Page 1
Circuit Note
CN-0260
10 MHz, 20 V/μs, G = 1, 10, 100, 1000 iCMOS®
Programmable Gain Instrumentation Amplifier
Ultralow Noise, 4.5 V XFET® Voltage Reference
with Current Sink and Source Capability
Rev.0
Circuits from the Lab™ circuits from Analog Devices have been designed and built by Analog Devices
engineers. Standard engineering practices have been employed in the design and construction of
nd performance have been tested and verified in a lab environment at
room temperature. However, you are solely responsible for testing the circuit and determining its
be liable for direct, indirect, special, incidental, consequential or punitive damages due to any cause
whatsoever connected to the use of any Circuits from the Lab circuits. (Continued on last page)
Fax: 781.461.3113 ©2012 Analog Devices, Inc. All rights reserved.
ADR439
12V
12V
12V
12V
–12V
–12V
–12V
4.5V
VCM = 2.25V
5V
2.5V
2.5V 3.3V1.2V
2.5V
R2
2kΩ
R1
1kΩ
15Ω
1nF
10kΩ
10kΩ
4.5V
A1
AD7985
IN+
IN−
SDP
4.5V
G = 1 OR
G = 100
AVDD
2.5V
DVDD
BVDD
VIO
REF
GND
FPGA
1/2
ADA4004-2
AD8021
1/2
ADA4004-2
AD8253
REF
10451-001
A1
Devices Connected/Referenced
Circuits from the Lab™ reference circuits
are engineered and tested for quick and
easy system integration to help solve today’s
analog, mixed-signal, and RF design
challenges. For more information and/or
support, visit www.analog.com/CN0260.
Oversampled SAR ADC with PGA Achieving Greater Than 125 dB Dynamic Range
AD7985 16-Bit, 2.5 MSPS, 15.5 mW PulSAR® ADC in LFCSP
AD8253
AD8021 Low Noise, High Speed Amplifier for 16-Bit Systems
ADA4004-2 1.8 nV/√Hz, 36 V Precision Dual Amplifier
ADR439
EVALUATION AND DESIGN SUPPORT
Design and Integration Files
Schematics, Layout Files, Bill of Materials
CIRCUIT FUNCTION AND BENEFITS
This circuit, shown in Figure 1, is a flexible sensor signal
conditioning block, with low noise, relatively high gain, and the
ability to dynamically change the gain in response to input level
changes without affecting performance, while still maintaining
a wide dynamic range. Existing sigma-delta technology can
each circuit, and their function a
suitability and applicability for your use and application. Accordingly, in no event shall Analog Dev ices
Figure 1. Wide Dynamic Range Signal Conditioning Circuit with Autoranging PGA and Oversampling SAR ADC (Note: All Connections and Decoupling Not Shown)
provide the dynamic range needed for many applications, but
only at the expense of low update rates. This circuit presents an
alternative approach that uses the AD7985 16-bit, 2.5 MSPS
PulSAR® successive-approximation ADC, combined with an
autoranging AD8253 iCMOS® programmable gain
instrumentation amplifier (PGA) front end. With gain that
changes automatically based on analog input value, it uses
oversampling and digital processing to increase the dynamic
range of the system to more than 125 dB.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Page 2
CN-0260 Circuit Note
OSR
F
SIGNAL
FS (MCLK)
ANALOG
ANTIALIAS
OSR INCREASED
F
SIGNAL
FS (MCLK)
ANALOG
ANTIALIAS
10451-002
Figure 2. Increasing Oversampling Ratio (OSR) Reduces Noise
CIRCUIT DESCRIPTION
There are many applications that require wide dynamic range.
Weigh scale systems typically use load cell bridge sensors with
maximum full-scale outputs of 1 mV to 2 mV. Such systems
may require resolutions on the order of 1,000,000 to 1, which,
when referred to a 2 mV full-scale input, call for a high
performance, low noise, high gain amplifier and a sigma-delta
modulator. Similarly, chemical and blood analyses for medical
applications often use photodiode sensors, producing very
small currents that need to be accurately measured. Some
applications, such as vibration monitoring systems, contain
both ac and dc information, so the ability to accurately monitor
both small and large signals is growing in importance. Sigmadelta ADCs implement this well in many cases but are limited
when both ac and dc measurements are needed and fast gain
switching is required.
Oversampling is the process of sampling the input signal at a
much higher rate than the Nyquist frequency. As a general rule,
every doubling of the sampling frequency yields approximately
a 3 dB improvement in noise performance within the original
signal bandwidth. The oversampling ADC is followed by digital
postprocessing to remove the noise outside the signal
bandwidth, as shown in Figure 2.
To achieve maximum dynamic range, a front-end PGA stage
can be added to increase the effective signal-to-noise ratio
(SNR) for very small signal inputs. Consider a system dynamic
range requirement of >126 dB. First, calculate the minimum
rms noise required to achieve this dynamic range. For example,
a 3 V input range (6 V p-p) has a 2.12 V full-scale rms value
(6/2√2). The maximum allowable system noise is calculated as
126 dB = 20 log (2.12 V/rms noise)
Thus, the rms noise ≈ 1 μV rms.
Now, consider the system update rate, which will determine the
oversampling ratio and the maximum amount of noise, referred
to the input (RTI), that can be tolerated in the system. For
example, with the AD7985 16-bit, 2.5 MSPS PulSAR ADC
Rev. 0 | Page 2 of 6
running at 600 kSPS (11 mW dissipation) and an oversampling
ratio of 72, the effective throughput rate of the system after
averaging and decimation is 600 kSPS ÷ 72 = 8.33 kSPS.
The input signal is therefore limited to a bandwidth of
approximately 4 kHz.
The total rms noise is simply the noise density (ND) times √f,
so the maximum allowable input spectral noise density (ND)
can be calculated as
1 μV rms = ND × √4 kHz
Or, ND = 15.8 nV/√Hz.
From this figure of merit for RTI system input noise, a suitable
instrumentation amplifier can be chosen that will provide
sufficient analog front-end gain (when summed with the SNR
of the ADC, with associated oversampling) to achieve the
required 126 dB. For the AD7985, the typical SNR figure is
89 dB, and oversampling by 72 yields another ~18 dB
improvement (72 is approximately 2
6
, and each doubling adds
3 dB). Achieving 126 dB DR still requires more than 20 dB
improvement, which can come from the gain provided by the
analog PGA stage. The instrumentation amplifier must provide
a gain of ≥20 (or whatever will not exceed a noise density
specification of 15.8 nV/√Hz).
A system-level solution to implement front-end PGA gain and
ADC oversampling as discussed above is shown in Figure 1.
The input stage uses the AD8253 very low noise 10 nV/√Hz
digitally controlled instrumentation amplifier. Gain options are
the following: G = 1, 10, 100, 1000.
The AD8021 is a 2.1 nV/√Hz low noise, high speed amplifier
capable of driving the AD7985. It also level shifts and attenuates
the AD8253 output. Both the AD8253 and AD8021 are operated
with an external common-mode bias voltage of 2.25 V, which
combine to maintain the same common-mode voltage on the
input to the ADC. With a 4.5 V reference, the input range of the
ADC is 0 V to 4.5 V.
Page 3
FPGA
AFE
DECIMATED
DATA
CONTROL
SIGNALS
SDP CONNECTOR
GAIN CONTROL
G = 1 OR G = 100
ADC
DATA
AIN±
DATA ANALYSIS
SOFTWARE
USB
CABLE
SYSTEM
DEMONSTRATION
PLATFORM (SDP-B)
10451-003
Circuit Note CN-0260
Figure 3. Test Setup Used to Measure P erformance of System
The output of the AD8021 is measured using a high speed ADC.
The PGA gain can be dynamically set based on the amplitude of
the input signal. For small signal inputs, a gain of 100 is
programmed. For larger inputs, the gain is reduced to 1.
Digital postprocessing is implemented using the AD7985 16-bit,
2.5 MSPS PulSAR ADC (11 mW dissipation) in a QFN package,
which, by virtue of its fast sampling rates, can also be used to
implement high orders of oversampling for low input
bandwidth applications. Since the complete system noise budget
is 15.8 nV/√Hz maximum, referred to the input (RTI), it is
useful to calculate the dominant noise sources of each block to
ensure that the 15.8 nV/√Hz hard limit is not exceeded.
The AD8021 has an input-referred noise specification of
<3 nV/√Hz, which is negligible when referred back to the input
of the gain-of-100 AD8253 stage. The AD7985 has a specified
SNR of 89 dB, using an external 4.5 V reference, for a noise
resolution of <45 μV rms.
Considering the Nyquist bandwidth of 300 kHz for the ADC, it
will contribute ~83 nV/√Hz across this bandwidth. When
referred back to the input of the AD7985, its <1 nV/√Hz noise
will be negligible in the system, where the RTI noise sources are
summed using a root-sum-of-squares calculation.
A further benefit of using the AD8253 is that it has digital gain
control, which allows the system gain to be dynamically
changed in response to changes in the input. This is achieved by
intelligently using the system’s digital signal processing
capability. The main function of digital processing in this
application is to produce a higher resolution output, using the
AD7985 16-bit conversion results. This is achieved by averaging
and decimating the data and switching the analog input gain
automatically, depending on the input amplitude. The
oversampling process results in a lower output data rate than
ADC sample rate, but with a greatly increased dynamic range.
To prototype the digital side of this application, a fieldprogrammable gate array (FPGA) was used as the digital core.
To rapidly debug the system, the analog circuitry and the FPGA
were consolidated onto a single board using the system
Rev. 0 | Page 3 of 6
demonstration platform (SDP) connector standard to allow easy
USB connectivity to the PC, as shown in Figure 3. The SDP is a
combination of reusable hardware and software that allows easy
control of and data capture from hardware over the most
commonly used component interfaces.
This module outputs a new gain setting based on the current
gain setting, two raw ADC samples, and some hard-coded
threshold figures. Four thresholds are used in the system. The
selection of these thresholds is critical to maximizing the analog
input range of the system, ensuring the G = 100 mode is used
for as much of the signal range as possible, while also
preventing the ADC input from being overdriven. Note that this
gain block operates on every raw ADC result, not on data that
has been normalized. Bearing this in mind, an illustrative
example of some thresholds that could be used in a system such
as this (assuming a bipolar system with a mid-scale of zero):
T1 (positive lower threshold): +162
(162 codes above mid-scale)
T2 (negative lower threshold): –162
(162 codes below mid-scale)
T3 (positive upper threshold): +32507
(260 codes below positive full-scale)
T4 (negative upper threshold): –32508
(260 codes above negative full-scale)
When in the G = 1 mode, the inner limits, T1 and T2, are used.
When an actual ADC result is between T1 and T2, gain is
switched to the G = 100 mode. This ensures that the analog
input voltage that the ADC sees is maximized as quickly as
possible. Then in the G = 100 mode, the outer limits, T3 and T4,
are used. If an ADC result is predicted to be above T3 or below
T4, the gain is switched to the G = 1 mode to prevent the input
of the ADC from being overranged, as shown in Figure 4.
Page 4
CN-0260 Circuit Note
0.15
–0.15
4.5
0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
–0.10
–0.05
0
0.05
0.10
AD8253 INPUT (V)
AD7985 INPUT (V)
AD8253 INPUT
AD7985 INPUT
10451-004
10451-005
Figure 4. The Gain from the Amplifier Input to the Converter Input
Is Reduced by 100 When the Analog-to-Digital Converter Input
Is Predicted to Be Outside the Threshold Limits
(Blue Line: Amplifier Input; Red Line: Converter Input.)
When in the G = 100 mode, if the algorithm predicts that the
next ADC sample would be just outside the outer threshold
(using a very rudimentary linear prediction), giving an ADC
result of +32510, the gain is switched to G = 1, so that, instead
of +32510, the next ADC result is +325.
Performance of the Full System
With fully optimized gain and decimation algorithms, the full
system is ready to be tested. Figure 5 shows the system response
to a large signal 1 kHz input tone of –0.5 dBFS. When the PGA
gain of 100 is factored in, the dynamic range achieved is 127 dB.
Similarly, when tested for small signal inputs in Figure 6, with
an input tone of 70 Hz @ –46.5 dBFS, up to 129 dB of dynamic
range is achieved. The improvement in performance at the
smaller input tone is expected, as no active switching of gain
ranges occurs during this measurement.
Figure 5. Response to Large-Scale 1 kHz Signal Showing 127 dB Dynamic Range
Rev. 0 | Page 4 of 6
Page 5
Circuit Note CN-0260
10451-006
Figure 6. Response to 70 Hz Small-Scale Input Signal
The system’s performance relies on the ability to switch the gain
dynamically to handle both small- and large-signal inputs.
While sigma-delta technology provides excellent dynamic
range, the SAR-based solution offers a way to dynamically
change the front-end gain based on the input signal, without
compromising system performance. This allows both smallsignal and large-signal ac and dc inputs to be measured in real
time without waiting for system settling time or incurring large
glitches due to delayed gain changing.
COMMON VARIATIONS
Other 16-bit PulSAR ADCs that can be considered for this
application are the AD7983 (16-bit @ 1.33 MSPS) and the
AD7980 (16-bit @ 1 MSPS). The use of 18-bit PulSAR ADCs
is also an option, including the AD7986 (18-bit @ 2 MSPS),
AD7984 (18-bit @ 1.33 MSPS), and the AD7982 (18-bit @
1 MSPS).
CIRCUIT EVALUATION AND TEST
Figure 3 shows the basic test setup used to evaluate the
circuit. A complete schematic and layout of the PCB can
be found in the CN-0260 Design Support package found
at www.analog.com/CN0260-DesignSupport.
It is important to use a low noise, low distortion signal source
for the input, such as an Agilent 33120A, Audio Precision
System Two 2322, or equivalent.
LEARN MORE
CN0260 Design Support Package:
www.analog.com/CN0260-DesignSupport
Ardizzoni, John. “A Practical Guide to High-Speed Printed-
Circuit-Board Layout,” Analog Dialogue 39-09, September
2005.
MT-001 Tutorial, Taking the Mystery out of the Infamous
Formula,"SNR = 6.02N + 1.76dB," and Why You Should
Care, Analog Devices.
MT-004 Tutorial, The Good, the Bad, and the Ugly Aspects of
ADC Input Noise—Is No Noise Good Noise?, Analog Devices.
MT-021 Tutorial, ADC Architectures II: Successive
Approximation ADCs, Analog Devices.
MT-022 Tutorial, ADC Architectures III: Sigma-Delta ADC
Basics, Analog Devices.
MT-031 Tutorial, Grounding Data Converters and Solving the
Mystery of “AGND” and “DGND”, Analog Devices.
MT-101 Tutorial, Decoupling Techniques, Analog Devices.
Colm Slattery and Mick McCarthy, “Oversampled ADC and
PGA Combine to Provide 127-dB Dynamic Range,” Analog
Dialogue, Vol.45, December 2011.
Rev. 0 | Page 5 of 6
Page 6
CN-0260 Circuit Note
(Continued from first page) Circuits from the L ab circuits are intended only for use with Analog Devices products and are the intellectual property of Analog Devices or its licensors. While you
reserves the right to change any Circuits from the Lab circuits at any time without notice but is under no obligation to do so.
registered trademarks are the property of their respective owners.
Data Sheets and Evaluation Boards
System Demonstration Platform (EVAL-SDP-CB1Z)
AD7985 Data Sheet
AD8253 Data Sheet
AD8021 Data Sheet
ADA4004-2 Data Sheet
ADR439 Data Sheet
REVISION HISTORY
1/12—Revision 0: Initial Version
may use the Circuits from the Lab circuits in the design of your product, no other license is granted by implication or otherwise under any patents or other intellectual property by
application or use of the Circuits from the Lab circuits. Information furnished by Analog Devices is believed to be accurate and reliable. However, "Circuits from the Lab" are supplied "as is"
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©2012 Analog Devices, Inc. All rights reserved. Trademarks and
CN10451-0-1/12(0)
Rev. 0 | Page 6 of 6
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