N-Channel Enhancement Mode Field Effect Transistor
FEATURES
30V, 47A,R
R
Super high dense cell design for extremely low R
High power and current handing capability.
Lead-free plating ; RoHS compliant.
TO-220 package.
ABSOLUTE MAXIMUM RATINGS T
Drain-Source Voltage
Gate-Source Voltage
Drain Current-Continuous@ TC = 25 C
@ TC = 100 C
Drain Current-Pulsed
Maximum Power Dissipation @ TC = 25 C
Operating and Store Temperature RangeTJ,Tstg-55 to 175
= 12mΩ @VGS = 10V.
DS(ON)
= 21mΩ @VGS = 4.5V.
DS(ON)
Parameter
a
- Derate above 25 C
G
D
S
CEP SERIES
TO-220
.
DS(ON)
= 25 C unless otherwise noted
c
Symbol
V
DS
V
GS
I
D
I
DM
P
D
G
Limit
±20
0.32
30
47
33
188
48
PRELIMINARY
D
S
Units
V
V
A
A
A
W
W/ C
C
Thermal Characteristics
ParameterSymbolLimitUnits
Thermal Resistance, Junction-to-Case
Thermal Resistance, Junction-to-Ambient
This is preliminary information on a new product in development now .
Details are subject to change without notice .
RθJA
1
3.1RθJC
62.5
C/W
C/W
Rev 1. 2012.Mar
http://www.cetsemi.com
Page 2
CEP3100
Electrical Characteristics T
= 25 C unless otherwise noted
A
ParameterSymbolMinUnits
Off Characteristics
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current
Gate Body Leakage Current, Forward
Gate Body Leakage Current, Reverse
On Characteristics
c
Gate Threshold Voltage
Static Drain-Source
On-Resistance
Dynamic Characteristics
d
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Switching Characteristics
d
Turn-On Delay Time
Turn-On Rise Time
Turn-Off Delay Time
Turn-Off Fall Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
BV
I
IGSSR
V
GS(th)
R
DS(on)
C
C
C
t
d(on)
t
d(off)
Q
Q
DSS
I
DSS
GSSF
iss
oss
rss
t
r
t
f
Q
g
gs
gd
Drain-Source Diode Characteristics and Maximun Ratings
Drain-Source Diode Forward Current
Drain-Source Diode Forward Voltage
Notes :
a.Repetitive Rating : Pulse width limited by maximum junction temperature.
b.Surface Mounted on FR4 Board, t < 10 sec.
c.Pulse Test : Pulse Width < 300µs, Duty Cycle < 2%.
d.Guaranteed by design, not subject to production testing.