• Ultra-low active power
—Typical active current: 1.5 mA @ f = 1 MHz
—Typical active current: 5.5 mA @ f = f
speed)
• Low and ultra-low standby power
• Easy memory expansion with CE
and OE features
• Automatic power-down when deselected
• CMOS for optimum speed/power
• Packages offered in a 48-ball FBGA
Functional Description
[1]
The CY62137CV25/30/33 and CY62137CV are high-performance CMOS static RAMs organized as 128K words by 16
bits. These devic es feature advanced circuit de sign to pro vide
ultra-low active current. This is ideal for providing More Battery
max
(70-ns
CY62137CV25/30/33 MoBL
CY62137CV MoBL
2M (128K x 16) Static RAM
Life™ (MoBL®) in portable applications such as cellular telephones. The devices also has an automatic power-down feature that significantly reduces power consumption by 80%
when addresses are not toggling. The device can also be put
into standby m ode reduci ng power con sumption by more tha n
99% when deselected (CE
HIGH). The input/output pins (I/O
in a high-impedance state when: deselected (CE
puts are dis abled (OE HIGH), both Byte High Enable and Byte
Low Enable a r e d is a bled ( B HE
operation (CE
LOW, and WE LOW).
Writing to the device is accomplished by taking Chip Enable
) and Write Enable (WE) inputs LOW. If Byte Low Enable
(CE
(BLE) is LOW, then data from I/O pins (I/O0 through I/O7), is
written into the location specified on the address pins (A
through A16). If Byte High Enable (BHE) is LOW, then data
from I/O pins (I/O8 through I/O15) is written into the location
specified on the address pins (A
Reading from the device is accomplished by taking Chip
Enable (CE
Write Enable (WE
) and Output Enable (OE) LOW while forcing the
) HIGH. If Byte Low Enable (BLE) is LOW,
then data from the memory location specified by the address
pins will appear on I/O
LOW , then d ata f rom memory will a ppear on I/O
the truth table at the back of this data sheet for a complete
description of read and write modes.
HIGH or both BLE and BHE are
through I/O15) are plac ed
0
HIGH), out-
, BLE HIGH), or during a write
through A16).
0
to I/O7. If Byte High Enable (BHE) is
0
to I/O15. See
8
®
®
0
Logic Block Diagram
10
A
10
A
9
A
8
A
7
A
6
A
5
A
4
A
3
A
2
A
1
A
0
Note:
1. For best practice recommendations, please refer to the Cypress applic a tion note “System Design Guidelines” on http://www.cypress.com.
DATA IN DRIVERS
ROW DECODER
COLUMN DECODER
11
A
Power- down
Circuit
128K x 16
RAM Array
2048 x 1024
14
A12A13A
– I/O
I/O
0
7
SENSE AMPS
15
16
A
A
CE
BHE
BLE
I/O8 – I/O
BHE
WE
CE
OE
BLE
15
Cypress Semiconductor Corporation•3901 North First Street•San Jose•CA 95134•408-943-2600
Document #: 38-05201 Rev. *D Revised September 20, 2002
5. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V
= –2.0V for pulse durations less than 20 ns.
IL(min.)
to ensure proper application.
SS
= V
CC
CC(typ.)
, TA = 25°C.
Document #: 38-05201 Rev. *DPage 2 of 13
Page 3
Electrical Characteristics Ov er the Op erat ing Range
ParameterDescriptionTest Conditions
V
V
V
V
I
IX
I
OZ
I
CC
I
SB1
I
SB2
OH
OL
IH
IL
Output HIGH Voltage IOH = –0.1 mAVCC = 2.2V2.02.0V
Output LOW VoltageIOL = 0.1 mAVCC = 2.2V0.40.4V
Input HIGH Voltage1.8VCC +
Input LOW Voltage–0.30.6–0.30.6V
Input Leakage Current GND < VI < V
Output Leakage
GND < VO < VCC, Output Disabled–1+1–1+1µA
CC
Current
VCC Operating Supply
Current
Automatic CE
Power-down Current—
CMOS Inputs
Automatic CE
Power-down Current—
CMOS Inputs
f = f
f = 1 MHz 1.531.53
MAX
= 1/t
RC
VCC = 2.7V
I
OUT
CMOS Levels
CE > VCC – 0.2V
V
> VCC – 0.2V or VIN < 0.2V,
IN
f = f
(Address and Data Only),
max
f=0 (OE
, WE, BHE, and BLE)
CE > VCC – 0.2V
> VCC – 0.2V or VIN < 0.2V,
V
IN
f = 0, VCC = 2.7V
= 0 mA
CY62137CV25/30/33 MoBL
CY62137CV MoBL
CY62137CV25-55CY62137CV25-70
[5]
Max.Min. Typ.
1.8VCC +
0.3V
–1+1–1+1µA
7155.512mA
210210µA
[5]
Max.
UnitMin. Typ.
V
0.3V
®
®
ParameterDescriptionTest Conditions
V
V
V
V
I
IX
I
OZ
I
CC
I
SB1
I
SB2
OH
OL
IH
IL
Output HIGH VoltageIOH = –1.0 mAVCC = 2.7V2.42.4V
Output LOW VoltageIOL = 2.1 mAVCC = 2.7V0.40.4V
Input HIGH Voltage2.2VCC +
Input LOW Voltage–0.30.8–0.30.8V
Input Leakage Current GND < VI < V
Output Leakage
GND < VO < VCC, Output Disabled–1+1–1+1µA
CC
Current
VCC Operating Supply
Current
Automatic CE
Power-down Current—
CMOS Inputs
Automatic CE
Power-down Current—
CMOS Inputs
f = f
f = 1 MHz1.531.53
MAX
= 1/t
RC
VCC = 3.3V
= 0 mA
I
OUT
CMOS Levels
CE > VCC – 0.2V
V
> VCC – 0.2V or VIN < 0.2V,
IN
f = f
(Address and Data Only),
max
f=0 (OE
, WE, BHE, and BLE)
CE > VCC – 0.2V
VIN > VCC – 0.2V or VIN < 0.2V,
CC
= 3.3V
f = 0, V
Electrical Characteristics Ov er the Op erat ing Range
ParameterDescriptionTest Conditions
V
OH
V
OL
Output HIGH VoltageIOH = –1.0 mAVCC = 3.0V2.42.4V
VCC = 2.7V2.4V
Output LOW VoltageIOL = 2.1 mAVCC = 3.0V0.40.4V
VCC = 2.7V0.4V
CY62137CV30-55CY62137CV30-70
[5]
Max.Min. Typ.
2.2VCC +
0.3V
[5]
Max.
UnitMin. Typ.
V
0.3V
–1+1–1+1µA
7155.512mA
210210µA
CY62137CV33-70
CY62137CV33-55
[5]
Max. Min. Typ.
CY62137CV-70
[5]
Max.
UnitMin. Typ.
Document #: 38-05201 Rev. *DPage 3 of 13
Page 4
Electrical Characteristics Ov er the Op erat ing Range (continued)
ParameterDescriptionTest Conditions
V
IH
V
IL
I
IX
I
OZ
I
CC
I
SB1
I
SB2
Capacitance
C
IN
C
OUT
Input HIGH Voltage2.2VCC +
Input LOW Voltage–0.30.8–0.30.8V
Input Leakage CurrentGND < VI < V
CC
Output Leakage CurrentGND < VO < VCC, Output Dis-
abled
VCC Operating Supply Current f = f
f = 1 MHz1.531.53
MAX
= 1/t
RCVCC
I
OUT
CMOS
= 3.6V
= 0 mA
Levels
Automatic CE
Power-down Current —CMOS
Inputs
Automatic CE
Power-down Current —CMOS
Inputs
[6]
CE > VCC – 0.2V
V
> VCC – 0.2V or VIN < 0.2V,
IN
f = f
(Address and Data Onl y),
max
f=0 (OE
, WE, BHE, and BLE)
CE > VCC – 0.2V
VIN > VCC – 0.2V or VIN <
0.2V,
CC
= 3.6V
f = 0, V
ParameterDescriptionTest ConditionsMax.Unit
Input CapacitanceTA = 25°C, f = 1 MHz,
= V
V
CC
Output Capacitance8pF
CC(typ.)
CY62137CV25/30/33 MoBL
CY62137CV MoBL
CY62137CV33-55
[5]
Max. Min. Typ.
0.3V
–1+1–1+1µA
–1+1–1+1µA
7155.512mA
515515µA
LL515515
SL15
CY62137CV33-70
CY62137CV-70
[5]
Max.
2.2VCC +
0.3V
6pF
®
®
UnitMin. Typ.
V
Thermal Resistance
ParameterDescriptionT est Condit ionsBGAUnit
Θ
Θ
Thermal Resistance
JA
(Junction to Ambient)
Thermal Resistance
JC
(Junction to Case)
[6]
[6]
Still Air, soldered on a 3 x 4.5 inch, two-layer printed
circuit board
55°C/W
16°C/W
AC Test Loads and Waveforms
30 pF
SCOPE
R1
VCC Typ
R2
Equivalent to:THÉ VENIN EQUIVALENT
GND
Rise TIme: 1 V/nsFall Time: 1 V/ns
OUTPUTV
10%
ALL INPUT PULSES
90%
R
TH
TH
90%
10%
8000645645Ω
1.201.751.75V
V
CC
OUTPUT
INCLUDING
JIG AND
Parameters2.5V3.0V3.3VUnit
R11660011051216Ω
R21540015501374Ω
R
TH
V
Note:
6. Tested initially and after any design or process changes that may affect these parameters.
TH
Document #: 38-05201 Rev. *DPage 4 of 13
Page 5
CY62137CV25/30/33 MoBL
CY62137CV MoBL
Data Retention Characte ristics (Over the Operating Range)
ParameterDescriptionConditionsMin. Typ.
V
DR
I
CCDR
[6]
t
CDR
[7]
t
R
Data Retention Waveform
VCC for Data Retention1.5V
Data Retention CurrentVCC= 1.5V
CE
> VCC – 0.2V,
V
> VCC – 0.2V or VIN < 0.2V
IN
LL16
SL4
Chip Deselect to Data Retention Time0ns
Operation Recovery Timet
[8]
RC
[5]
Max.Unit
ccmax
®
®
V
µA
ns
V
V
CC
CC(min.)
t
CDR
VDR> 1.5 V
V
CC(min.)
t
R
CE or
BHE.BLE
DATA RETENTION MODE
Switching Characteristics Over the Operating Range
[9]
55 ns70 ns
ParameterDescription
Read Cycle
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
t
DBE
[11]
t
LZBE
t
HZBE
Write Cycle
t
WC
t
SCE
Notes:
7. Full-device AC operation requires linear V
8. BHE
9. T est conditions assume signal transition time of 5 ns or less, timing reference levels of V
specified I
10. At any given temperature and voltage condition, t
any given device.
11. If both byte enables are toggled together this value is 10 ns.
12. t
HZOE
13. The internal write time of the memory is defined by the overlap of WE
of these signals can terminate a write by going INACTIVE. The data input set-up and hold timing should be referenced to the edge of the signal that terminates
the write.
[13]
.BLE is the AND of both BHE and BLE. Chip can be deselected by either disabling the chip enable signals or by disabling both BHE and BLE.
and 30-pF load capacitance.
OL/IOH
, t
, t
HZBE
, and t
HZCE
Read Cycle Time5570ns
Address to Data Valid5570ns
Data Hold from Address Change1010ns
CE LOW to Data Valid5570ns
OE LOW to Data Valid2535ns
OE LOW to Low-Z
OE HIGH to High-Z
CE LOW to Low-Z
CE HIGH to High-Z
[10]
[10, 12]
[10]
[10, 12]
55ns
2025ns
1010ns
2025ns
CE LOW to Power-up00ns
CE HIGH to Power-down5570ns
BHE/BLE LOW to Data Valid5570ns
BHE/BLE LOW to Low-Z
BHE/BLE HIGH to High-Z
[10]
[10, 12]
55ns
2025ns
Write Cycle Time5570ns
CE LOW to Write End4560ns
ramp from V
CC
HZCE
transitions are measured when the outputs enter a high impedance state.
HZWE
to V
DR
CC(min.)
is less than t
> 100 µs or stable at V
CC(typ.)
, t
LZCE
, CE = VIL, BHE and/or BLE = VIL. All signals must be ACTIVE to initiate a write and any
is less than t
HZBE
LZBE
> 100 µs.
CC(min.)
/2, input pulse levels of 0 to V
, t
is less than t
HZOE
LZOE
, and output loading of the
CC(typ.)
, and t
HZWE
is less than t
UnitMinMaxMinMax
LZWE
for
Document #: 38-05201 Rev. *DPage 5 of 13
Page 6
CY62137CV25/30/33 MoBL
CY62137CV MoBL
®
®
Switching Characteristics Over the Operating Range
ParameterDescription
t
AW
t
HA
t
SA
t
PWE
t
BW
t
SD
t
HD
t
HZWE
t
LZWE
Address Set-up to Write End4560ns
Address Hold from Write End00ns
Address Set-up to Write Start00ns
WE Pulse Width4045ns
BHE/BLE Pulse Width5060ns
Data Set-up to Write End2530ns
Data Hold from Write End00ns
WE LOW to High-Z
WE HIGH to Low-Z
[10, 12]
[10]
Switching Waveforms
Read Cycle No. 1 (Address Transition Controlled)
ADDRESS
t
OHA
DATA OUTPREVIOUS DATA VALID
[14, 15]
t
AA
[9]
(continued)
t
RC
55 ns70 ns
UnitMinMaxMinMax
2025ns
1010ns
DATA VALID
Read Cycle No. 2 (OE Controlled)
ADDRESS
CE
OE
BHE/BLE
t
LZBE
DATA OUT
V
CC
SUPPLY
CURRENT
Notes:
14. Device is continuously selected. OE
is HIGH for read cycle.
15. WE
16. Address valid prior to or coincident with CE
HIGH IMPEDANCE
t
LZCE
t
PU
, CE = VIL, BHE, BLE = VIL.
[15, 16]
t
ACE
t
DOE
t
t
LZOE
LZOE
t
DBE
50%
, BHE, BLE transition LOW.
t
RC
t
PD
t
HZCE
t
HZOE
t
HZBE
HIGH
IMPEDANCE
DATA VALID
I
50%
CC
I
SB
Document #: 38-05201 Rev. *DPage 6 of 13
Page 7
Switching Waveforms (continued)
Write Cycle No. 1 (WE Controlled)
ADDRESS
CE
[13, 17, 18]
t
SCE
t
WC
CY62137CV25/30/33 MoBL
CY62137CV MoBL
®
®
t
SA
WE
BHE/BLE
OE
DATA I/O
NOTE
19
t
HZOE
Write Cycle No. 2 (CE Controlled)
ADDRESS
CE
WE
[13, 17, 18]
t
SA
t
t
AW
AW
t
WC
t
BW
t
PWE
t
SD
DATA
t
PWE
IN
t
SCE
VALID
t
HA
t
HD
t
HA
t
BHE/BLE
BW
OE
DATA I/O
Notes:
17. Data I/O is high-impedance if OE
18. If C E
19. During this period, the I/Os are in output state and input signals should not be applied.
goes HIGH simultaneous ly with WE HIGH , the output remains in a high- impedance st ate.
NOTE
19
= VIH.
t
HZOE
t
SD
DATA
IN
VALID
t
HD
Document #: 38-05201 Rev. *DPage 7 of 13
Page 8
Switching Waveforms (continued)
Write Cycle No. 3 (WE Controlled, OE LOW)
ADDRESS
CE
BHE/BLE
[18]
t
t
SCE
BW
t
WC
CY62137CV25/30/33 MoBL
CY62137CV MoBL
®
®
t
SA
WE
DATAI/O
NOTE 19
t
HZWE
Write Cycle No. 4 (BHE/BLE Controlled, OE LOW)
ADDRESS
CE
BHE/BLE
t
SA
WE
t
t
AW
AW
[18]
t
SCE
t
PWE
t
WC
t
PWE
t
BW
t
SD
DATAIN VALID
t
HA
t
t
HA
t
LZWE
HD
t
HD
DATA I/O
NOTE 19
t
SD
DATA
IN
VALID
Document #: 38-05201 Rev. *DPage 8 of 13
Page 9
Typical DC and AC Parameters
CY62137CV25/30/33 MoBL
CY62137CV MoBL
®
®
(Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = V
Operating Current vs. Supply Voltage
14.0
12.0
10.0
MoBL
(mA)
8.0
CC
I
6.0
4.0
2.0
0.0
2.2
2.5
2.7
SUPPLY VOLT AGE (V)
,
(f = f
max
55 ns)
,
(f = f
max
70 ns)
(f = 1 MHz)
14.0
12.0
10.0
MoBL
(mA)
8.0
CC
I
6.0
4.0
2.0
0.0
2.7
3.0
3.3
SUPPLY VOLTAGE (V)
(f = f
55 ns)
(f = f
70 ns)
(f = 1 MHz)
14.0
12.0
10.0
max
max
,
,
MoBL
(mA)
8.0
CC
I
6.0
4.0
2.0
0.0
3.0
SUPPLY VOLTAGE (V)
3.3
(f = f
55 ns)
(f = f
70 ns)
(f = 1 MHz)
3.6
max
max
,
,
Standby Current vs. Supply Voltage
12.0
10.0
MoBL
8.0
SB (µA)
I
6.0
4.0
2.0
0
2.2
2.5
SUPPLY VOLTAGE (V)
2.7
12.0
10.0
MoBL
8.0
SB (µA)
I
6.0
4.0
2.0
0
3.0
2.7
SUPPLY VOLTAGE (V)
3.3
12.0
MoBL
10.0
8.0
SB (µA)
I
6.0
4.0
2.0
0
3.3
3.0
SUPPLY VOLT AGE (V)
3.6
Access Time vs. Supply Voltage
, TA = 25°C)
CC(typ.)
.
14.0
12.0
10.0
MoBL
(mA)
8.0
CC
I
6.0
4.0
2.0
0.0
2.7
3.3
SUPPLY VOLTAGE (V)
12.0
MoBL
10.0
8.0
SB (µA)
I
6.0
4.0
2.0
SL
0
2.7
SUPPLY VOLTAGE (V)
LL
(f = f
70 ns)
(f = 1 MHz
3.6
3.3
max
3.6
,
60
MoBL
50
40
30
AA (ns)
20
T
10
0
2.2
2.5
2.7
SUPPLY VOLTAGE (V)
60
MoBL
50
40
30
AA (ns)
20
T
10
0
3.0
2.7
3.3
SUPPLY VOLTAGE (V)
60
MoBL
50
40
30
AA (ns)
20
T
10
0
3.0
3.3
SUPPLY VOLTAGE (V)
3.6
60
MoBL
50
40
30
AA (ns)
20
T
10
0
2.7
3.3
SUPPLY VOLTAGE (V)
3.6
Document #: 38-05201 Rev. *DPage 9 of 13
Page 10
CY62137CV25/30/33 MoBL
CY62137CV MoBL
Truth Table
CEWEOEBHEBLEInputs/OutputsModePower
HXXXXHigh-Z Deselect/Power-downStandby (ISB)
XXXHHHigh-ZDeselect/Power-downStandby (ISB)
LHLLLData Out (I/OO–I/O15)ReadActive (ICC)
LHLHLData Out (I/OO–I/O7);
I/O8–I/O
LHLLHData Out (I/O8–I/O15);
LHHLLHigh-ZOutput DisabledActive (ICC)
LHHHLHigh-ZOutput DisabledActive (ICC)
LHHLHHigh-ZOutput DisabledActive (ICC)
LLXLLData In (I/OO–I/O15)WriteActive (ICC)
LLXHLData In (I/OO–I/O7);
LLXLHData In (I/O8–I/O15);
I/O
I/O
I/O
0
8
0
in High-Z
15
–I/O7 in High-Z
–I/O
in High-Z
15
–I/O7 in High-Z
ReadActive (ICC)
ReadActive (ICC)
WriteActive (ICC)
WriteActive (ICC)
®
®
Ordering Information
Speed
(ns)Ordering Code
70CY62137CV25LL-70BAI2.2–2.7BA48A48-ball Fine Pitch BGA (7 mm x 7 mm x 1.2 mm)Industrial
CY62137CV25LL-70BVI2.2–2.7BV48A48-ball Fine Pitch BGA (6 mm x 8 mm x 1 mm)
CY62137CV30LL-70BAI2.7–3.3BA48A48-ball Fine Pitch BGA (7 mm x 7 mm x 1.2 mm)
CY62137CV30LL-70BVI2.7–3.3BV48A48-ball Fine Pitch BGA (6 mm x 8 mm x 1 mm)
CY62137CV33LL-70BAI3.0–3.6BA48A48-ball Fine Pitch BGA (7 mm x 7 mm x 1.2 mm)
CY62137CV33LL-70BVI3.0–3.6BV48A48-ball Fine Pitch BGA (6 mm x 8 mm x 1 mm)
CY62137CVLL-70BAI2.7–3.6BA48A48-ball Fine Pitch BGA (7 m m x 7 mm x 1.2 mm)
CY62137CVLL-70BVI2.7–3.6BV48A48-ball Fine Pitch BGA (6 mm x 8 mm x 1 mm)
CY62137CVSL-70BAI2.7–3.6BA48A48-ball Fine Pitch BGA (7 m m x 7 mm x 1.2 mm)
CY62137CVSL-70BVI2.7–3.6BV4 8A48-ball Fine Pitch BGA (6 mm x 8 mm x 1 mm)
55CY62137CV25LL-55BAI2.2–2.7BA48A48-ball Fine Pitch BGA (7 mm x 7 mm x 1.2 mm)
CY62137CV25LL-55BVI2.2–2.7BV48A48-ball Fine Pitch BGA (6 mm x 8 mm x 1 mm)
CY62137CV30LL-55BAI2.7–3.3BA48A48-ball Fine Pitch BGA (7 mm x 7 mm x 1.2 mm)
CY62137CV30LL-55BVI2.7–3.3BV48A48-ball Fine Pitch BGA (6 mm x 8 mm x 1 mm)
CY62137CV33LL-55BAI3.0–3.6BA48A48-ball Fine Pitch BGA (7 mm x 7 mm x 1.2 mm)
CY62137CV33LL-55BVI3.0–3.6BV48A48-ball Fine Pitch BGA (6 mm x 8 mm x 1 mm)
Voltage
Range (V)
Package
NamePackage Type
Operating
Range
Document #: 38-05201 Rev. *DPage 10 of 13
Page 11
Package Diagrams
CY62137CV25/30/33 MoBL
48-ball (7.00 mm x 7.00 mm x 1.2 mm) FBGA BA48A
CY62137CV MoBL
®
®
51-85096-*E
Document #: 38-05201 Rev. *DP age 11 of 13
Page 12
Package Diagrams (continued)
CY62137CV25/30/33 MoBL
48-ball VFBGA (6 x 8 x 1 mm) BV48A
CY62137CV MoBL
®
®
51-85150-*A
MoBL is a registered trademark and More Battery Life is a trademark of Cypress Semiconductor Corporation. All product and
company names mentioned in this document may be the trademarks of their respective holders.