Datasheet BUK555-60B, BUK555-60A Datasheet (Philips)

Page 1
Philips Semiconductors Product Specification
PowerMOS transistor BUK555-60A/B Logic level FET

GENERAL DESCRIPTION QUICK REFERENCE DATA

N-channel enhancement mode SYMBOL PARAMETER MAX. MAX. UNIT logic level field-effect power transistor in a plastic envelope. BUK555 -60A -60B The device is intended for use in V Switched Mode Power Supplies I (SMPS), motor control, welding, P DC/DC and AC/DC converters, and T in automotive and general purpose R switching applications. resistance; VGS = 5 V
D
tot j
DS(ON)

PINNING - TO220AB PIN CONFIGURATION SYMBOL

Drain-source voltage 60 60 V Drain current (DC) 39 35 A Total power dissipation 125 125 W Junction temperature 175 175 ˚C Drain-source on-state 0.042 0.055
PIN DESCRIPTION
tab
d
1 gate 2 drain 3 source
tab drain
123
g
s

LIMITING VALUES

Limiting values in accordance with the Absolute Maximum System (IEC 134)

SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT

V
V
DGR
±V
GS
±V
GSM
I
D
I
D
I
DM
P
tot
T
stg
T
j
Drain-source voltage - - 60 V Drain-gate voltage RGS = 20 k -60V Gate-source voltage - - 15 V Non-repetitive gate-source voltage tp 50 µs - 20 V
-60A -60B
Drain current (DC) Tmb = 25 ˚C - 39 35 A Drain current (DC) Tmb = 100 ˚C - 28 25 A Drain current (pulse peak value) Tmb = 25 ˚C - 156 140 A
Total power dissipation Tmb = 25 ˚C - 125 W Storage temperature - - 55 175 ˚C Junction Temperature - - 175 ˚C

THERMAL RESISTANCES

SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
R
th j-mb
R
th j-a
April 1993 1 Rev 1.100
Thermal resistance junction to - - 1.2 K/W mounting base Thermal resistance junction to - 60 - K/W ambient
Page 2
Philips Semiconductors Product Specification
PowerMOS transistor BUK555-60A/B Logic level FET

STATIC CHARACTERISTICS

Tmb = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)DSS
V
GS(TO)
I
DSS
I
DSS
I
GSS
R
DS(ON)

DYNAMIC CHARACTERISTICS

Tmb = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
g
fs
C
iss
C
oss
C
rss
t
d on
t
r
t
d off
t
f
L
d
L
d
L
s
Drain-source breakdown VGS = 0 V; ID = 0.25 mA 60 - - V voltage Gate threshold voltage VDS = VGS; ID = 1 mA 1.0 1.5 2.0 V Zero gate voltage drain current VDS = 60 V; VGS = 0 V; Tj = 25 ˚C - 1 10 µA Zero gate voltage drain current VDS = 60 V; VGS = 0 V; Tj =125 ˚C - 0.1 1.0 mA Gate source leakage current VGS = ±15 V; VDS = 0 V - 10 100 nA Drain-source on-state VGS = 5 V; BUK555-60A - 0.035 0.042 resistance ID = 20 A BUK555-60B - 0.045 0.055
Forward transconductance VDS = 25 V; ID = 20 A 11 20 - S Input capacitance VGS = 0 V; VDS = 25 V; f = 1 MHz - 1450 1750 pF
Output capacitance - 500 600 pF Feedback capacitance - 220 275 pF
Turn-on delay time VDD = 30 V; ID = 3 A; - 25 40 ns Turn-on rise time VGS = 5 V; RGS = 50 ; - 120 150 ns Turn-off delay time R Turn-off fall time - 110 145 ns
= 50 - 160 220 ns
gen
Internal drain inductance Measured from contact screw on - 3.5 - nH
tab to centre of die
Internal drain inductance Measured from drain lead 6 mm - 4.5 - nH
from package to centre of die
Internal source inductance Measured from source lead 6 mm - 7.5 - nH
from package to source bond pad

REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS

Tmb = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
DR
I
DRM
V t
rr
Q
rr
Continuous reverse drain - - - 39 A current Pulsed reverse drain current - - - 156 A Diode forward voltage IF = 39 A ; VGS = 0 V - 1.4 2.0 V
Reverse recovery time IF = 39 A; -dIF/dt = 100 A/µs; - 60 - ns Reverse recovery charge VGS = 0 V; VR = 30 V - 0.30 - µC

AVALANCHE LIMITING VALUE

Tmb = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
W
DSS
April 1993 2 Rev 1.100
Drain-source non-repetitive ID = 39 A ; VDD 25 V ; - - 90 mJ unclamped inductive turn-off VGS = 5 V ; RGS = 50 energy
Page 3
Philips Semiconductors Product Specification
PowerMOS transistor BUK555-60A/B Logic level FET
PD%
120 110 100
90 80 70 60 50 40 30 20 10
0
0 20 40 60 80 100 120 140 160 180
Normalised Power Derating
Tmb / C
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/P
ID%
120 110 100
90 80 70 60 50 40 30 20 10
0
0 20 40 60 80 100 120 140 160 180
Tmb / C
= f(Tmb)
D 25 ˚C
Normalised Current Derating
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/I
= f(Tmb); conditions: VGS ≥ 5 V
D 25 ˚C
Zth j-mb / (K/W)
10
D =
1
0.5
0.2
0.1
0.1
0.05
0.02
0.01
0.001
0
1E-07 1E-05 1E-03 1E-01 1E+01
t / s
P
D
BUKx55-lv
p
p
t
t
D =
T
t
T
Fig.4. Transient thermal impedance.
Z
= f(t); parameter D = tp/T
th j-mb
ID / A
100
80
60
40
20
0
0 2 4 6 8 10
10
7
VDS / V
BUK555-50A
VGS / V =
5
4
3
Fig.5. Typical output characteristics, Tj = 25 ˚C
ID = f(VDS); parameter V
GS
.
ID / A
1000
100
RDS(ON) = VDS/ID
10
1
1 100
DC
10
A
B
VDS / V
BUK555-60
tp = 10 us
100 us
1 ms 10 ms
100 ms
Fig.3. Safe operating area. Tmb = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter t
p
RDS(ON) / Ohm
0.20
3.5
4
4.5
ID / A
3
0.15
0.10
0.05
0
0 20 40 60 80 100
BUK555-50A
5
VGS / V =
7
10
Fig.6. Typical on-state resistance, Tj = 25 ˚C
R
= f(ID); parameter V
DS(ON)
GS
.
April 1993 3 Rev 1.100
Page 4
Philips Semiconductors Product Specification
PowerMOS transistor BUK555-60A/B Logic level FET
ID / A
80 70 60 50 40 30 20 10
0
0 2 4 6 8
Tj / C =
25 150
VGS / V
BUK555-50A
Fig.7. Typical transfer characteristics.
ID = f(VGS) ; conditions: VDS = 25 V; parameter T
gfs / S
20
16
12
8
BUK555-50A
VGS(TO) / V
2
1
0
-60 -20 20 60 100 140 180
max.
typ.
min.
Tj / C
Fig.10. Gate threshold voltage.
V
j
= f(Tj); conditions: ID = 1 mA; VDS = V
GS(TO)
1E-01
1E-02
1E-03
1E-04
ID / A
SUB-THRESHOLD CONDUCTION
2 %
typ
GS
98 %
4
0
0 20 40 60 80
Fig.8. Typical transconductance, Tj = 25 ˚C
ID / A
.
gfs = f(ID); conditions: VDS = 25 V
a
2.0
1.5
1.0
0.5
0
-60 -20 20 60 100 140 180
Normalised RDS(ON) = f(Tj)
Tj / C
Fig.9. Normalised drain-source on-state resistance.
a = R
DS(ON)/RDS(ON)25 ˚C
= f(Tj); ID = 20 A; VGS = 5 V
1E-05
1E-06
0 0.4 0.8 1.2 1.6 2 2.4
VGS / V
Fig.11. Sub-threshold drain current.
ID = f(V
10000
1000
100
10
Fig.12. Typical capacitances, C
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
; conditions: Tj = 25 ˚C; VDS = V
GS)
C / pF
0 20 40
VDS / V
, C
iss
BUK5y5-50
Ciss
Coss Crss
, C
oss
GS
rss
.
April 1993 4 Rev 1.100
Page 5
Philips Semiconductors Product Specification
PowerMOS transistor BUK555-60A/B Logic level FET
VGS / V
12
10
8
6
4
2
0
0 20 40
QG / nC
BUK555-50
VDS / V =10
40
Fig.13. Typical turn-on gate-charge characteristics.
V
= f(QG); conditions: ID = 39 A; parameter V
GS
100
50
IF / A
BUK555-50A
DS
WDSS%
120 110 100
90 80 70 60 50 40 30 20 10
0
20 40 60 80 100 120 140 160 180
Tmb / C
Fig.15. Normalised avalanche energy rating.
W
% = f(Tmb); conditions: ID = 39 A
DSS
+
L
VDS
VGS
0
T.U.T.
-
VDD
-ID/100
Tj / C = 150
0
0 1 2
25
VSDS / V
Fig.14. Typical reverse diode current.
IF = f(V
); conditions: V
SDS
= 0 V; parameter T
GS
RGS
Fig.16. Avalanche energy test circuit.
W
= 0.5 LI
j
DSS
2
D
BV
DSS
/(BV
R 01
shunt
DSS−VDD
)
April 1993 5 Rev 1.100
Page 6
Philips Semiconductors Product Specification
PowerMOS transistor BUK555-60A/B Logic level FET

MECHANICAL DATA

Dimensions in mm Net Mass: 2 g
10,3 max
1,3
3,7
4,5 max
3,0 max
not tinned
1,3
max
(2x)
123
2,54 2,54
2,8
3,0
13,5
min
0,9 max (3x)
5,9
min
15,8
max
0,6
2,4
Fig.17. TO220AB; pin 2 connected to mounting base.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent damage to MOS gate oxide.
2. Refer to mounting instructions for TO220 envelopes.
3. Epoxy meets UL94 V0 at 1/8".
April 1993 6 Rev 1.100
Page 7
Philips Semiconductors Product Specification
PowerMOS transistor BUK555-60A/B Logic level FET

DEFINITIONS

Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
Philips Electronics N.V. 1996
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent or other industrial or intellectual property rights.

LIFE SUPPORT APPLICATIONS

These products are not designed for use in life support appliances, devices or systems where malfunction of these products can be reasonably expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
April 1993 7 Rev 1.100
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