Datasheet CD4020BCC2, CD4019BCSJX, CD4019BCSJ, CD4019BCN, CD4019BCMX Datasheet (Fairchild Semiconductor)

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October 1987 Revised January 1999
CD4019BC Quad AND-OR Select Gate
© 1999 Fairchild Semiconductor Corporation DS005952.prf www.fairchildsemi.com
CD4019BC Quad AND-OR Select Gate
General Description
The CD4019BC is a complementar y MOS quad AND-OR select gate. Low power and high noise margin over a wide voltage range is possible through implementation of N- and P-channel enhancement m ode transistors. These comp le­mentary MOS (CMOS) transistors provide the building
blocks for the 4 “AND-OR select” gate configuration s, each consisting of two 2-input AND gates driving a single 2-input OR gate. Selection is accompl ished by control bi ts K
A
and
K
B
. All inputs are protecte d against static discharge dam-
age.
Features
Wide supply voltage range: 3.0V to 15V
High noise immunity: 0.45 V
DD
(typ.)
Low power TTL compatibility: Fan out of 2 driving 74L or 1 driving 74LS
Applications
• AND-OR select gating
• Shift-right/shift-left registers
• True/complement selection
• AND/OR/EXCLUSIVE-OR selection
Ordering Code:
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to t he ordering code.
Connection Diagram
Pin Assignments for DIP, SOIC and SOP
Top View
Order Number Package Number Package Description
CD4019BCM M16A 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150” Narrow CD4019BCSJ M16D 16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide CD4019BCN N16E 16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
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CD4019BC
Schematic Diagram
Schematic diagram for 1 of 4 identical stages
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CD4019BC
Absolute Maximum Ratings(Note 1)
(Note 2)
Recommended Operation Conditions
(Note 2)
Note 1: “Absolute Maximum Rat ings” are tho se values beyond which the safety of the device cannot be guaranteed; they are not meant to imply that the devices should be o perated at these limits. The tables of “R ecom­mended Operating Conditions” and “Electrical Characteristics” provide con­ditions for actual device operat ion.
Note 2: V
SS
= 0V unless otherw is e s pecified.
DC Electrical Characteristics (Note 3)
Note 3: VSS = 0V unless otherwise specified. Note 4: I
OH
and IOL are tested one output at a ti m e.
Supply Voltage (VDD) 0.5V to +18V Input Voltage (V
IN
) 0.5V to VDD +0.5V
Storage Temperature Range (T
S
) 65°C to +150°C
Power Dissipation (P
D
) Dual-In-Line 700 mW Small Outline 500 mW
Lead Temperature (T
L
) (Soldering, 10 seconds ) 260°C
DC Supply Voltage (V
DD
) +3V to +15V
Input Voltage (V
IN
)0V to V
DD
V
Operating Temperature Range (T
A
) 40°C to +85°C
Symbol Parameter Conditions
40°C +25°C +85°C
Units
Min Max Min Typ Max Min Max
I
DD
Quiescent Device VDD = 5V 1 0.03 1 7.5 µA Current VDD = 10V 2 0.05 2 15 µA
VDD = 15V 4 0.07 4 30 µA
V
OL
LOW Level |IO| < 1 µA Output Voltage VDD = 5V 0.05 0 0.05 0.05 V
VDD = 10V 0.05 0 0.05 0.05 V VDD = 15V 0.05 0 0.05 0.05 V
V
OH
HIGH Level |IO| < 1 µA Output Voltage VDD = 5V 4.95 4.95 5 4.95 V
VDD = 10V 9.95 9.95 10 9.95 V VDD = 15V 14.95 14.95 15 14.95 V
V
IL
LOW Level VDD = 5V, VO = 0.5V or 4.5V 1.5 2 1.5 1.5 V Input Voltage VDD = 10V, VO = 1.0V or 9.0V 3.0 4 3.0 3.0 V
VDD = 15V, VO = 1.5V or 13.5V 4.0 6 4.0 4.0 V
V
IH
HIGH Level VDD = 5V, VO = 0.5V or 4.5V 3.5 3.5 3 3.5 V Input Voltage VDD = 10V, VO = 1.0V or 9.0V 7.0 7.0 6 7.0 V
VDD = 15V, VO = 1.5V or 13.5V 11.0 11.0 9 11.0 V
I
OL
LOW Level Output VDD = 5V, VO = 0.4V 0.52 0.44 1 0.36 mA Current (Note 4) VDD = 10V, VO = 0.5V 1.3 1.1 2.5 0.9 mA
VDD = 15V, VO = 1.5V 3.6 3.0 10 2.4 mA
I
OH
HIGH Level Output VDD = 5V, VO = 4.6V −0.2 0.16 0.4 0.12 mA Current (Note 4) VDD = 10V, VO = 9.5V 0.5 0.4 1.0 0.3 mA
VDD = 15V, VO = 13.5V 1.4 1.2 3.0 1.0 mA
I
IN
Input Current VDD = 15V, VIN = 0V 0.30 −10−5−0.30 −1.0 µA
VDD = 15V, VIN = 15V 0.30 10−50.30 1.0 µA
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CD4019BC
AC Electrical Charac teristics (Note 5)
TA = 25°C, CL = 50 pF, RL = 200k, unless otherwise specified
Note 5: AC Parameters are guara nt eed by DC correlated testing.
Symbol Parameter Conditions Min Typ Max Units
t
PHL
, Propagation Delay, VDD = 5V 100 300 ns
t
PLH
Input to Output VDD = 10V 50 120 ns
VDD = 15V 45 100 ns
t
THL
HIGH-to-LOW Level VDD = 5V 100 200 ns Transition Time VDD = 10V 50 100 ns
VDD = 15V 40 80 ns
t
TLH
LOW-to-HIGH Level VDD = 5V 150 300 ns Transition Time VDD = 10V 70 140 ns
VDD = 15V 50 100 ns
C
IN
Input Capacitance All A and B Inputs 5 7.5 pF
KA and KB Inputs 10 15 pF
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CD4019BC
Physical Dimensions inches (millimeters) unless otherwise noted
16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150” Narrow
Package Number M16A
16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M16D
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Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reser ves the right at any time without notice to change said circuitry and specifications.
CD4019BC Quad AND-OR Select Gate
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or system s ar e devices or syste ms which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea­sonably expected to result in a significant injury to the user.
2. A critical component in any c omponent of a life suppor t device or system whose failure to perform can be rea­sonably expected to cause the failure of the life suppor t device or system, or to affect its safety or effectiveness.
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Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
Package Number N16E
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