Dual Enhancement Mode Field Effect Transistor (N and P Channel)
FEATURES
D1/D2
40V , 14A , R
R
-40V , -9A , R
R
Super high dense cell design for extremely low R
= 32mΩ @VGS = 10V.
DS(ON)
= 46mΩ @VGS = 4.5V.
DS(ON)
= 72mΩ @VGS = 10V.
DS(ON)
= 110mΩ @VGS = 4.5V.
DS(ON)
DS(ON)
G1
.
G2
High power and current handing capability.
D1/D2
S1
Lead free product is acquired.
S1
TO-252-4L package.
ABSOLUTE MAXIMUM RATINGS T
Parameter
Drain-Source Voltage
Gate-Source Voltage
Drain Current-Continuous
Drain Current-Pulsed
Maximum Power Dissipation @ TC = 25 C
e
a
- Derate above 25 C
G1
S2
G2
CEU SERIES
TO-252-4L
= 25 C unless otherwise noted
c
Symbol
V
DS
V
GS
e
I
D
I
DM
P
D
N-Channel
40
±20
14
56
10.4
0.08
Operating and Store Temperature RangeTJ,Tstg-55 to 150
Thermal Characteristics
ParameterSymbolLimitUnits
Thermal Resistance, Junction-to-Case
Thermal Resistance, Junction-to-Ambient
RθJA
P-ChannelUnits
40
±20
-9
-36
12RθJC
50
S2
V
V
A
A
W
W/ C
C
C/W
C/W
Details are subject to change without notice .
Rev 2. 2007.Jan
http://www.cetsemi.com
1
Page 2
CED4279/CEU4279
N-Channel Electrical Characteristics T
ParameterSymbolMinUnits
= 25 C unless otherwise noted
A
Test Condition
Off Characteristics
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current
Gate Body Leakage Current, Forward
Gate Body Leakage Current, Reverse
BV
I
DSS
I
GSSF
IGSSR
DSS
VGS = 0V, ID = 250µA
VDS = 40V, VGS = 0V
VGS = 20V, VDS = 0V
VGS = -20V, VDS = 0V
On Characteristics
Gate Threshold Voltage
Static Drain-Source
On-Resistance
Dynamic Characteristics
d
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Switching Characteristics
d
Turn-On Delay Time
Turn-On Rise Time
Turn-Off Delay Time
Turn-Off Fall Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
V
GS(th)
R
DS(on)
g
C
C
C
t
d(on)
t
d(off)
Q
Q
VGS = VDS, ID = 250µA
VGS = 10V, ID = 8A
VGS = 4.5V, ID = 6A
c
FS
iss
oss
rss
t
r
t
f
Q
g
gs
gd
VDS = 5V, ID = 8A
VDS = 20V, VGS = 0V,
f = 1.0 MHz
VDD = 20V, ID = 6A,
VGS = 10V, R
VDS = 20V, ID = 6A,
VGS = 4.5V
Drain-Source Diode Characteristics and Maximun Ratings
Drain-Source Diode Forward Current
Drain-Source Diode Forward Voltage
Notes :
a.Repetitive Rating : Pulse width limited by maximum junction temperature.
b.Surface Mounted on FR4 Board, t < 10 sec.
c.Pulse Test : Pulse Width < 300µs, Duty Cycle < 2%.
d.Guaranteed by design, not subject to production testing.
e.Calculated continuous current based on the maximum allowable junction temperature. Package limitation current=8A.
b
c
I
S
V
SD
VGS = 0V, IS = 1A
GEN
= 3Ω
TypMax
40
13
10
1055
160
100
15
11
18
19
10
3.7
4.2
1
100
-100
3225
4635mΩ
30
22
36
38
13.3
8
1.2
V
µA
nA
nA
V
mΩ
S
pF
pF
pF
ns
ns
ns
ns
nC
nC
nC
A
V
2
Page 3
CED4279/CEU4279
P-Channel Electrical Characteristics T
ParameterSymbolMinUnits
= 25 C unless otherwise noted
A
Test Condition
Off Characteristics
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current
Gate Body Leakage Current, Forward
Gate Body Leakage Current, Reverse
BV
I
DSS
I
GSSF
IGSSR
DSS
VGS = 0V, ID = -250µA
VDS = -40V, VGS = 0V
VGS = 20V, VDS = 0V
VGS = -20V, VDS = 0V
On Characteristics
Gate Threshold Voltage
Static Drain-Source
On-Resistance
Dynamic Characteristics
Forward Transconductance
d
c
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Switching Characteristics
d
Turn-On Delay Time
Turn-On Rise Time
Turn-Off Delay Time
Turn-On Fall Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
V
GS(th)
R
DS(on)
g
C
C
C
t
d(on)
t
d(off)
Q
Q
VGS = VDS, ID = -250µA
VGS = -10V, ID = -8A
VGS = -4.5V, ID = -6A
c
FS
iss
oss
rss
t
r
t
f
Q
g
gs
gd
VDS = -5V, ID = -8A
VDS = -20V, VGS = 0V,
f = 1.0 MHz
VDD = -15V, ID = -1A,
VGS = -10V, R
VDS = -20V, ID = -4.5A,
VGS = -4.5V
Drain-Source Diode Characteristics and Maximun Ratings
Drain-Source Diode Forward Current
Drain-Source Diode Forward Voltage
Notes :
a.Repetitive Rating : Pulse width limited by maximum junction temperature.
b.Surface Mounted on FR4 Board, t < 10 sec.
c.Pulse Test : Pulse Width < 300µs, Duty Cycle < 2%.
d.Guaranteed by design, not subject to production testing.
e.Calculated continuous current based on the maximum allowable junction temperature. Package limitation current=8A.