N-Channel Enhancement Mode Field Effect Transistor
FEATURES
TypeV
CEPF640200V0.15Ω19A10V
CEBF640200V0.15Ω19A10V
CEFF640200V0.15Ω19A
DSS
R
DS(ON)
I
@V
D
d
GS
10V
CEFF640
Super high dense cell design for extremely low R
DS(ON)
.
High power and current handing capability.
Lead free product is acquired.
TO-220 & TO-263 & TO-220F full-pak for through hole.
D
G
S
CEB SERIES
TO-263(DD-PAK)
G
D
S
CEP SERIES
TO-220
ABSOLUTE MAXIMUM RATINGS T
ParameterSymbol
Drain-Source Voltage
Gate-Source Voltage
Drain Current-Continuous
Drain Current-Pulsed
Maximum Power Dissipation @ TC = 25 C
a
- Derate above 25 C
G
D
S
CEF SERIES
TO-220F
= 25 C unless otherwise noted
c
V
DS
V
GS
I
D
e
I
DM
P
D
G
Limit
TO-220/263TO-220F
19
76
125
1.0
Operating and Store Temperature RangeTJ,Tstg-55 to 150
Thermal Characteristics
ParameterSymbolLimitUnits
Thermal Resistance, Junction-to-Case
Thermal Resistance, Junction-to-Ambient
RθJA
1.0RθJC
62.5
200
±20
D
S
19
76
40
0.32
3.1
65
Units
V
V
d
d
A
A
W
W/ C
C
C/W
C/W
Details are subject to change without notice .
Rev 3. 2008.Oct.
http://www.cetsemi.com
1
Page 2
CEPF640/CEBF640
CEFF640
Electrical Characteristics T
= 25 C unless otherwise noted
c
ParameterSymbolMinUnits
Off Characteristics
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current
Gate Body Leakage Current, Forward
Gate Body Leakage Current, Reverse
On Characteristics
b
Gate Threshold Voltage
Static Drain-Source
On-Resistance
Dynamic Characteristics
c
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Switching Characteristics
c
Turn-On Delay Time
Turn-On Rise Time
Turn-Off Delay Time
Turn-Off Fall Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
V
R
BV
C
C
C
t
d(on)
t
d(off)
Q
Q
DSS
I
DSS
I
GSSF
IGSSR
GS(th)
DS(on)
g
FS
iss
oss
rss
t
r
t
f
Q
g
gs
gd
Drain-Source Diode Characteristics and Maximun Ratings
Drain-Source Diode Forward Current
Drain-Source Diode Forward Voltage
Notes :
a.Repetitive Rating : Pulse width limited by maximum junction temperature .
b.Pulse Test : Pulse Width < 300µs, Duty Cycle < 2% .
c.Guaranteed by des ign, not subject to production testing .
d.Limited only by maximum temperature allowed .
e .Pulse width limited by safe operating area .
f .Full package I
g.Full package VSD test condition IS = 10.5A .