Datasheet BUK9640-100A, BUK9540-100A Datasheet (Philips)

Page 1
Philips Semiconductors Product specification
TrenchMOS transistor BUK9540-100A Logic level FET BUK9640-100A
GENERAL DESCRIPTION QUICK REFERENCE DATA
N-channel enhancement mode logic SYMBOL PARAMETER MAX. UNIT level field-effectpowertransistorina plastic envelope available in V
DS
TO220AB and SOT404 . Using I
D
Drain current (DC) 37 A
trench’ technology which features P
tot
Total power dissipation 138 W
very low on-state resistance. It is T
j
Junction temperature 175 ˚C
intended for use in automotive and R
DS(ON)
Drain-source on-state general purpose switching resistance VGS = 5 V 40 m applications. VGS = 10 V 39 m
PINNING TO220AB & SOT404 PIN CONFIGURATION SYMBOL
PIN DESCRIPTION
1 gate 2 drain 3 source
tab/mb drain
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
DS
Drain-source voltage - - 100 V
V
DGR
Drain-gate voltage RGS = 20 k - 100 V
±V
GS
Gate-source voltage - - 10 V
±V
GSM
Non-repetitive gate-source voltage tp≤50µS - 15 V
I
D
Drain current (DC) Tmb = 25 ˚C - 37 A
I
D
Drain current (DC) Tmb = 100 ˚C - 26 A
I
DM
Drain current (pulse peak value) Tmb = 25 ˚C - 149 A
P
tot
Total power dissipation Tmb = 25 ˚C - 138 W
T
stg
, T
j
Storage & operating temperature - - 55 175 ˚C
THERMAL RESISTANCES
SYMBOL PARAMETER CONDITIONS TYP. MAX. UNIT
R
th j-mb
Thermal resistance junction to - - 1.1 K/W mounting base
R
th j-a
Thermal resistance junction to in free air 60 - K/W ambient(TO220AB)
R
th j-a
Thermal resistance junction to Minimum footprint, FR4 50 - K/W ambient(SOT404) board
123
tab
13
mb
2
SOT404
TO220AB
d
g
s
December 1999 1 Rev 1.000
Page 2
Philips Semiconductors Product specification
TrenchMOS transistor BUK9540-100A Logic level FET BUK9640-100A
STATIC CHARACTERISTICS
Tj= 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)DSS
Drain-source breakdown VGS = 0 V; ID = 0.25 mA; 100 - - V voltage Tj = -55˚C 89 - - V
V
GS(TO)
Gate threshold voltage VDS = VGS; ID = 1 mA 1 1.5 2.0 V
Tj = 175˚C 0.5 - - V
Tj = -55˚C - - 2.3 V
I
DSS
Zero gate voltage drain current VDS = 100 V; VGS = 0 V; - 0.05 10 µA
Tj = 175˚C - - 500 µA
I
GSS
Gate source leakage current VGS = ±10 V; VDS = 0 V - 2 100 nA
R
DS(ON)
Drain-source on-state VGS = 5 V; ID = 25 A - 30 40 m resistance Tj = 175˚C - - 100 m
VGS = 10 V; ID = 25 A - 29 39 m VGS = 4.5 V; ID = 25 A - 31 43 m
DYNAMIC CHARACTERISTICS
Tmb = 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
C
iss
Input capacitance VGS = 0 V; VDS = 25 V; f = 1 MHz - 2304 3072 pF
C
oss
Output capacitance - 222 266 pF
C
rss
Feedback capacitance - 151 207 pF
t
d on
Turn-on delay time VDD = 30 V; R
load
=1.2; - 20 30 ns
t
r
Turn-on rise time VGS = 5 V; RG = 10 - 135 189 ns
t
d off
Turn-off delay time - 125 189 ns
t
f
Turn-off fall time - 90 135 ns
L
d
Internal drain inductance Measured from drain lead 6 mm - 4.5 - nH
from package to centre of die
L
d
Internal drain inductance Measured from contact screw on - 3.5 - nH
tab to centre of die(TO220AB)
L
d
Internal drain inductance Measured from upper edge of drain - 2.5 - nH
tab to centre of die(SOT404)
L
s
Internal source inductance Measured from source lead to - 7.5 - nH
source bond pad
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
Tj = 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
DR
Continuous reverse drain - - 37 A current
I
DRM
Pulsed reverse drain current - - 149 A
V
SD
Diode forward voltage IF = 25 A; VGS = 0 V - 0.85 1.2 V
IF = 37 A; VGS = 0 V - 1.1 - V
t
rr
Reverse recovery time IF = 37 A; -dIF/dt = 100 A/µs; - 60 - ns
Q
rr
Reverse recovery charge VGS = -10 V; VR = 30 V - 0.24 - µC
December 1999 2 Rev 1.000
Page 3
Philips Semiconductors Product specification
TrenchMOS transistor BUK9540-100A Logic level FET BUK9640-100A
AVALANCHE LIMITING VALUE
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
W
DSS
1
Drain-source non-repetitive ID = 25 A; VDD 25 V; - - 31 mJ unclamped inductive turn-off VGS = 5 V; RGS = 50 ; Tmb = 25 ˚C energy
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/P
D 25 ˚C
= f(Tmb)
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/I
D 25 ˚C
= f(Tmb); conditions: VGS ≥ 5 V
Fig.3. Safe operating area. Tmb = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter t
p
Fig.4. Transient thermal impedance.
Z
th j-mb
= f(t); parameter D = tp/T
0 20 40 60 80 100 120 140 160 180
Tmb / C
PD%
Normalised Power Derating
120 110 100
90 80 70 60 50 40 30 20 10
0
1
1
10
100
1000
ID/A
10
100
1000
RDS(ON)=VDS/ID
DC
10us
100us
100ms
10ms
1ms
tp =
VDS/V
1us
0 20 40 60 80 100 120 140 160 180
Tmb / C
ID%
Normalised Current Derating
120 110 100
90 80 70 60 50 40 30 20 10
0
0.001
0.01
0.1
1
10
1E-07 1E-05 1E-03 1E-01 1E+01
t/s
Zth/(K/W)
0
0.02
0.05
0.1
0.2
0.5
1 For maximum permissible repetive avanche current see fig.18.
December 1999 3 Rev 1.000
Page 4
Philips Semiconductors Product specification
TrenchMOS transistor BUK9540-100A Logic level FET BUK9640-100A
Fig.5. Typical output characteristics, Tj = 25 ˚C
.
ID = f(VDS); parameter V
GS
Fig.6. Typical on-state resistance, Tj = 25 ˚C
.
R
DS(ON)
= f(ID); parameter V
GS
Fig.7. Typical on-state resistance, Tj = 25 ˚C
.
R
DS(ON)
= f(VGS); conditions: ID = 25 A;
Fig.8. Typical transfer characteristics.
ID = f(VGS) ; conditions: VDS = 25 V; parameter T
j
Fig.9. Typical transconductance, Tj = 25 ˚C
.
gfs = f(ID); conditions: VDS = 25 V
Fig.10. Normalised drain-source on-state resistance.
a = R
DS(ON)/RDS(ON)25 ˚C
= f(Tj); ID = 25 A; VGS = 5 V
0
20
40
60
80
100
120
0246810
VDS/V
ID/A
2.4
2.6
2.8
3.0
3.2
3.4
3.6
3.8
4.0
5.0
10.0
VGS/V =
0
5
10
15
20
25
30
35
40
012345678910
Gate-source voltage, VGS (V)
Drain current, ID (A)
VDS > ID X RDS(ON)
Tj = 25 C
175 C
20
25
30
35
40
45
50
10 20 30 40 50 60 70
VDS/V
ID/A
3.0
3.2
3.4
3.6
4.0
5.0
0
10
20
30
40
50
60
70
0 10203040
ID/A
gfs/S
26
28
30
32
34
36
38
345678910
VGS/V
RDS(ON) Ohm
0.5
1
1.5
2
2.5
3
-100 -50 0 50 100 150 200 Tmb / degC
a
Rds(on) normalised to 25degC
December 1999 4 Rev 1.000
Page 5
Philips Semiconductors Product specification
TrenchMOS transistor BUK9540-100A Logic level FET BUK9640-100A
Fig.11. Gate threshold voltage.
V
GS(TO)
= f(Tj); conditions: ID = 1 mA; VDS = V
GS
Fig.12. Sub-threshold drain current.
ID = f(V
GS)
; conditions: Tj = 25 ˚C; VDS = V
GS
Fig.13. Typical capacitances, C
iss
, C
oss
, C
rss
.
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
Fig.14. Typical turn-on gate-charge characteristics.
V
GS
= f(QG); conditions: ID = 25 A; parameter V
DS
Fig.15. Typical reverse diode current.
IF = f(V
SDS
); conditions: V
GS
= 0 V; parameter T
j
Fig.16. Normalised avalanche energy rating.
W
DSS
% = f(Tmb); conditions: ID = 75 A
-100 -50 0 50 100 150 200
0
0.5
1
1.5
2
2.5
Tj / C
VGS(TO) / V
max.
typ.
min.
0
1
2
3
4
5
0 1020304050
QG / nC
VGS / V
VDS = 14V
VDS = 44V
0 0.5 1 1.5 2 2.5 3
1E-05
1E-05
1E-04
1E-03
1E-02
1E-01
Sub-Threshold Conduction
2% typ
98%
0
5
10
15
20
25
30
35
40
45
50
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 1.1 1.2 1.3 1.4 1.5
Source-Drain Voltage, VSDS (V)
Source-Drain Diode Current, IF (A)
Tj = 25 C
175 C
VGS = 0 V
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
0.01 0.1 1 10 100 VDS/V
Capacitance/nF
Ciss
Coss Crss
20 40 60 80 100 120 140 160 180
Tmb / C
120 110 100
90 80 70 60 50 40 30 20 10
0
WDSS%
December 1999 5 Rev 1.000
Page 6
Philips Semiconductors Product specification
TrenchMOS transistor BUK9540-100A Logic level FET BUK9640-100A
Fig.17. Avalanche energy test circuit.
Fig.18. Maximum permissible repetitive avalanche
current(IAV) versus avalanche time(tAV) for unclamped
inductive loads.
Fig.19. Switching test circuit.
L
T.U.T.
VDD
RGS
R 01
VDS
-ID/100
+
-
shunt
VGS
0
RD
T.U.T.
VDD
RG
VDS
+
-
VGS
0
W
DSS
= 0.5 LI
D
2
BV
DSS
/(BV
DSS−VDD
)
1
10
100
0.001 0.01 0.1 1 10
Avalanche Time, tAV (ms)
I
AV
Tj prior to avanche 150ºC
25ºC
December 1999 6 Rev 1.000
Page 7
Philips Semiconductors Product specification
TrenchMOS transistor BUK9540-100A Logic level FET BUK9640-100A
MECHANICAL DATA
Dimensions in mm Net Mass: 2 g
Fig.20. SOT78 (TO220AB); pin 2 connected to mounting base.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent damage to MOS gate oxide.
2. Refer to mounting instructions for SOT78 (TO220) envelopes.
3. Epoxy meets UL94 V0 at 1/8".
10,3 max
3,7
2,8
3,0
3,0 max
not tinned
1,3
max
(2x)
123
2,4
0,6
4,5 max
5,9
min
15,8
max
1,3
2,54 2,54
0,9 max (3x)
13,5
min
December 1999 7 Rev 1.000
Page 8
Philips Semiconductors Product specification
TrenchMOS transistor BUK9540-100A Logic level FET BUK9640-100A
MECHANICAL DATA
Fig.21. SOT404 surface mounting package. Centre pin connected to mounting base.
Notes
1. This product is supplied in anti-static packaging. The gate-source input must be protected against static discharge during transport or handling.
2. Refer to SMD Footprint Design and Soldering Guidelines, Data Handbook SC18.
3. Epoxy meets UL94 V0 at 1/8".
UNIT
A
REFERENCES
OUTLINE
VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC JEDEC EIAJ
mm
A
1
D
1
D
max.
E
eLpHDQc
2.54
2.60
2.20
15.40
14.80
2.90
2.10
11
1.60
1.20
10.30
9.70
4.50
4.10
1.40
1.27
0.85
0.60
0.64
0.46
b
DIMENSIONS (mm are the original dimensions)
SOT404
0 2.5 5 mm
scale
Plastic single-ended surface mounted package (Philips version of D2-PAK); 3 leads (one lead cropped)
SOT404
e e
E
b
D
1
H
D
D
Q
L
p
c
A
1
A
13
2
mounting
base
98-12-14 99-06-25
December 1999 8 Rev 1.000
Page 9
Philips Semiconductors Product specification
TrenchMOS transistor BUK9540-100A Logic level FET BUK9640-100A
MOUNTING INSTRUCTIONS
Dimensions in mm
Fig.22. SOT404 : soldering pattern for surface mounting
.
DEFINITIONS
Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
Philips Electronics N.V. 1999
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent or other industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these products can be reasonably expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
17.5
11.5
9.0
5.08
3.8
2.0
December 1999 9 Rev 1.000
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