N-channel enhancement mode logicSYMBOLPARAMETERMAX.UNIT
level field-effectpowertransistorina
plastic envelope suitable for surfaceV
mounting using ’trench’ technology.I
Thedevicefeaturesverylow on-stateP
resistance and has integral zenerT
diodes giving ESD protection up toR
DS
D
tot
j
DS(ON)
2kV. It is intended for use inresistanceVGS = 5 V
automotive and general purpose
switching applications.
PINNING - SOT404PIN CONFIGURATIONSYMBOL
Drain-source voltage30V
Drain current (DC)75A
Total power dissipation142W
Junction temperature175˚C
Drain-source on-state10.5mΩ
PINDESCRIPTION
mb
d
1gate
2drain
3source
mbdrain
2
13
g
s
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOLPARAMETERCONDITIONSMIN.MAX.UNIT
V
V
±V
I
D
I
D
I
DM
P
T
DS
DGR
tot
stg
GS
, T
j
Drain-source voltage--30V
Drain-gate voltageRGS = 20 kΩ-30V
Gate-source voltage--10V
Drain current (DC)Tmb = 25 ˚C-75A
Drain current (DC)Tmb = 100 ˚C-53A
Drain current (pulse peak value)Tmb = 25 ˚C-240A
Total power dissipationTmb = 25 ˚C-142W
Storage & operating temperature-- 55175˚C
THERMAL RESISTANCES
SYMBOLPARAMETERCONDITIONSTYP.MAX.UNIT
R
th j-mb
Thermal resistance junction to--1.05K/W
mounting base
Fig.18. SOT404 : centre pin connected to mounting base.
11.5
2.5
9.0
17.5
2.0
3.8
5.08
Fig.19. SOT404 : soldering pattern for surface mounting
.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent
damage to MOS gate oxide.
2. Epoxy meets UL94 V0 at 1/8".
December 19977Rev 1.100
Page 8
Philips SemiconductorsProduct specification
TrenchMOS transistorBUK9610-30
Logic level FET
DEFINITIONS
Data sheet status
Objective specificationThis data sheet contains target or goal specifications for product development.
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.
Product specificationThis data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and
operation of the device at these or at any other conditions above those given in the Characteristics sections of
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
Philips Electronics N.V. 1997
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the
copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any
consequence of its use. Publication thereof does not convey nor imply any license under patent or other
industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these
products can be reasonably expected to result in personal injury. Philips customers using or selling these products
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting
from such improper use or sale.
December 19978Rev 1.100
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