• Memory Retention for Standby Battery Voltage of 2V
Minimum
• Output-Disable for Common I/O Systems
• Three-State Data Output for Bus-Oriented Systems
• Separate Data Inputs and Outputs
Ordering Information
5V10VP ACKAGE TEMP. RANGE
o
CDP1822CECDP1822EPDIP-40
CDP1822CEX CDP1822EXBurn-In
CDP1822CDCDP1822DSBDIP-40oC to +85oC
CDP1822CDX-Burn-In
C to +85oC
PKG.
NO.
E22.4
E22.4
D22.4A
D22.4A
Description
The CDP1822 and CDP1822C are 256-word by 4-bit static
random-access memories designed for use in memory systems where high speed, low operating current, and simplicity
in use are desirable. The CDP1822 features high speed and
a wide operating voltage range. Both types have separate
data inputs and outputs and utilize single power supplies of
4V to 6.5V for the CDP1822C and 4V to 10.5V for the
CDP1822.
Two Chip-Select inputs are provided to simplify system
expansion. An Output Disable control provides Wire-OR
capability and is also useful in common Input/Output systems. The Output Disable input allows these RAMs to be
used in common data Input/Output systems by forcing the
output into a high-impedance state during a write operation
independent of the Chip-Select input condition. The output
assumes a high-impedance state when the Output Disable is
at high level or when the chip is deselected by
CS2.
The high noise immunity of the CMOS technology is preserved in this design. For TTL interfacing at 5V operation,
excellent system noise margin is preserved by using an
external pull-up resistor at each input.
DC Operating Voltage Range410.546.5V
Input Voltage RangeV
Static Electrical Specifications At T
= -40oC to +85oC, Except as Noted
A
SS
V
DD
V
SS
V
DD
CONDITIONSLIMITS
CDP1822CDP1822C
PARAMETERSYMBOL
Quiescent Device
Current
Output Low (Sink)
Current
Output High (Source)
Current
Output Voltage
Low-Level
Output Voltage
High-Level
Input Low VoltageV
V
O
(V)
I
DD
-0, 55--500--500µA
-0, 1010--1000---µA
I
OL
0.40, 5524-24-mA
0.50, 10104.59----mA
I
OH
4.60, 55-1-2--1-2-mA
9.50, 1010-2.2-4.4----mA
V
OL
-0, 55-00.1-00.1V
-0, 1010-00.1---V
V
OH
-0, 554.95-4.95-V
-0, 10109.910----V
0.5, 4.5-5--1.5--1.5V
IL
V
(V)
V
IN
DD
(V)
MIN
(NOTE 1)
TYPMAXMIN
(NOTE 1)
TYPMAX
0.5, 9.5-10--3---V
Input High VoltageV
0.5, 9.5-53.5--3.5--V
IH
0.5, 9.5-107-----V
Input Leakage CurrentI
IN
-0, 55--±5- - ±5µA
-0, 1010--±10---µA
V
UNITS
6-12
Page 3
CDP1822, CDP1822C
Static Electrical Specifications At T
= -40oC to +85oC, Except as Noted (Continued)
A
CONDITIONSLIMITS
PARAMETERSYMBOL
Operating Current
(Note 2)
Three-State Output
Leakage Current
Input CapacitanceC
Output CapacitanceC
I
DD1
I
OUT
OUT
V
O
(V)
-0, 55-48-48mA
-0, 1010-816---mA
0, 50, 55--±5- - ±5µA
0, 100, 1010--±10---µA
IN
----57.5-57.5pF
----1015-1015pF
V
(V)
IN
NOTES:
1. Typical values are for TA = +25oC and nominal VDD.
2. Outputs open circuited; Cycle time = 1µs.
Dynamic Electrical Specifications At T
+ -40 to +85oC, VDD±5%, Input tR, tF = 20ns, VIH = 0.7 VDD, VIL = 0.3 VDD,
A
CL = 100 pF
TEST
CONDITIONSLIMITS
V
PARAMETER
DD
(V)
Read Cycle Times (Figure 1)
Read Cyclet
RC
5450--450--ns
10250-----ns
Access from Addresst
AA
5-250450-250450ns
10-150250---ns
Output Valid from Chip-Select 1t
DOA1
5-250450-250450ns
10-150250---ns
Output Valid from Chip-Select 2t
DOA2
5-250450-250450ns
10-150250---ns
Output Valid from Output Disable t
DOA3
5--200--200ns
10--110---ns
Output Hold from Chip-Select 1t
DOH1
520--20--ns
1020-----ns
Output Hold from Chip-Select 2t
DOH2
520--20--ns
1020-----ns
Output Hold from Output Disable t
DOH3
520--20--ns
1020-----ns
NOTES:
1. Time required by a limit device to allow for indicated function.
2. Typical values are for TA = 25oC and nominal VDD.
V
DD
(V)
(NOTE 1)
MIN
CDP1822CDP1822C
(NOTE 1)
MIN
TYPMAXMIN
CD1822CDP1822C
(NOTE 2)
TYPMAX
(NOTE 1)
MIN
(NOTE 2)
(NOTE 1)
TYPMAX
TYPMAX
UNITS
UNITS
6-13
Page 4
A0 - A7
CHIP-SELECT 1
CDP1822, CDP1822C
t
RC
t
DOA1
t
DOH1
CHIP-SELECT 2
OUTPUT DISABLE
WRITE
READ/
DATA OUT
HIGH
IMPEDANCE
FIGURE 1. READ CYCLE TIMING WAVEFORMS
Dynamic Electrical Specifications At T
CL = 100 pF.
TEST
CONDITIONS
V
DD
PARAMETER
Read Cycle Times (Figure 2)
Write Cyclet
Address Setupt
Write Recoveryt
Write Widtht
Input Data Setup Timet
Data Holdt
Chip-Select 1 Setupt
Chip-Select 2 Setupt
WC
AS
WR
WRW
DS
DH
CS1S
CS2S
(V)
5500--500--ns
10300-----ns
5200--200--ns
10110-----ns
550--50--ns
1040-----ns
5250--250--ns
10150-----ns
5250--250--ns
10150-----ns
550--50--ns
1040-----ns
5200--200--ns
10110-----ns
5200--200--ns
10110-----ns
VALID
t
DOH3
t
DOH2
HIGH
IMPEDANCE
t
DOA2
t
DOA3
t
AA
DATA OUT
+ -40 to +85oC, VDD±5%, Input tR, tF = 20ns, VIH = 0.7 VDD, VIL = 0.3 VDD,
A
LIMITS
CD1822CDP1822C
(NOTE 1)
MIN
(NOTE 2)
TYPMAX
(NOTE 1)
MIN
(NOTE 2)
TYPMAX
UNITS
6-14
Page 5
CDP1822, CDP1822C
Dynamic Electrical Specifications At T
+ -40 to +85oC, VDD±5%, Input tR, tF = 20ns, VIH = 0.7 VDD, VIL = 0.3 VDD,
A
CL = 100 pF. (Continued)
TEST
CONDITIONS
PARAMETER
Chip-Select 1 Holdt
CS1H
V
DD
(V)
50--0--ns
(NOTE 1)
MIN
100--0--ns
Chip-Select 2 Holdt
CS2H
50--0--ns
100--0--ns
Output Disable Set-Upt
ODS
5200--200--ns
10110-----ns
NOTES:
1. Time required by a limit device to allow for indicated function.
2. Typical values are for TA = 25oC and nominal VDD.
LIMITS
CD1822CDP1822C
(NOTE 2)
TYPMAX
t
WC
(NOTE 1)
MIN
(NOTE 2)
TYPMAX
t
WR
UNITS
NOTE: t
A0-A7
t
t
AS
CSIS
(NOTE)
t
ODS
t
CS2S
DON’T CARE
DATA IN STABLE
t
WRW
CHIP-SELECT 1
CHIP-SELECT 2
OUTPUT DISABLE
DI1-DI4
READ/
WRITE
is required for common I/O operation only. For separate I/O operations, output disable is don’t care.
ODS
t
CSIH
t
CS2H
t
DS
FIGURE 2. WRITE CYCLE TIME WAVEFORMS
t
DH
6-15
Page 6
CDP1822, CDP1822C
Data Retention Specifications At T
= -40 to +85oC, see Figure 3.
A
TEST CONDITIONS
V
PARAMETER
Min. Data Retention VoltageV
Data Retention Quiescent
CurrentI
DD
Chip Deselect to Data Retention
Timet
CDR
Recovery to Normal Operation
Timet
RC
VDD to VDR Rise and Fall TimetR,t
DR
F
DR
(V)
---1.52-1.52V
2--30100-30100µA
-5600--600--ns
- 10300---- -ns
-5600--600--ns
- 10300---- -ns
251--1--µA
NOTE: Typical values are for TA = 25oC and nominal VDD.
DATA RETENTION
DD
MODE
0.95 V
DD
V
DR
t
f
t
r
V
C
DD
t
CDR
S2
V
IH
V
IL
0.95 V
V
DD
(V)MIN
t
RC
V
IH
V
IL
LIMITS
CDP1822CDP1822C
(NOTE 1)
TYPMAXMIN
DATA IN
WRITE
ADDRESS
DECODER
(NOTE 1)
TYPMAX
V
DD
V
SS
READ
ADDRESS
DECODER
UNITS
DATA OUT
V
DD
FIGURE 3. LOW VDD DATA RETENTION TIME WAVEFORMSFIGURE 4. MEMORY CELL CONFIGURATION
6-16
Page 7
A0
A1
A2
A3
A4
CDP1822, CDP1822C
†
4
†
3
†
2
†
1
†
21
(5)
INPUT
BUFFERS
AND
ALL ROWS
DESELECT
FUNCTION
(32)
ROW
DECODERS
†††
22
V
DD
DI1
DI2
DI3
DI4
A5
A6
A7
R/W
CSI
CS2
OD
†
9
†
11
†
13
†
15
†
5
†
6
†
7
†
20
†
19
†
17
†
18
(4)
GATES
(3)
INPUT
BUFFERS
AND
ALL COLUMNS
DESELECT
FUNCTION
CONTROL
A
V
DD
CONTROL
B
(8 x 32)
STORAGE
ARRAY
BIT (1)
(8)
COLUMN
DECODERS
CONTROL
C
V
DD
(8 x 32)
STORAGE
ARRAY
BIT (2)
(8)
COLUMN
DECODERS
(8 x 32)
STORAGE
ARRAY
BIT (3)
(8)
COLUMN
DECODERS
V
DD
(8 x 32)
STORAGE
ARRAY
BIT (4)
(8)
COLUMN
DECODERS
BITS
(1-4)
(4)
BUFFER
DRIVERS
††
10
D01
††
12
D02
††
14
D03
††
16
D04
†††
8
V
SS
V
SS
INPUT PROTECTION
††††††
NETWORK
V
SS
OUTPUT
PROTECTION
CIRCUIT
FIGURE 5. FUNCTIONAL BLOCK DIAGRAM FOR CDP1822 AND CDP1822C
6-17
V
SS
OVER VOLTAGE
PROTECTION
CIRCUIT
Page 8
CDP1822, CDP1822CS
C
CONTROL A
CS1
19
CS2
17
CONTROL B
W
R/
20
CONTROL C
OUTPUT
DISABLE
18
FIGURE 6. LOGIC DIAGRAM OF CONTROLS FOR CDP1822 AND CDP1822C
A
CHIP-SELECT
CONTROL
B
CHIP-SELECT AND
W CONTROL
R/
C
OUTPUT
DISABLE
CONTROL
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may result from its use. No license is granted by implication or otherwise under an y patent or patent rights of Intersil or its subsidiaries.
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