Datasheet CD4023BCSJX, CD4023BCSJ, CD4023BCN, CD4023BCMX, CD4023BCM Datasheet (Fairchild Semiconductor)

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© 2000 Fairchild Semiconductor Corporation DS005956 www.fairchildsemi.com
October 1987 Revised August 2000
CD4023BC Buffered Triple 3-Input NAND Gate
CD4023BC Buffered Triple 3-Input NAND Gate
General Description
These triple gates are monolithic complementary MOS (CMOS) integrated circuits constructed with N- and P­channel enhancement mode transistors. They have eq ual source and sink current capabilities and confo rm to stan­dard B series output drive. The devices also ha ve buffered outputs which improve tra nsfe r ch ar acte risti cs b y pr ovid ing very high gain. All inputs are protected against static dis­charge with diodes to V
DD
and VSS.
Features
Wide supply voltage range: 3.0V to 15V
High noise immunity: 0.45 V
DD
(typ)
Low power TTL compatibility: fan out of 2 driving 74L or 1 driving 74LS
5V–10V–15V parametric ratings
Symmetrical output characteristics
Maximum input leakage 1
µA at 15V over full
temperature range
Ordering Code:
Devices also availab le in Tape and Reel. Specify by appending th e s uffix let t er “X” tot he ordering code.
Connection Diagram
Top View
Block Diagram
1
/3 Device Shown
*All Inputs Protected by Standard CMOS Input Protection Circuit.
Order Number Package Number Package Description
CD4023BCM M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow CD4023BCS M14D 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide CD4023BCN N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
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CD4023BC
Absolute Maximum Ratings(Note 1)
(Note 2)
Recommended Operating Conditions
Note 1: Absolute Maximum Ratings are those values beyond which the
safety of the device cannot be guaranteed; they are not meant to imply that the devices should be operated at these limits. The table of “Recom- mended Operating Conditions and Electrical Characteristics provides conditions for actua l device operation.
Note 2: V
SS
= 0V unless otherwise specified.
DC Electrical Characteristics (Note 3)
Note 3: VSS = 0V unless otherwise s pec if ied. Note 4: I
OH
and IOL are tested one out put at a time.
DC Supply Voltage (VDD) 0.5 VDCto +18 V
DC
Input Voltage (VIN) 0.5 VDCto V
DD
+0.5 V
DC
Storage Temp. Range (TS) 65°C to +150°C Power Dissipation (P
D
) Dual-In-Line 700 mW Small Outline 500 mW
Lead Temperature (T
L
) (Soldering, 10 seconds) 260
°C
DC Supply Voltage (V
DD
)5 V
DC
to 15 V
DC
Input Voltage (VIN)0 V
DC
to VDD V
DC
Operating Temperature Range (TA) 40°C to +85°C
Symbol Parameter Conditions
40°C +25°C +85°C
Units
Min Typ Min Typ Max Min Max
I
DD
Quiescent Device Current VDD = 5V 1.0 0.004 1.0 7.5
µAVDD = 10V 2.0 0.005 2.0 15
VDD = 15V 4.0 0.006 4.0 30
V
OL
LOW Level Output Voltage VDD = 5V 0.05 0 0.05 0.05
VVDD = 10V 0.05 0 0.05 0.05
VDD = 15V 0.05 0 0.05 0.05
V
OH
HIGH Level Output Voltage VDD = 5V 4.95 4.95 5 4.95
VVDD = 10V 9.95 9.95 10 9.95
VDD = 15V 14.95 14.95 15 14.95
V
IL
LOW Level Input Voltage VDD=5V, VO=4.5V 1.5 2 1.5 1.5
VVDD=10V, VO=9.0V |IO|<1µA 3.0 4 3.0 3.0
VDD=15V, VO=13.5V 4.0 6 4.0 4.0
V
IH
HIGH Level Input Voltage VDD=5V, VO=0.5V 3.5 3.5 3 3.5
VV
DD
=10V, VO=1.0V |IO|<1µA 7 .0 7.0 6 7.0
VDD=15V, VO=1.5V 11.0 11.0 9 11.0
I
OL
LOW Level Output Current VDD=5V, VO = 0.4V 0.52 0.44 0.88 0.36
mA(Note 4) V
DD
= 10V, VO = 0.5V 1.3 1.1 2.2 0.90
VDD = 15V, VO = 1.5V 3.6 3.0 8 2.4
I
OH
HIGH Level Output Current VDD = 5V, VO = 4.6V 0.52 0.44 0.88 0.36
mA(Note 4) V
DD
= 10V, VO = 9.5V 1.3 1.1 2.2 0.90
VDD = 15V, VO = 13.5V 3.6 3.0 8 2.4
I
IN
Input Current VDD = 15V, VIN = 0V 0.3 10−5−0.3 −1.0
µA
VDD = 15V, VIN = 15V 0.3 10−50.3 1.0
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CD4023BC
AC Electrical Characteristics (Note 5)
T
A
= 25°C, CL = 50 pF, R
L
= 200k, unless otherwise specified
Note 5: AC Parameters are guar ant eed by DC correlated te s tin g. Note 6: C
PD
determines the no load AC power consumption of any CMOS device.
For complete explanation, see Family Characteristics Application Note AN-90.
Symbol Parameter Conditions Min Typ Max Units
t
PHL
Propagation Delay, HIGH-to-LOW Level VDD = 5V 130 250
nsVDD = 10V 60 100
V
DD
= 15V 40 70
t
PLH
Propagation Delay, LOW-to-HIGH Level VDD = 5V 110 250
nsVDD = 10V 50 100
V
DD
= 15V 35 70
t
THL
, Transition Time VDD = 5V 90 200
nst
TLH
VDD = 10V 50 100 V
DD
= 15V 40 80
C
IN
Average Input Capacitance Any Input 5 7.5 pF
C
PD
Power Dissipation Capacity (Note 6) Any Gate 17 pF
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CD4023BC
Physical Dimensions inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow
Package Number M14A
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CD4023BC
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M14D
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CD4023BC Buffered Triple 3-Input NAND Gate
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N14A
Fairchild does not assume any responsibility for use of any circuitr y described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life supp or t de vices o r systems a re devices or syste ms which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea­sonably expected to result in a significant inju ry to the user.
2. A cr itical compon ent in any compon ent of a life su pport device or system whose failure t o perform can be rea­sonably expected to ca use the failure of the life supp ort device or system, or to affect its safety or effectiveness.
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