
, t
HZCE
, and t
HZWE
are specified with CL = 5 pF as in part (b) of AC Test Loads. Transition is measured ±200 mV from steady-state voltage.
8. The internal write time of the memory is defined by the overlap of CE
LOW and WE LOW. Both signals must be LOW to initiate a write and either signal can
terminate a write by going HIGH. The data input set-up and hold timing should be referenced to the rising edge of the signal that terminates the write.
9. The minimum write cycle time for Write Cycle #3 (WE
controlled, OE LOW) is the sum of t
HZWE
and tSD.