Data sheet acquired from Cypress Semiconductor Corporation.
Data sheet modified to remove devices not offered.
CY29FCT52T
SCCS010 - May 1994 - Revised February 2000
Features
• Function, pinout, and drive compatible with FCT,
F Logic and AM2952
• FCT-C speed at 6.3 ns max. (Com’l)
• Reduced V
FCT functions
(typically = 3.3V) versions of equivalent
OH
• Edge-rate control circuitry for significantly improved
noise characteristics
• ESD > 2000V
• Power-off disable feature
• Matched rise and fall times
Logic Block Diagram
CPA
CEA
OEA
A
0
A
1
A
2
A
3
A
4
A
5
A
6
A
7
D
D
D
D
D
D
D
D
Q
Q
Q
Q
Q
Q
Q
Q
0
1
2
3
4
5
6
7
0
1
2
3
4
5
6
7
CE CP
CE CP
Q
0
Q
1
Q
2
Q
3
Q
4
Q
5
Q
6
Q
7
D
0
D
1
D
2
D
3
D
4
D
5
D
6
D
7
8-Bit Registered Transceive
• Fully compatible with TTL input and output logic levels
• Sink Current 64 mA (Com’l)
Source Current 32 mA (Com’l)
Functional Description
The CY29FCT52T has two 8-bit back-to-back registers that
store data flowing in both directions between two bidirectional
buses. Separate clock, clock enable, and three-state output
enable signals are provided for each register. Both A outputs
and B outputs are specified to sink 64 mA.
The outputs are designed with a power-off disable feature to
allow for live insertion of boards.
Pin Configurations
OEB
B
0
B
1
B
2
B
3
B
4
B
5
B
6
B
7
CPB
CEB
OEB
CPA
CEA
GND
B
7
B
6
B
5
B
4
B
3
B
2
B
1
B
0
SOIC/QSOP
Top View
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
V
CC
A
7
A
6
A
5
A
4
A
3
A
2
A
1
A
0
OEA
CPB
CEB
]
Function Table
[1]
Inputs
Internal QFunctionDCPCE
XXHNCHold Data
L
H
Note:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care
AA register inputs or B register outputs.
BB register inputs or A register outputs.
CPAClockforthe A register.When CEA is LOW,data is entered into the A register on the LOW-to-HIGHtransition of the
CEAClockEnable fortheAregister.When CEAisLOW,data is entered into theAregisteron the LOW-to-HIGHtransition
OEAOutputEnable for the A register.When OEAis LOW,theAregisteroutputsare enabledontotheB lines.WhenOEA
CPBClockforthe B register.When CEB is LOW,data is entered into the B register on the LOW-to-HIGHtransition of the
CEBClockEnable fortheBregister.When CEBisLOW,data is entered into theBregisteron the LOW-to-HIGHtransition
OEBOutputEnable for the B register.When OEBis LOW,theBregisteroutputsare enabledontotheA lines.WhenOEB
CPA signal.
of the CPA signal. When
CEA is HIGH, the A register holds its contents regardless of CPA signal transitions.
is HIGH, the A outputs are in the high impedance state.
CPB signal.
of the CPB signal. When
CEB is HIGH, the B register holds its contents regardless of CPA signal transitions.
is HIGH, the B outputs are in the high impedance state.
Maximum Ratings
[2, 3]
(Above which the useful life may be impaired. For user
guidelines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
DC Output Current (Maximum Sink Current/Pin) ......120 mA
Power Dissipation..........................................................0.5W
All inputs0.2V
Input Clamp Diode VoltageVCC=Min., IIN=–18 mA–0.7–1.2V
Input HIGH CurrentVCC=Max., VIN=V
CC
Input HIGH CurrentVCC=Max., VIN=2.7V±1µA
Input LOW CurrentVCC=Max., VIN=0.5V±1µA
Output Short Circuit Current
Power-Off DisableVCC=0V, V
[7]
VCC=Max., V
=0.0V–60–120–225mA
OUT
=4.5V±1µA
OUT
CY29FCT52T
[5]
Max.Unit
5µA
Capacitance
ParameterDescriptionTyp.
C
IN
C
OUT
Notes:
5. Typical values are at V
6. This parameter is specified but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatusand/or sample
and hold techniques are preferablein order to minimize internal chipheating and more accurately reflect operational values. Otherwise prolonged shortingof
a high output may raise the chip temperature well abovenormal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
[6]
Input Capacitance510pF
Output Capacitance912pF
=5.0V, TA=+25˚C ambient.
CC
tests should be performed last.
OS
[5]
Max.Unit
3
Page 4
Power Supply Characteristics
ParameterDescriptionTest ConditionsTyp.
I
CC
∆I
CC
I
CCD
I
C
Notes:
8. Per TTL driven input (V
9. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
10. I
C
IC=ICC+∆ICCDHNT+I
I
CC
∆I
D
N
I
CCD
f
0
f
1
N
All currents are in milliamps and all frequencies are in megahertz.
11. Values for these conditions are examples of the ICC formula. These limits are specified but not tested.
Quiescent Power Supply CurrentVCC=Max., VIN< 0.2V, VIN> VCC–0.2V0.10.2mA
Quiescent Power Supply Current
VCC=Max., VIN=3.4V, f1=0, Outputs Open
[8]
(TTL inputs HIGH)
[10]
[9]
VCC=Max.,OneInputToggling,50%DutyCycle,
Outputs Open,
V
< 0.2V or VIN> VCC–0.2V
IN
OEA or OEB=GND,
VCC=Max., f0=10 MHz, 50% Duty Cycle,
Outputs Open, One Bit Toggling at f
OEA or OEB=GND,
V
< 0.2V or VIN> VCC–0.2V
IN
=5 MHz,
1
Dynamic Power Supply Current
Total Power Supply Current
VCC=Max., 50% Duty Cycle, Outputs Open,
f
=10 MHz, One Bit Toggling at f1=5 MHz,
0
OEA or OEB=GND, VIN=3.4V or VIN=GND
VCC=Max., 50% Duty Cycle, Outputs Open,
f
=10 MHz, Eight Bits Toggling at f1=2.5 MHz,
0
OEA or OEB=GND,
V
< 0.2V or VIN> VCC–0.2V
IN
VCC=Max., 50% Duty Cycle, Outputs Open,
f
=10 MHz, Eight Bits Toggling at f1=2.5 MHz,
0
OEA or OEB=GND, VIN=3.4V or VIN=GND
=3.4V); all other inputs at VCC or GND.
IN
=I
QUIESCENT
= Quiescent Current with CMOS input levels
= Power Supply Current for a TTL HIGH input (VIN=3.4V)
CC
= Duty Cycle for TTL inputs HIGH
H
= Number of TTL inputs at D
T
= Dynamic Current caused by an input transition pair (HLH or LHL)
= Clock frequency for registered devices, otherwise zero
= Input signal frequency
= Number of inputs changing at f
1
+ I
INPUTS
CCD(f0
+ I
DYNAMIC
/2 + f1N1)
H
1
CY29FCT52T
[5]
Max.Unit
0.52.0mA
0.060.12mA/MHz
0.71.4mA
1.23.4mA
1.63.2
3.912.2
[11]
[11]
mA
mA
4
Page 5
CY29FCT52T
Switching Characteristics Over the Operating Range
ParameterDescription
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
S
t
H
t
S
t
H
t
W
Propagation Delay
CPA, CPB to A, B
Output Enable Time OEA or OEB to A or B1.57.0ns1, 7, 8
12. Minimum limits are specified but not tested on Propagation Delays.
13. See “Parameter Measurement Information” in the General Information section.
Document #: 38-00262-B
Package
NamePackage Type
Operating
Range
5
Page 6
Package Diagrams
CY29FCT52T
24-Lead Quarter Size Outline Q13
24-Lead (300-Mil) Molded SOIC
S13
6
Page 7
IMPORTANT NOTICE
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any product or service without notice, and advise customers to obtain the latest version of relevant information
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pertaining to warranty, patent infringement, and limitation of liability.
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accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
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Copyright 2000, Texas Instruments Incorporated
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