1. Global joint venture starts operations as WeEn Semiconductors
Dear customer,
As from November 9th, 2015 NXP Semiconductors N.V. and Beijing JianGuang Asset
Management Co. Ltd established Bipolar Power joint venture (JV), WeEn Semiconductors, which
will be used in future Bipolar Power documents together with new contact details.
In this document where the previous NXP references remain, please use the new links as shown
below.
WWW - For www.nxp.com use www.ween-semi.com
Email - For salesaddresses@nxp.com use salesaddresses@ween-semi.com
If you have any questions related to this document, please contact our nearest sales office via email or phone (details via salesaddresses@ween-semi.com).
Thank you for your cooperation and understanding,
WeEn Semiconductors
Page 2
DDATA SHEET
DISCRETE SEMICONDUCTORS
BTA212 series B
Three quadrant triacs
high commutation
Product specification
September 1997
Page 3
1;3 SemiconductorsProduct specification
Three quadrant triacsBTA212 series B
high commutation
GENERAL DESCRIPTIONQUICK REFERENCE DATA
Glass passivated high commutationSYMBOLPARAMETERMAX. MAX. MAX. UNIT
triacs in a plastic envelope intended
for use in circuits wherehigh staticandBTA212-500B600B800B
dynamic dV/dt and high dI/dt canV
occur. These devices will commutatevoltages
the full rated rms current at theI
maximum rated junction temperature,I
without the aid of a snubber.current
Peak gate current-2A
Peak gate voltage-5V
Peak gate power-5W
Average gate powerover any 20 ms-0.5W
Storage temperature-40150˚C
Operating junction-125˚C
temperature
t = 16.7 ms-105A
/dt = 0.2 A/μs
G
period
600
1
800V
T1T2
1 Although not recommended, off-state voltages up to 800V may be applied without damage, but the triac may
switch to the on-state. The rate of rise of current should not exceed 15 A/μs.
September 19971Rev 1.200
Page 4
1;3 SemiconductorsProduct specification
Three quadrant triacsBTA212 series B
high commutation
THERMAL RESISTANCES
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
R
th j-mb
R
th j-a
STATIC CHARACTERISTICS
Tj = 25 ˚C unless otherwise stated
SYMBOLPARAMETERCONDITIONSMIN.TYP.MAX.UNIT
I
GT
I
L
I
H
V
T
V
GT
I
D
Thermal resistancefull cycle--1.5K/W
junction to mounting base half cycle--2.0K/W
Thermal resistancein free air-60-K/W
junction to ambient
/dtCritical rate of change ofVDM = 400 V; Tj = 125 ˚C; I
dI
com
t
gt
off-state voltageexponential waveform; gate open circuit
commutating currentwithout snubber; gate open circuit
Gate controlled turn-onITM = 12 A; VD = V
timedI
/dt = 5 A/μs
G
; Tj = 125 ˚C;10004000-V/μs
DRM(max)
= 12 A;-24-A/ms
T(RMS)
; IG = 0.1 A;-2-μs
DRM(max)
2 Device does not trigger in the T2-, G+ quadrant.
September 19972Rev 1.200
Page 5
1;3 SemiconductorsProduct specification
Three quadrant triacsBTA212 series B
high commutation
Ptot / W
20
15
10
5
0
051015
BT138
1
IT(RMS) / A
Fig.1. Maximum on-state dissipation, P
on-state current, I
ITSM / A
1000
dI /dt limit
T
100
10
10us100us1ms10ms100ms
, where α = conduction angle.
T(RMS)
BTA212
I
T / s
Tmb(max) / C
= 180
120
90
60
30
, versus rms
tot
T
Tj initial = 25 C max
I
T
TSM
time
Fig.2. Maximum permissible non-repetitive peak
on-state current I
sinusoidal currents, t
, versus pulse width tp, for
TSM
≤ 20ms.
p
95
102.5
110
117.5
125
IT(RMS) / A
15
10
5
0
-50050100150
Fig.4. Maximum permissible rms current I
versus mounting base temperature T
IT(RMS) / A
25
20
15
10
5
0
0.010.1110
BT138
Tmb / C
BT138
surge duration / s
99 C
T(RMS)
.
mb
,
Fig.5. Maximum permissible repetitive rms on-state
current I
, versus surge duration, for sinusoidal
T(RMS)
currents, f = 50 Hz; T
≤ 99˚C.
mb
ITSM / A
100
80
60
40
20
0
1101001000
BT138
I
T
Tj initial = 25 C max
Number of cycles at 50Hz
I
TSM
time
T
Fig.3. Maximum permissible non-repetitive peak
on-state current I
sinusoidal currents, f = 50 Hz.
, versus number of cycles, for
TSM
VGT(Tj)
VGT(25 C)
1.6
1.4
1.2
1
0.8
0.6
0.4
-50050100150
BT136
Tj / C
Fig.6. Normalised gate trigger voltage
V
)/ VGT(25˚C), versus junction temperature Tj.
GT(Tj
September 19973Rev 1.200
Page 6
1;3 SemiconductorsProduct specification
Three quadrant triacsBTA212 series B
high commutation
IGT(Tj)
IGT(25 C)
3
2.5
2
1.5
1
0.5
0
-50050100150
BTA212
T2+ G+
T2+ GT2- G-
Tj / C
Fig.7. Normalised gate trigger current
I
)/ IGT(25˚C), versus junction temperature T
GT(Tj
IL(Tj)
2.5
1.5
0.5
IL(25 C)
3
2
1
TRIAC
IT / A
40
Tj = 125 C
Tj = 25 C
30
Vo = 1.175 V
Rs = 0.0316 Ohms
20
10
0
00.511.522.53
BT138
typ
max
VT / V
Fig.10. Typical and maximum on-state characteristic.
.
j
Zth j-mb (K/W)
10
1
0.1
0.01
unidirectional
BT138
bidirectional
t
P
p
D
t
0
-50050100150
Tj / C
Fig.8. Normalised latching current IL(Tj)/ IL(25˚C),
versus junction temperature T
IH(Tj)
IH(25C)
3
2.5
2
1.5
1
0.5
0
-50050100150
TRIAC
Tj / C
.
j
Fig.9. Normalised holding current IH(Tj)/ IH(25˚C),
versus junction temperature T
.
j
0.001
10us0.1ms1ms10ms0.1s1s10s
Fig.11. Transient thermal impedance Z
dIcom/dt (A/ms)
1000
100
10
1
20406080100120140
tp / s
pulse width t
BTA212
Tj / C
, versus
.
p
th j-mb
Fig.12. Typical, critical rate of change of commutating
current dI
/dt versus junction temperature.
com
September 19974Rev 1.200
Page 7
1;3 SemiconductorsProduct specification
Three quadrant triacsBTA212 series B
high commutation
MECHANICAL DATA
Dimensions in mm
Net Mass: 2 g
3,0 max
not tinned
1,3
max
(2x)
10,3
max
3,7
123
2,8
3,0
13,5
min
0,9 max (3x)
4,5
max
1,3
5,9
min
15,8
max
0,6
2,54 2,54
Fig.13. TO220AB; pin 2 connected to mounting base.
Notes
1. Refer to mounting instructions for TO220 envelopes.
2. Epoxy meets UL94 V0 at 1/8".
September 19975Rev 1.200
2,4
Page 8
NXP Semiconductors
Legal information
DATA SHEET STATUS
DOCUMENT
STATUS
Objective data sheetDevelopmentThis document contains data from the objective specification for product
Preliminary data sheetQualificationThis document contains data from the preliminary specification.
Product data sheetProductionThis document contains the product specification.
Notes
1. Please consult the most recently issued document before initiating or completing a design.
2. The product status of device(s) described in this document may have changed since this document was published
and may differ in case of multiple devices. The latest product status information is available on the Internet at
URL http://www.nxp.com.
DEFINITIONS
Product specification ⎯ The information and data
provided in a Product data sheet shall define the
specification of the product as agreed between NXP
Semiconductors and its customer, unless NXP
Semiconductors and customer have explicitly agreed
otherwise in writing. In no event however, shall an
agreement be valid in which the NXP Semiconductors
product is deemed to offer functions and qualities beyond
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DISCLAIMERS
Limited warranty and liability ⎯ Information in this
document is believed to be accurate and reliable.
However, NXP Semiconductors does not give any
representations or warranties, expressed or implied, as to
the accuracy or completeness of such information and
shall have no liability for the consequences of use of such
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Notwithstanding any damages that customer might incur
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aggregate and cumulative liability towards customer for
the products described herein shall be limited in
accordance with the Terms and conditions of commercial sale of NXP Semiconductors.
(1)
PRODUCT
STATUS
(2)
DEFINITION
development.
Right to make changes ⎯ NXP Semiconductors
reserves the right to make changes to information
published in this document, including without limitation
specifications and product descriptions, at any time and
without notice. This document supersedes and replaces all
information supplied prior to the publication he reof.
Suitability for use ⎯ NXP Semiconductors products are
not designed, authorized or warranted to be suitable for
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of an NXP Semiconductors product can reasonably be
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accepts no liability for inclusion and/or use of NXP
Semiconductors products in such equipment or
applications and therefore such inc lus ion and/or use is at
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Applications ⎯ Applications that are described herein for
any of these products are for illustrative purposes only.
NXP Semiconductors makes no representation or
warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and operation of
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Semiconductors products, and NXP Semiconductors
accepts no liability for any assistance with applications or
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Semiconductors product is suitable and fit for the
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Page 9
NXP Semiconductors
Legal information
NXP Semiconductors does not accept any liability related
to any default, damage, costs or problem which is based
on any weakness or default in the customer’s applications
or products, or the application or use by customer’s third
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customer(s). NXP does not accept any liability in this
respect.
Limiting values ⎯ Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) will cause permanent damage to
the device. Limiting values are stress ratings only and
(proper) operation of the device at these or any other
conditions above those given in the Recommended
operating conditions section (if present) or the
Characteristics sections of this document is not warranted.
Constant or repeated exposure to limiting values will
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reliability of the device.
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Semiconductors products are sold subject to the general
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Quick reference data ⎯ The Quick reference data is an
extract of the product data given in t he Limiting values and
Characteristics sections of this document, and as such is
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qualified products in automotive equipment or
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In the event that customer uses the product for design-in
and use in automotive applications to automotive
specifications and standards, customer (a) shall use the
product without NXP Semiconductors’ warranty of the
product for such automotive applications, use an d
specifications, and (b) whenever customer uses the
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Semiconductors’ standard warranty and NXP
Semiconductors’ product specifications.
Customer notification
This data shee
t was changed to reflect the new company name NXP Semiconductors, including new legal definitions
and disclaimers. No changes were made to the content, except for the legal definitions and discla imers.
Contact information
For additional information please visit: http://www.nxp.com
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