Datasheet ced4201_ceu4201 Datasheet

Page 1
CED4201/CEU4201
P-Channel Enhancement Mode Field Effect Transistor
FEATURES
-40V, -28A, R
R
Super high dense cell design for extremely low R
= 26mΩ @VGS = -10V.
DS(ON)
= 36mΩ @VGS = -4.5V.
DS(ON)
DS(ON)
High power and current handing capability.
Lead free product is acquired.
TO-251 & TO-252 package.
D
G
S CEU SERIES TO-252(D-PAK)
ABSOLUTE MAXIMUM RATINGS T
Parameter
Drain-Source Voltage
Gate-Source Voltage
Drain Current-Continuous
Drain Current-Pulsed
Maximum Power Dissipation @ TC = 25 C
a
- Derate above 25 C
G
D
S
CED SERIES TO-251(I-PAK)
= 25 C unless otherwise noted
c
Symbol
V
DS
V
GS
D
DM
P
D
G
Limit
±20
-112
0.25
Operating and Store Temperature Range TJ,Tstg -55 to 150
-40
-28
38
D
S
Units
V
V
A
A
W
W/ C
C
Thermal Characteristics
Parameter Symbol Limit Units
Thermal Resistance, Junction-to-Case
Thermal Resistance, Junction-to-Ambient
Details are subject to change without notice .
C/W
C/W
RθJA
4RθJC
50
Rev 1. 2010.July
http://www.cetsemi.com
1
Page 2
CED4201/CEU4201
Electrical Characteristics T
= 25 C unless otherwise noted
A
Parameter Symbol Min Units
Off Characteristics
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current
Gate Body Leakage Current, Forward
Gate Body Leakage Current, Reverse
On Characteristics
c
Gate Threshold Voltage
Static Drain-Source
On-Resistance
Dynamic Characteristics
d
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Switching Characteristics
d
Turn-On Delay Time
Turn-On Rise Time
Turn-Off Delay Time
Turn-Off Fall Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
V
R
BV
g
C
C
C
d(on)
d(off)
Q
Q
DSS
DSS
GSSF
IGSSR
GS(th)
DS(on)
FS
iss
oss
rss
r
f
Q
g
gs
gd
b
Drain-Source Diode Characteristics and Maximun Ratings
Drain-Source Diode Forward Current
Drain-Source Diode Forward Voltage
Notes :
a.Repetitive Rating : Pulse width limited by maximum junction temperature. b.Surface Mounted on FR4 Board, t < 10 sec. c.Pulse Test : Pulse Width < 300µs, Duty Cycle < 2%. d.Guaranteed by design, not subject to production testing. 
b
c
S
V
SD
Test Condition
VGS = 0V, ID = -250µA
VDS = -40V, VGS = 0V
VGS = 20V, VDS = 0V
VGS = -20V, VDS = 0V
VGS = VDS, ID = -250µA
VGS = -10V, ID = -18A
VGS = -4.5V, ID = -8A
VDS = -5V, ID = -4.8A
VDS = -20V, VGS = 0V, f = 1.0 MHz
VDD = -15V, ID = -1A, VGS = -10V, R
GEN
= 6Ω
VDS = -20V, ID = -4.1A, VGS = -4.5V
VGS = 0V, IS = -28A
Typ Max
-40
-1 -3
12
1760
220
150
16
6
61
15
18
5
7
-1
100
-100
2620
3628 mΩ
32
12
122
30
23
-28
-1.3
V
µA
nA
nA
V
mΩ
S
pF
pF
pF
ns
ns
ns
ns
nC
nC
nC
A
V
2
Page 3
CED4201/CEU4201
25
20
15
10
-ID, Drain Current (A)
5
0
0 1 4 532
-VGS=10,8,6,4V
-VDS, Drain-to-Source Voltage (V)
Figure 1. Output Characteristics
2400
2000
1600
1200
800
C, Capacitance (pF)
400
0
0 5 10 15 20 25
C
iss
C
oss
C
rss
-VDS, Drain-to-Source Voltage (V)
40
TJ=125 C
32
24
-V
=3.0
V
GS
16
-ID, Drain Current (A)
25 C
8
0
0 4 102 86
-55 C
-VGS, Gate-to-Source Voltage (V)
Figure 2. Transfer Characteristics
2.2 ID=-18A
VGS=-10V
1.9
1.6
1.3
1.0
RDS(ON), Normalized
0.7
RDS(ON), On-Resistance(Ohms)
0.4
-100 -50 0 50 100 150 200
TJ, Junction Temperature( C)
Figure 3. Capacitance
1.3 VDS=V
GS
ID=-250µA
1.2
1.1
1.0
0.9
0.8
VTH, Normalized
0.7
Gate-Source Threshold Voltage
0.6
-50 -25 0 25 50 75 100 125 150
TJ, Junction Temperature( C)
Figure 5. Gate Threshold Variation
with Temperature
Figure 4. On-Resistance Variation
with Temperature
V
=0
V
GS
2
10
1
10
-IS, Source-drain current (A)
0
10
0.4 0.6 0.8 1.0
1.41.2
-VSD, Body Diode Forward Voltage (V)
Figure 6. Body Diode Forward Voltage
Variation with Source Current
3
Page 4
CED4201/CEU4201
10
VDS=-20V ID=-4.1A
8
6
4
2
-VGS, Gate to Source Voltage (V)
0
0 4 16 208 12
Qg, Total Gate Charge (nC)
V
GS
GEN
R
Figure 7. Gate Charge
DD
V
R
IN
V
L
D
G
S
2
10
R
Limit
DS(ON)
1
10
0
10
-1
10
-ID, Drain Current (A)
-2
10
TC=25 C TJ=150 C
Single Pulse
-2
10
-1
10
10
1ms
10ms
100ms
DC
0
1
10
2
10
-VDS, Drain-Source Voltage (V)
Figure 8. Maximum Safe
Operating Area
on
d(off)
r
d(on)
OUT
V
OUT
V
IN
V
10%
90%
10% 10%
INVERTED
50% 50%
90%
off
f
90%
PULSE WIDTH
Figure 9. Switching Test Circuit
0
10
D=0.5
0.2
-1
0.1
10
0.05
0.02
10
-2
-2
10
0.01
Single Pulse
-1
10
r(t),Normalized Effective
Transient Thermal Impedance
Figure 11. Normalized Thermal Transient Impedance Curve
Figure 10. Switching Waveforms
0
10
1
10
Square Wave Pulse Duration (msec)
4
PDM
t1
t2
1. RθJC (t)=r (t) * RθJC
2. RθJC=See Datasheet
3. TJM-TC = P* RθJC (t)
4. Duty Cycle, D=t1/t2
2
10
3
10
4
10
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