Datasheet CD3207BB Datasheet (Philips)

INTEGRATED CIRCUITS

FB2041

7-bit Futurebus+ transceivers

Product specification
IC19 Data Handbook

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1995 May 25

Philips Semiconductors Product specification

ns

ns

I

Supply Current

mA

FB20417-bit Futurebus+ transceiver

DESCRIPTION

The FB2041 is a 7-bit bidirectional BTL transceiver and is intended
to provide the electrical interface to a high performance wired-OR
bus. The FB2041 is an inverting transceiver.

The B-port drivers are Low-capacitance open collectors with
controlled ramp and are designed to sink 100mA. Precision band
gap references on the B-port insure very good noise margins by
limiting the switching threshold to a narrow region centered at 1.55V .

FEA TURES

•7-bit BTL transceiver

•Separate I/O on TTL A-port

•Inverting

•Three separate pairs of driver enables in a 1 bit, 3 bit, 3 bit

arrangement

•Drives heavily loaded backplanes with equivalent load

impedances down to 10Ω.

•Allows incident wave switching in heavily loaded backplane buses

•Reduced BTL voltage swing produces less noise and reduces

power consumption

•Built-in precision band-gap reference provides accurate receiver

thresholds and improved noise immunity

•Compatible with IEEE Futurebus+ or proprietary BTL backplanes

•Controlled output ramp and multiple GND pins minimize ground

bounce

•Each BTL driver has a dedicated Bus GND for a signal return

•Glitch-free power up/power down operation

•Low I

current

CC

•Tight output skew

•Supports live insertion

•Pins for the optional JTAG boundary scan function are provided

•High density packaging in plastic Quad Flatpack

•High drive 100mA BTL open collector drivers on B-port

QUICK REFERENCE DATA

SYMBOL PARAMETER TYPICAL UNIT

t

PLH

t

PHL

t

PLH

t

PHL

C

I

OB

OL

CC

Propagation delay 3.7
AIn to Bn 2.7
Propagation delay 3.4
Bn to AOn 3.2
Output capacitance (B0 - B6 only) 6 pF
Output current (B0 - B6 only) 100 mA

Standby 19

pp

AIn to Bn (outputs Low or High) 40
Bn to AOn (outputs Low) 22
Bn to AOn (outputs High) 19

ORDERING INFORMATION

PACKAGE

52-pin Plastic Quad Flatpack FB2041BB CD3207BB SOT379-1

1995 May 25 853-1561 15279

COMMERCIAL RANGE

VCC = 5V±10%; T

= 0 to +70°C

amb

2

INDUSTRIAL RANGE

VCC = 5V±10%; T

= -40 to +85°C

amb

DWG

No.

Philips Semiconductors Product specification

FB20417-bit Futurebus+ transceiver

PIN CONFIGURATION

CC

LOGIC V

AI0

AO1

AO0

52 51 50 49 48 47 46 45 44 43 42 41 40

LOGIC GND

LOGIC GND

LOGIC GND

LOGIC GND

LOGIC GND

AI1

AI2

AO2

AO3

AI3

AI4

AO4

AO5

1
2
3
4
5
6
7

8

9
10
11
12
13

14 15 16 17 18 19 20 21 22 23 24 25 26

AI5

7-Bit Transceiver

52-lead PQFP

CC

AO6

LOGIC V

LOGIC GND

The B-port interfaces to “Backplane Transceiver Logic” (See the
IEEE 1194.1 BTL standard). BTL features low power consumption
by reducing voltage swing (1Vp-p, between 1V and 2V) and reduced
capacitive loading by placing an internal series diode on the drivers.
BTL also provides incident wave switching, a necessity for high
performance backplanes.

There are three separate pairs of driver enables in a 1 bit, 3 bit, 3 bit
arrangement. The TTL/BTL output drivers for bit 0 are enabled with
OEA1/OEB1
OEA2/OEB2
OEA3/OEB3

, output drivers for bits 1–2–3 are enabled with
and output drivers for bits 4–5–6 are enabled with
.

The A-port operates at TTL levels with separate I/O. The 3-state
A-port drivers are enabled when OEAn goes High after an extra 6ns
delay which is built in to provide a break-before-make function.
When OEAn goes Low, A-port drivers become High impedance
without any extra delay. During power on/of f cycles, the A-port
drivers are held in a High impedance state when V

is below 2.5V.

CC

The B-port has an output enable, OEB0, which affects all seven
drivers. When OEB0 is High and OEBn
be enabled. When OEB0 is Low or if OEBn

is Low the output driver will

is High, the B-port

drivers will be inactive and at the level of the backplane signal.

CC

B0

TMS (option)

OEB0

OEB1

OEA2

TDO (option)

TCK (option)

BUS V

CC

OEA3

BUS V

TDI (option)

BUS GND

39
38
37
36
35
34
33

32
31
30
29
28
27

OEB2

OEB3

BUS GND
B1
BUS GND
B2
BUS GND
B3
BUS GND
B4
BUS GND
B5
BUS GND
B6
BUS GND

BIAS V

OEA1

FB2041

AI6

LOGIC GND

To support live insertion, OEB0 is held Low during power on/off
cycles to insure glitch free B port drivers. Proper bias for B port
drivers during live insertion is provided by the BIAS V pin when at a
5V level while V
BIAS V pin should be tied to a V

is Low. If live insertion is not a requirement, the

CC

CC

pin.

The LOGIC GND and BUS GND pins are isolated in the package to
minimize noise coupling between the BTL and TTL sides. These
pins should be tied to a common ground external to the package.

Each BTL driver has an associated BUS GND pin that acts as a
signal return path and these BUS GND pins are internally isolated
from each other. In the event of a ground return fault, a “hard” signal
failure occurs instead of a pattern dependent error that may be very
infrequent and impossible to trouble-shoot.

The LOGIC V

and BUS VCC pins are also isolated internally to

CC

minimize noise and may be externally decoupled separately or
simply tied together.

JTAG boundary scan functionality is provided as an option with
signals TMS, TCK, TDI and TDO. When this option is not present,
TMS and TCK are no-connects (no bond wires) and TDI and TDO
are shorted together internally.

1995 May 25

3

Philips Semiconductors Product specification

V

In ut voltage

I

VIHHigh-level in ut voltage

VILLow-level in ut voltage

IOLLow-level out ut current

FB20417-bit Futurebus+ transceiver

PIN DESCRIPTION

SYMBOL PIN NUMBER TYPE NAME AND FUNCTION

AI0 – AI6 51, 2, 3, 8, 9, 14, 18 Input Data inputs (TTL)

AO0 – AO6 50, 52, 4, 6, 10, 12, 16 Output 3-state outputs (TTL)

B0 – B6 40, 38, 36, 34, 32, 30, 28 I/O Data inputs/Open Collector outputs, High current drive (BTL)

OEB0 46 Input Enables the Bn outputs when High
OEB1 45 Input Enables the B0 output when Low
OEB2 25 Input Enables the B1 – B3 outputs when Low
OEB3 26 Input Enables the B4 – B6 outputs when Low
OEA1 47 Input Enables the A0 outputs when High
OEA2 20 Input Enables the A1 – A3 outputs when High
OEA3 24 Input Enables the A4 – A6 outputs when High

BUS GND 41, 39, 37, 35, 33, 31, 29, 27 GND Bus ground (0V)

LOGIC GND 1, 5, 7, 11, 13, 15, 19 GND Logic ground (0V)

BUS V

CC

LOGIC V

CC

BIAS V 48 Power Positive supply voltage

TMS 42 Input Test Mode Select (no-connect)
TCK 44 Input Test Clock (no-connect)

TDI 22 Input Test Data In (shorted to TDO)

TDO 21 Output Test Data Out (TDI)

23, 43 Power Positive supply voltage
17, 49 Power Positive supply voltage

ABSOLUTE MAXIMUM RATINGS

Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the
operating free-air temperature range.

SYMBOL

V

CC

IN

I

IN

V

OUT

OUT

T

STG

Supply voltage -0.5 to +7.0 V

p

Input current -18 to +5.0 mA
Voltage applied to output in High output state -0.5 to +V
Current applied to output in AO0 – AO6 48 mA
Low output state B0 – B6 200
Storage temperature -65 to +150 °C

PARAMETER RATING UNIT

AI0 – AI6, OEB0, OEBn, OEAn -1.2 to +7.0 V

B0 – B6 -1.2 to +5.5

CC

RECOMMENDED OPERATING CONDITIONS

SYMBOL

V

CC

I

IK

I

OH

C

OB

T

amb

COMMERCIAL LIMITS

PARAMETER

VCC = 5V±10%;

T

= 0 to +70°C

amb

MIN TYP MAX MIN TYP MAX

Supply voltage 4.5 5.0 5.5 4.5 5.0 5.5 V

p

p

Except B0–B6 2.0 2.0 V
B0 – B6 1.62 1.55 1.62 1.55
Except B0–B6 0.8 0.8 V

B0 – B6 1.47 1.47
Input clamp current -18 -18 mA
High-level output current AO0 – AO6 -3 -3 mA

p

AO0 – AO6 24 24 mA

B0 – B6 100 100
Output capacitance on B port 6 7 6 7 pF
Operating free-air temperature range 0 +70 -40 +85 °C

INDUSTRIAL LIMITS

VCC = 5V±10%;

T

= -40 to +85°C

amb

V

UNIT

1995 May 25

4

Philips Semiconductors Product specification

FB20417-bit Futurebus+ transceiver

FUNCTION TABLE

MODE INPUTS OUTPUTS

AIn Bn* OEB0 OEB1 OEB2 OEB3 OEA1 OEA2 OEA3 AOn Bn*

L — H L L L L L L Z H**

AIn to Bn H — H L L L L L L Z L

L — H L L L H H H L H**

H — H L L L H H H H L

L — H L X X L L L Z H**

AI0 to B0 H — H L X X L L L Z L

L — H L X X H H H L H**

H — H L X X H H H H L

L — H X L X L L L Z H**

AI1 – AI3 to B1 – B3 H — H X L X L L L Z L

L — H X L X H H H L H**

H — H X L X H H H H L

L — H X X L L L L Z H**

AI4 – AI6 to B4 – B6 H — H X X L L L L Z L

L — H X X L H H H L H**

H — H X X L H H H H L

Disable Bn outputs X X L X X X X X X X H**

X X X H H H X X X X H**
Disable B0 outputs X X H H X X X X X X H**
Disable B1 – B3 outputs X X H X H X X X X X H**
Disable B4 – B6 outputs X X H X X H X X X X H**

X L L X X X H H H H Input
Bn to AOn X H L X X X H H H L Input

X L X H H H H H H H Input

X H X H H H H H H L Input

X L L X X X H X X H Input
B0 to AO0 X H L X X X H X X L Input

X L X H H H H X X H Input

X H X H H H H X X L Input

X L L X X X X H X H Input
B1 – B3 to AO1 – AO3 X H L X X X X H X L Input

X L X H H H X H X H Input

X H X H H H X H X L Input

X L L X X X X X H H Input
B4 – B6 to AO4 – AO6 X H L X X X X X H L Input

X L X H H H X X H H Input

X H X H H H X X H L Input
Disable AOn outputs X X X X X X L L L Z X
Disable AO0 outputs X X X X X X L X X Z X
Disable AO1 – AO3 outputs X X X X X X X L X Z X
Disable AO4 – AO6 outputs X X X X X X X X L Z X

NOTES:

H = High voltage level
L = Low voltage level
X = Don’t care
Z = High-impedance (OFF) state
— = Input not externally driven
H** = Goes to level of pull-up voltage
B* = Precaution should be taken to ensure B inputs do not float.

If they do, they are equal to Low state.

Z = High-impedance (OFF) state
— = Input not externally driven
H** = Goes to level of pull-up voltage
B* = Precaution should be taken to ensure B inputs do not float.

If they do, they are equal to Low state.

1995 May 25

5

Philips Semiconductors Product specification

FB20417-bit Futurebus+ transceiver

LOGIC DIAGRAM

46

OEB0

45

OEB1

47

OEA1

AO0

OEB2

OEA2

AO1

AI0

AI1

51

50

25

20

2

52

40

B0

38

B1

TTL

Levels

AO2

AO3

OEB3

OEA3

AO4

AO5

AO6

AI2

AI3

AI4

AI5

AI6

36

3

4

8

6

26

24

9

10

14

12

18

16

B2

34

32

30

28

BTL

Levels

B3

B4

B5

B6

TMS
TCK

TDI

TDO

LOGIC V
LOGIC GND = 1, 5, 7, 11, 13, 15, 19
BUS V
BUS GND = 27, 29, 31, 33, 35, 37, 39, 41
BIAS V = 48

= 17, 49

CC

= 23, 43

CC

1995 May 25

42
44

(Future JTAG Boundary Scan option)

22
21

SG00071

6

Philips Semiconductors Product specification

SYMBOL

PARAMETER

UNIT

I

Bias pin DC current

IOLOFF

Power up current

A

SYMBOL

PARAMETER

TEST CONDITIONS

1

UNIT

µ

IH

g

µ
µ

IL

µ

ICCSupply current (total)

mA

FB20417-bit Futurebus+ transceiver

LIVE INSERTION SPECIFICA TIONS

LIMITS

MIN TYP MAX

V

BIASV

BIASV

V

I
I

IBnPEAK

t

Bias pin voltage VCC = 0 to 5.25V, Bn = 0 to 2.0V 4.5 5.5 V

VCC = 0 to 4.75V, Bn = 0 to 2.0V,

p

Bias V = 4.5 to 5.5V
VCC = 4.5 to 5.5V, Bn = 0 to 2.0V,

Bias V = 4.5 to 5.5V

Bus voltage during prebias B0 – B8 = 0V, Bias V = 5.0V 1.62 2.1 V

Bn

Fall current during prebias B0 – B8 = 2V, Bias V = 4.5 to 5.5V 1 µA

LM

Rise current during prebias B0 – B8 = 1V, Bias V = 4.5 to 5.5V -1 µA

HM

Peak bus current during
insertion

p

Input glitch rejection VCC = 5.0V 1.0 1.35 ns

GR

VCC = 0 to 5.25V, B0 – B8 = 0 to 2.0V,
Bias V = 4.5 to 5.5V, OEB0 = 0.8V, tr = 2ns

V

= 0 to 5.25V, OEB0 = 0.8V 100

CC

V

= 0 to 2.2V, OEB0 = 0 to 5V 100

CC

1 mA

10 µA

10 mA

µ

DC ELECTRICAL CHARACTERISTICS

Over recommended operating free-air temperature range unless otherwise noted.

LIMITS

MIN TYP2MAX

I

I

OFF

V

V

V

I

OZH

I

OZL

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operation conditions for the applicable type.

2. All typical values are at V

3. Due to test equipment limitations, actual test conditions are V

High level output current B0 – B6 VCC = MAX, VIL = MAX, VIH = MIN, VOH = 2.1V 100 µA

OH

Power-off output current B0 – B6 VCC = 0.0V, VIL = MAX, VIH = MIN, VOH = 2.1V 100 µA

OH

High-level output
voltage

AO0 – AO6
AO0 – AO6

Low-level output voltage B0 – B6 VCC = MIN, VIL = MAX, VIH = MIN, IOL = 80mA .75 1.0 1.10 V

OL

3

VCC = MIN, VIL = MAX, VIH = MIN, IOH = -3mA 2.5 2.85 V

3

VCC = MIN, VIL = MAX, VIH = MIN, IOL = 24mA 0.33 0.5

VCC = MIN, VIL = MAX, VIH = MIN, IOL = 100mA 1.15

Input clamp voltage VCC = MIN, II = I

IK

Input current at

I

I

maximum input voltage

OEB0, OEBn,
OEAn, AI0 – AI6 VCC = MAX, VI = GND or 5.5V ±50 µA

IK

OEB0, OEBn,

I

High-level input current

IH

OEAn, AI0 – AI6 VCC = MAX, VI = 2.7V 20
B0 – B6 VCC = MAX, VI = 2.1V 100
OEB0, OEBn,

I

Low-level input current

IL

OEAn, AI0 – AI6

VCC = MAX, VI = 0.5V

B0 – B6 VCC = MAX, VI = 0.75V -100
Off-state output current AO0 – AO6 VCC = MAX, VO = 2.7V 50 µA
Off-state output current AO0 – AO6 VCC = MAX, VO = 0.5V -50 µA

I

Output current AO0 – AO6 only VCC = MAX -30 -55 -150 mA

O

I

(standby) VCC = MAX 19 30

CCZ

I

AIn to Bn VCC = MAX, outputs Low or High 40 60

pp

= 5V, TA = 25°C.

CC

CCB,

I

Bn to AOn VCC = MAX, outputs Low 22 35

CCA,

I

Bn to AOn VCC = MAX, outputs High 19 35

CCA,

= 1.8V and VIL = 1.3V for the B side.

IH

-1.2 V

-20

A

A

1995 May 25

7

Philips Semiconductors Product specification

FB20417-bit Futurebus+ transceiver

AC ELECTRICAL CHARACTERISTICS (Commercial)

A PORT LIMITS

T

= 0 to 70°C,

SYMBOL PARAMETER

TEST

CONDITION

T

= +25°C, VCC = 5V,

amb

CL = 50pF, RL = 500Ω

MIN TYP MAX MIN MAX

t

PLH

t

PHL

t

PZH

t

PZL

t

PHZ

t

PLZ

t

TLH

t

THL

tSK(o)

Propagation delay,
Bn

to AOn

Output enable time,
OEA to AOn

Output disable time,
OEA to AOn

Transition time, AOn Port
(10% to 90% or 90% to 10%)

Output skew between receivers
in same package

1

Waveform 1, 2

Waveform 4, 5

Waveform 4, 5

Test Circuit and

Waveforms

1.8

1.6

2.2

2.0

1.5

1.8

1.5

1.5

3.4

3.2

5.0

4.0

3.3

3.0

2.2

2.4

5.0

4.9

6.5

6.5

4.8

5.0

3.0

3.0

Waveform 3 0.4 1.0 1.0 ns

B PORT LIMITS

SYMBOL

t

PLH

t

PHL

t

PLH

t

PHL

t

PLH

t

PHL

t

TLH

t

THL

tSK(o)

PARAMETER TEST CONDITION

Propagation delay,
AIn to Bn

Enable/disable time,
OEB0 to Bn

Enable/disable time,
OEB1 to Bn

Transition time, Bn Port
(1.3V to 1.8V)

Output skew between drivers in
same package

1

Waveform 1, 2

Waveform 2

Waveform 1

Test Circuit and

Waveforms

Waveform 3 0.3 1.0 1.0 ns

T

= +25°C, VCC = 5V,

amb

CD = 30pF, RU = 9Ω

2.4

1.5

2.4

1.9

2.4

1.9

1.0

0.5

3.7

2.7

3.7

3.5

4.0

3.6

1.4

1.1

4.9

4.4

4.9

4.9

5.5

5.5

3.0

3.0

SYMBOL PARAMETER TEST CONDITION RU = 16.5Ω RU = 16.5Ω UNIT

t

PLH

t

PHL

t

PLH

t

PHL

t

PLH

t

PHL

t

TLH

t

THL

tSK(o)

Propagation delay,
AIn to Bn

Enable/disable time,
OEB0 to Bn

Enable/disable time,
OEB1 to Bn

Transition time, Bn Port
(1.3V to 1.8V)

Output skew between drivers in
same package

1

Waveform 1, 2

Waveform 2

Waveform 1

Test Circuit and

Waveforms

2.5

1.6

2.5

2.0

2.5

2.0

1.0

0.5

3.8

2.8

3.8

3.6

4.1

3.7

1.5

1.1

5.0

4.5

5.0

5.0

5.6

5.6

3.0

3.0

Waveform 3 0.3 1.0 1.0 ns

NOTES:

1.  t

actual – tPMactual for any data input to output path compared to any other data input to output path where N and M are either LH or

PN

HL. Skew times are valid only under same test conditions (temperature, V

, loading, etc.).

CC

amb

VCC = 5V±10%,

CL = 50pF, RL = 500Ω

1.6

1.6

2.0

1.8

1.2

1.5

1.5

1.5

T

= 0 to 70°C,

amb

VCC = 5V±10%,

5.5

5.0

10.0

8.0

5.0

5.5

3.5

3.5

CD = 30pF, RU = 9Ω

1.9

1.5

1.9

1.8

1.9

2.5

1.0

0.5

2.0

1.6

2.0

1.9

2.0

2.6

1.0

0.5

5.7

5.0

6.4

5.4

5.9

5.9

3.0

3.0

5.8

5.1

6.5

5.5

6.0

6.0

3.0

3.0

UNIT

ns

ns

ns

ns

UNIT

ns

ns

ns

ns

ns

ns

ns

ns

1995 May 25

8

Philips Semiconductors Product specification

FB20417-bit Futurebus+ transceiver

AC ELECTRICAL CHARACTERISTICS (Industrial)

A PORT LIMITS

T

= -40 to +85°C,

SYMBOL PARAMETER

TEST

CONDITION

T

= +25°C, VCC = 5V,

amb

CL = 50pF, RL = 500Ω

MIN TYP MAX MIN MAX

t

PLH

t

PHL

t

PZH

t

PZL

t

PHZ

t

PLZ

t

TLH

t

THL

tSK(o)

Propagation delay,
Bn

to AOn

Output enable time,
OEA to AOn

Output disable time,
OEA to AOn

Transition time, AOn Port
(10% to 90% or 90% to 10%)

Output skew between receivers
in same package

1

Waveform 1, 2

Waveform 4, 5

Waveform 4, 5

Test Circuit and

Waveforms

1.8

1.6

2.2

2.0

1.5

1.5

1.5

1.5

3.4

3.2

5.0

4.0

3.3

3.0

2.2

2.4

5.0

4.9

6.5

6.5

4.8

5.0

3.0

3.0

Waveform 3 0.4 1.0 1.0 ns

B PORT LIMITS

SYMBOL PARAMETER TEST CONDITION

t

PLH

t

PHL

t

PLH

t

PHL

t

PLH

t

PHL

t

TLH

t

THL

tSK(o)

Propagation delay,
AIn to Bn

Enable/disable time,
OEB0 to Bn

Enable/disable time,
OEB1 to Bn

Transition time, Bn Port
(1.3V to 1.8V)

Output skew between drivers in
same package

1

Waveform 1, 2

Waveform 2

Waveform 1

Test Circuit and

Waveforms

Waveform 3 0.3 1.0 1.0 ns

T

= +25°C, VCC = 5V,

amb

CD = 30pF, RU = 9Ω

2.4

1.5

2.4

1.9

2.4

1.9

1.0

0.5

3.7

2.7

3.7

3.5

4.0

3.6

1.4

1.1

4.9

4.4

4.9

4.9

5.5

5.5

3.0

3.0

SYMBOL PARAMETER TEST CONDITION RU = 16.5Ω RU = 16.5Ω UNIT

t

PLH

t

PHL

t

PLH

t

PHL

t

PLH

t

PHL

t

TLH

t

THL

tSK(o)

Propagation delay,
AIn to Bn

Enable/disable time,
OEB0 to Bn

Enable/disable time,
OEB1 to Bn

Transition time, Bn Port
(1.3V to 1.8V)

Output skew between drivers in
same package

1

Waveform 1, 2

Waveform 2

Waveform 1

Test Circuit and

Waveforms

2.5

1.6

2.5

2.0

2.5

2.0

1.0

0.5

3.8

2.8

3.8

3.6

4.1

3.7

1.5

1.1

5.0

4.5

5.0

5.0

5.5

5.5

3.0

3.0

Waveform 3 0.3 1.0 1.0 ns

NOTES:

1.  t

actual – tPMactual for any data input to output path compared to any other data input to output path where N and M are either LH or

PN

HL. Skew times are valid only under same test conditions (temperature, V

, loading, etc.).

CC

amb

VCC = 5V±10%,

CL = 50pF, RL = 500Ω

1.6

1.6

1.5

1.5

0.8

1.2

1.5

1.5

T

= -40 to +85°C,

amb

VCC = 5V±10%,

5.5

5.5

8.0

8.0

6.0

6.0

3.5

3.5

CD = 30pF, RU = 9Ω

1.9

1.5

1.9

1.8

1.9

1.5

1.0

0.5

2.0

1.6

2.0

1.9

2.0

1.6

1.0

0.5

5.9

5.0

6.4

5.9

6.8

6.8

3.0

3.0

6.0

5.1

6.5

6.0

6.9

6.9

3.0

3.0

UNIT

ns

ns

ns

ns

UNIT

ns

ns

ns

ns

ns

ns

ns

ns

1995 May 25

9

Philips Semiconductors Product specification

FB20417-bit Futurebus+ transceiver

AC WAVEFORMS

AIn, Bn or Bn

OEBn

AOn or Bn

V

M

t

PLH

V

M

t

PHL

V

M

V

M

Waveform 1. Propagation Delay for Data

or Output Enable to Output

AIn, Bn

AOn, Bn

OEA

AOn

V

M

t

PZH

V

M

t

PHZ

V

M

Waveform 3. Output Skews

VOH -0.3V

OV

Waveform 4. 3-State Output Enable Time to High Level

and Output Disable Time from High Level

NOTE: V

= 1.55V for Bn, V

M

V

M

tSK(o)

V

M

Waveform 5. 3-State Output Enable Time to Low Level

= 1.5V for all others.

M

AIn, Bn

OEB0

AOn, Bn

V

M

t

PHL

V

M

t

PLH

V

M

Waveform 2. Propagation Delay for Data

or Output Enable to Output

OEAn

AOn

V

M

t

PZL

V

M

t

PLZ

V

M

VOL +0.3V

and Output Disable Time from Low Level

V

M

SG00079

1995 May 25

10

Philips Semiconductors Product specification

FB20417-bit Futurebus+ transceiver

TEST CIRCUIT AND WAVEFORMS

V

CC

BIAS

V

PULSE

GENERATOR

V

IN

R

T

D.U.T.

V

OUT

Test Circuit for 3-State Outputs on A Port

SWITCH POSITION

TEST SWITCH

t
All other

PULSE

GENERATOR

PLZ,

t

PZL

V

IN

BIAS

V

V

D.U.T.

closed

open

CC

V

OUT

R

L

R

C

L

L

2.0V (for RU = 9 Ω)

2.1V (for RU = 16.5 Ω)

R

U

7.0V
NEGATIVE
PULSE

POSITIVE
PULSE

Family

FB+

A Port

90%

10%

t

W

V

M

10%

(tf)

t

THL

t

(tr)

TLH

90%

V

M

t

W

VM = 1.55V for Bn, VM = 1.5V for all others.

V

10%

90%

V

Input Pulse Definitions

INPUT PULSE REQUIREMENTS

Low V

0.0V

1.0VB Port

Rep. RateAmplitude t

1MHz3.0V
1MHz2.0V

t

500ns

M

M

W

2.5ns

2.5ns500ns

V

t

TLH

t

THL

LOW V

(tr)

(tf)

V

LOW V

IN

IN

90%

10%

TLHtTHL

2.5ns

2.5ns

R

T

Test Circuit for Outputs on B Port

C

D

DEFINITIONS:

RL= Load Resistor; see AC CHARACTERISTICS for value.
CL= Load capacitance includes jig and probe capacitance; see AC

CHARACTERISTICS for value.

R

= Termination resistance should be equal to Z

T

CD= Load capacitance includes jig and probe capacitance; see AC

of pulse generators.

OUT

CHARACTERISTICS for value.

RU= Pull up resistor; see AC CHARACTERISTICS for value.

SG00059

1995 May 25

11

Philips Semiconductors Product specification

FB20417-bit Futurebus+ transceivers

QFP52: plastic quad flat package; 52 leads (lead length 1.6 mm); body 10 x 10 x 2.0 mm SOT379-1

1995 May 25

12

Philips Semiconductors Product specification

FB20417-bit Futurebus+ transceivers

NOTES

1995 May 25

13

Philips Semiconductors Product specification

FB20417-bit Futurebus+ transceivers

Data sheet status

Data sheet
status

Objective
specification

Preliminary
specification

Product
specification

Product
status

Development

Qualification

Production

Definition

This data sheet contains the design target or goal specifications for product development.
Specification may change in any manner without notice.

This data sheet contains preliminary data, and supplementary data will be published at a later date.
Philips Semiconductors reserves the right to make chages at any time without notice in order to
improve design and supply the best possible product.

This data sheet contains final specifications. Philips Semiconductors reserves the right to make
changes at any time without notice in order to improve design and supply the best possible product.

[1]

[1] Please consult the most recently issued datasheet before initiating or completing a design.

Definitions

Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For

detailed information see the relevant data sheet or data handbook.
Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one

or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may affect device reliability.

Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or
modification.

Disclaimers

Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can

reasonably be expected to result in personal injury . Philips Semiconductors customers using or selling these products for use in such applications
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.

Right to make changes — Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless
otherwise specified.

Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Sunnyvale, California 94088–3409
Telephone [phone]

 Copyright Philips Electronics North America Corporation 1998

All rights reserved. Printed in U.S.A.

print code Date of release: 08-98
Document order number:

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1995 May 25

14