Datasheet BUK581-60A Datasheet (Philips)

Page 1
Philips Semiconductors Product Specification
PowerMOS transistor BUK581-60A Logic level FET

GENERAL DESCRIPTION QUICK REFERENCE DATA

N-channel enhancement mode SYMBOL PARAMETER MAX. UNIT logic level field-effect power transistor in a plastic envelope V suitable for surface mount I applications. P The device is intended for use in T automotive and general purpose R
DS
D
tot j
DS(ON)
switching applications. resistance; VGS = 5 V

PINNING - SOT223 PIN CONFIGURATION SYMBOL

PIN DESCRIPTION
4
d
1 gate 2 drain 3 source 4 drain (tab)
1
23
g
s

LIMITING VALUES

Limiting values in accordance with the Absolute Maximum System (IEC 134)

SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT

V
DS
V
DGR
±VGSGate-source voltage - - 15 V I
D
I
D
I
DM
P
tot
T
stg
T
j
Drain-source voltage - - 60 V Drain-gate voltage RGS = 20 k -60V
Drain current (DC) T Drain current (DC) T Drain current (pulse peak value) T Total power dissipation T
= 25 ˚C - 1.5 A
amb
= 100 ˚C - 1 A
amb
= 25 ˚C - 6 A
amb
= 25 ˚C - 1.5 W
amb
Storage temperature - - 55 150 ˚C Junction Temperature - - 150 ˚C

THERMAL RESISTANCES

SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
R R
th j-sp th j-amb
From junction to solder point From junction to ambient Mounted on PCB of Fig.18 - - 85 K/W
1
Mounted on any PCB . - 14 17 K/W
1 Temperature measured at solder joint on drain tab.
October 1995 1 Rev 1.100
Page 2
Philips Semiconductors Product Specification
PowerMOS transistor BUK581-60A Logic level FET

STATIC CHARACTERISTICS

Tj = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)DSS
V
GS(TO)
I
DSS
I
DSS
I
GSS
R
DS(ON)

DYNAMIC CHARACTERISTICS

Tj = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
g
fs
C
iss
C
oss
C
rss
t
d on
t
r
t
d off
t
f
Drain-source breakdown VGS = 0 V; ID = 0.25 mA 60 - - V voltage Gate threshold voltage VDS = VGS; ID = 0.1 mA 1.0 1.5 2.0 V Zero gate voltage drain current VDS = 60 V; VGS = 0 V; - 1 10 µA Zero gate voltage drain current VDS = 60 V; VGS = 0 V; Tj = 125 ˚C - 0.1 1.0 mA Gate source leakage current VGS = ±15 V; VDS = 0 V - 10 100 nA Drain-source on-state VGS = 5 V; ID = 1.5 A - 0.28 0.40 resistance
Forward transconductance VDS = 25 V; ID = 1.5 A 1.0 2.2 - S Input capacitance VGS = 0 V; VDS = 25 V; f = 1 MHz - 170 300 pF
Output capacitance - 60 100 pF Feedback capacitance - 25 50 pF
Turn-on delay time VDD = 30 V; ID = 3 A; - 7 10 ns Turn-on rise time VGS = 5 V; RGS = 50 ; - 45 55 ns Turn-off delay time R Turn-off fall time - 25 35 ns
= 50 - 1525ns
gen

REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS

Tj = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
DR
I
DRM
V t
rr
Q
SD
rr
Continuous reverse drain - - - 1.5 A current Pulsed reverse drain current - - - 6 A Diode forward voltage IF = 1.5 A; VGS = 0 V - 0.85 1.1 V
Reverse recovery time IF = 1.5 A; -dIF/dt = 100 A/µs; - 30 - ns Reverse recovery charge VGS = -10 V; VR = 30 V - 50 - nC

AVALANCHE LIMITING VALUE

SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
W
DSS
Drain-source non repetitive ID = 1.5 A ; VDD < 25 V - - 10 mJ unclamped inductive turn-off VGS = 5 V ; RGS = 50 energy T
= 25 ˚C
amb
October 1995 2 Rev 1.100
Page 3
Philips Semiconductors Product Specification
PowerMOS transistor BUK581-60A Logic level FET
PD%
120 110 100
90 80 70 60 50 40 30 20 10
0
0 20 40 60 80 100 120 140
Normalised Power Derating
Tamb / C
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/P
ID%
120 110 100
90 80 70 60 50 40 30 20 10
0
0 20 40 60 80 100 120 140
Tamb / C
= f(T
D 25 ˚C
Normalised Current Derating
amb
)
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/I
D 25 ˚C
= f(T
); conditions: VGS ≥ 5 V
amb
ID / A
10
1
0.1
0.01
RDS(ON) = VDS/ID
DC
0.1 1 10 100 VDS / V
Fig.4. Safe operating area T
ID & I
f(VDS); IDM single pulse; parameter t
DM =
ID / A
5
10
4.5
4
3
2
1
0
0 2 4 6 8 10
5
VDS / V
BUK581-60A
tp = 100 us
1 ms
10 ms
100 ms 1 s
10 s
= 25 ˚C
amb
BUK581-60A
VGS / V = 2.5
p
4
3.5
3
Fig.5. Typical output characteristics, Tj = 25 ˚C
ID = f(VDS); parameter V
GS
.
Zth j-amb / (K/W)
1E+02
D =
0.5
1E+01
1E+00
0.2
0.1
0.05
0.02
t
P
p
D
1E-01
T
1E-02
1E-07 1E-05 1E-03 1E-01 1E+01 1E+03
t / s
Fig.3. Transient thermal impedance.
Z
= f(t); parameter D = tp/T
th j-amb
BUKX81
t
p
D =
T
t
RDS(ON) / Ohm
1
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1 0
0 2 4
34
135
3.5
ID / A
Fig.6. Typical on-state resistance, Tj = 25 ˚C
R
= f(ID); parameter V
DS(ON)
BUK581-60A
4.5 5
VGS / V = 10
.
GS
October 1995 3 Rev 1.100
Page 4
Philips Semiconductors Product Specification
PowerMOS transistor BUK581-60A Logic level FET
3
BUK581-60A
150
5
ID / A
5
4
Tj / C = 25
3
2
1
0
0 2 4
1
VGS / V
Fig.7. Typical transfer characteristics.
ID = f(VGS) ; conditions: VDS = 25 V; parameter T
gfs / S
3
2.8
2.6
2.4
2.2 2
1.8
1.6
1.4
1.2 1
0.8
0.6
0.4
0.2 0
0 2 4
1
ID / A
Fig.8. Typical transconductance, Tj = 25 ˚C
BUK581-60A
35
.
gfs = f(ID); conditions: VDS = 25 V
VGS(TO) / V
2
1
0
-60 -40 -20 0 20 40 60 80 100 120 140
max.
typ.
min.
Tj / C
Fig.10. Gate threshold voltage.
V
j
= f(Tj); conditions: ID = 0.1 mA; VDS = V
GS(TO)
ID / A
1E-02
1E-03
1E-04
1E-05
1E-06
1E-07
00.4 0.8 1.2 1.6 2 2.4
SUB-THRESHOLD CONDUCTION SIZE 1
2 %
VGS / V
typ
98 %
GS
Fig.11. Sub-threshold drain current.
ID = f(VGS); conditions: Tj = 25 ˚C; VDS = V
GS
a
1.5
1.0
0.5
0
-60 -40 -20 0 20 40 60 80 100 120 140
Normalised RDS(ON) = f(Tj)
Tj / C
Fig.9. Normalised drain-source on-state resistance.
a = R
DS(ON)/RDS(ON)25 ˚C
= f(Tj); ID = 1.5 A; VGS = 5 V
C / pF
1000
100
10
0 20 40
10 30
VDS / V
Fig.12. Typical capacitances, C
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
BUK581-60A
, C
iss
oss
Ciss
Coss
Crss
, C
rss
.
October 1995 4 Rev 1.100
Page 5
Philips Semiconductors Product Specification
PowerMOS transistor BUK581-60A Logic level FET
VGS / V
10
9 8 7 6 5 4 3 2 1 0
0 2 4 6 8 10
QG / nC
BUK581-60A
48 VDS / V =12
Fig.13. Typical turn-on gate-charge characteristics.
V
= f(QG); conditions: ID = 1.5 A; parameter V
GS
IF / A
5
4
3
2
BUK581-60A
25Tj / C = 150
DS
WDSS% Normalised Avalanche Energy
120 110 100
90 80 70 60 50 40 30 20 10
0
20 40 60 80 100 120 140
Tamb/ C
Fig.15. Normalised avalanche energy rating.
W
% = f(T
DSS
); conditions: ID = 1.5 A
amb
+
L
VDS
VGS
0
T.U.T.
-
VDD
-ID/100
1
0
0 1
0.5 VSDS / V
Fig.14. Typical reverse diode current.
IF = f(V
); conditions: V
SDS
= 0 V; parameter T
GS
1.5
RGS
Fig.16. Avalanche energy test circuit.
W
= 0.5 LI
j
DSS
D
2
BV
DSS
/(BV
R 01
shunt
DSS−VDD
)
October 1995 5 Rev 1.100
Page 6
Philips Semiconductors Product Specification
PowerMOS transistor BUK581-60A Logic level FET

MOUNTING INSTRUCTIONS

Dimensions in mm.
3.8
min
1.5
min
1.5
min (3x)
1.5
min
Fig.17. soldering pattern for surface mounting
SOT223.
2.3
4.6
6.3

PRINTED CIRCUIT BOARD

Dimensions in mm.
36
18
60
4.6
9
10
7
50
15
Fig.18. PCB for thermal resistance and power rating
for SOT223.
PCB: FR4 epoxy glass (1.6 mm thick), copper
laminate (35 µm thick).
4.5
October 1995 6 Rev 1.100
Page 7
Philips Semiconductors Product Specification
PowerMOS transistor BUK581-60A Logic level FET

MECHANICAL DATA

Dimensions in mm Net Mass: 0.11 g
16
max
1.8
max
0.32
0.24
0.10
0.02
10 max
13
1.05
0.85
6.7
6.3
3.1
2.9
4
1
2.3
23
0.80
0.60
4.6
B
A
7.3
6.7
M
B
0.1
3.7
3.3
(4x)
Fig.19. SOT223 surface mounting package.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent damage to MOS gate oxide.
2. Refer to surface mounting instructions for SOT223 envelope.
3. Epoxy meets UL94 V0 at 1/8".
AM0.2
October 1995 7 Rev 1.100
Page 8
Philips Semiconductors Product Specification
PowerMOS transistor BUK581-60A Logic level FET

DEFINITIONS

Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
Philips Electronics N.V. 1996
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent or other industrial or intellectual property rights.

LIFE SUPPORT APPLICATIONS

These products are not designed for use in life support appliances, devices or systems where malfunction of these products can be reasonably expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
October 1995 8 Rev 1.100
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