Datasheet BUK7608-55A Datasheet (Philips)

Page 1
Philips Semiconductors Product specification
TrenchMOS transistor BUK7608-55 Standard level FET
GENERAL DESCRIPTION QUICK REFERENCE DATA
N-channel enhancement mode SYMBOL PARAMETER MAX. UNIT standard level field-effect power transistor in a plastic envelope V suitable for surface mounting. Using I ’trench technology the device P featuresverylow on-state resistance T and has integral zener diodes giving R
DS
D
tot j
DS(ON)
ESD protection up to 2kV. It is resistance VGS = 10 V intended for use in automotive and general purpose switching applications.
PINNING - SOT404 PIN CONFIGURATION SYMBOL
PIN DESCRIPTION
mb
d
1 gate 2 drain 3 source
mb drain
2
13
g
s
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V V ±V I
D
I
D
I
DM
P T
DS DGR
tot
stg
GS
, T
j
Drain-source voltage - - 55 V Drain-gate voltage RGS = 20 k -55V Gate-source voltage - - 16 V Drain current (DC) Tmb = 25 ˚C - 75 A Drain current (DC) Tmb = 100 ˚C - 65 A Drain current (pulse peak value) Tmb = 25 ˚C - 240 A Total power dissipation Tmb = 25 ˚C - 187 W Storage & operating temperature - - 55 175 ˚C
ESD LIMITING VALUE
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
C
Electrostatic discharge capacitor Human body model - 2 kV voltage, all pins (100 pF, 1.5 k)
THERMAL RESISTANCES
SYMBOL PARAMETER CONDITIONS TYP. MAX. UNIT
R
th j-mb
R
th j-a
April 1998 1 Rev 1.000
Thermal resistance junction to - - 0.8 K/W mounting base Thermal resistance junction to Minimum footprint, FR4 50 - K/W ambient board
Page 2
Philips Semiconductors Product specification
TrenchMOS transistor BUK7608-55
Standard level FET
STATIC CHARACTERISTICS
Tj= 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)DSS
V
GS(TO)
I
DSS
I
GSS
±V R
DS(ON)
(BR)GSS
Drain-source breakdown VGS = 0 V; ID = 0.25 mA; 55 - - V voltage Tj = -55˚C 50 - - V Gate threshold voltage VDS = VGS; ID = 1 mA 2 3.0 4.0 V
Tj = 175˚C 1 - - V
Tj = -55˚C - - 4.4 V
Zero gate voltage drain current VDS = 55 V; VGS = 0 V; - 0.05 10 µA
Tj = 175˚C - - 500 µA
Gate source leakage current VGS = ±10 V; VDS = 0 V - 0.02 1 µA
Tj = 175˚C - - 20 µA Gate-source breakdown IG = ±1 mA; 16 - - V voltage Drain-source on-state VGS = 10 V; ID = 25 A - 6.5 8 m resistance Tj = 175˚C - - 17 m
DYNAMIC CHARACTERISTICS
Tmb = 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
g C
C C
t t t t
L
fs
iss oss rss
d on r d off f
d
Forward transconductance VDS = 25 V; ID = 25 A 10 45 - S Input capacitance VGS = 0 V; VDS = 25 V; f = 1 MHz - 3600 4500 pF
Output capacitance - 830 1000 pF Feedback capacitance - 320 440 pF
Turn-on delay time VDD = 30 V; ID = 25 A; - 27 40 ns Turn-on rise time VGS = 10 V; RG = 10 - 70 105 ns Turn-off delay time Resistive load - 100 140 ns Turn-off fall time - 50 70 ns
Internal drain inductance Measured from upper edge of drain - 2.5 - nH
tab to centre of die
L
s
Internal source inductance Measured from source lead - 7.5 - nH
soldering point to source bond pad
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
Tj = 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
DR
I
DRM
V
t
rr
Q
SD
rr
Continuous reverse drain - - 75 A current Pulsed reverse drain current - - 240 A Diode forward voltage IF = 25 A; VGS = 0 V - 0.85 1.2 V
IF = 75 A; VGS = 0 V - 1.0 - V
Reverse recovery time IF = 75 A; -dIF/dt = 100 A/µs; - 65 - ns Reverse recovery charge VGS = -10 V; VR = 30 V - 0.18 - µC
April 1998 2 Rev 1.000
Page 3
Philips Semiconductors Product specification
TrenchMOS transistor BUK7608-55
Standard level FET
AVALANCHE LIMITING VALUE
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
W
DSS
Drain-source non-repetitive ID = 75 A; VDD 25 V; - - 500 mJ unclamped inductive turn-off VGS = 10 V; RGS = 50 ; Tmb = 25 ˚C energy
PD%
120 110 100
90 80 70 60 50 40 30 20 10
0
0 20 40 60 80 100 120 140 160 180
Normalised Power Derating
Tmb / C
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/P
ID%
120 110 100
90 80 70 60 50 40 30 20 10
0
0 20 40 60 80 100 120 140 160 180
Tmb / C
= f(Tmb)
D 25 ˚C
Normalised Current Derating
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/I
= f(Tmb); conditions: VGS ≥ 5 V
D 25 ˚C
1000
ID / A
RDS(ON) = VDS/ID
100
10
1
1
DC
10
VDS / V
BUKX508-55
tp = 10 us 100 us
1 ms 10 ms
100 ms
100
Fig.3. Safe operating area. Tmb = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter t
Zth / (K/W)
1E+00
0.5
1E-01
1E-02
1E-03
0.2
0.1
0.05
t
p
t / s
P
D
0.02
0
1E-07 1E-05 1E-03 1E-01 1E+01
t
p
D =
T
t
T
Fig.4. Transient thermal impedance.
Z
= f(t); parameter D = tp/T
th j-mb
p
April 1998 3 Rev 1.000
Page 4
Philips Semiconductors Product specification
TrenchMOS transistor BUK7608-55 Standard level FET
100
ID/A
80
60
40
20
0
6.516 10
0246810
VDS/V
VGS/V = 6.0
5.5
5.0
4.5
4.0
Fig.5. Typical output characteristics, Tj = 25 ˚C
RDS(ON)/mOhm
15
VGS/V=
10
5
ID = f(VDS); parameter V
GS
BUK7508-55
65.5
6.5 7
8
10
70
gfs/S
60
50
40
30
20
10
0
0 20406080100
.
Fig.8. Typical transconductance, Tj = 25 ˚C
ID/A
.
gfs = f(ID); conditions: VDS = 25 V
2.5
1.5
a
2
1
BUK959-60
Rds(on) normlised to 25degC
0
0 20406080100120
Fig.6. Typical on-state resistance, Tj = 25 ˚C
R
DS(ON)
100
ID/A
80
60
40
20
0
01234567
ID/A
= f(ID); parameter V
Tj/C = 175 25
VGS/V
.
GS
Fig.7. Typical transfer characteristics.
ID = f(VGS) ; conditions: VDS = 25 V; parameter T
j
0.5
-100 -50 0 50 100 150 200 Tmb / degC
Fig.9. Normalised drain-source on-state resistance.
a = R
DS(ON)/RDS(ON)25 ˚C
VGS(TO) / V
5
max.
4
typ.
3
min.
2
1
0
-100 -50 0 50 100 150 200
= f(Tj); ID = 25 A; VGS = 5 V
BUK759-60
Tj / C
Fig.10. Gate threshold voltage.
V
= f(Tj); conditions: ID = 1 mA; VDS = V
GS(TO)
GS
April 1998 4 Rev 1.000
Page 5
Philips Semiconductors Product specification
TrenchMOS transistor BUK7608-55 Standard level FET
1E-01
1E-02
1E-03
1E-04
1E-05
1E-06
012345
2%
Sub-Threshold Conduction
typ
98%
Fig.11. Sub-threshold drain current.
ID = f(V
7
6
5
4
3
Thousands pF
2
1
0
0.01 0.1 1 10 100
Fig.12. Typical capacitances, C
; conditions: Tj = 25 ˚C; VDS = V
GS)
VDS/V
, C
iss
oss
, C
GS
rss
Ciss
Coss Crss
.
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
100
IF/A
80
60
Tj/C = 175 25
40
20
0
0 0.2 0.4 0.6 0.8 1 1.2
VSDS/V
Fig.14. Typical reverse diode current.
IF = f(V
120 110 100
90 80 70 60 50 40 30 20 10
0
); conditions: V
SDS
WDSS%
20 40 60 80 100 120 140 160 180
= 0 V; parameter T
GS
Tmb / C
Fig.15. Normalised avalanche energy rating.
W
% = f(Tmb); conditions: ID = 75 A
DSS
j
12
VGS/V
10
8
6
4
2
0
0 102030405060708090100
VDS = 14V
QG/nC
Fig.13. Typical turn-on gate-charge characteristics.
V
= f(QG); conditions: ID = 50 A; parameter V
GS
BUK7508-55
VDS = 44V
DS
L
VDS
VGS
0
RGS
T.U.T.
Fig.16. Avalanche energy test circuit.
W
= 0.5 LI
DSS
D
2
BV
DSS
/(BV
R 01
shunt
DSS−VDD
VDD
+
-
-ID/100
)
April 1998 5 Rev 1.000
Page 6
Philips Semiconductors Product specification
TrenchMOS transistor BUK7608-55 Standard level FET
VDD
+
RD
VDS
VGS
0
RG
T.U.T.
Fig.17. Switching test circuit.
-
April 1998 6 Rev 1.000
Page 7
Philips Semiconductors Product specification
TrenchMOS transistor BUK7608-55
Standard level FET
MECHANICAL DATA
Dimensions in mm Net Mass: 1.4 g
2.54 (x2)
MOUNTING INSTRUCTIONS
Dimensions in mm
10.3 max
11 max
15.4
0.85 max (x2)
4.5 max
1.4 max
0.5
Fig.18. SOT404 : centre pin connected to mounting base.
11.5
2.5
9.0
17.5
2.0
3.8
5.08
Fig.19. SOT404 : soldering pattern for surface mounting
.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent damage to MOS gate oxide.
2. Epoxy meets UL94 V0 at 1/8".
April 1998 7 Rev 1.000
Page 8
Philips Semiconductors Product specification
TrenchMOS transistor BUK7608-55
Standard level FET
DEFINITIONS
Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
Philips Electronics N.V. 1998
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent or other industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these products can be reasonably expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
April 1998 8 Rev 1.000
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